Patents Examined by Irakli Kiknadza
  • Patent number: 8325876
    Abstract: The present invention relates to an X-ray imaging apparatus comprising an X-ray source unit generating an X-ray, an X-ray detecting sensor unit having a sensor panel equipped with multiple sensors detecting the X-ray which is generated from the X-ray source unit and passed through an object, and a panel-moving means mounted on the X-ray detecting sensor unit and moving the sensor panel. Thus, employing and butting multiple small X-ray sensors instead of expensive large sensors advantageously reduces the manufacturing cost for the X-ray imaging apparatus, and enables the imaging of the same wide area as with the use of the large sensors.
    Type: Grant
    Filed: January 15, 2009
    Date of Patent: December 4, 2012
    Assignees: Vatech Ewoo Holdings, Co., Ltd., Rayence Co., Ltd.
    Inventor: Tae Woo Kim