Patents Examined by Hwa (Andrew) Lee
  • Patent number: 12123716
    Abstract: The invention relates to an apparatus of inner light layer illumination for optical imaging in turbid media. This apparatus comprises laser generating short light pulse(s), negative dispersion device to broaden the width of the short light pulse(s) before the pulse(s) enter(s) the turbid medium, imaging distance adjuster changing the imaging distance and optical receiver receiving returned signal light pulse(s). This apparatus can reduce absorption and scattering of the turbid media greatly and create an inner light layer with strong intensity to illuminate the object in the turbid medium. The mathematical calculations have proved that this apparatus can enhance the signal strength by more than 600 dB. The imaging depth can be over 5 cm in human body, and more than 500 m in clear seawater. The imaging resolutions are <1 micrometer along object plane and are approximate 1 micrometer along direction of depth of field.
    Type: Grant
    Filed: August 25, 2023
    Date of Patent: October 22, 2024
    Inventor: Shangqing Liu
  • Patent number: 12104906
    Abstract: Disclosed is a chip-level disc-type acousto-optic standing wave gyroscope including a substrate and a gyroscope structure placed on an upper surface of the substrate; the substrate is in a shape of a circular disc; the gyroscope structure includes an acoustic wave drive module and an optical detection module, the acoustic wave drive module is arranged in a circular shape taking the center of the circular disc as an origin and extending outward radially, and the optical detection module is arranged in the middle of the acoustic wave drive module and is annular; the acoustic wave drive module includes an annular interdigitated transducer, a metal electrode layer group uniformly sputtered on the annular interdigitated transducer, annularly arranged metallic pillars and an annular reflection grating, respectively placed in sequence from center of the disk radially to periphery of the disk; the optical detection module includes a first grating coupler, an optical waveguide at a light source input end, a first coup
    Type: Grant
    Filed: September 30, 2021
    Date of Patent: October 1, 2024
    Assignee: NORTHWESTERN POLYTECHNICAL UNIVERSITY
    Inventors: Honglong Chang, Lu Tian, Qiang Shen, Ge Yang
  • Patent number: 12100129
    Abstract: A printing solder point quality identification and maintenance suggestion system and a method thereof are disclosed. In the system, when solder paste inspection data, component inspection data or circuit inspection data indicates presence of defect, an analysis and calculation device intercepts the operating data, the equipment data, the raw material data, the process data and the environment data from a time data stream, to generate a data feature portrait.
    Type: Grant
    Filed: June 24, 2021
    Date of Patent: September 24, 2024
    Assignees: Inventec (Pudong) Technology Corporation, Inventec Corporation
    Inventor: Meng Sun
  • Patent number: 12098913
    Abstract: A detector that detects relative positions of a first object and a second object in directions different from each other on a predetermined plane, includes an illumination optical system configured to illuminate a first mark provided on the first object and a second mark provided on the second object, and a detection optical system configured to detect interference light of diffracted lights from the first mark and the second mark illuminated by the illumination optical system. A light intensity distribution is formed, on a pupil plane of the illumination optical system, to illuminate the first mark and the second mark from a direction tilted with respect to a normal of the predetermined plane. A pupil plane of the detection optical system allows the interference light to pass through and block at least a part light other than the interference light.
    Type: Grant
    Filed: May 17, 2021
    Date of Patent: September 24, 2024
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Takamitsu Komaki, Yasuyuki Unno, Tooru Kawashima
  • Patent number: 12092739
    Abstract: A sensor device for measuring a motion of a vehicle includes a light source for radiating light on a region on a ground below the vehicle in temporal intervals and to produce a spot of increased temperature; a heat detection unit, which is mountable at an underside of the vehicle for detecting a position of the spot on the ground at the temporal intervals; and a control unit for receiving data about a measured time of the spot and the position of the spot from the heat detection unit and to estimate a change of the position of the spot in vehicle coordinates.
    Type: Grant
    Filed: July 19, 2021
    Date of Patent: September 17, 2024
    Assignees: Hyundai Motor Company, Kia Corporation
    Inventors: Vincent Laurent, Timo Schoening
  • Patent number: 12085506
    Abstract: A method for determining an index-of-refraction profile of an optical object, which has a cylindrical surface and a cylinder longitudinal axis, said method comprising the following method steps: (a) scanning the cylindrical surface of the object at a plurality of scanning locations by means of optical beams; (b) capturing, by means of an optical detector, a location-dependent intensity distribution of the optical beams deflected in the optical object; (c) determining the angles of deflection of the zero-order beams for each scanning location from the captured intensity distribution, comprising eliminating beam intensities, and (d) calculating the index-of-refraction profile of the object on the basis of the angle-of-deflection distribution, wherein method steps (a) and (b) are carried out with light beams having at least two different wavelengths.
    Type: Grant
    Filed: March 18, 2021
    Date of Patent: September 10, 2024
    Assignee: Heraeus Quarzglas GmbH & Co. KG
    Inventor: Maximilian Schmitt
  • Patent number: 12072281
    Abstract: Optical cells are described for use in spectroscopy applications. The cells include a series of discrete planar reflectors aligned with one another and spaced apart from one another at each end of the sample cavity. The discrete planar reflectors can be surrounded by transparent windows and divergent energy can be removed from the cell cavity via the windows. The cells can define a unique beam path for the energy beam, and there can be no overlapping optical paths through the cell. The cells can provide well-defined detection signals with very high signal-to-noise ratio.
    Type: Grant
    Filed: October 23, 2019
    Date of Patent: August 27, 2024
    Assignee: Battelle Savannah River Alliance, LLC
    Inventors: Patrick E. O'Rourke, Kimberly Alicia Strange Fessler, Donald J. Pak
  • Patent number: 12072259
    Abstract: A resolution measurement apparatus includes a stage configured to receive a display module including an optical part. The stage includes an opening that overlaps the optical part, when viewed in a plan view, when the display module is disposed on the stage. The resolution measuring apparatus further includes a plurality of cameras disposed above the stage, a light source disposed under the stage and overlapping the opening when viewed in the plan view, and a lens disposed between the light source and the stage. The lens overlaps the opening when viewed in the plan view, and the optical part overlaps the lens, when viewed in the plan view, when the display module is disposed on the stage.
    Type: Grant
    Filed: July 6, 2021
    Date of Patent: August 27, 2024
    Assignee: SAMSUNG DISPLAY CO., LTD.
    Inventors: Sanghui Park, Jinwook Lee
  • Patent number: 12056865
    Abstract: A dual-beam device, such as, a scanning electron microscope combined with a focused-ion beam milling column, is employed for a slice-in-image process. Based on one or more images of at least one cross-section of a test volume of a wafer, a wafer tilt is determined.
    Type: Grant
    Filed: October 7, 2021
    Date of Patent: August 6, 2024
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Dmitry Klochkov, Chuong Huynh, Thomas Korb
  • Patent number: 12057336
    Abstract: The present disclosure relates to a method for estimating heights of defects in a wafer. The method comprises creating an un-calibrated 3D model of a defect in a wafer, determining one or more attributes associated with the un-calibrated 3D model, transforming the un-calibrated 3D model to a calibrated 3D model, and estimating a height of the defect using the calibrated 3D model. Creating an un-calibrated 3D model corresponds to a defect present in a wafer based on a plurality of Scanning Electron Microscope (SEM) images of the defect. Transforming the un-calibrated 3D model to a calibrated 3D model uses a scaling factor corresponding to the determined one or more attributes associated with the un-calibrated 3D model. A height of the defect is estimated based on the calibrated 3D model of the defect.
    Type: Grant
    Filed: March 3, 2021
    Date of Patent: August 6, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Shashank Shrikant Agashe, Gaurav Kumar, Sathyanarayanan Kulasekaran, Chanwoo Park, Yunje Cho
  • Patent number: 12046492
    Abstract: A transportation monitoring method is provided, including the following steps. A monitoring image of a robot blade outside a carrier is captured from a fixed field of view by an image capturing device. The robot blade is configured to move an item into or out of the carrier. Next, a sampling area is obtained from the monitoring image by a processing device. Also, a tilting state of the robot blade is determined according to the sampling area by the processing device. When the processing device determines that the robot blade is tilted, the processing device sends a warning signal. A transportation monitoring system is also provided.
    Type: Grant
    Filed: July 20, 2021
    Date of Patent: July 23, 2024
    Assignee: Winbond Electronics Corp.
    Inventors: Yi-Ta Chen, Wen-Chin Hsieh
  • Patent number: 12038276
    Abstract: An optical fiber ring interferometer is provided, which is based on a common light path for two or more light beam pairs preferably originated from two or more light sources of a substantially different spectrum or from a single light source split spectrum and whereas each light beam of a specific pair is propagating in relative opposite directions, wherein at least one pair of light beams is utilized to detect acousto-mechanical events and to provide information regarding location and other characteristics of detected environmental disturbance.
    Type: Grant
    Filed: June 29, 2023
    Date of Patent: July 16, 2024
    Inventor: Zbigniew Sobolewski
  • Patent number: 12031863
    Abstract: An optical device includes: a base which includes a main surface; a movable mirror which includes a mirror surface; a first and a second elastic support portions which support the movable mirror so as to be movable along a first direction perpendicular to the main surface; an actuator which moves the movable mirror; and a first optical function portion which is disposed at one side of the movable mirror in a second direction perpendicular to the first direction. The first elastic support portion includes a pair of first levers extending from the movable mirror toward both sides of the first optical function portion in a third direction perpendicular to the first and the second directions. A length of each of first levers in the second direction is larger than the shortest distance between an outer edge of the mirror surface and an edge of the first optical function portion.
    Type: Grant
    Filed: July 6, 2018
    Date of Patent: July 9, 2024
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Tatsuya Sugimoto, Tomofumi Suzuki, Kyosuke Kotani
  • Patent number: 12018941
    Abstract: An optical fiber ring interferometer is provided, which is based on a common light path for two or more light beam pairs preferably originated from two or more light sources of a substantially different spectrum or from a single light source split spectrum and whereas each light beam of a specific pair is propagating in relative opposite directions, wherein at least one pair of light beams is utilized to detect acousto-mechanical events and to provide information regarding location and other characteristics of detected environmental disturbance.
    Type: Grant
    Filed: June 29, 2023
    Date of Patent: June 25, 2024
    Inventor: Zbigniew Sobolewski
  • Patent number: 12007221
    Abstract: A heterogeneous integration detecting method and a heterogeneous integration detecting apparatus are provided. The heterogeneous integration detecting method includes the following. Under the condition of maintaining the same relative distance between an interference objective lens and a sample, the relative posture of the interference objective lens and the sample is continuously adjusted according to the change of an image of the sample in the field of view of the interference objective lens until a first optical axis of the interference objective lens is determined to be substantially perpendicular to the surface of the sample according to the image. The interference objective lens is replaced with an imaging objective lens and the geometric profile of at least one via of the sample is detected. A second optical axis of the imaging objective lens after replacement overlaps with the first optical axis of the interference objective lens before replacement.
    Type: Grant
    Filed: December 27, 2021
    Date of Patent: June 11, 2024
    Assignee: Industrial Technology Research Institute
    Inventors: Hsiang-Chun Wei, Chih-Hsiang Liu, Yi-Sha Ku, Chung-Lun Kuo, Chun-Wei Lo, Chieh-Yi Lo
  • Patent number: 12002195
    Abstract: A computer vision-based anomaly detection method and device and an electronic apparatus are disclosed. The method comprises: dividing a target picture into at least two feature regions according to different region features of the target picture, and forming training sets respectively using the feature regions corresponding to each target picture; selecting generative adversarial networks GAN as network models to be used, and training GAN network models with the training sets of different feature regions to obtain GAN network models corresponding to different feature regions; and when performing anomaly detection, performing same feature region division on a target picture to be detected, inputting different feature regions of the target picture to be detected into corresponding GAN network models to obtain a generated picture, and performing pixel value-based difference detection on the generated picture and the target picture to be detected.
    Type: Grant
    Filed: October 24, 2020
    Date of Patent: June 4, 2024
    Assignee: GOERTEK INC.
    Inventors: Fuli Xie, Yifan Zhang, Jie Liu, Jifeng Tian
  • Patent number: 12000752
    Abstract: A system for measuring (200) a sample (2) by deflectometry comprising: a source (10) for generating a light beam in a source plane (105); an illumination module (19) for forming an illumination beam (9) comprising: a first converging optical element (18); a first selection optical element (16) with a first aperture (160); reflective matrix optical modulation means (30) to form a pattern (7), said first aperture (160) being configured to control the angles of said illumination beam (9) on said reflective matrix optical modulation means (30); a Schlieren lens (20) for obtaining an angle-intensity encoding of said pattern (7) on the sample (2); imaging (40) and detecting means (50) for detecting an image of said sample (2).
    Type: Grant
    Filed: April 24, 2020
    Date of Patent: June 4, 2024
    Assignee: LAMBDA-X OPHTHALMICS
    Inventors: Philippe Antoine, Didier Beghuin, Luc Joannes
  • Patent number: 12002197
    Abstract: A defect detection method based on an image of products and an electronic device can accurately determine the error threshold by determining the reconstruction error generated during image reconstruction and by determining the estimated probability generated by the Gaussian mixture model. The test error can then be compared with the error, since the test error and the error threshold are compared numerically, the existence of subtle defects are revealed in the product image, thereby improving the accuracy of defect detection.
    Type: Grant
    Filed: November 15, 2021
    Date of Patent: June 4, 2024
    Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chin-Pin Kuo, Tung-Tso Tsai, Shih-Chao Chien
  • Patent number: 11994628
    Abstract: A LIDAR sensing system includes a light source that is controlled to project a collimated beam at various wavelengths. An interferometer receives the collimated beam and projects an object beam corresponding to the collimated beam at a diffraction grating. The object beam is diffracted from the diffraction grating at different angles corresponding to the wavelength of the collimated beam, creating a two dimensional scan along a first axis. The object beam is also controlled along a second axis that is perpendicular to the first axis. As a result, the LIDAR sensing system generates a horizontal and vertical scan (e.g., a three-dimensional scan) of the external environment.
    Type: Grant
    Filed: November 16, 2020
    Date of Patent: May 28, 2024
    Assignee: Santec Holdings Corporation
    Inventor: Changho Chong
  • Patent number: 11983863
    Abstract: An alpha channel is added in addition to multiple channels forming an image of an item. A second pixel value differing from a first pixel value, which is assigned to a defect-free region, is assigned to a region corresponding to a defect region in the alpha channel. The image including the alpha channel is divided into multiple image segments. A defect label is assigned to the image segment in which the second pixel value is included in the alpha channel, and a non-defect label is assigned to the image segment, in which the second pixel value is not included in the alpha channel. The alpha channel is removed from the image segments to generate labeled image segment data.
    Type: Grant
    Filed: July 11, 2019
    Date of Patent: May 14, 2024
    Assignee: Kabushiki Kaisha N-Tech
    Inventors: Kazumi Banno, Yuichi Yamagishi, Hiroyuki Kibe, Kunimitsu Toyoshima