Patents Examined by Hsien Tsai
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Patent number: 10258299Abstract: Among other things, one or more systems and/or techniques are described for shaping a profile of radiation attenuation in a fan-angle direction via a pre-object filter (e.g., a bowtie filter) based upon a profile of an object. For example, a pre-object filter may be at least partially rotated about a filter axis and/or may be translated in a direction parallel to a direction of conveyance of the object under examination to adjust a profile of radiation attenuation in the fan-angle direction. Further, in one embodiment, the profile of radiation attenuation may be reshaped during rotation of the radiation source about the object to adjust an amount of radiation attenuation in the fan-angle direction (e.g., to adjust a profile of radiation attenuation as a shape of the object changes from a perspective of a radiation source as the radiation source is rotated about the object).Type: GrantFiled: October 31, 2012Date of Patent: April 16, 2019Assignee: Analogic CorporationInventors: Matthew B. Christensen, Aleksander Roshi, Anton M. Deykoon
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Patent number: 10251613Abstract: A method is disclosed for x-ray CT scanning with a dual-source system, in which two radiation bundles are each delimited by diaphragms such that these radiation bundles are free of mutual points of intersection at least in the examination object. An embodiment of the invention also relates to a dual source CT system, including a controller configured to control radiation-delimiting diaphragms, which delimit and align the radiation bundles such that these run free of mutual points of intersection at least in the examination object.Type: GrantFiled: October 19, 2016Date of Patent: April 9, 2019Assignee: SIEMENS HEALTHCARE GMBHInventors: Thomas Allmendinger, Johan Sunnegardh
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Patent number: 10242850Abstract: A method includes producing ions from one or more calibrant species and delivering the ions to a mass analyzer, and measuring a first set of mass related physical values for the ions from the one or more calibrant species. The method further includes producing ions from a sample and delivering the ions to a mass analyzer, and measuring a second mass related physical value for a first sample ion species. The first sample ion species has a mass-to-charge ratio outside of the range of the mass-to-charge ratios of the calibrant ion species. Additionally, the method includes calculating a calibration curve based on the first set of mass related physical values and second mass related physical value, and modifying at least one instrument parameter based on the calibration curve.Type: GrantFiled: March 24, 2016Date of Patent: March 26, 2019Assignee: THERMO FINNIGAN LLCInventors: Scott T. Quarmby, George B. Guckenberger
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Patent number: 10236156Abstract: A multi-beam apparatus for observing a sample with oblique illumination is proposed. In the apparatus, a new source-conversion unit changes a single electron source into a slant virtual multi-source array, a primary projection imaging system projects the array to form plural probe spots on the sample with oblique illumination, and a condenser lens adjusts the currents of the plural probe spots. In the source-conversion unit, the image-forming means not only forms the slant virtual multi-source array, but also compensates the off-axis aberrations of the plurality of probe spots. The apparatus can provide dark-field images and/or bright-field images of the sample.Type: GrantFiled: March 23, 2016Date of Patent: March 19, 2019Assignee: HERMES MICROVISION INC.Inventors: Weiming Ren, Shuai Li, Xuedong Liu, Zhongwei Chen, Jack Jau
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Patent number: 10207015Abstract: Provided is a decontamination apparatus for decontaminating an enclosed room. The decontamination apparatus includes a source including a UVC bulb and a reflective shield arranged adjacent to the UVC bulb and configured to reflect UVC light emitted by the UVC bulb toward a region of the enclosed room to be decontaminated. A mounting system that is adjustable secures the source at a desired location within the enclosed room. A controller is operatively-connected to the source to terminate operation of the UVC bulb in response to a determination that an occupant is present within the enclosed room.Type: GrantFiled: October 23, 2017Date of Patent: February 19, 2019Assignee: Diversey, Inc.Inventor: Roderick M. Dayton
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Patent number: 10186827Abstract: Systems, methods, and apparatus, including non-transitory computer-readable storage medium, for amplifying pulsed laser radiation in an EUV laser driver are provided. An example EUV laser driver includes a beam source configured to produce the pulsed laser radiation with at least one laser frequency, an amplifier arrangement with at least one optical amplifier for amplifying the pulsed laser radiation, the at least one optical amplifier having a frequency-dependent gain with a maximum gain at a maximum frequency, at least one frequency shifter configured to produce a frequency shift for the laser frequency of the pulsed laser radiation relative to the maximum frequency, and a controller configured to set the frequency shift such that a gain of the at least one optical amplifier for the pulsed laser radiation is reduced to less than a percentage, e.g., 90%, 70%, or 50%, of the maximum gain.Type: GrantFiled: January 10, 2017Date of Patent: January 22, 2019Assignee: TRUMPF Lasersystems for Semiconductor Manufacturing GmbHInventors: Joachim Schulz, Guenther Krauss, Matthias Wissert
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Patent number: 10175382Abstract: A method of radiological examination of an object for the identification and detection of the composition the object comprising the steps of: irradiating an object under test with high energy radiation such as x-rays or gamma-rays and collecting radiation emergent from the object at a suitable detector system in such manner that emergent radiation intensity data is collected for the entire volume of the object under test; numerically processing the radiation intensity data to obtain a first data item correlated to the total number of electrons within the sample; applying an alternative method to obtain a second data item correlated to another property of the sample; using the first and second data items to derive an indication of the material content of the sample.Type: GrantFiled: November 11, 2013Date of Patent: January 8, 2019Assignee: Kromek LimitedInventors: Ian Radley, Benjamin John Cantwell, Andrew Keith Powell
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Patent number: 10176977Abstract: An ion source is configured for soft electron ionization and produces a low electron-energy, yet high-intensity, electron beam. The ion source includes an electron source that produces the electron beam and transmits it into an ionization chamber. The electron beam interacts with sample material in the ionization chamber to produce an ion beam that may be transmitted to a downstream device. The electron source is configured for generating a virtual cathode upstream of the ionization chamber, which enhances the intensity of the electron beam.Type: GrantFiled: November 24, 2015Date of Patent: January 8, 2019Assignee: Agilent Technologies, Inc.Inventor: Mingda Wang
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Patent number: 10156429Abstract: Aspects of the disclosed subject matter involve an airborne-based network for implementing a laser-based visual disruption countermeasure scan pattern system, method, and computer program product. The scan pattern can be comprised of a plurality of lasers each with their own scan pattern and may be used to disrupt an optical system of a weapon or an individual. One vehicle in the network can transmit target information and/or scan information to one or more other vehicles or to a non-vehicle remote location in the network.Type: GrantFiled: July 24, 2017Date of Patent: December 18, 2018Assignee: Lockheed Martin CorporationInventors: Stephen C. Moraites, Carl R. Herman
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Patent number: 10157725Abstract: Some embodiments are directed to an electron microscopy sample support including: a support member; and a metal foil including a porous region. The support member is configured to give structural stability to the metal foil, and the porous region of the metal foil is configured to receive an electron microscopy sample. Also disclosed is a method of manufacturing such an electron microscopy sample support, a method of imaging using such an electron microscopy sample support and an apparatus operable to perform such imaging. The disclosed microscopy specimen support reduces particle motion and/or sample charging in electron microscopy, and thus improve information available from electron micrographs.Type: GrantFiled: August 12, 2014Date of Patent: December 18, 2018Assignee: UNITED KINGDOM RESEARCH AND INNOVATIONInventors: Lori A. Passmore, Christopher J. Russo
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Patent number: 10151567Abstract: Aspects of the disclosed subject matter involve an airborne-based network for implementing a laser-based visual disruption countermeasure scan pattern system, method, and computer program product. The scan pattern can be comprised of a plurality of lasers each with their own scan pattern and may be used to disrupt an optical system of a weapon or an individual. One vehicle in the network can transmit target information and/or scan information to one or more other vehicles or to a non-vehicle remote location in the network.Type: GrantFiled: July 31, 2017Date of Patent: December 11, 2018Assignee: Lockheed Martin CorporationInventors: Stephen C. Moraites, Carl R. Herman
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Patent number: 10153130Abstract: A charged particle beam drawing apparatus has a drawing unit including a charged particle source, a deflector and a stage on which a target object is placed, to perform drawing with a charged particle beam on a plurality of drawing regions on the target object, and a calculator to calculate a drawing progress ratio on the target object using a ratio of a drawn area of the drawing regions to a total area of the drawing regions.Type: GrantFiled: December 11, 2015Date of Patent: December 11, 2018Assignee: NuFlare Technology, Inc.Inventor: Sumito Nakada
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Patent number: 10143075Abstract: An extreme ultraviolet light source device includes two discharge electrodes, two plasma raw material containers associated with the discharge electrodes, respectively, and two supply units associated with the containers, respectively. The supply units supply the plasma raw materials from the containers onto the discharge electrodes upon rotations of the discharge electrodes. The light source device also includes an energy beam irradiating unit configured to irradiate the plasma raw material on a circumferential surface of one of the discharge electrodes with an energy beam to vaporize the plasma raw material such that electric discharge takes place between the discharge electrodes to generate the plasma. The light source device also includes two film thickness regulating units associated with the discharge electrodes, respectively.Type: GrantFiled: March 29, 2016Date of Patent: November 27, 2018Assignee: USHIO DENKI KABUSHIKI KAISHAInventors: Yusuke Teramoto, Hideyuki Urakami, Akihisa Nagano
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Patent number: 10133181Abstract: An electron source is formed on a silicon substrate having opposing first and second surfaces. At least one field emitter is prepared on the second surface of the silicon substrate to enhance the emission of electrons. To prevent oxidation of the silicon, a thin, contiguous boron layer is disposed directly on the output surface of the field emitter using a process that minimizes oxidation and defects. The field emitter can take various shapes such as pyramids and rounded whiskers. One or several optional gate layers may be placed at or slightly lower than the height of the field emitter tip in order to achieve fast and accurate control of the emission current and high emission currents. The field emitter can be p-type doped and configured to operate in a reverse bias mode or the field emitter can be n-type doped.Type: GrantFiled: August 11, 2016Date of Patent: November 20, 2018Assignee: KLA-Tencor CorporationInventors: Yung-Ho Alex Chuang, Yinying Xiao-Li, Xuefeng Liu, John Fielden
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Patent number: 10128092Abstract: A miniature mass spectrometer is disclosed comprising an atmospheric pressure ionization source, a first vacuum chamber having an atmospheric pressure sampling orifice or capillary, a second vacuum chamber located downstream of the first vacuum chamber and a third vacuum chamber located downstream of the second vacuum chamber. A first vacuum pump is arranged and adapted to pump the first vacuum chamber, wherein the first vacuum pump is arranged and adapted to maintain the first vacuum chamber at a pressure <10 mbar. A first RF ion guide is located within the first vacuum chamber. An ion detector is located in the third vacuum chamber. The ion path length from the atmospheric pressure sampling orifice or capillary to an ion detecting surface of the ion detector is ?400 mm. The mass spectrometer further comprises a split flow turbomolecular vacuum pump comprising an intermediate or interstage port connected to the second vacuum chamber and a high vacuum (“HV”) port connected to the third vacuum chamber.Type: GrantFiled: May 29, 2014Date of Patent: November 13, 2018Assignee: MICROMASS UK LIMITEDInventors: David Gordon, Daniel James Kenny
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Patent number: 10119938Abstract: Synchronized ion modification systems and techniques are described. An ion modifier can be used to modify a portion of ions that enter a drift chamber via a gate that controls entry of the ions to the drill chamber. A controller that is communicatively coupled to the ion modifier is configured to control the ion modifier to select a portion of the ion to be modified. In embodiments, the controller selects the portion based on a detector's previous response to other ions that are formed from a sample from which the ions were formed. The other ions, for example, correspond to ions that are associated with a peak in previous operation of a spectrometer.Type: GrantFiled: December 9, 2016Date of Patent: November 6, 2018Assignee: SMITHS DETECTION—WATFORD LTD.Inventors: Stephen J. Taylor, Jonathan R. Atkinson
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Patent number: 10107766Abstract: Among other things, one or more techniques and/or systems are described for defining imaging modes and for operating a photon counting radiation imaging system. A set of imaging modes with different counting schemes may be defined such that counting schemes will count detection events of a set of radiation events in different manners. For example, a first counting scheme may count primary detection events in a primary counter and secondary detection events in a secondary counter. A second counting scheme may count primary and secondary detection events in the primary counter. A third counting scheme may merely count detection events occurring within a primary detector cell associated with the primary counter. A fourth counting scheme may combine energy of detection events into merged energy. A selected imaging mode may be applied to the photon counting radiation imaging system in order to achieve desired image scanning characteristics (e.g., spatial resolution, dose savings, spectral ability).Type: GrantFiled: January 15, 2015Date of Patent: October 23, 2018Assignee: Analogic CorporationInventors: Doug Q. Abraham, Anton Deykoon, Basak Ulker Karbeyaz
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Patent number: 10103013Abstract: Certain embodiments described herein are directed to collision cells that comprise one or more integrated lenses. In some examples, a lens is coupled to two sections of a sectioned quadrature rod assembly, the lens comprising an aperture and a plurality of separate conductive elements disposed each one side of the lens, in which a respective disposed conductive element on one side of the lens is configured to electrically couple to a first, second, third, and fourth pole segments of the sectioned quadrature rod assembly.Type: GrantFiled: May 15, 2016Date of Patent: October 16, 2018Assignee: PerkinElmer Health Sciences, Inc.Inventor: Urs Steiner
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Patent number: 10103000Abstract: A double-tilt sample holder for TEM, comprising: it comprise the main body of sample holder body, front-end tilt stage, drive rod, linkage, tilt axis, rotation axis, fixed axis of drive rod and sample loading stage. The axis hole is arranged at the front-end tilt stage, which is connected to the main body of the sample holder body by the tilt axis. The linkage, the boss slot and the drive rod slot are connected by the rotation axis. Two through movement guide grooves are designed symmetrically at both sides of the front-end of sample holder body, and the drive rod is fixed by the fixed axis of the drive rod, which restricts the drive rod to move reciprocally in a straight line driven by the linear stepping motor at the back-end of the main body of the holder body, further leading the tilt stage to rotate around the tilt axis. The tilt angle of the sample loading stage can be precisely controlled by the high precision linear stepping motor in the apparatus.Type: GrantFiled: December 21, 2016Date of Patent: October 16, 2018Assignee: BEIJING UNIVERSITY OF TECHNOLOGYInventors: Xiaodong Han, Jianfei Zhang, Mao Shengcheng, Yadi Zhai, Xiaodong Wang, Zhipeng Li, Xiaochen Li, Taonan Zhang, Dongfeng Ma, Ze Zhang
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Patent number: 10103001Abstract: A double-tilt in-situ mechanical sample holder for TEM based on piezoelectric ceramic drive belongs to the field of material microstructure-mechanical properties in-situ characterization, and it comprise two parts of sample holder shaft body and piezoelectric ceramic drive system. The sample holder shaft body comprise tilt stage, sample holder, linear stepping motor, drive rod, drive linkage. The piezoelectric ceramic drive system comprise piezoelectric ceramic loading stage, piezoelectric ceramic, connecting base and the sample loading stage realizing stretch or compression function. The double-axis tilt of the samples in X and Y axis directions is realized by the reciprocating motion back and forth of the drive rod driven by the linear stepping motor. The stretch or compression of the samples is realized by applying voltage on the piezoelectric ceramic to generate displacement and push the sample loading stage by the connecting base.Type: GrantFiled: December 21, 2016Date of Patent: October 16, 2018Assignee: BEIJING UNIVERSITY OF TECHNOLOGYInventors: Xiaodong Han, Jianfei Zhang, Mao Shengcheng, Yadi Zhai, Xiaodong Wang, Zhipeng Li, Taonan Zhang, Dongfeng Ma, Xiaochen Li, Ze Zhang