Patents Examined by Gordon J. Stock
  • Patent number: 11274991
    Abstract: An inspection tool for allowing visual inspection of an end face of a fiber optic ferrule. The inspection tool includes a passage for allowing a camera to view the end face. The inspection tool also includes light directing structure for first directing ferrule illumination light axially along the inspection tool, and then reflecting the axial light across the end face of the fiber optic ferrule.
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: March 15, 2022
    Assignee: CommScope Technologies LLC
    Inventors: Patrick Jacques Ann Diepstraten, Jozef Christiaan Mathieu Versleegers, Antonius Bernardus Gerardus Bolhaar, Christiaan Radelet
  • Patent number: 11271641
    Abstract: There is therefore provided an OTDR method for characterizing an optical fiber link, wherein a receive device comprising a reflective optical signature and a receive fiber is connected at a remote end of the optical fiber link under test. The reflective optical signature is detected using an OTDR acquisition and link continuity is verified. Because detection of the reflective optical signature rely on high-intensity reflective peaks of the reflective optical signature and not on RBS level, dynamic range constraints are relaxed and so is the averaging time. Advantageously, the method may be employed to detect the reflective optical signature, verify link continuity, measure total link length, measure total insertion loss and/or determine a polarity of a multi-fiber array cable link.
    Type: Grant
    Filed: January 13, 2020
    Date of Patent: March 8, 2022
    Assignee: EXFO Inc.
    Inventor: Stephane Perron
  • Patent number: 11265079
    Abstract: A process including the following steps: injecting in an optical fiber a first optical pump at a first optical frequency that evolves in time or not, and a second optical pump at a second optical frequency that evolves in time or not, the first optical frequency and the second optical frequency being different at each given time; a first detection of a first Rayleigh backscattered signal at the first optical frequency from the optical fiber; a second detection, separated from the first detection, of a second Rayleigh backscattered signal at the second optical frequency from the optical fiber; and analyzing the detected first Rayleigh backscattered signal and the detected second Rayleigh backscattered signal.
    Type: Grant
    Filed: December 14, 2018
    Date of Patent: March 1, 2022
    Assignee: OMNISENS SA
    Inventor: Etienne Rochat
  • Patent number: 11255746
    Abstract: A photonic resonator analyzer characterizes a photonic resonator and incudes a light source that provides a probe light; a photonic resonator that receives the probe light and produces product light; an optical detector that receives the product light and produces a product signal; a mode analyzer that receives the product signal and produces a resonator spectrum; and a spectral analyzer that receives the resonator spectrum, performs regression by fitting a non-parametric model to the resonator spectrum, and produces a thermal response function of the photonic resonator from fitting the non-parametric model to the resonator spectrum to characterize the photonic resonator.
    Type: Grant
    Filed: December 7, 2020
    Date of Patent: February 22, 2022
    Assignee: GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
    Inventor: Zeeshan Ahmed
  • Patent number: 11237110
    Abstract: A method for photoluminescence measurement of a sample that includes a front face and a rear face linked by a contour, the sample resting, via the rear face of same, on a receiving face of an active base. The sample also includes a first region partially delimited by the contour and that emits a photoluminescence signal of an intensity, referred to as the first intensity, that is lower at any point to the average intensity of the photoluminescence signal of the sample, referred to as the reference intensity, the active base emitting a photoluminescence signal of an intensity, referred to as the secondary intensity, that is at least equal to the reference intensity. The active base includes an edge that is set apart from the contour by an overlap distance and that delimits, with said contour, a peripheral section of the active base.
    Type: Grant
    Filed: November 20, 2018
    Date of Patent: February 1, 2022
    Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventor: Renaud Varache
  • Patent number: 11230266
    Abstract: A laminated glazing and related detection method is described. The laminated glazing has a detecting device to determine the presence of mist on a surface of the glazing and/or the presence of an object contacting or proximal the glazing. The detecting device including transmitter means for emitting a beam of electromagnetic radiation, detector means for detecting electromagnetic radiation and a target for non-specular reflection of first beam of electromagnetic radiation. The transmitter means is configured to emit the beam of electromagnetic radiation to illuminate the target such that electromagnetic radiation reflects therefrom to illuminate a region of a major surface of the glazing. At least a portion of the electromagnetic radiation reflected off the region is detectable by the detector means to provide a detection signal for detecting mist on the region and/or the presence of an object contacting or proximal the glazing. A detection method is also described.
    Type: Grant
    Filed: September 11, 2018
    Date of Patent: January 25, 2022
    Assignee: Pilkington Group Limited
    Inventor: Stephen Roland Day
  • Patent number: 11215526
    Abstract: The present disclosure relates to an inspection apparatus and an inspection method that enable inspection of the performance of an image pickup element. Generation of collimated light and transmission of part of the collimated light through a transmission filter having a light-blocking face provided with circular holes arranged regularly, causes conversion to rays of columnar collimated light arranged regularly. An image including the rays of columnar collimated light arranged regularly, is captured by an image pickup element being inspected. Then, acquisition of the difference between the image captured by the image pickup element being inspected and an ideal image captured by an ideal image pickup element and comparison between the difference and a threshold, result in inspection of the performance of the image pickup element being inspected.
    Type: Grant
    Filed: September 20, 2018
    Date of Patent: January 4, 2022
    Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
    Inventors: Katsuji Kimura, Hiroyuki Yamanaka, Yuji Furukawa, Kohei Harada, Hironori Takahashi, Hiroyuki Goto, Heiichiro Ryu, Katsuaki Tatebayashi
  • Patent number: 11215445
    Abstract: An optical apparatus includes: a light source to emit reference light; a phototransmitter optical system to project the reference light emitted from the light source onto a measurement area extending 90 degrees or more; an image sensor having an imaging surface on which an optical image is formed; and a photoreceiver optical system to form an image of reflected light on the imaging surface, the reflected light being resulting from the reference light reflected at a measurement target present in the measurement area extending 90 degrees or more. The phototransmitter optical system and the photoreceiver optical system are disposed such that at least an optical axis of the phototransmitter optical system and an optical axis of the photoreceiver optical system partially coincide with each other, and at least a portion of the phototransmitter optical system and a portion of the photoreceiver optical system constitute a common optical system unit.
    Type: Grant
    Filed: February 24, 2020
    Date of Patent: January 4, 2022
    Assignee: RICOH COMPANY, LTD.
    Inventor: Takehiro Nishimori
  • Patent number: 11209739
    Abstract: A method and a device for aligning two lenses, wherein the method is directed to aligning first and second optical partial systems of an optical system, which are arranged so as to be located opposite to one another. The method includes the steps of: projecting alignment marks into a first image plane of the first optical partial system, projecting the alignment marks from the first image plane onto a sensitive surface of the second optical partial system, and aligning the optical partial systems relative to one another, such that projections of the alignment marks in a depth of field of the sensitive surface are imaged at ideal positions.
    Type: Grant
    Filed: February 22, 2018
    Date of Patent: December 28, 2021
    Assignee: EV Group E. Thallner GmbH
    Inventor: Boris Povazay
  • Patent number: 11204240
    Abstract: A strain measurement method includes disposing a 3D camera module at a first measurement position; using the 3D camera module to acquire a first 3D image of a to-be-measured object at a first to-be-measured position; acquiring a second 3D image of the to-be-measured object at the first to-be-measured position; and splicing the first and second 3D images to obtain an initial 3D image. The method still includes: moving the 3D camera module from the first measurement position to a second measurement position; using the 3D camera module to acquire a third 3D image of the to-be-measured object at a second to-be-measured position; acquiring a fourth 3D image of the to-be-measured object at the second to-be-measured position; and splicing the third and fourth 3D images to obtain a deformed 3D image. The method further includes comparing the initial 3D image and the deformed 3D image to output 3D deformation information.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: December 21, 2021
    Assignee: Industrial Technology Research Institute
    Inventors: I-Hung Chiang, Hung-Hsien Ko, Cheng-Ta Pan, Yu-Lin Hsu, Kuo-Hua Tseng
  • Patent number: 11199394
    Abstract: An apparatus for three-dimensional shape measurement is provided, including a projection device, an image capture device, and an image processing device. The projection device sequentially projects a plurality of structured light beams on a scene during a first projection period and a second projection period. The mean level of the structured light beams during the first projection period is the same as the mean level of the structured light beams during the second projection period, and the frequency of the structured light beams during the first projection period is different from the frequency of the structured light beams during the second projection period. The image capture device captures an image of the scene within the projection time of each of the structured light beams. The image processing device obtains a three-dimensional shape of a to-be-measured object in the scene according to the images.
    Type: Grant
    Filed: September 25, 2020
    Date of Patent: December 14, 2021
    Assignee: BENANO INC.
    Inventors: Liang-Pin Yu, Yeong-Feng Wang, Chun-Di Chen
  • Patent number: 11199473
    Abstract: An object of the present invention is to provide an optical pulse test apparatus that can test an optical fiber cable at once in a short period of time.
    Type: Grant
    Filed: June 4, 2019
    Date of Patent: December 14, 2021
    Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
    Inventors: Hiroyuki Iida, Tetsuya Manabe, Yusuke Koshikiya, Hidenobu Hirota, Takui Uematsu
  • Patent number: 11199472
    Abstract: A lensmeter system may include a mobile device having a camera. The camera may capture a first image of a pattern through a lens that is separate from the camera, while the lens is in contact with a pattern. The mobile device may determine the size of the lens based on the first image and known features of the pattern. The camera may capture a second image of the pattern, while the lens is at an intermediate location between the camera and the pattern. The second image may be transformed to an ideal coordinate system, and processed determine a distortion of the pattern attributable to the lens. The mobile device may measure characteristics of the lens based on the distortion. Characteristics of the lens may include a spherical power, a cylinder power, and/or an astigmatism angle.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: December 14, 2021
    Assignee: Warby Parker Inc.
    Inventors: David Howard Goldberg, Joseph Carrafa
  • Patent number: 11193801
    Abstract: Aspects of the present disclosure describe amplifier dynamics compensation through feedback control for distributed fiber sensing systems, methods, and structures employing Brillouin optical time-domain reflectometry.
    Type: Grant
    Filed: May 20, 2020
    Date of Patent: December 7, 2021
    Inventors: Ezra Ip, Yue-Kai Huang
  • Patent number: 11193758
    Abstract: A measurement device is configured to measure a three-dimensional shape of an object for measurement. The measurement device includes a projector, an imager, an identifier, and a calculator. The projector is configured to project a plurality of light lines onto the object for measurement. The imager is configured to capture an image of the object for measurement on which the plurality of light lines are projected. The identifier is configured to identify a projection condition of the light lines based on shaping information of the object for measurement. The calculator is configured to calculate a plurality of line shapes from the image captured by the imager, based on the projection condition.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: December 7, 2021
    Assignee: RICOH COMPANY, LTD.
    Inventor: Ryohsuke Nishi
  • Patent number: 11193829
    Abstract: A circular dichroism spectrometer which comprises a metasurface. The metasurface has a plurality of anisotropic antennas configured to simultaneously spatially separate LCP and RCP spectral components from an incoming light beam. An optical detector array is included which detects the LCP and RCP spectral components. A transparent medium is situated between the metasurface and the optical detector array.
    Type: Grant
    Filed: July 20, 2020
    Date of Patent: December 7, 2021
    Assignee: Purdue Research Foundation
    Inventors: Amr Mohammad E Shaltout, Alexander V. Kildishev, Vladimir M Shalaev, Jingjing Liu
  • Patent number: 11187615
    Abstract: A system for monitoring of the resin front during resin infusion into a fiber preform for the manufacturing of composites. Such monitoring is based on Optical Frequency Domain Reflectometry by emitting light pulses through optic fibers which forms a resin infusion mesh in a fiber preform.
    Type: Grant
    Filed: July 1, 2020
    Date of Patent: November 30, 2021
    Assignee: AIRBUS OPERATIONS S.L.U.
    Inventors: Carlos De Miguel Giraldo, José Sánchez Del Rio Sáez
  • Patent number: 11187523
    Abstract: Systems and methods for three-dimensional (3D) shape estimation of objects embedded in light-scattering media via polarimetry are provided. The systems and methods utilize polarization to exploit forward scattering in the light-scattering medium to mitigate backscatter interference (BSI).
    Type: Grant
    Filed: May 28, 2020
    Date of Patent: November 30, 2021
    Assignee: BAE Systems Information and Electronic Systems Integration Inc.
    Inventors: Michael J. DeWeert, Eric M. Louchard, Reid A. Noguchi, Dugan C. Yoon
  • Patent number: 11175129
    Abstract: A sample shape measuring method includes a step of preparing illumination light that is to be passed through a predetermined illumination region, a step of irradiating the illumination light to a sample, and a predetermined processing step. The predetermined illumination region is set such that an area of a region of the illumination light passing through a pupil of an observation optical system is smaller than an area of the pupil of the observation optical system. The predetermined processing step includes a step of receiving light emerged from the observation optical system, a step of computing a position of an image of the predetermined illumination region from light received, a step of computing a difference between the position of the image of the predetermined illumination region and a reference position, and a step of calculating an amount of inclination at a surface of the sample, from the difference calculated.
    Type: Grant
    Filed: October 3, 2018
    Date of Patent: November 16, 2021
    Assignee: OLYMPUS CORPORATION
    Inventor: Yoshimasa Suzuki
  • Patent number: 11169051
    Abstract: A testing device includes a test port, a light source, a measurement element, and a controller. A method of testing an optical system with the testing device includes, and/or the testing device is configured for, measuring an unloaded reference signal when the testing device is not connected to the optical system and storing the unloaded reference signal in a memory of the testing device. The method and/or configuration also includes detecting a signal from the optical system after storing the unloaded reference signal. Based on the detected signal, it is determined that the optical system is connected to a test port of the testing device. A test of the optical system with the testing device is automatically initiated in response to determining that the optical system is connected to the test port of the testing device.
    Type: Grant
    Filed: February 13, 2020
    Date of Patent: November 9, 2021
    Assignee: AFL Telecommunications LLC
    Inventor: Fang Xu