Abstract: The present invention provides a distributed optical fiber sensor capable of measuring the strain and temperature of an object to be measured simultaneously and independently with high spatial resolution. A distributed optical fiber sensor FS is a distributed optical fiber sensor which uses an optical fiber 15 as a sensor, and a strain and temperature detector 14 measures a Brillouin frequency shift amount caused by a strain and a temperature generated in the optical fiber 15 by using a Brillouin scattering phenomenon, measures a Rayleigh frequency shift amount caused by the strain and temperature generated in the optical fiber 15 by using a Rayleigh scattering phenomenon, and calculates the strain and temperature generated in the optical fiber 15 from the measured Brillouin frequency shift amount and Rayleigh frequency shift amount.

Abstract: The shape of a prism is set such that an excitation light beam that enters the prism to cause surface plasmon resonance to be generated is not irradiated onto the corners of the prism after being totally reflected within the prism. The angle of a surface that the excitation light exits the prism is set to an angle at which the excitation light beam is not totally reflected. Thereby, the excitation light beam returning to a light source, and being scattered within the prism are prevented, and therefore the accuracy of measurements can be improved.

Abstract: An optical coherence tomography apparatus includes a light source, a light coupling module, and an optical path difference generating module. The light source emits a coherent light. The light coupling module divides the coherent light into a first incident light and a second incident light. The first incident light is emitted to an item to be inspected and a first reflected light is generated. The second incident light is emitted to the optical path difference generating module, a second reflected light is generated according to the second incident light by the optical path difference generating module through changing the transparent/reflection properties of at least one optical devices of the optical path difference generating module, so that there is a optical path difference between the first reflected light and the second reflected light.

Abstract: An optical target for temporary application in non-determined placement on a surface of an object such as a vehicle wheel assembly within the field of view of an imaging sensor of a machine vision vehicle service system. The optical target consists of a flexible body which is relatively thin and generally flat, capable of conforming to the contours of a surface onto which it is secured in releasable manner by a means of adhesion. A set of visible optical elements are disposed on a front face of the target body for observation and imaging by the imaging sensors.

Abstract: A lay meter includes a computer based device, a light source for creating a light plane operably connected with the computer based device, a shadow based sensor a light plane operably connected with the computer based device, and signal processing circuits and software for processing sensed signals such that a clean square wave voltage signal is generated in direct response to the lays passing through the light plane.

Abstract: The present invention relates to light sensors for measuring light characteristics. In particular, the present invention relates to a light directionality sensor that is capable of measuring light characteristics such as the light direction, light collimation, and light distribution. According to a first aspect of the present invention there is provided a light directionality sensor comprising a photo-sensor (2), comprising a plurality of photo-sensitive elements (3), and a plurality of light-absorbing light selecting structures (1) arranged on the photo-sensor so as to form an array of light-absorbing light selecting structures. In the array of light-absorbing light selecting structures, a succession of at least some of the light-absorbing light selecting structures has varying structural characteristics.

Abstract: A defect inspection apparatus for inspecting a defect of a substrate as an object to be inspected comprises an illumination optical system for illuminating the substrate, a receiving optical system for receiving diffracted light from the substrate and a polarizing element provided in either one of the illumination optical system or the receiving optical system.

Abstract: An optical element for resonating and reflecting incident light having a wavelength includes a periodic structure formed of protrusions and recessions. A period of the periodic structure is equal to or less than the wavelength of the incident light. The incident light having the wavelength is resonated and reflected by a resonance caused between the incident light and the protrusions and recessions. Widths of the protrusions are spatially changed.

Abstract: A semiconductor wafer inspection method includes: an imaging step in which a first image being an image of the chamfered surface seen from the main surface side and a second image being an image of the chamfered surface seen from the back surface side are taken; a calculation step in which a first width is obtained based on the first image, the first width being a width of the chamfered surface seen from the main surface side, a second width is obtained based on the second image, the second width being a width of the chamfered surface seen from the back surface side, and a ratio of the first width to the second width thus obtained is calculated; and a shape determination step in which a form of the chamfered surface is determined to be abnormal in a case where the ratio is out of a predetermined range.

Abstract: A method of particle detection includes a shock wave generating step of irradiating a dispersion liquid having dispersed first particles having a first diameter and second particles having a second diameter larger than the first diameter, with a pulse laser, and generating a shock wave in the dispersion liquid, a migration speed difference imparting step of migrating and accelerating the first particles at a first acceleration speed, and the second particles at a second acceleration speed higher than the first acceleration speed, by the shock wave generated at the shock wave generating step, and a detecting step of detecting the first or second particles.

Abstract: Techniques for measuring light absorption of liquid samples are described herein. According to one embodiment, an apparatus includes an upper arm having a first measuring surface and a lower arm having a second measuring surface coupled to the lower arm via a hinge. The upper arm is capable of swinging via the hinge. One of the measuring surfaces is coupled to a light source while the other is coupled to a detector. The apparatus further includes an actuator configured to position the upper arm into a first measuring position. The first measuring surface of the upper arm and the second measuring surface of the lower arm are spaced approximately to contact and sandwich a liquid sample in between to form an optical path, such that light generated from the light source is received and detected through the light path by the detector for measuring light absorption by the liquid sample. Other methods and apparatuses are also described.

Abstract: A method of detecting the condition of a turf grass is described. According to one aspect of the invention, the method comprises steps of attaching an active sensor to a mower; traversing a section of turf grass; and processing the output of the sensor. A device for detecting the condition of turf grass is also disclosed. The device comprises an array of illuminating devices generating a pattern of illuminating light; a detecting device receiving a pattern of reflected light which is coincident with the pattern of illuminating light; a detecting device adapted to detect stray light from the array of illuminating devices; and a feedback loop controlling the array of illuminating devices. A system employing the device is also disclosed.

Abstract: An optical detection sensor detects presence or absence of a product within a fluid delivery medium. An emitter directs radiation into the fluid delivery medium and detectors detect transmitted light at a plurality of wavelengths. The output of each detector and combinations of outputs of multiple detectors are associated with at least one out-of-product threshold. In addition, a color ratio is established. A controller compares the detector outputs and combination outputs with the associated out-of-product threshold(s). If any of the thresholds are satisfied, the controller compares the color ratio with an associated out-of-product threshold to verify an out-of-product event has occurred and reduce errors due to batch-to-batch variation of the product. The sensor is able to determine presence or absence of a variety of products having different color, transparency or turbidity.

Abstract: An apparatus for measuring an internal dimension of a well-bore comprising a tool adapted to be positioned inside the well bore. The tool comprises an optical caliper comprising an optical sensor providing a response correlated to the internal dimension of the well bore, the optical sensor being coupled to an optical fiber.

Abstract: An optical system for receiving and collimating light and for transporting and processing light received in each of N wavelength ranges, including near-ultraviolet, visible, near-infrared and mid-infrared wavelengths, to determine a fraction of light received, and associated dark current, in each wavelength range in each of a sequence of time intervals.

Abstract: An optical semiconductor wafer inspection system and a method thereof are provided for classifying and inspecting defects such as scratches, voids and particles produced in a flattening process by a polishing or grinding technique used for semiconductor manufacturing. The present invention is an optical semiconductor wafer inspection system and a method thereof characterized by obliquely illuminating a scratch, void or particle produced on the surface of a polished or ground insulating film at substantially the same velocity of light, detecting scattered light at the time of oblique illumination from the surface of an inspection target at different angles and thereby classifying the scratch, void or particle.

Abstract: A device having a robotic arm within a robot chamber. The robotic arm includes an end effector adapted to handle a wafer. A linear array of charge-coupled devices are provided within the interior of the robot chamber, the linear array positioned to acquire image data from a measurement volume in one or more predetermined locations within the robot chamber.

Abstract: In a hydrogen gas detection device, light emitted from a light source is irradiated onto a hydrogen sensor whose reflectance (optical reflectance) varies upon contact with hydrogen gas, and the light transmitted through the hydrogen sensor or reflected by a reflective film of the hydrogen sensor is received by an optical sensor. On the basis of the signal output from the optical sensor and indicative of the amount of light received, the hydrogen gas detection device detects leakage of hydrogen gas.

Abstract: Of the “four C's,” cut has historically been the most complex to understand and assess. This application presents a three-dimensional mathematical model o study the interaction of light with a fully faceted, colorless, symmetrical round-brilliant-cut diamond. With this model, one can analyze how various appearance factors (brilliance, fire, and scintillation) depend on proportions. The model generates images and a numerical measurement of the optical efficiency of the round brilliant-called DCLR—which approximates overall fire. DCLR values change with variations in cut proportions, in particular crown angle, pavilion angle, table size, star facet length, culet size, and lower girdle facet length. The invention describes many combinations of proportions with equal or higher DCLR than “Ideal” cuts, and these DCLR ratings may be balanced with other factors such as brilliance and scintillation to provide a cut grade for an existing diamond or a cut analysis for prospective cut of diamond rough.

Abstract: An apparatus for determining surface properties, comprises at least a first radiation device which emits radiation onto a surface to be analyzed, at least a first radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by the surface and outputs at least a first measurement signal which is characteristic of the reflected or scattered radiation, and at least a further radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by a surface and outputs at least a second measurement signal which is characteristic of the reflected or scattered radiation.