Abstract: Example embodiments relate to a magnetic memory device that includes a magnetic tunnel junction layer including a first magnetic layer, a second magnetic layer, and a first tunnel barrier layer between the first and second magnetic layers. The second magnetic layer is disposed on the first tunnel barrier layer and is in direct contact with the first tunnel barrier layer. The second magnetic layer includes cobalt-iron-beryllium (CoFeBe). A beryllium content of CoFeBe in the second magnetic layer ranges from about 2 at % to about 10 at %.
Type:
Grant
Filed:
May 18, 2016
Date of Patent:
September 12, 2017
Assignees:
Samsung Electronics Co., Ltd., International Business Machines Corporation
Inventors:
Woojin Kim, Keewon Kim, Jaewoo Jeong, Stuart S. P. Parkin, Mahesh Govind Samant