Patents Examined by Hoai-An D. Nugyen
  • Patent number: 10725080
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: July 28, 2020
    Assignee: National Instruments Corporation
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz