Patents Examined by Isiaka Akanbi
  • Patent number: 10254108
    Abstract: An optical measurement device configured for connection to an industrial network, the industrial network functioning to synchronize time between a master device and a slave device, the optical measurement device includes: an interface module configured to receive a synchronization signal transmitted on the industrial network from the master device within a fixed communication cycle; and a measurement unit configured to perform optical measurements in a measurement cycle. The measurement unit synchronizes when a measurement is taken with the communication cycle in accordance with the synchronization signal received by the interface module.
    Type: Grant
    Filed: January 24, 2017
    Date of Patent: April 9, 2019
    Assignee: OMRON Corporation
    Inventors: Koji Shimada, Tomonori Kondo
  • Patent number: 10228322
    Abstract: Disclosed is an apparatus for and method of measuring the concentration of F2 in the laser gas used in an excimer laser. Quartz Enhanced Photoacoustic Spectroscopy is used to obtain a direct measurement of F2 concentration quickly and using only a small sample volume.
    Type: Grant
    Filed: July 13, 2017
    Date of Patent: March 12, 2019
    Assignee: CYMER LLC
    Inventor: Thomas Patrick Duffey
  • Patent number: 10228556
    Abstract: According to an exemplary embodiment of the present disclosure, apparatus and process for providing at least one radiation can be provided. For example, with at least one multi-mode waveguide, it is possible to transmit the radiation(s). In addition, with a shape sensing arrangement, it is possible To dynamically measure a shape of the multi-mode waveguide(s). Further, with a specifically programmed computer arrangement, it is possible to control a light modulator arrangement based on the dynamically-measured shape to cause the radiation(s) transmitted through the multi-mode waveguide(s) to have at least one pattern.
    Type: Grant
    Filed: April 3, 2015
    Date of Patent: March 12, 2019
    Assignee: The General Hospital Corporation
    Inventors: Rohith K. Reddy, Guillermo J. Tearney
  • Patent number: 10228531
    Abstract: A method of aligning a lens device includes: coupling an optical free-space beam that propagates along a first direction into an access port of an optoelectronic component, the first, a second, and a third direction being mutually perpendicular; positioning the lens device inside a free-space beam path, the lens device having an adjustment lens configured to focus radiation in only the second direction; moving the lens device along the second direction to align the adjustment lens with respect to the access port at an initial aligned position at which the optical free-space beam is one-dimensionally focused by the adjustment lens and at least a portion of a resulting one-dimensionally focused beam is input into the access port; and starting from the initial aligned position, moving the lens device in the second and/or third directions to position an optical element of the lens device in front of the access port.
    Type: Grant
    Filed: October 8, 2015
    Date of Patent: March 12, 2019
    Assignee: FINISAR GERMANY GMBH
    Inventors: Benjamin Voelker, Johannes Plumhof
  • Patent number: 10222595
    Abstract: An optical multipass system is configured to include, in addition an end-mirror configuration of reflective surfaces, a multipass pattern folding assembly. The end-mirror configuration includes at least two reflective surfaces arranged to provide for establishing cell stability of an optical multipass cell comprising all or part of the optical multipass system, or further provide for directing and/or focusing light within the optical multipass cell. The multipass pattern folding assembly includes at least two inner reflective surfaces configured to provide for folding an optical pattern intra-cavity at least twice off one of the inner reflective surfaces of the multipass pattern folding assembly.
    Type: Grant
    Filed: November 12, 2015
    Date of Patent: March 5, 2019
    Inventor: Joshua B Paul
  • Patent number: 10215559
    Abstract: Methods and systems for evaluating the performance of multiple patterning processes are presented. Patterned structures are measured and one or more parameter values characterizing geometric errors induced by the multiple patterning process are determined. In some examples, a primary, multiple patterned target is measured and a value of a parameter of interest is directly determined from the measured data by a Signal Response Metrology (SRM) measurement model. In some other examples, a primary, multiple patterned target and an assist target are measured and a value of a parameter of interest is directly determined from the measured data by a Signal Response Metrology (SRM) measurement model. In some other examples, a primary, multiple patterned target is measured at different process steps and a value of a parameter of interest is directly determined from the measured data by a Signal Response Metrology (SRM) measurement model.
    Type: Grant
    Filed: October 9, 2015
    Date of Patent: February 26, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Stilian Ivanov Pandev, Dzmitry Sanko, Alexander Kuznetsov
  • Patent number: 10215713
    Abstract: Methods and systems for determining a configuration for an optical element positioned in a collection aperture during wafer inspection are provided. One system includes a detector configured to detect light from a wafer that passes through an optical element, which includes a set of collection apertures, when the optical element has different configurations thereby generating different images for the different configurations. The system also includes a computer subsystem configured for constructing additional image(s) from two or more of the different images, and the two or more different images used to generate any one of the additional image(s) do not include only different images generated for single collection apertures in the set. The computer subsystem is further configured for selecting one of the different or additional configurations for the optical element based on the different images and the additional image(s).
    Type: Grant
    Filed: June 18, 2017
    Date of Patent: February 26, 2019
    Assignee: KLA-Tencor Corp.
    Inventors: Pavel Kolchin, Mikhail Haurylau, Junwei Wei, Dan Kapp, Robert Danen, Grace Chen
  • Patent number: 10215680
    Abstract: Disclosed herein are a dust measuring apparatus and a mobile terminal for controlling the same. The dust measuring apparatus includes a flow channel defining unit for defining a flow channel allowing a fluid containing dust to move through, a light emitter for emitting light into the flow channel, a light detector for detecting light scattered from the dust in the flow channel and converting the same into an electrical signal, and a controller for controlling the flow channel defining unit, the light emitter and the light detector. The controller is configured to verify whether a detection value received from the light detector is within an effective measurement range, vary the effective measurement range when the detection value is outside the effective measurement range, and measure, when the detection value is within the varied effective measurement range, a dust concentration based on the detection value.
    Type: Grant
    Filed: July 17, 2017
    Date of Patent: February 26, 2019
    Assignee: LG Electronics Inc.
    Inventors: Yongho Cho, Bolam Kim, Seonghong Park, Sangkeun Lee, Pilwon Jeong
  • Patent number: 10184785
    Abstract: Provided is an optical receptacle (140) having an installation plane (141), an optical plane, and a reference plane (147). An inclination angle of the reference plane (147) with respect to the installation plane (141) is smaller than an inclination angle of the optical plane with respect to the installation plane (141). Then, a first inclination angle ?1 that is the inclination angle of the reference plane (147) with respect to the installation plane (141) and a second inclination angle ?2 that is an inclination angle of the optical plane with respect to the reference plane (147) are measured. Then, the first inclination angle ?1 is added to the second inclination angle ?2 to calculate a third inclination angle ?3 that is the inclination angle of the optical plane with respect to the installation plane (141).
    Type: Grant
    Filed: December 17, 2015
    Date of Patent: January 22, 2019
    Assignee: ENPLAS CORPORATION
    Inventors: Shimpei Morioka, Yuki Saito, Tadanobu Niimi
  • Patent number: 10165935
    Abstract: A measuring head of an endoscopic device is provided. The measuring head has an optical projection unit (projection optics) intended and designed to illuminate an object to be examined with light, and an optical measurement unit (measurement optics) intended and designed to record the light reflected or diffused from the object to be examined. It is provided that the optical measurement unit (measurement optics) has an aperture diaphragm of which the aperture is settable.
    Type: Grant
    Filed: January 27, 2016
    Date of Patent: January 1, 2019
    Assignee: Rolls-Royce Deutschland Ltd & Co KG
    Inventors: Joachim Bauer, Sigurd Schrader, Martin Burger, Silvio Pulwer, Friedhelm Heinrich, Viachaslau Ksianzou, Patrick Steglich, Jean Blondeau, Claus Villringer
  • Patent number: 10161857
    Abstract: A metamaterial optical member 100 includes a light collecting optical member 1 having a light-entering surface IN1 and a light-exiting surface OUT1 and having a light collecting function and an antireflection film 2 disposed in the light-exiting surface OUT1 of the light collecting optical member 1. The antireflection film 2 has a first metamaterial structure in which a refractive index is gradually reduced in the light travelling direction. The metamaterial optical member 100 includes the antireflection film 2 having the metamaterial structure, thereby externally extracting light.
    Type: Grant
    Filed: April 3, 2015
    Date of Patent: December 25, 2018
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventor: Yoshiro Nomoto
  • Patent number: 10161844
    Abstract: A particle sensing device, which senses a particulate matter by using a light beam from a light source, is provided. The particle sensing device includes a columnar array and a light-sensing element. The columnar array is disposed at a downstream side of a traveling path of the light beam. The columnar array has a plurality of columnar objects. A gap is existed between two adjacent columnar objects. The light-sensing element is disposed opposite to the columnar array and at a downstream side of a traveling path of the light beam. Wherein, the traveling path of the light beam is parallel with a length direction of each columnar object. And, the light beam passes through the gap for arriving at the light-sensing element. The particle sensing device can sense the particulate matter satisfactorily and can be simply integrated into various electronic apparatuses.
    Type: Grant
    Filed: August 31, 2016
    Date of Patent: December 25, 2018
    Assignee: Winbond Electronics Corp.
    Inventors: Yu-Hsuan Ho, Yi-Der Wu
  • Patent number: 10162057
    Abstract: Some embodiments of the invention relate to a method for capturing a relative position of at least one first spatial point by means of a portable distance measuring device, the method comprising positioning a known reference object, which has known features which may be captured by optical means, said features being arranged in a pattern designed for a resection, at least one first measuring process, comprising measuring a first distance to the first spatial point, and recording a first reference image linked in time with measuring the first distance, the reference object being imaged in the first reference image, and ascertaining the position and orientation of the distance measuring device relative to the reference object comprising identifying the reference object, recalling stored information about the known features of the identified reference object and identifying positions of known features of the reference object in the first reference image.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: December 25, 2018
    Assignee: LEICA GEOSYSTEMS AG
    Inventors: Bernhard Metzler, Beat Aebischer, Knut Siercks, Siegfried Wiltsche
  • Patent number: 10161869
    Abstract: Turbidity measurement systems and methods of using the same are described. A turbidity measurement system comprise a vessel configured to hold a wellbore fluid, wherein a permeable obstruction to flow is positioned in the vessel; a light source positioned to direct light at the vessel; a light detector positioned to measure light intensity of light emitted by the light source and passing through the vessel; and a backscatter detector positioned to measure the light intensity of reflected light emitted from the light source.
    Type: Grant
    Filed: November 25, 2014
    Date of Patent: December 25, 2018
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Rui Shen, Timothy N. Harvey, Dale E. Jamison, Cato Russell McDaniel
  • Patent number: 10161861
    Abstract: A compact device useful for measuring an absorption spectrum of a liquid, such as water with organic contaminants, is provided. The device comprises an array of light emitting diodes (LEDs) each emitting light with a unique spectral peak. A reflector shaped as a half ellipsoid reflects the emitted light to form a reference beam. The reflector has an opening to allow part of the emitted light to form a measurement beam after passing through the liquid. Two photodetectors measure the reference beam and the measurement beam to give a reference intensity and a measured intensity, respectively. The LEDs sequentially emit showers of light one-by-one, giving plural pairs of reference and measured intensities for estimating the absorption spectrum. The device receives energy from a separate power-providing device through wireless power transfer. The power-providing device harvests motional energy of the flowing liquid to generate electrical energy.
    Type: Grant
    Filed: December 13, 2016
    Date of Patent: December 25, 2018
    Assignee: Hong Kong Applied Science and Technology Research Institute Company Limited
    Inventors: Chun Zhang, Ngok Man Sze, Luis Ng
  • Patent number: 10151678
    Abstract: Turbidity measurement systems and methods of using the same are described. A turbidity measurement system comprises a vessel configured to hold a wellbore fluid, wherein a porous media is positioned in the vessel; a light source positioned to direct light at the vessel; a light detector positioned to measure light intensity of light emitted by the light source and passing through the vessel; a backscatter detector configured to measure the light intensity of reflected light emitted from the light source; and a computer system communicatively coupled to at least one of the light source, light detector, or light detector.
    Type: Grant
    Filed: November 25, 2014
    Date of Patent: December 11, 2018
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Rui Shen, Timothy N. Harvey, Dale E. Jamison, Cato Russell McDaniel
  • Patent number: 10151979
    Abstract: Within area where of four heads installed on a wafer stage, heads included in the first head group and the second head group to which three heads each belong that include one head different from each other face the corresponding areas on a scale plate, the wafer stage is driven based on positional information which is obtained using the first head group, as well as obtain the displacement (displacement of position, rotation, and scaling) between the first and second reference coordinate systems corresponding to the first and second head groups using the positional information obtained using the first and second head groups. By using the results and correcting measurement results obtained using the second head group, the displacement between the first and second reference coordinate systems is calibrated, which allows the measurement errors that come with the displacement between areas on scale plates where each of the four heads face.
    Type: Grant
    Filed: May 30, 2017
    Date of Patent: December 11, 2018
    Assignee: NIKON CORPORATION
    Inventor: Yuichi Shibazaki
  • Patent number: 10139340
    Abstract: The present invention pertains to the measurement of the refractive index of a medium, such as a fluid, through the wall of its container. The essential characteristic of the invention is that, by using at least two separate light paths that are of unequal length and that reflect from the wall/medium interface, it is possible to perform the measurement of the refractive index of the medium so that the result is insensitive to the color and thickness of the wall.
    Type: Grant
    Filed: June 28, 2016
    Date of Patent: November 27, 2018
    Inventors: Hannu Harjunmaa, Sinikka Harjunmaa
  • Patent number: 10126248
    Abstract: A system includes a vessel floating on a body of water. The system also includes at least one conduit extending from the vessel to below the body of water. The system also includes a scanning device disposed within the at least one conduit. The scanning device includes at least one two-dimensional (2D) line scanner and a rotary encoder coupled to the at least one 2D line scanner. The scanning device is configured to generate three-dimensional (3D) image data of a surface of the at least one conduit or at least one component disposed within the at least one conduit.
    Type: Grant
    Filed: May 2, 2017
    Date of Patent: November 13, 2018
    Assignee: General Electric Company
    Inventors: Manuel Kenneth Bueno, Robert Martin Roney, Jr.
  • Patent number: 10119811
    Abstract: A method for measuring wafer alignment is provided. The method includes providing a plurality of first mark patterns extending in a first direction on a wafer, providing at least one second mark pattern on the first mark patterns such that it overlaps and intersects the first mark patterns, irradiating an optical signal onto the first mark patterns and the second mark pattern and obtaining coordinates of the second mark pattern by detecting signals from the second mark pattern.
    Type: Grant
    Filed: March 2, 2017
    Date of Patent: November 6, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Seung Yoon Lee, Chan Hwang, Jeong Jin Lee