Patents Examined by Hsien C Tsai
  • Patent number: 12385878
    Abstract: A mass spectrometry method comprises generating ions and separating the ions in an ion mobility cell. Some of the generated ions can be contacted with a mobility modifier. The ions can be analyzed with a mass analyzer.
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: August 12, 2025
    Assignee: THE TRUSTEES OF INDIANA UNIVERSITY
    Inventor: Ian K. Webb
  • Patent number: 12381072
    Abstract: Curved ion manipulation devices can provide relatively greater ion pathway lengths over conventional devices. Ions can be directed through one or more pairs of opposing curved surfaces of a curved ion manipulation structure. Each pair of opposing curved surfaces can be spaced apart radially relative to a common longitudinal axis of the ion manipulation structure to define a radial gap. Each pair of opposing curved surfaces can include a first electrode arrangement and a second electrode arrangement opposed to the first electrode arrangement. The first and second electrode arrangements can define an ion pathway and are configured to direct ions along the ion pathway and circumferentially through the radial gaps of the ion manipulation structure.
    Type: Grant
    Filed: July 8, 2022
    Date of Patent: August 5, 2025
    Assignee: Battelle Memorial Institute
    Inventor: Yehia M. Ibrahim
  • Patent number: 12367414
    Abstract: A method and system is provided for operating a quantum information processing (QIP) system, including a dual-space, single-species architecture for trapped-ion quantum information processing. An exemplary method of preparing the ions include i) applying a first optical beam to the plurality of ions to shelve at least a portion of the plurality of ions from a first state to a second state, ii) applying a second optical beam to the plurality of ions to deshelve the at least a portion of the plurality of ions from the second state to a third state, iii) applying a third optical beam to optically pump the at least a portion of the plurality of ions from the third state and to a fourth state, and iv) iteratively repeat i) to iii) to transition a remaining portion of the plurality of ions to the fourth state.
    Type: Grant
    Filed: July 15, 2022
    Date of Patent: July 22, 2025
    Assignee: IonQ, Inc.
    Inventors: Michael Lurie Goldman, Adam Daniel West, Hermann Uys, Peter Lukas Wilhelm Maunz
  • Patent number: 12361310
    Abstract: Aspects of the present disclosure may include a method and/or a system for identifying an ion chain having a plurality of trapped ions, selecting at least two non-consecutive trapped ions in the ion chain for implementing a qubit, applying at least a first Raman beam to shuttle at least one neighbor ion of the at least two non-consecutive trapped ions from a ground state to a metastable state, and applying at least a second Raman beam to one or more of the at least two non-consecutive trapped ions, after shuttling the at least one neighbor ion to the metastable state, to transition from a first manifold to a second manifold.
    Type: Grant
    Filed: October 11, 2022
    Date of Patent: July 15, 2025
    Assignee: IonQ, Inc
    Inventor: Michael Lurie Goldman
  • Patent number: 12362162
    Abstract: An ion guide assembly (2) is disclosed comprising: two planar mounting components (4); and first and second ion guides (6,8) mounted on the two planar mounting components such that the ion guides are spaced apart from each other, wherein at least one of the planar mounting components has an aperture (14) therethrough that is located between the positions on said at least one mounting component at which the first and second ion guides are mounted; and an ion optical device sized and configured to be inserted through the aperture in the planar mounting component and into the space between the first and second ion guides.
    Type: Grant
    Filed: March 19, 2021
    Date of Patent: July 15, 2025
    Assignee: Micromass UK Limited
    Inventors: Jason Wildgoose, Darren Hewitt, Matthew Collier, Oliver Malpas
  • Patent number: 12354828
    Abstract: A focused ion beam system has a differentially-pumped vacuum unit and a focused ion beam column, comprising: a vacuum pad, of a porous material, with a suction surface exposed in a way that surrounds the outer edge of a substrate to be processed; a substrate support on which the substrate and vacuum pad are placed, and a vacuum pump for vacuum evacuation using the vacuum pad. The system provides an arrangement in which, while a head of the differentially-pumped vacuum unit partially falls out of the outer edge of the substrate, the suction surface allows an input of air evacuated from a region between the suction surface and the head, and the processing area on a substrate is expanded by allowing the processing with an ion beam to be performed even in the vicinity of the peripheral substrate surface without requiring a large vacuum chamber.
    Type: Grant
    Filed: June 29, 2021
    Date of Patent: July 8, 2025
    Assignee: V TECHNOLOGY CO., LTD.
    Inventor: Michinobu Mizumura
  • Patent number: 12347639
    Abstract: Described are ion implantation devices, systems, and methods, and in particular to an ion source that is useful for generating an aluminum ion beam.
    Type: Grant
    Filed: December 11, 2023
    Date of Patent: July 1, 2025
    Assignee: ENTEGRIS, INC.
    Inventors: Ying Tang, Joseph R. Despres, Joseph D. Sweeney, Oleg Byl, Barry Lewis Chambers
  • Patent number: 12340996
    Abstract: The present invention discloses a method for rapid on-site detection of fentanyl analogs using a miniature mass spectrometer, comprising the following steps: (1) selecting a spotting plate; (2) loading a sample: depositing the sample and 3-nitrobenzonitrile solution in acetonitrile on the spotting plate to form a crystalline mixture; (3) carrying out analysis and detection: setting the parameters of the miniature mass spectrometer, placing the crystalline mixture on the spotting plate in close proximity to the inlet of the miniature mass spectrometer, and facilitating the ionization of the crystalline mixture for the analysis and detection of fentanyl analogs. The method for rapid on-site detection of fentanyl analogs using a miniature mass spectrometer provided by the present invention requires no extraction solvent, no voltage, no laser, no gas, and the method is simple, rapid, and suitable for rapid on-site detection of fentanyl analogs.
    Type: Grant
    Filed: September 9, 2022
    Date of Patent: June 24, 2025
    Assignee: Chinese Academy of Inspection and Quarantine
    Inventors: Qiang Ma, Xiangyu Guo, Hua Bai, Wentao Li
  • Patent number: 12339329
    Abstract: A device for controlling trapped ions includes a substrate. An electrode structure is disposed on the substrate, the electrode structure including DC electrodes and RF electrodes of an ion trap configured to trap ions in a space above the substrate. A first device terminal is disposed on the substrate, the first device terminal being connected via a first electrode connection line to a specific DC electrode. Further, a second device terminal is disposed on the substrate, the second device terminal being connected via a second electrode connection line to the specific DC electrode.
    Type: Grant
    Filed: July 15, 2022
    Date of Patent: June 24, 2025
    Assignee: Infineon Technologies Austria AG
    Inventors: Clemens Roessler, Thomas Ostermann, Norbert Rieser, Johanna Elisabeth Roessler, Siegfried Schmid, Walter Slamnig
  • Patent number: 12327342
    Abstract: Various approaches are provided for automatically focusing particle beams for SPA. In one example, a method includes determining a focus adjustment for a region of a sample to achieve a targeted defocus based on at least one defocus measurement from at least one neighboring region of the sample, and causing an acquisition of an image of the sample at the region with the focus adjustment. In this way, a targeted defocus may be achieved across regions of a sample with reduced auxiliary imaging, thereby providing increased and uniform image quality while reducing the time and thus increasing the throughput of processing.
    Type: Grant
    Filed: January 28, 2022
    Date of Patent: June 10, 2025
    Assignee: FEI Company
    Inventors: Yuchen Deng, Erik Franken, Bart van Knippenberg, Holger Kohr
  • Patent number: 12327718
    Abstract: A lens assembly for an outer source of a mass spectrometer, the assembly comprising: a housing; a plurality of lens elements, each lens element comprising a radially extending electrically conductive protrusion, the lens elements being linearly arranged in the housing such that the protrusions are aligned with one another, and an interface connector having a plurality of sockets to receive the protrusions therein and create an electrical connection between the protrusions and sockets. A housing for a resistance temperature detector is also disclosed.
    Type: Grant
    Filed: August 27, 2024
    Date of Patent: June 10, 2025
    Assignee: Micromass UK Ltd.
    Inventors: Alastair Booth, Alvin Chua, Carl Chen, Marcus Dawber, Pham Hoang Vu Ngo, William Ngo, Dennis Ong, Richard Tyldesley-Worster, Arvind Rangan, Steven Rocha
  • Patent number: 12315713
    Abstract: Pole electrodes (150) are disclosed for use in an ion reaction apparatus, e.g., an electron induced dissociation cell, to reduce fouling due to polymer build-up and increase the useful lifetime of such electrodes. To reduce fouling, the novel pole electrode designs include a X-shaped aperture (160) in lieu of the conventional central circular aperture. The pole electrodes are particularly useful in systems having a plurality of branched electrodes (152) defining a first axis for controlled passage of charged ions and a transverse axis for passage of an electron beam. The pole electrodes are adapted for disposition between an electron source and the branched electrodes to provide an aperture for passage of an electron beam while also impeding escape of ions and reaction products from the apparatus. The X-shaped aperture eliminates or reduces the portion of the pole electrode surface that is most prone to fouling by polymeric build-up.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: May 27, 2025
    Assignee: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
    Inventor: Takashi Baba
  • Patent number: 12311071
    Abstract: A cash sterilization device, includes a sterilization device case, the sterilization device case having an opening on one side and a cap assembly; an internal sterilization assembly, the internal sterilization device including an opening, wherein the internal sterilization is inserted into the opening of the sterilization device case, the cap assembly is attached to cover the internal sterilization within the sterilization device case, and wherein the opening of the sterilization device case is aligned with the opening of the internal sterilization assembly.
    Type: Grant
    Filed: February 4, 2022
    Date of Patent: May 27, 2025
    Assignee: Bgkin Global LLC
    Inventors: Ian Pawlowski, Tristen Rivera
  • Patent number: 12299536
    Abstract: Aspects of the present disclosure may include a method and/or a system for identifying an ion chain having a plurality of trapped ions, selecting at least two non-consecutive trapped ions in the ion chain for implementing a qubit, applying at least a first Raman beam to shuttle at least one neighbor ion of the at least two non-consecutive trapped ions from a ground state to a metastable state, and applying at least a second Raman beam to one or more of the at least two non-consecutive trapped ions, after shuttling the at least one neighbor ion to the metastable state, to transition from a first manifold to a second manifold.
    Type: Grant
    Filed: October 10, 2022
    Date of Patent: May 13, 2025
    Assignee: IonQ, Inc.
    Inventors: Michael Lurie Goldman, Adam Daniel West, Jeremy Mathew Sage, Laird Nicholas Egan
  • Patent number: 12288667
    Abstract: A method of imaging a sample includes acquiring one or more first images of a region of the sample at a first imaging condition with a charged particle microscope system. The one or more first images are applied to an input of a trained machine learning model to obtain a predicted image indicating atom structure probability in the region of the sample. An enhanced image indicating atom locations in the region of the sample based on the atom structure probability in the predicted image is caused to be displayed in response to obtaining the predicted image.
    Type: Grant
    Filed: June 2, 2022
    Date of Patent: April 29, 2025
    Assignee: FEI Company
    Inventors: Pavel Potocek, Bert Henning Freitag, Maurice Peemen
  • Patent number: 12288133
    Abstract: Aspects of the present disclosure may include a method and/or a system for identifying an ion chain having a plurality of trapped ions, selecting at least two non-consecutive trapped ions in the ion chain for implementing a qubit, applying at least a first Raman beam to shuttle at least one neighbor ion of the at least two non-consecutive trapped ions from a ground state to a metastable state, and applying at least a second Raman beam to one or more of the at least two non-consecutive trapped ions, after shuttling the at least one neighbor ion to the metastable state, to transition from a first manifold to a second manifold.
    Type: Grant
    Filed: September 22, 2022
    Date of Patent: April 29, 2025
    Assignee: IonQ, Inc.
    Inventor: Michael Lurie Goldman
  • Patent number: 12281944
    Abstract: A structure (10) for simulating a thermal image generated by a real world object, the structure (10) comprising a body (22), (24), (26) and (28) having at least one cavity (106), and at least one inlet opening into the cavity (106) for receiving a flow of fluid medium into the cavity (106). The fluid medium having a temperature that differs from ambient. The cavity (106) having internal configurations defining flow paths for the fluid medium to cause temperature variations on an external surface (26) of the body to simulate the thermal image of the real world object.
    Type: Grant
    Filed: July 18, 2019
    Date of Patent: April 22, 2025
    Assignee: Raider Targetry Pty Ltd
    Inventors: Michael Fielding, Cody Webster
  • Patent number: 12278020
    Abstract: The present disclosure discloses a supporting insulation base of a negative high-voltage potential neutron target of a compact neutron source, including a cylindrical coolant liquid channel, a cylindrical high-voltage channel, an upper cover plate and a lower cover plate, which are integrally formed by 3D printing using a PEEK material.
    Type: Grant
    Filed: October 25, 2024
    Date of Patent: April 15, 2025
    Assignee: Institute of Energy, Hefei Comprehensive National Science Center (Anhui Energy Laboratory)
    Inventors: Xiancai Meng, Xu Li, Lizhen Liang, Yuzhong Qian, Bing Hong
  • Patent number: 12278086
    Abstract: The present disclosure relates to the determination of a pattern height of a pattern, which has been produced with extreme ultraviolet (EUV) lithography in a resist film. The determination is performed by using an electron beam (e-beam) system, in particular, by using a scanning electron microscope (SEM). In this respect, the disclosure provides a device for determining the pattern height, wherein the device comprising a processor. The processor is configured to obtain a SEM image of the pattern from an SEM. Further, the processor is configured to determine a contrast value related to the pattern based on the obtained SEM image. Subsequently, the processor is configured to determine the pattern height based on calibration data and the determined contrast value.
    Type: Grant
    Filed: June 2, 2022
    Date of Patent: April 15, 2025
    Assignees: IMEC VZW, Katholieke Universiteit Leuven
    Inventors: Gian Francesco Lorusso, Mohamed Saib, Alain Moussa, Anne-Laure Charley, Danilo De Simone, Joren Severi
  • Patent number: 12270774
    Abstract: A system inspects, modifies or analyzes a region of interest of a sample via charged particles. A detector device of the system produces a pixel image having horizontal and vertical pixel resolutions. A charged particle deflection device produces a scanning charged particle beam in a scanning region. The deflection device has horizontal and vertical deflection units controlled by a digital to analog converter having a digital resolution larger than the horizontal pixel resolution and/or the vertical pixel resolution. An operator control interface of the system selects an assignment between respective image pixels of a desired pixel image and digital inputs of the DAC to produce horizontal and/or vertical deflection signals to guide the charged particle beam to the location of the respective image pixel. A reliable image of a sample can be obtained even when there is zooming or panning within an accessible region of the sample.
    Type: Grant
    Filed: May 2, 2024
    Date of Patent: April 8, 2025
    Assignee: Carl Zeiss SMT GmbH
    Inventors: John A. Notte, Mark D. DiManna, Jeffrey Sauer, Terry Griffin