Patents Examined by Hsien C Tsai
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Patent number: 12385878Abstract: A mass spectrometry method comprises generating ions and separating the ions in an ion mobility cell. Some of the generated ions can be contacted with a mobility modifier. The ions can be analyzed with a mass analyzer.Type: GrantFiled: May 27, 2021Date of Patent: August 12, 2025Assignee: THE TRUSTEES OF INDIANA UNIVERSITYInventor: Ian K. Webb
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Patent number: 12381072Abstract: Curved ion manipulation devices can provide relatively greater ion pathway lengths over conventional devices. Ions can be directed through one or more pairs of opposing curved surfaces of a curved ion manipulation structure. Each pair of opposing curved surfaces can be spaced apart radially relative to a common longitudinal axis of the ion manipulation structure to define a radial gap. Each pair of opposing curved surfaces can include a first electrode arrangement and a second electrode arrangement opposed to the first electrode arrangement. The first and second electrode arrangements can define an ion pathway and are configured to direct ions along the ion pathway and circumferentially through the radial gaps of the ion manipulation structure.Type: GrantFiled: July 8, 2022Date of Patent: August 5, 2025Assignee: Battelle Memorial InstituteInventor: Yehia M. Ibrahim
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Patent number: 12367414Abstract: A method and system is provided for operating a quantum information processing (QIP) system, including a dual-space, single-species architecture for trapped-ion quantum information processing. An exemplary method of preparing the ions include i) applying a first optical beam to the plurality of ions to shelve at least a portion of the plurality of ions from a first state to a second state, ii) applying a second optical beam to the plurality of ions to deshelve the at least a portion of the plurality of ions from the second state to a third state, iii) applying a third optical beam to optically pump the at least a portion of the plurality of ions from the third state and to a fourth state, and iv) iteratively repeat i) to iii) to transition a remaining portion of the plurality of ions to the fourth state.Type: GrantFiled: July 15, 2022Date of Patent: July 22, 2025Assignee: IonQ, Inc.Inventors: Michael Lurie Goldman, Adam Daniel West, Hermann Uys, Peter Lukas Wilhelm Maunz
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Patent number: 12361310Abstract: Aspects of the present disclosure may include a method and/or a system for identifying an ion chain having a plurality of trapped ions, selecting at least two non-consecutive trapped ions in the ion chain for implementing a qubit, applying at least a first Raman beam to shuttle at least one neighbor ion of the at least two non-consecutive trapped ions from a ground state to a metastable state, and applying at least a second Raman beam to one or more of the at least two non-consecutive trapped ions, after shuttling the at least one neighbor ion to the metastable state, to transition from a first manifold to a second manifold.Type: GrantFiled: October 11, 2022Date of Patent: July 15, 2025Assignee: IonQ, IncInventor: Michael Lurie Goldman
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Patent number: 12362162Abstract: An ion guide assembly (2) is disclosed comprising: two planar mounting components (4); and first and second ion guides (6,8) mounted on the two planar mounting components such that the ion guides are spaced apart from each other, wherein at least one of the planar mounting components has an aperture (14) therethrough that is located between the positions on said at least one mounting component at which the first and second ion guides are mounted; and an ion optical device sized and configured to be inserted through the aperture in the planar mounting component and into the space between the first and second ion guides.Type: GrantFiled: March 19, 2021Date of Patent: July 15, 2025Assignee: Micromass UK LimitedInventors: Jason Wildgoose, Darren Hewitt, Matthew Collier, Oliver Malpas
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Patent number: 12354828Abstract: A focused ion beam system has a differentially-pumped vacuum unit and a focused ion beam column, comprising: a vacuum pad, of a porous material, with a suction surface exposed in a way that surrounds the outer edge of a substrate to be processed; a substrate support on which the substrate and vacuum pad are placed, and a vacuum pump for vacuum evacuation using the vacuum pad. The system provides an arrangement in which, while a head of the differentially-pumped vacuum unit partially falls out of the outer edge of the substrate, the suction surface allows an input of air evacuated from a region between the suction surface and the head, and the processing area on a substrate is expanded by allowing the processing with an ion beam to be performed even in the vicinity of the peripheral substrate surface without requiring a large vacuum chamber.Type: GrantFiled: June 29, 2021Date of Patent: July 8, 2025Assignee: V TECHNOLOGY CO., LTD.Inventor: Michinobu Mizumura
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Patent number: 12347639Abstract: Described are ion implantation devices, systems, and methods, and in particular to an ion source that is useful for generating an aluminum ion beam.Type: GrantFiled: December 11, 2023Date of Patent: July 1, 2025Assignee: ENTEGRIS, INC.Inventors: Ying Tang, Joseph R. Despres, Joseph D. Sweeney, Oleg Byl, Barry Lewis Chambers
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Patent number: 12340996Abstract: The present invention discloses a method for rapid on-site detection of fentanyl analogs using a miniature mass spectrometer, comprising the following steps: (1) selecting a spotting plate; (2) loading a sample: depositing the sample and 3-nitrobenzonitrile solution in acetonitrile on the spotting plate to form a crystalline mixture; (3) carrying out analysis and detection: setting the parameters of the miniature mass spectrometer, placing the crystalline mixture on the spotting plate in close proximity to the inlet of the miniature mass spectrometer, and facilitating the ionization of the crystalline mixture for the analysis and detection of fentanyl analogs. The method for rapid on-site detection of fentanyl analogs using a miniature mass spectrometer provided by the present invention requires no extraction solvent, no voltage, no laser, no gas, and the method is simple, rapid, and suitable for rapid on-site detection of fentanyl analogs.Type: GrantFiled: September 9, 2022Date of Patent: June 24, 2025Assignee: Chinese Academy of Inspection and QuarantineInventors: Qiang Ma, Xiangyu Guo, Hua Bai, Wentao Li
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Patent number: 12339329Abstract: A device for controlling trapped ions includes a substrate. An electrode structure is disposed on the substrate, the electrode structure including DC electrodes and RF electrodes of an ion trap configured to trap ions in a space above the substrate. A first device terminal is disposed on the substrate, the first device terminal being connected via a first electrode connection line to a specific DC electrode. Further, a second device terminal is disposed on the substrate, the second device terminal being connected via a second electrode connection line to the specific DC electrode.Type: GrantFiled: July 15, 2022Date of Patent: June 24, 2025Assignee: Infineon Technologies Austria AGInventors: Clemens Roessler, Thomas Ostermann, Norbert Rieser, Johanna Elisabeth Roessler, Siegfried Schmid, Walter Slamnig
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Patent number: 12327342Abstract: Various approaches are provided for automatically focusing particle beams for SPA. In one example, a method includes determining a focus adjustment for a region of a sample to achieve a targeted defocus based on at least one defocus measurement from at least one neighboring region of the sample, and causing an acquisition of an image of the sample at the region with the focus adjustment. In this way, a targeted defocus may be achieved across regions of a sample with reduced auxiliary imaging, thereby providing increased and uniform image quality while reducing the time and thus increasing the throughput of processing.Type: GrantFiled: January 28, 2022Date of Patent: June 10, 2025Assignee: FEI CompanyInventors: Yuchen Deng, Erik Franken, Bart van Knippenberg, Holger Kohr
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Patent number: 12327718Abstract: A lens assembly for an outer source of a mass spectrometer, the assembly comprising: a housing; a plurality of lens elements, each lens element comprising a radially extending electrically conductive protrusion, the lens elements being linearly arranged in the housing such that the protrusions are aligned with one another, and an interface connector having a plurality of sockets to receive the protrusions therein and create an electrical connection between the protrusions and sockets. A housing for a resistance temperature detector is also disclosed.Type: GrantFiled: August 27, 2024Date of Patent: June 10, 2025Assignee: Micromass UK Ltd.Inventors: Alastair Booth, Alvin Chua, Carl Chen, Marcus Dawber, Pham Hoang Vu Ngo, William Ngo, Dennis Ong, Richard Tyldesley-Worster, Arvind Rangan, Steven Rocha
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Patent number: 12315713Abstract: Pole electrodes (150) are disclosed for use in an ion reaction apparatus, e.g., an electron induced dissociation cell, to reduce fouling due to polymer build-up and increase the useful lifetime of such electrodes. To reduce fouling, the novel pole electrode designs include a X-shaped aperture (160) in lieu of the conventional central circular aperture. The pole electrodes are particularly useful in systems having a plurality of branched electrodes (152) defining a first axis for controlled passage of charged ions and a transverse axis for passage of an electron beam. The pole electrodes are adapted for disposition between an electron source and the branched electrodes to provide an aperture for passage of an electron beam while also impeding escape of ions and reaction products from the apparatus. The X-shaped aperture eliminates or reduces the portion of the pole electrode surface that is most prone to fouling by polymeric build-up.Type: GrantFiled: September 29, 2020Date of Patent: May 27, 2025Assignee: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.Inventor: Takashi Baba
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Patent number: 12311071Abstract: A cash sterilization device, includes a sterilization device case, the sterilization device case having an opening on one side and a cap assembly; an internal sterilization assembly, the internal sterilization device including an opening, wherein the internal sterilization is inserted into the opening of the sterilization device case, the cap assembly is attached to cover the internal sterilization within the sterilization device case, and wherein the opening of the sterilization device case is aligned with the opening of the internal sterilization assembly.Type: GrantFiled: February 4, 2022Date of Patent: May 27, 2025Assignee: Bgkin Global LLCInventors: Ian Pawlowski, Tristen Rivera
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Patent number: 12299536Abstract: Aspects of the present disclosure may include a method and/or a system for identifying an ion chain having a plurality of trapped ions, selecting at least two non-consecutive trapped ions in the ion chain for implementing a qubit, applying at least a first Raman beam to shuttle at least one neighbor ion of the at least two non-consecutive trapped ions from a ground state to a metastable state, and applying at least a second Raman beam to one or more of the at least two non-consecutive trapped ions, after shuttling the at least one neighbor ion to the metastable state, to transition from a first manifold to a second manifold.Type: GrantFiled: October 10, 2022Date of Patent: May 13, 2025Assignee: IonQ, Inc.Inventors: Michael Lurie Goldman, Adam Daniel West, Jeremy Mathew Sage, Laird Nicholas Egan
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Patent number: 12288667Abstract: A method of imaging a sample includes acquiring one or more first images of a region of the sample at a first imaging condition with a charged particle microscope system. The one or more first images are applied to an input of a trained machine learning model to obtain a predicted image indicating atom structure probability in the region of the sample. An enhanced image indicating atom locations in the region of the sample based on the atom structure probability in the predicted image is caused to be displayed in response to obtaining the predicted image.Type: GrantFiled: June 2, 2022Date of Patent: April 29, 2025Assignee: FEI CompanyInventors: Pavel Potocek, Bert Henning Freitag, Maurice Peemen
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Patent number: 12288133Abstract: Aspects of the present disclosure may include a method and/or a system for identifying an ion chain having a plurality of trapped ions, selecting at least two non-consecutive trapped ions in the ion chain for implementing a qubit, applying at least a first Raman beam to shuttle at least one neighbor ion of the at least two non-consecutive trapped ions from a ground state to a metastable state, and applying at least a second Raman beam to one or more of the at least two non-consecutive trapped ions, after shuttling the at least one neighbor ion to the metastable state, to transition from a first manifold to a second manifold.Type: GrantFiled: September 22, 2022Date of Patent: April 29, 2025Assignee: IonQ, Inc.Inventor: Michael Lurie Goldman
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Patent number: 12281944Abstract: A structure (10) for simulating a thermal image generated by a real world object, the structure (10) comprising a body (22), (24), (26) and (28) having at least one cavity (106), and at least one inlet opening into the cavity (106) for receiving a flow of fluid medium into the cavity (106). The fluid medium having a temperature that differs from ambient. The cavity (106) having internal configurations defining flow paths for the fluid medium to cause temperature variations on an external surface (26) of the body to simulate the thermal image of the real world object.Type: GrantFiled: July 18, 2019Date of Patent: April 22, 2025Assignee: Raider Targetry Pty LtdInventors: Michael Fielding, Cody Webster
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Patent number: 12278020Abstract: The present disclosure discloses a supporting insulation base of a negative high-voltage potential neutron target of a compact neutron source, including a cylindrical coolant liquid channel, a cylindrical high-voltage channel, an upper cover plate and a lower cover plate, which are integrally formed by 3D printing using a PEEK material.Type: GrantFiled: October 25, 2024Date of Patent: April 15, 2025Assignee: Institute of Energy, Hefei Comprehensive National Science Center (Anhui Energy Laboratory)Inventors: Xiancai Meng, Xu Li, Lizhen Liang, Yuzhong Qian, Bing Hong
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Patent number: 12278086Abstract: The present disclosure relates to the determination of a pattern height of a pattern, which has been produced with extreme ultraviolet (EUV) lithography in a resist film. The determination is performed by using an electron beam (e-beam) system, in particular, by using a scanning electron microscope (SEM). In this respect, the disclosure provides a device for determining the pattern height, wherein the device comprising a processor. The processor is configured to obtain a SEM image of the pattern from an SEM. Further, the processor is configured to determine a contrast value related to the pattern based on the obtained SEM image. Subsequently, the processor is configured to determine the pattern height based on calibration data and the determined contrast value.Type: GrantFiled: June 2, 2022Date of Patent: April 15, 2025Assignees: IMEC VZW, Katholieke Universiteit LeuvenInventors: Gian Francesco Lorusso, Mohamed Saib, Alain Moussa, Anne-Laure Charley, Danilo De Simone, Joren Severi
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Patent number: 12270774Abstract: A system inspects, modifies or analyzes a region of interest of a sample via charged particles. A detector device of the system produces a pixel image having horizontal and vertical pixel resolutions. A charged particle deflection device produces a scanning charged particle beam in a scanning region. The deflection device has horizontal and vertical deflection units controlled by a digital to analog converter having a digital resolution larger than the horizontal pixel resolution and/or the vertical pixel resolution. An operator control interface of the system selects an assignment between respective image pixels of a desired pixel image and digital inputs of the DAC to produce horizontal and/or vertical deflection signals to guide the charged particle beam to the location of the respective image pixel. A reliable image of a sample can be obtained even when there is zooming or panning within an accessible region of the sample.Type: GrantFiled: May 2, 2024Date of Patent: April 8, 2025Assignee: Carl Zeiss SMT GmbHInventors: John A. Notte, Mark D. DiManna, Jeffrey Sauer, Terry Griffin