Abstract: An automatic optical inspection of a moving web of glass for defects is provided by transversely scanning a moving web of glass with a light source which is internally reflected within the glass and travels towards the edge of the glass when the scanning light source strikes defects within the web. The light leaving the edges of the glass as a result of internal reflection is captured on opposite edges of the glass web. The captured light is detected and converted to electrical signals which are utilized to determine whether defects are present in the glass web in accordance with the characteristics of the electrical signals so generated. An apparatus is provided for the inspection method which includes edge detectors having a mouthlike construction fitting over the edges of the glass web and collecting internally reflected radiation from the edges of the web and applying it to photomultiplier tubes which are cooled.

Abstract: This invention relates to inspecting glass containers and other types of containers for defects, such as horizontal checks, in the sidewall thereof. The invention involves both method and apparatus for inspecting for such defects, whereby radiant energy is directed from above to be transmitted through the sidewall as a vertical band or column while the container is rotated. A light-sensitive detector observes the sidewall for reflected light produced by the defect, energizing of the detector creating a reject signal for rejection of flawed containers.

Abstract: A solid state image sensing array has a plurality of imaging sensing elements comprising first and second charge coupled MOS capacitors and a floating gate FET. The floating gate of the FET is disposed beneath the electrode of the second capacitor. In operation, a potential well is formed under the first capacitor. When the element is exposed to radiation, photochargers are accumulated in the potential well. To readout the photocharge, the charge is shifted under the second capacitor, thereby modulating the conductivity of the floating gate FET to provide signal sensing and amplification at the image sensing element. After readout, the photocharge can be purged from the sensing element by removing the potential from both capacitors, or if nondestructive readout is desired, the photocharge can be shifted back under the first capacitor.