Patents Examined by Hal D Wachsman
  • Patent number: 7917326
    Abstract: A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to measure the test coverage can range from a few instructions to all the instructions. The technique is easily integrated into existing test generation systems and is applicable to both uni- and multi-processing systems.
    Type: Grant
    Filed: January 30, 2008
    Date of Patent: March 29, 2011
    Assignee: International Business Machines Corporation
    Inventors: Theodore J. Bohizic, Ali Y. Duale, Dennis W. Wittig
  • Patent number: 7917319
    Abstract: Delay-fault testing and parametric analysis systems and methods utilizing one or more variable delay time-base generators. In embodiments of the delay-fault testing systems, short-delay logic paths are provided with additional scan-chain memory elements and logic that, in conjunction with the one or more variable-delay time-base generators, provides the effect of over-clocking without the need to over-clock. Related methods provide such effective over-clocking. In embodiments of parametric analysis systems, test point sampling elements and analysis circuitry are clocked as a function of the output of the one or more variable-delay time-base generators to provide various parametric analysis functionality. Related methods address this functionality.
    Type: Grant
    Filed: February 6, 2008
    Date of Patent: March 29, 2011
    Assignee: DFT Microsystems Inc.
    Inventor: Mohamed M. Hafed
  • Patent number: 7912666
    Abstract: Disclosed is a system and method for disk drive grouping in a multi-cell disk drive test system. A test platform includes a plurality of cells. Each cell is configured to receive and to provide communication with a disk drive. An automated loader/unloader is coupled to a test computer and is responsive to the test computer. The automated loader/unloader is configured to identify disk drives and to selectively load and unload disk drives into and out of the plurality of cells. Particularly, once the automated loader/unloader has identified a first disk drive, the test computer is configured to: determine a grouping criteria based upon the first disk drive; detect a subsequent disk drive having the same grouping criteria as the first disk drive; and cause the automated loader/unloader to load the subsequent disk drive into one of the plurality of cells.
    Type: Grant
    Filed: November 28, 2005
    Date of Patent: March 22, 2011
    Assignee: Western Digital Technologies, Inc.
    Inventors: Mostafa Pakzad, Peter Cheok Him Pang, Mohammad R. Bahadori, Joseph M. Viglione, Roma Leang
  • Patent number: 7912676
    Abstract: A system for detecting abnormal operation of at least a portion of a process plant includes a model to model at least the portion of the process plant. The model may be configurable to include multiple regression models corresponding to multiple different operating regions of the portion of the process plant. The system may also include a deviation detector configured to determine if the actual operation of the portion of the process plant deviates significantly from the operation predicted by the model. If there is a significant deviation, this may indicate an abnormal operation.
    Type: Grant
    Filed: July 25, 2006
    Date of Patent: March 22, 2011
    Assignee: Fisher-Rosemount Systems, Inc.
    Inventor: John P. Miller
  • Patent number: 7908109
    Abstract: A method includes receiving measured values for a plurality of electrical test parameters associated with integrated circuit devices on at least one wafer measured prior to completion of the wafer. Values of the electrical test parameters are predicted. The measured values are compared to the predicted values to generate residual values associated with the electrical test parameters. At least one performance metric associated with the devices is generated based on the residual values.
    Type: Grant
    Filed: July 8, 2008
    Date of Patent: March 15, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Richard P. Good, Lothar Waetzold, Thomas Depaly
  • Patent number: 7899644
    Abstract: A threat launch detection system includes at least one temporal threat detector, each temporal threat detector including a single sensing element operable to sense radiation from various types of short-burn threats that occur within a field of view of the detector. The single sensing element generates a detection signal in response to the sensed radiation. A processing circuit is coupled to each temporal threat detector and is operable to analyze the detection signal from each detector as a function of time to detect the occurrence of a short-burn threat within the field of view of any of the temporal threat detectors. Each temporal threat detector may be a prism-coupled compound parabolic concentrator (PCCP).
    Type: Grant
    Filed: February 7, 2005
    Date of Patent: March 1, 2011
    Assignee: BAE Systems Information and Electronic Systems Integration Inc.
    Inventors: Jonathan L. Weber, John Mandzy, Paul I. Egbert, Kirby A. Smith, Jill A. Shea, John L. Downing, III
  • Patent number: 7899640
    Abstract: There is presented a system and method for characterizing an integrated circuit (IC) for comparison with a pre-defined system-level characteristic related to an aspect of IC operation, wherein a test procedure on the IC that invokes this aspect is executed, while at least one operational bottleneck is invoked to constrain operation of the IC to exhibit a system-level operation thereof related to the aspect. Data generated via the test procedure in response to the bottleneck is collected and the system-level operation exhibited thereby is compared for consistency with the pre-defined system-level characteristic.
    Type: Grant
    Filed: July 31, 2008
    Date of Patent: March 1, 2011
    Assignee: Semiconductor Insights Inc.
    Inventors: Vyacheslav L. Zavadsky, Mykola Sherstyuk
  • Patent number: 7890300
    Abstract: A method for monitoring a field device connected via a data bus with a control unit. To prevent unauthorized tampering with the field device, the control unit requests, at intervals of time, an individual identifier of the field device. The requested individual identifier is compared with an identifier stored in the control unit. An alarm is produced or a warning, in the case of a change in the requested individual identifier.
    Type: Grant
    Filed: June 9, 2004
    Date of Patent: February 15, 2011
    Assignee: Endress + Hauser Process Solutions AG
    Inventors: Vincent De Groot, Philipp Zumoberhaus
  • Patent number: 7890296
    Abstract: A method of analysing measured data from a system having multiple associated system variables, the method including the steps of: a) optimizing an error function relating the measured data to a predetermined number of the system variables to adjust the system variables; b) selecting a subset of the adjusted variables; and c) re-optimizing the error function by adjusting only the variables in the subset. A method of identifying likely contributors to an error caused in measured data from a system which has multiple associated system variables. A method of analysing measured engine service or test data form an engine having a plurality of associated system variables, includes the step of optimizing an error function which relates the measured data to a predetermined number of the system variables, by least-absolutes optimization wherein the error function is a sum of absolute variations.
    Type: Grant
    Filed: April 13, 2006
    Date of Patent: February 15, 2011
    Assignee: Rolls-Royce PLC
    Inventor: Stephen G. Brown
  • Patent number: 7890271
    Abstract: The object of the invention is providing a revolution indicator and a program for the indicator, which can detect a varying number of revolutions precisely. The indicator includes: a detecting portion detecting a physical phenomenon resulting from the revolution movement of a measuring object; a FFT computation portion performing a fast Fourier transform of the data detected by the detecting portion under a specific data length, and computing and outputting the analytical data; and a revolution computing portion computing the number of revolutions of the measuring object based on the analytical data output from the FFT computation portion. A variation determination portion is equipped, which makes the FFT computation portion compute the first analytical data continuously, based on the data successively detected by the detecting portion under the first data length and determines whether there is any variation or not in the first analytical data computed continuously.
    Type: Grant
    Filed: November 2, 2007
    Date of Patent: February 15, 2011
    Assignee: Ono Sokki Co., Ltd.
    Inventors: Tomio Miyano, Hideaki Hori
  • Patent number: 7890299
    Abstract: Providing for event-controlled continuous logging for a mobile operating environment is described herein. For instance, collection of mobile device operating system (OS) log data can be initiated and terminated as a result of one or more predetermined events. The events can both trigger collection as well as terminate collection of the log data. Further, limiting collection/termination of log data to particular log index codes is also described herein, enabling logging of data pertinent to one or more determinable events. As described, the subject specification discloses mechanisms to initiate and to terminate continuous logging of mobile OS log codes as a result of occurrence of one or more determinable events.
    Type: Grant
    Filed: January 7, 2008
    Date of Patent: February 15, 2011
    Assignee: QUALCOMM, Incorporated
    Inventors: Kenny Fok, Eric Chi Chung Yip, Mikhail A. Lushin
  • Patent number: 7881906
    Abstract: A system, method and computer program product for event-based sampling to monitor computer system performance are provided. The system includes a sample buffer to store a sample of instrumentation data, where the instrumentation data enables measurement of computer system performance. The system also includes a sample segment selector to isolate a segment of the sample of instrumentation data as an event. The system further includes an instrumentation counter counting in response to a combination of the event and a sample pulse, and asserting a sample interrupt indicating that the sample of instrumentation data is ready to logout from the sample buffer.
    Type: Grant
    Filed: February 15, 2008
    Date of Patent: February 1, 2011
    Assignee: International Business Machines Corporation
    Inventors: Jane H. Bartik, Willm Hinrichs, Martin Recktenwald, Patrick M. West, Jr.
  • Patent number: 7877231
    Abstract: A system and method are provided for supplying electromechanical actuator (EMA) health status information to a control system. A determination is made as to whether the EMA has experienced a fault. If the EMA has experienced a fault, a fault-based position limit and a fault-based rate limit of the EMA are determined, based on the fault. A design position limit and a design rate limit of the EMA are supplied. An updated position limit of the EMA is determined based on at least the design position limit and the fault-based position limit, and an updated rate limit of the EMA is supplied based on at least the design rate limit and the fault-based rate limit.
    Type: Grant
    Filed: July 22, 2008
    Date of Patent: January 25, 2011
    Assignee: Honeywell International Inc.
    Inventors: Raj M. Bharadwaj, Dwayne M. Benson, George D. Hadden, Darryl G. Busch
  • Patent number: 7877229
    Abstract: A method and computer system for executing a program for calculating Load Enhancement Factor that includes the steps of obtaining coupon test data and storing the coupon test data on an information storage device. Analyzing the coupon test data for fit with a Weibull distribution and other analysis criteria and performing either a Modified Joint Weibull analysis or a Weibull Regression analysis or both a Modified Joint Weibull analysis and a Weibull Regression analysis with an accommodation in the analysis for scatter within the coupon testing data.
    Type: Grant
    Filed: December 22, 2006
    Date of Patent: January 25, 2011
    Assignee: The Boeing Company
    Inventors: James W. Giancaspro, Winson Taam
  • Patent number: 7877226
    Abstract: An apparatus and method for counting exercise repetitions are provided for counting exercise repetition even when an exerciser attaches the apparatus in different places and along different orientations of his or her body. The apparatus and method utilizes acceleration data along at least three axes and determines that a valid step is taken by the exerciser if at least one of acceleration profiles falls within at least one of pre-defined thresholds. Moreover, a method of identifying an optimal axis for exercise repetition measurement is disclosed by comparing the acceleration profiles of previous steps with amplitude, cycle and rhythm thresholds.
    Type: Grant
    Filed: March 3, 2008
    Date of Patent: January 25, 2011
    Assignee: IDT Technology Limited
    Inventors: Raymond Chan, Mun Hoong Leong, Li Li
  • Patent number: 7877236
    Abstract: An integrated circuit includes a first storage location, a first generator, a converter, and a second generator. The first storage location is operable to store a first adjustment value. The first generator is coupled to the first storage location, is operable to generate a first signal having a first characteristic, and includes a first adjuster operable to change the first characteristic in response to the first adjustment value. The converter is coupled to the first storage location and is operable to generate from the first adjustment value a modified adjustment value. The second generator is coupled to the converter, is operable to generate a second signal having a second characteristic, and includes a second adjuster operable to change the second characteristic in response to the modified adjustment value.
    Type: Grant
    Filed: July 27, 2007
    Date of Patent: January 25, 2011
    Assignees: STMicroelectronics Asia Pacific Pte Ltd, Hynix Semiconductor Inc.
    Inventors: Donghyun Seo, Kijun Nam, Seokseong Yoon
  • Patent number: 7865319
    Abstract: A method and system for measuring the input (loading) impedance of measurement systems using a test fixture. This is done by first measuring the characteristics of an unloaded test fixture to obtain scattering parameters of the test fixture and using a splitting algorithm to calculate the scattering parameters of each transmission line leg of the test fixture. The test fixture is then measured with a measurement system attached. The test fixture effects defined by the scattering parameters are then removed from the measurement to yield the scattering parameters of the measurement system alone (measurement system effects).
    Type: Grant
    Filed: November 30, 2007
    Date of Patent: January 4, 2011
    Assignee: LeCroy Corporation
    Inventors: Lawrence W. Jacobs, Peter J. Pupalaikis
  • Patent number: 7865335
    Abstract: Techniques are disclosed for integrating complexity analysis with procedure authoring (design and/or documentation). By way of example, a technique for authoring a procedure associated with a computing system operation based on a complexity analysis associated with the operation and the computing system implementing the operation comprises the following steps/operations. A procedure associated with a computing system operation is generated, wherein the generated procedure represents a new procedure or an edited existing procedure. A structured representation of the generated procedure is extracted from the generated procedure. The structured representation of the generated procedure is analyzed to produce complexity analysis results, wherein at least a portion of the complexity analysis results are fed back to a procedure author for use in selectively altering the generated procedure.
    Type: Grant
    Filed: December 28, 2007
    Date of Patent: January 4, 2011
    Assignee: International Business Machines Corporation
    Inventors: Aaron B. Brown, Joseph Y. Kim
  • Patent number: 7860674
    Abstract: An approach is provided for digital triggering a recording of one or more digitized signals on a digital oscilloscope by means of carrying out a level comparison for determining a triggering instant in each case between two successive sample values of a reference signal and a threshold values. According to the approach, at least one additional sample value of the reference signal is determined between two sequential samples of the reference signals by means of interpolation.
    Type: Grant
    Filed: April 24, 2006
    Date of Patent: December 28, 2010
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Markus Freidhof, Johann Huber
  • Patent number: 7853432
    Abstract: A computer implemented method is provided for clustering and visualization of an n-dimensional space in a Euclidean space. The method includes: collecting a plurality of multi-dimensional data sets; estimating a probability density function from each data set; approximating a dissimilarity between every pair of said probability density functions and recording every dissimilarity in a dissimilarity matrix; embedding the dissimilarity matrix into a Euclidean space having a dimensionality of three or less using a multi-dimensional scaling method; and graphically displaying relationships between data sets using data in the Euclidean space on a display of a computing device.
    Type: Grant
    Filed: October 1, 2008
    Date of Patent: December 14, 2010
    Assignee: The Regents of The University of Michigan
    Inventors: Alfred Hero, III, Kevin Carter, Raviv Raich, William Finn