Patents Examined by Gordon J. Stock
  • Patent number: 11965731
    Abstract: The present disclosure provides a measurement method including providing a base, a device disposed on the base, and a lid disposed over the base and the device; irradiating a top surface of the device through an opening of the lid to obtain a first focal plane associated with a top surface of the device; irradiating the lid at the lower end of the opening to obtain a second focal plane associated with the lid at the lower end of the opening; and deriving a distance between the top surface of the device and an interior surface of the lid facing the top surface of the device based on a difference between a level of the first focal plane and a level of the second focal plane. The present disclosure also provides a package structure for the measurement.
    Type: Grant
    Filed: March 14, 2021
    Date of Patent: April 23, 2024
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventor: Kuei-Sung Chang
  • Patent number: 11966169
    Abstract: A system includes a radiation source, first and second phased arrays, and a detector. The first and second phased arrays include optical elements, a plurality of ports, waveguides, and phase modulators. The optical elements radiate radiation waves. The waveguides guide radiation from a port of the plurality of ports to the optical elements. Phase modulators adjust phases of the radiation waves. One or both of the first and second phased arrays form a first beam and/or a second beam of radiation directed toward a target structure based on the port coupled to the radiation source. The detector receives radiation scattered by the target structure and generates a measurement signal based on the received radiation.
    Type: Grant
    Filed: September 23, 2020
    Date of Patent: April 23, 2024
    Assignee: ASML Holding N.V.
    Inventors: Mohamed Swillam, Tamer Mohamed Tawfik Ahmed Elazhary, Stephen Roux, Yuxiang Lin, Justin Lloyd Kreuzer
  • Patent number: 11953315
    Abstract: A vehicle wheel assembly position measurement apparatus measures, at each of at least three measurement positions in a circumferential direction, a distance in a vehicle width direction between each of plural measurement points located on a specified line that crosses a lateral surface of a tire section from an inner circumferential end to an outer circumferential end and a respective one of distance measuring instruments, calculates an approximate curve indicating a relationship between a position in an extending direction of the specified line and the distance of each of the measurement points at the respective measurement position, calculates a rotation center position of a wheel assembly from a specific position of the approximate curve at the measurement position, and calculates a height position of the wheel assembly relative to a vehicle body from the rotation center position and a height position of a specified portion of the vehicle body.
    Type: Grant
    Filed: September 3, 2020
    Date of Patent: April 9, 2024
    Assignee: MAZDA MOTOR CORPORATION
    Inventors: Taiga Inoue, Akira Fukunaga, Yoko Doi
  • Patent number: 11953317
    Abstract: A reference core position calculation device 100 that calculates a reference core position of an elevator shaft in which an elevator is to be installed includes a measurement unit 101 and a calculation unit 112. The measurement unit 101 measures a dimension of each portion of the elevator shaft. The calculation unit 112 calculates portion dimension values of the elevator shaft based on the reference core position and the dimension of each portion measured by the measurement unit 101. When the reference core position is a first reference core position, the calculation unit 112 determines whether portion dimension values of the elevator shaft calculated based on the first reference core position satisfy a predetermined specification.
    Type: Grant
    Filed: December 5, 2019
    Date of Patent: April 9, 2024
    Assignee: Hitachi Building Systems Co., Ltd.
    Inventors: Hirofumi Taguchi, Naoaki Noguchi, Daisuke Matsuka, Nobuaki Yagi, Masato Itou
  • Patent number: 11953420
    Abstract: Light detection systems for measuring light (e.g., in a flow stream) are described. Light detection systems according to embodiments include a light scatter detector, a brightfield photodetector and an optical adjustment component configured to convey light to the light scatter detector and to the brightfield photodetector. Systems and methods for measuring light emitted by a sample (e.g., in a flow stream) and kits having a light scatter detector, a brightfield photodetector and a beam splitter component are also provided.
    Type: Grant
    Filed: March 15, 2021
    Date of Patent: April 9, 2024
    Assignee: BECTON, DICKINSON AND COMPANY
    Inventors: Jizuo Zou, Matthew Bahr, Eric D. Diebold
  • Patent number: 11940389
    Abstract: A device to detect and analyze defects in magnified scale images of a surface of a finished product illuminated with a blue light source and viewed by multiple image-capturing devices each focused on their own spot includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a blue light source assembly. The processor is used to connect to a camera assembly, and preprocess the image of the front of the product to obtain a detection and analysis of any defects of the front of the product.
    Type: Grant
    Filed: December 15, 2021
    Date of Patent: March 26, 2024
    Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.
    Inventors: Liu-Bin Hu, Wei Yang
  • Patent number: 11940608
    Abstract: A dark field metrology device includes an objective lens arrangement and a zeroth order block to block zeroth order radiation. The objective lens arrangement directs illumination onto a specimen to be measured and collects scattered radiation from the specimen, the scattered radiation including zeroth order radiation and higher order diffracted radiation. The dark field metrology device is operable to perform an illumination scan to scan illumination over at least two different subsets of the maximum range of illumination angles; and simultaneously perform a detection scan which scans the zeroth order block and/or the scattered radiation with respect to each other over a corresponding subset of the maximum range of detection angles during at least part of the illumination scan.
    Type: Grant
    Filed: April 2, 2020
    Date of Patent: March 26, 2024
    Assignee: ASML NETHERLANDS B.V.
    Inventor: Sebastianus Adrianus Goorden
  • Patent number: 11923894
    Abstract: In some examples, automatic OTDR-based testing may include determining, based on analysis of a signal that is received from a DUT that is to be monitored, whether the DUT is optically connected. Based on a determination that the DUT is optically connected, a measurement associated with the DUT may be performed.
    Type: Grant
    Filed: October 27, 2022
    Date of Patent: March 5, 2024
    Assignee: VIAVI SOLUTIONS INC.
    Inventor: Julien Barrier
  • Patent number: 11920922
    Abstract: A system for detecting an alignment of a relay lens assembly and a combiner of a head-up display is disclosed. The system includes an illuminated reticle spatially coupled to the relay lens assembly, an optical sensor spatially coupled to the combiner, and a control module configured to receive an input from the optical sensor, determine a position of the combiner relative to the relay lens assembly based on the received input; and generate an output based on a determined position of the combiner relative to the relay lens assembly. In another system, the illuminated reticle is spatially coupled to the combiner, and the optical sensor is spatially coupled to the relay lens assembly. The system may also participate in a feedback loop with the head-up display to reduce jitter in the head-up display.
    Type: Grant
    Filed: April 2, 2021
    Date of Patent: March 5, 2024
    Assignee: Rockwell Collins, Inc.
    Inventors: Eric P. Stratton, Ian M. Meyer
  • Patent number: 11906289
    Abstract: A triangulation-based optical profilometry system for scanning a three-dimensional sample surface located at a sample plane includes a projection system; an image sensor; a processing unit; an objective lens assembly for imaging onto the image sensor a luminous line formed on the sample plane, a first direction orthogonal to an optical axis and being defined parallel to an extent of the luminous line, a second direction being defined perpendicular to the first direction; and a diaphragm defining a non-circular aperture defined by a first dimension and a second dimension greater than the first dimension, the diaphragm being rotationally oriented such that the first dimension is aligned with the first direction and the second dimension is aligned with the second direction, the objective lens assembly being arranged to form an out-of-focus image of the luminous line on the image sensor.
    Type: Grant
    Filed: June 28, 2019
    Date of Patent: February 20, 2024
    Assignee: INSTITUT NATIONAL D'OPTIQUE
    Inventor: Francois Martin
  • Patent number: 11906284
    Abstract: A method for detecting an edge of an object is carried out by means of a detection device (10), which has an emission region running along a first straight line and has a receiving region which runs along a second straight line, which is arranged in parallel to the first straight line. An emission subregion (11a-p) of the emission region is selected, which extends up to a first end of the emission region. Light is emitted from the emission subregion (11a-p) and a light signal of light reflected on the object is received in the receiving region. The emission subregion (11a-p) is then shifted along the first straight line in the direction of a second end of the emission region. Emitting, receiving and shifting are repeated until the emission subregion (11a-p) extends up to the second end at the start of the shifting step. A signal course is compiled from the received light signals, and the detection of the edge from the signal course is carried out.
    Type: Grant
    Filed: February 22, 2021
    Date of Patent: February 20, 2024
    Assignee: BALLUFF GMBH
    Inventors: Juri Schroffenegger, Sergej Hense
  • Patent number: 11906389
    Abstract: There is provided a system and a method for assisting a technician in fiber optic cable splices and comprising a pair of test units including an OTDR, an optical switch, a tone generator and a tone detector to automate the splicing process and testing. The test units may be in communication with a wireless portable device used by the splicing technician and controlled therefrom. In one embodiment, the test units are driven by a test orchestrator application (e.g., server-based) to switch fibers, perform continuity tests and/or splice quality tests, triggered by the technician's portable device.
    Type: Grant
    Filed: April 21, 2022
    Date of Patent: February 20, 2024
    Assignee: EXFO Inc.
    Inventors: Stephane Perron, Michel Leclerc
  • Patent number: 11908717
    Abstract: A transfer method transfers a substrate between a transfer unit configured to hold and transfer the substrate and a substrate stage serving as a transfer destination or a transfer source of the substrate. The transfer method includes: acquiring positional information of the transfer unit and positional information of the substrate stage; determining whether or not there is a risk for the substrate to contact with the substrate stage, based on the acquired positional information of the transfer unit and positional information of the substrate stage; and when determined that there is a risk for the substrate to contact with the substrate stage, notifying the risk according to the determination at the determining.
    Type: Grant
    Filed: May 26, 2020
    Date of Patent: February 20, 2024
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Masakazu Yamamoto, Tadashi Enomoto
  • Patent number: 11899375
    Abstract: A multi-column metrology tool may include two or more measurement columns distributed along a column direction, where the two or more measurement columns simultaneously probe two or more measurement regions on a sample including metrology targets. A measurement column may include an illumination sub-system to direct illumination to the sample, a collection sub-system including a collection lens to collect measurement signals from the sample and direct it to one or more detectors, and a column-positioning sub-system to adjust a position of the collection lens. A measurement region of a measurement column may be defined by a field of view of the collection lens and a range of the positioning system in the lateral plane. The tool may further include a sample-positioning sub-system to scan the sample along a scan path different than the column direction to position metrology targets within the measurement regions of the measurement columns for measurements.
    Type: Grant
    Filed: March 24, 2021
    Date of Patent: February 13, 2024
    Assignee: KLA Corporation
    Inventors: Jonathan Madsen, Andrei V. Shchegrov, Amnon Manassen, Andrew V. Hill, Yossi Simon, Gilad Laredo, Yoram Uziel
  • Patent number: 11901937
    Abstract: Disclosed are a long-distance optical fiber detecting method, apparatus, device and system, and a storage medium. The method comprises: in response to a detection request of a target node on a to-be-detected optical fiber, determining a first and second sampling sequence that are formed by respectively propagating, on said optical fiber, a first and second optical signal respectively sent from each end of the optical fiber through an OTDR; determining a total length of the optical fiber; generating a detection result according to the first and second sampling sequence and the total length, and sending the detection result to the target node. By determining the first and second sampling sequence and combining the total length of the optical fiber, a detection result of the to-be-detected optical fiber is generated.
    Type: Grant
    Filed: December 28, 2020
    Date of Patent: February 13, 2024
    Assignee: ACCELINK TECHNOLOGIES CO., LTD.
    Inventors: Qi Zhou, Tao Xiong, Chunping Yu, Qinlian Bu
  • Patent number: 11885707
    Abstract: A system for providing advanced characterization of an optical fiber span is based upon the use of a pair of optical time domain reflectometers (OTDRs), located at opposing end terminations of the span being characterized. Each OTDR performs standard reflectometry measurements and transmits the resulting OTDR trace to monitoring equipment in a typical manner. The pair of OTDR traces is thereafter combined in a particular manner (“stitched together”) to create an OTDR trace of the entire fiber span (essentially doubling the operational range of prior art OTDR measurement capabilities). The transmit portion of one OTDR may be paired with the receive portion of the other OTDR, with time-of-light measurements (or signal loss measurements) used to determine optical path length and/or optical signal loss of the span. Using a multi-wavelength light source in the paired transmit/receive arrangement allows for a characterization of chromatic dispersion of the span.
    Type: Grant
    Filed: November 17, 2021
    Date of Patent: January 30, 2024
    Assignee: II-VI Delaware, Inc.
    Inventors: Michael J. Cahill, Ian Peter McClean
  • Patent number: 11879803
    Abstract: An optical fiber testing method is presented for measuring the change amount for the wave number k of a Brillouin Frequency Shift ? in stimulated Brillouin scattering generated in the same acoustic mode with respect to each target propagation mode. In this way, the ratio of the change amount measured at each propagation mode is acquired as the group delay ratio between the modes.
    Type: Grant
    Filed: June 3, 2020
    Date of Patent: January 23, 2024
    Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
    Inventors: Tomokazu Oda, Hiroyuki Oshida, Daisuke Iida, Atsushi Nakamura, Yuto Sagae
  • Patent number: 11879997
    Abstract: A system and method for analyzing a surface of an object is provided. The system includes a 3D measurement device operable to acquire a plurality of points on the surface of the object and determine 3D coordinates for each of the points. The system further includes processors operably coupled to the 3D measurement device. The processors are responsive to computer instructions when executed on the processors for performing a method comprising: generating a point cloud from the 3D coordinates of the plurality of points; extracting a first set of points from the plurality of points; defining a first reference geometry through the first set of points; measuring at least one first metric from each of the points in the first set of points to the first reference geometry; and identifying a nonconforming feature based at least in part on the at least one first metric.
    Type: Grant
    Filed: March 18, 2021
    Date of Patent: January 23, 2024
    Assignee: FARO Technologies, Inc.
    Inventors: Oliver Zweigle, Aleksej Frank, Johannes Buback
  • Patent number: 11879802
    Abstract: There are provided methods and systems for testing the continuity of optical fiber links under test and/or a fiber arrangement, polarity or mapping of optical fiber connections within optical devices under test using the backscattering pattern as a signature. The device under test may comprises a single fiber, a duplex link, a multifiber cable or another multi-port device such as a backplane device.
    Type: Grant
    Filed: October 19, 2021
    Date of Patent: January 23, 2024
    Assignee: EXFO Inc.
    Inventors: Stephane Perron, Michel Leclerc, Pascal Gosselin-Badaroudine
  • Patent number: 11867494
    Abstract: Provided is an optical displacement sensor that allows a housing serving as a head to be downsized. A relay cable extending from the head is integrated with a body. The head is primarily responsible for projecting and receiving light to and from a to-be-detected object, while the body is made up of a power supply circuit, a display, and an operation part. The head includes a green laser light source and emits the green laser light to form a spot on a surface of the to-be-detected object.
    Type: Grant
    Filed: March 9, 2021
    Date of Patent: January 9, 2024
    Assignee: KEYENCE CORPORATION
    Inventors: Daiki Matsumoto, Choryon Oh