Patents Examined by Jack I. Berman
  • Patent number: 8164072
    Abstract: A method and a device for preparing specimens for a cryo-electron microscope are described. A carrier is fixed to a holder, sample liquid is applied to the carrier, and a blotting device for removing excess sample liquid from the carrier by means of the absorbing medium is applied. The absorbing medium is illuminated with light and a change in the optical properties of the absorbing medium is detected by means of an optical sensor device. A control moves the blotting away from the carrier depending on a change in the detected optical properties.
    Type: Grant
    Filed: January 11, 2010
    Date of Patent: April 24, 2012
    Assignee: Leica Mikrosysteme GmbH
    Inventors: Reinhard Lihl, Guenter Resch
  • Patent number: 8134135
    Abstract: The invention relates to a multiple beam charged particle optical system, comprising an electrostatic lens structure with at least one electrode, provided with apertures, wherein the effective size of a lens field effected by said electrode at a said aperture is made ultimately small. The system may comprise a diverging charged particle beam part, in which the lens structure is included. The physical dimension of the lens is made ultimately small, in particular smaller than one mm, more in particular less than a few tens of microns. In further elaboration, a lens is combined with a current limiting aperture, aligned such relative to a lens of said structure, that a virtual aperture effected by said current limiting aperture in said lens is situated in an optimum position with respect to minimizing aberrations total.
    Type: Grant
    Filed: July 23, 2007
    Date of Patent: March 13, 2012
    Assignee: Mapper Lithography IP B.V.
    Inventors: Pieter Kruit, Yanxia Zhang, Martijn J. Van Bruggen, Stijn Willem Herman Karel Steenbrink
  • Patent number: 8128330
    Abstract: One embodiment of this fastening apparatus comprises a body with a passage through its length, a threaded member, a locking member, and a bowed ring. The threaded member is retained by the locking member in the passage. The bowed ring is disposed on the body and is configured to be flexible. This body may be fabricated of graphite in one instance.
    Type: Grant
    Filed: August 1, 2008
    Date of Patent: March 6, 2012
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventor: Paul N. Zeytoonian
  • Patent number: 8022361
    Abstract: Novel and significantly simplified procedures for fabrication of fully integrated nanoelectrospray emitters have been described. For nanofabricated monolithic multinozzle emitters (NM2 emitters), a bottom up approach using silicon nanowires on a silicon sliver is used. For microfabricated monolithic multinozzle emitters (M3 emitters), a top down approach using MEMS techniques on silicon wafers is used. The emitters have performance comparable to that of commercially-available silica capillary emitters for nanoelectrospray mass spectrometry.
    Type: Grant
    Filed: October 28, 2008
    Date of Patent: September 20, 2011
    Assignee: The Regents of the University of California
    Inventors: Daojing Wang, Peidong Yang, Woong Kim, Rong Fan
  • Patent number: 8020216
    Abstract: Probe structures and fabrication techniques are described. The described probe structures can be used as probes for various applications such as conductance measurement probes, field emitter probes, nanofabrication probes, and magnetic bit writing or reading probes.
    Type: Grant
    Filed: May 10, 2006
    Date of Patent: September 13, 2011
    Assignee: The Regents of the University of California
    Inventor: Sungho Jin
  • Patent number: 8013291
    Abstract: A method of controlling a mass spectrometer comprises the steps of: supplying a current to a cathode electrode of an ion source having the cathode electrode and an anode electrode, and ionizing a molecules of a gas to be measured; selecting ions generated in the ion source by mass-to-charge ratio; and detecting an ion current value of the selected ions. When a partial pressure of the gas to be measured is measured based on a detection result of the ion current value, a cathode current is supplied to the cathode electrode such that an emission current flowing between the cathode electrode and the anode electrode becomes constant. When a partial pressure of the gas to be measured is not measured, a constant current having a current value less than that of the cathode current is supplied to the cathode electrode.
    Type: Grant
    Filed: April 14, 2008
    Date of Patent: September 6, 2011
    Assignee: Ulvac, Inc.
    Inventors: Toyoaki Nakajima, Yujirou Kurokawa, Tsutomu Yuri, Ryota Tanaka, Jiro Endo, Hitomi Obise
  • Patent number: 8003964
    Abstract: An apparatus includes a yoke having a first end and a second end. The yoke is configured to hold a device that includes an aperture and a range compensation structure. A catch arm is pivotally secured to the first end of the yoke. The catch arm includes a locking feature. The locking feature and the second end of the yoke interface, respectively, to a first retention feature and a second retention feature defined by the aperture and the range compensation structure. The locking feature is configured to interface to the first retention feature and the second end of the yoke is configured to interface to the second retention feature.
    Type: Grant
    Filed: October 11, 2007
    Date of Patent: August 23, 2011
    Assignee: Still River Systems Incorporated
    Inventors: James M. Stark, Stanley J. Rosenthal, Miles S. Wagner, Michael J. Ahearn
  • Patent number: 7989759
    Abstract: In a mass spectrometer having an ion source in which analyte substances are ionized by matrix assisted laser desorption and form an ion beam that travels to a parent ion selector for selecting ions to form daughter ions, the ion beam is reflected in at least one reflector prior to the parent ion selector so that only ions that have both the mass of the parent ions and their kinetic energy are allowed to pass to the parent ion selector. By taking this measure, the mass resolution in the daughter ion spectra is also increased; the improved mass resolution and improved signal-to-noise ratio produce higher sensitivity, even though fewer ions are admitted for analysis in the daughter ion spectrum.
    Type: Grant
    Filed: September 24, 2008
    Date of Patent: August 2, 2011
    Assignee: Bruker Daltonik GmbH
    Inventor: Armin Holle
  • Patent number: 7989785
    Abstract: The present embodiments relate to a gantry for the beam guidance of a particle beam with at least one beam guidance element. A carrier device is rotatably mounted in such a way that the particle beam can be directed by a rotation of the carrier device with the beam guidance element from various angles on to an object to be irradiated. At least one moveable actuating element may adjust a spatial position of the beam guidance element.
    Type: Grant
    Filed: October 14, 2008
    Date of Patent: August 2, 2011
    Assignee: Siemens Aktiengesellschaft
    Inventors: Stephan Emhofer, Werner Kaiser
  • Patent number: 7989758
    Abstract: Fragment ion spectra are acquired in Kingdon ion traps that have a potential well for harmonic oscillations of the ions in the longitudinal direction and in which the ions can oscillate radially in a plane between two or more inner electrodes. Metastable ions, preferably produced by laser desorption, are introduced into the Kingdon ion trap close to the minimum of the longitudinal potential well and stored there locally for a predetermined time period. Excess internal energy in the metastable ions causes most of the ions to decompose ergodically to fragment ions. Then the fragment ions and any remaining analyte ions are excited to execute harmonic oscillations in the longitudinal potential well. The harmonic oscillations are measured as image currents, from which a high-resolution mass spectrum of the fragment ions can be calculated.
    Type: Grant
    Filed: May 19, 2009
    Date of Patent: August 2, 2011
    Assignee: Bruker Daltonik GmbH
    Inventor: Claus Köster
  • Patent number: 7989764
    Abstract: According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.
    Type: Grant
    Filed: August 10, 2007
    Date of Patent: August 2, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Yasuda, Shinji Nagai, Tetsuya Nishida
  • Patent number: 7989762
    Abstract: In an ion source that generates ions by matrix-assisted laser desorption (MALDI), ion acceleration diaphragms having apertures though which ions are accelerated and which have become contaminated by matrix material, are cleaned by temporarily heating the diaphragms. During the cleaning process, the sample support plate is moved aside but remains in the ion source housing, and the heating is preferably limited to regions surrounding the apertures in the diaphragms. In one embodiment, the diaphragms are heated by irradiation generated by infrared laser diodes.
    Type: Grant
    Filed: February 9, 2009
    Date of Patent: August 2, 2011
    Assignee: Bruker Daltonik GmbH
    Inventors: Armin Holle, Jens Hörndorf
  • Patent number: 7982184
    Abstract: A multi-reflecting TOF mass analyser has two parallel, gridless ion mirrors each having an elongated structure in a drift direction (Z). These ion mirrors provide a folded ion path formed by multiple reflections of ions in a flight direction (X), orthogonal to the drift direction (Z). The analyser also has a further gridless ion mirror for reflecting ions in the drift direction (Z). In operation ions are spatially separated according to mass-to-charge ratio due to their different flight times along the folded ion path and ions having substantially the same mass-to-charge ratio are subjected to energy focusing with respect to the flight and drift directions.
    Type: Grant
    Filed: October 12, 2007
    Date of Patent: July 19, 2011
    Assignee: Shimadzu Corporation
    Inventor: Michael Sudakov
  • Patent number: 7982182
    Abstract: The present invention relates to an ion trap with a large trap capacity. A mass spectrometer comprises a first linear ion trap that performs mass selective ejection, and a second linear ion trap that accumulates and then mass selectively ejects ions ejected from the first linear ion trap. Directions of resonant excitation of ions of the first linear ion trap and of the second linear ion trap are orthogonal. Compared to conventional art, sensitivity is significantly improved.
    Type: Grant
    Filed: May 27, 2009
    Date of Patent: July 19, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Masayuki Sugiyama
  • Patent number: 7977627
    Abstract: An ion mobility spectrometer or other ion apparatus has two or three grid electrodes 51 and 52; 151 to 153; 106 and 107; 106? and 107? extending laterally of the ion flowpath. An asymmetric waveform with a dc compensating voltage is applied between the electrodes to produce a field parallel to the ion flow path that affects ions differently according to their field-dependent mobility. This filters or delays different ions selectively in their passage to an ion detector 11, 111, 111? to facilitate discrimination between ions that would otherwise produce a similar output.
    Type: Grant
    Filed: January 9, 2007
    Date of Patent: July 12, 2011
    Assignee: Smith Detection-Watford Limited
    Inventors: Jonathan Richard Atkinson, Alastair Clark, Bruce Alexander Colin Grant, Robert Brian Turner
  • Patent number: 7977658
    Abstract: A flexible infrared delivery apparatus useful for endoscopic infrared coagulating of human or animal blood and tissue or for other uses employs a source of infrared radiation which is not a laser and an elongated flexible fiber optic member which transmits radiation from the source to a contact portion at a distal end of the member and to a material such as human or animal tissue proximate the contact portion. The elongated member has an outer diameter which enables it to be inserted into and through an accessory channel of an endoscope to view the human or animal tissue or material to be treated with infrared radiation. A connector on the proximal end of the member allows the elongated member to be quickly connected to and disconnected from the apparatus where the member is aligned for receiving infrared radiation from the source. The contact portion defines a size, direction and shape of a radiation delivery area from the member to the human or animal tissue or material proximate the contact portion.
    Type: Grant
    Filed: June 12, 2008
    Date of Patent: July 12, 2011
    Assignee: Precision Endoscopic Technologies
    Inventors: Robert M. Stuba, Michael S. Epstein, Richard M. Wolf
  • Patent number: 7977657
    Abstract: An ion radiation therapy machine provides a control of the range of the ion beam that a Bragg peak of the beam is located according to a determined gradient of the dose plan.
    Type: Grant
    Filed: February 27, 2008
    Date of Patent: July 12, 2011
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: Ryan T. Flynn, Thomas R. Mackie
  • Patent number: 7979916
    Abstract: Aspects of the invention are directed to piezoresponse force analysis of a material. A stimulus signal including a first frequency component is applied to a contact point on the material such that the stimulus signal actuates a portion of the material to experience a motion as a result of a piezoelectric effect. A resonant device is coupled to the contact point such that the resonant device experiences a resonant motion at the first frequency component in response to the motion of the material, the resonant motion having a greater displacement than a displacement of the motion of the material, and is substantially unaffected by mechanical properties of the material at the contact point. The resonant motion of the resonant device is detected and processed to produce a measurement representing the piezoresponse of the material at the contact point.
    Type: Grant
    Filed: May 26, 2009
    Date of Patent: July 12, 2011
    Inventors: Bede Pittenger, Kumar Virwani, Benedikt Zeyen
  • Patent number: 7973280
    Abstract: An apparatus is provided that precisely conduct ion beam etching to a sample having the properties of which easily change by electron beam irradiation with no loss of ease of operation and throughput. An apparatus includes an ion beam lens barrel and an electron beam lens barrel, which can observe or measure the conditions of a sample with an electron beam in the process of etching with an ion beam, wherein first, an observation image is obtained that includes the entire process area formed by secondary signals generated by an electron beam, secondly, an irradiation permit area and an irradiation inhibit area are defined in the observation image, and thirdly, electron beam irradiation is restricted only to the irradiation permit area.
    Type: Grant
    Filed: February 11, 2009
    Date of Patent: July 5, 2011
    Assignee: SII Nanotechnology Inc.
    Inventors: Haruo Takahashi, Yutaka Ikku, Yo Yamamoto, Kouji Iwasaki
  • Patent number: 7975315
    Abstract: There is provided an atomic force microscope (AFM) with increase the speed and sensitivity of detection of the resonant frequency shift in a cantilever. An AFM (1) extracts a reference signal and a phase shift signal from a detection signal from a displacement sensor of the cantilever. The reference signal is restrained from a phase change in accordance with the resonant frequency shift. The phase shift signal has a phase shifted in accordance with the resonant frequency shift. The AFM (1) determines the phase difference of the phase shift signal from the reference signal, as the resonant frequency shift. The AFM (1) may detect the phase difference between a plus-minus inversion point on the reference signal and a corresponding plus-minus inversion point on the phase shift signal. The AFM (1) may adjust phase before phase detection. The phase adjustment may move the detection point for the resonant frequency shift defined on the oscillation waveforms to the plus-minus inversion point.
    Type: Grant
    Filed: July 27, 2007
    Date of Patent: July 5, 2011
    Assignee: National University Corporation Kanazawa University
    Inventors: Toshio Ando, Takayuki Uchihashi, Noriyuki Kodera, Naohisa Takahashi