Patents Examined by Hal Wachoman
  • Patent number: 7286957
    Abstract: Systems and methods configured to guide and manage laboratory analytical process control operations. A Biometric quality control (QC) process application is configured to monitor bias and imprecision for each test, characterize patient population data distributions and compare, contrast, and correlate changes in patient data distributions to any change in QC data populations. The Biometric QC process monitors the analytical process using data collected from repetitive testing of quality control materials and patient data (test results). The QC process identifies the optimal combination of, for example, frequency of QC testing, number of QCs tested, and QC rules applied in order to minimize the expected number of unacceptable patient results produced due to any out-of-control error condition that might occur.
    Type: Grant
    Filed: May 2, 2005
    Date of Patent: October 23, 2007
    Assignee: Bio-Rad Laboratories, Inc.
    Inventors: Curtis Parvin, George Cembrowski, William G. Cooper
  • Patent number: 7031881
    Abstract: Provided are a method, system, and article of manufacture, wherein in certain embodiments, an indicator is searched for in a computational platform, and wherein the indicator indicates an operational state of a device coupled to the computational platform. A determination is made that the indicator has been modified to disable the device. The indicator is modified to allow enablement of the disabled device. The device is tested to determine whether the device is capable of operating correctly.
    Type: Grant
    Filed: December 19, 2003
    Date of Patent: April 18, 2006
    Assignee: Intel Corporation
    Inventors: Scott P. Dubal, Patrick L. Connor, Mark V. Montecalvo