Abstract: A cytometer cartridge insert includes a micro-molded component and a plastic laminate component. The micro-molded component is embedded in the plastic laminate component.

Abstract: A method serves the detection of surface defects of a component. The surface of the component (5) is radiated from the side with light from a light source (4, 4?). The light radiated back from the surface of the component (5) is detected by a sensor. To improve such a method, only a rear region (19, 19?) of the surface of the component (5) is radiated with light from the light source (4, 4?) and/or only the light radiated back from a rear region (19, 19?) of the surface of the component (5) is detected by the sensor and/or evaluated by an evaluation device FIG. 3).

Abstract: A method of and apparatus for inspecting a container having a base and a mouth. Light is directed through the container base into the container, and out of the container through the container mouth, using at least one light source disposed beneath the container base. A plurality of images of the container mouth is obtained from the light transmitted through the container mouth. Minimum bore diameters of the container mouth are calculated from the plurality of images, and an overall lowest minimum bore diameter (OLMBD) of the minimum bore diameters is identified. A value other than the OLMBD is determined to be an effective minimum bore diameter of the container mouth.

Abstract: An optical measuring apparatus comprising at least one light emitting unit, a stage, at least one lens, and at least one light detector is provided. The light emitting unit emits a light beam. The stage contains accommodating spaces. The accommodating spaces move to the transmission path of the light beam in turn. The lens is located between the light emitting unit and the stage, whose orthogonal projection on the stage appears substantially to be a polygon. When one of the accommodating spaces moves to the transmission path of the light beam, a perpendicular bisector half line of each side of the polygon is not overlapped with another adjacent accommodating space of the accommodating spaces. An optical measuring method is also provided.

Abstract: The disclosure is directed to a system and method for inspecting a spinning sample by substantially simultaneously scanning multiple spots on a surface of the sample utilizing a plurality of illumination beams. Portions of illumination reflected, scattered, or radiated from respective spots on the surface of the sample are collected by at least one detector array. Information associated with at least one defect of the sample is determined by at least one computing system in communication with the detector array. According to various embodiments, at least one of scan pitch, spot size, spot separation, and spin rate is controlled to compensate pitch error due to tangential spot separation.

Abstract: A method testing physical properties of bulk powder materials uses acceleration forces induce a change in physical configuration of a powder sample. Various different properties may be determined by relationships between the applied acceleration and the associated detected change in configuration event. In various embodiments powder strength, friction angle, or other properties may be determined. Novel methods and devices are provided.

Abstract: Disclosed are systems and methods for inspecting and monitoring an inner surface of a pipeline. One system includes a pig arranged within the pipeline, one or more optical computing devices arranged on the pig adjacent the inner surface of the pipeline for monitoring at least one substance present on the inner surface. The optical computing devices include at least one integrated computational element configured to optically interact with the at least one substance and thereby generate optically interacted light, and at least one detector arranged to receive the optically interacted light and generate an output signal corresponding to a characteristic of the at least one substance. A signal processor is communicably coupled to the at least one detector of each optical computing device for receiving the output signal of each optical computing device and determining the characteristic of the at least one substance.

Abstract: In a shadow mask-substrate alignment method, a substrate is provided that includes a grate having a plurality of spaced bars and a shadow mask is provided that includes a grate having a plurality of spaced bars. Also provided is a light source-light receiver pair that defines a path of light therebetween. The grate of the substrate and the grate of the shadow mask are caused to be positioned in the path of the light. Thereafter, the orientation of the substrate, the shadow mask, or both are caused to be adjusted to position the grate of the substrate, the grate of the shadow mask, or both until a predetermined amount of light or a predetermined range of an amount of light on the path passing through the grates is received by the light receiver.

Abstract: Example methods and systems for calibrating one or more light sources are described. One example method includes determining a position of at least three photosensors relative to a world frame, controlling an orientation of at least one light source so as to cause the at least one light source to project a light beam across an area encompassing the at least three photosensors, receiving signals indicating a sensing of a light beam directed at one of the photosensors, determining orientations of the at least one light source that cause a signal at one of the photosensors, and based on the position of the at least three photosensors and the orientations of the at least one light source that cause a signal at one of the photosensors, determining a transformation from a local frame of the at least one light source to the world frame.

Abstract: The invention concerns an optical system. The optical system comprises an input for receiving an optical signal, a predetermined output plane, and a diffraction grating for separating the optical signal received at the input into spectral elements thereof. The grating has a diffraction surface, which is formed by a photolithography process. The diffraction surface has a first predetermined profile. The first profile is formed by a plurality of points each conducted by different equations. Consequently, each spectral component is focused on the predetermined output plane.

Abstract: In a shadow mask-substrate alignment method, a light source, a beam splitter, a first substrate including a first grate, a second substrate including a second grate, and a light receiver are positioned relative to each other to define a light path that includes light output by the light source being reflected a first time by the beam splitter. The light reflected the first time passes through the first or second grate and is at least partially reflected a second time by the second or first grate back through the first or the second grate, respectively. The light reflected the second time passes at least partially through the beam splitter for receipt by the light receiver. The orientation of the first substrate, the second substrate or both is adjusted to position the first grate, the second grate, or both until a predetermined amount is received by the light receiver.

Abstract: A two-dimensional displacement sensor includes first and second laser units that emit first laser light incident on the surface of the strip-shaped member from a direction intersecting the thickness direction of the strip-shaped member and second laser light incident on the surface of the strip-shaped member from a direction parallel to the thickness direction of the strip-shaped member, a camera that has a light receiving element for receiving light reflected from the surface of the strip-shaped member and measures the amount of displacement of the surface of the strip-shaped member from the reflected light receiving position detected by the light receiving element, an optical element for focusing the reflected light on the light receiving element, and a switching member for switching the laser light to be incident on the surface of the strip-shaped member between the first laser light and the second laser light.

Abstract: A sample, which has a mesa portion having a pattern thereon, is placed on a Z table. Light is irradiated to the mesa portion through an optical system and light reflected by the mesa portion is received to measure a height of the mesa portion. A height map of the mesa portion is created based on a height of a corner position. A height using the height map is corrected based on a deviation of a measured value from a target value, and a temporal variation of a focal position of light irradiated to the mesa portion. An optical image of the pattern is obtained based on the corrected height of the mesa portion. The optical image is compared with a reference image and a defect is determined when a difference value between the optical image and the reference image is more than a predetermined threshold value.

Abstract: Contrast enhancement in a metrology tool may include generating a beam of illumination, directing a portion of the generated beam onto a surface of a spatial light modulator (SLM), directing at least a portion of the generated beam incident on the surface of the SLM through an aperture of an aperture stop and onto one or more target structures of one or more samples, and generating a selected illumination pupil function of the illumination transmitted through the aperture utilizing the SLM in order to establish a contrast level of one or more field images of the one or more target structures above a selected contrast threshold, and performing one or more metrology measurements on the one or more target structures utilizing the selected illumination pupil function.

Abstract: A method of fabricating an aberration monitor on a production mask used in photolithographic patterning of a semiconductor substrate is provided. The method may include placing a production mask within a nanomachine repair tool and generating, using the nanomachine repair tool, a phase shifting pattern within a region of the production mask.

Abstract: The present invention is related to the semiconductor manufacturing field, especially a method for monitoring alignment between contact holes and polycrystalline silicon gate by setting a plurality of equidistant contact holes with same sharp on poly-silicon and residual active area, and then obtain the process alignment profile of the quantized values in the plane in order to have a better control of process quality, thereby have a better control of the quality of the process.

Abstract: A method of determining a position of a mobile apparatus includes: firing a laser mounted on the mobile apparatus; rotating the laser and a first and second photo detector that are disposed proximate the laser while monitoring an amount of rotation; detecting a first amplitude of light received by the first photo detector and a second amplitude of light received by a second photo detector as a function of rotation; identifying a first orientation corresponding to perpendicularity of the laser to a position referencing structure; identifying a second orientation corresponding to perpendicularity of the laser to the position referencing structure; identifying a third orientation corresponding to perpendicularity of the laser to the position referencing structure; and calculating the position of the mobile apparatus based on the first orientation, the second orientation, the third orientation, and a predetermined distance associated with the position referencing structure.

Abstract: The invention relates to a method for determining a distance between charged particle beamlets in a multi-beamlet exposure apparatus. The apparatus is provided with a sensor comprising a converter element for converting charged particle energy into light and a light sensitive detector provided with a two-dimensional pattern of beamlet blocking and non-blocking regions. The method comprises scanning a first beamlet over the pattern, receiving light generated by the converter element, and converting the received light into a first signal. Then the two-dimensional pattern and the first beamlet are moved relatively with respect to each other over a predetermined distance. Subsequently, the method comprises scanning a second beamlet over the pattern, receiving light generated by the converter element, and converting the received light into a second signal. Finally, the distance between the first beamlet and second beamlet is determined based on the first signal, the second signal and the predetermined distance.

Abstract: The invention relates to a flow cytometer system and method to apply a gain to data measurements to improve the display of the data measurements. The method for applying a gain to data detected in a flow cytometer, involves obtaining measurements from a detector in a flow cytometer, applying a gain to the measurements to produce shifted measurements to allow for improved display of the shifted measurements while maintaining the relationship between data points of the shifted measurements and displaying the shifted measurements on a display.

Abstract: The present disclosure provides an optical device for selecting specific matter, such as plant matter. The device comprises a light source for emitting light having at least (3) wavelengths and for generating a combined beam of light having the at least 3 wavelengths. The device further comprises an optical element for directing a plurality of light beams towards matter including the specific matter. The optical element has first surface portions through which in use the plurality of component light beams are directed to the matter including the specific matter. Each component light beam is directed through a respective first surface portion that has an optical property that is selected so that light intensity differences between the component light beams are reduced.