Patents Examined by Jacqueline M. Steady
  • Patent number: 5466927
    Abstract: Apparatus for inspecting the bottom of a container that includes a light sensor positioned to view the container bottom through the open container mouth, a light source positioned externally of the container on the opposite side of the container bottom, and electronics for detecting commercial variations in the container bottom as a function of light energy incident on the sensor. The light source, as viewed by the sensor through the container bottom, is characterized by being elongated radially of the container bottom and narrow transversely of the container bottom. In this way, any variations in the container bottom that refract the line of sight of the sensor in the radial direction, such as mold code rings and baffle scars, are essentially transparent as viewed by the sensor.
    Type: Grant
    Filed: April 8, 1994
    Date of Patent: November 14, 1995
    Assignee: Owens-Brockway Glass Container Inc.
    Inventors: Timothy A. Kohler, James A. Ringlien
  • Patent number: 5461237
    Abstract: In an apparatus which positions an average plane thereof parallel to a best focus plane of a projection optical system even if there is unevenness on a wafer, a leveling stage is tilted on the basis of detection signal from an auto-leveling system and a surface of a shot area on a wafer is positioned in a predetermined tilt position relative to a focus plane of the projection optical system. While such a position being kept unchanged, a deviation between the focus plane of the projection optical system and the surface of the shot area is detected at each of multi-points. Within the shot area, by the use of auto-focus system, an amount of relative tilt between an average plane of the shot area obtained from plural deviations and the focus plane of the projection optical system is calculated, and by the use of thus calculated amount of tilt and the detection signal of auto-leveling system, the focus plane of the projection optical system is positioned in parallel with the average plane of the shot area.
    Type: Grant
    Filed: July 26, 1994
    Date of Patent: October 24, 1995
    Assignee: Nikon Corporation
    Inventors: Shinji Wakamoto, Yuji Imai, Yasuaki Tanaka
  • Patent number: 5459310
    Abstract: An apparatus for sensing different attenuation windows within an optical scanner which adjusts the power level of a laser to a maximum safe power level. The apparatus includes an attenuation sensor which senses the amount of attenuation of the laser beam by a first attenuation window, and a laser power adjuster which changes the laser power level to an optimal but safe level based upon the sensed amount of attenuation of the laser beam. The apparatus may also include a detection circuit having a threshold detection level which is capable of being adjusted based upon the laser power level.
    Type: Grant
    Filed: May 4, 1994
    Date of Patent: October 17, 1995
    Assignee: AT&T Global Information Solutions Company
    Inventors: Duanfeng He, Donald A. Collins, Jr., Daniel B. Seevers, Stephen J. Ames
  • Patent number: 5457312
    Abstract: A method and apparatus for counting flat sheets of specularly reflective material juxtaposed in side by side relationship including a source of a parallel, collimated, beam of light adapted for movement to shine on a finite point across sides of a plurality of flat sheets at a shallow, acute angle of incidence relative to the sides of the flat sheets such that the beam of light is specularly reflected from the sides of the flat sheets except at one terminal edge of each side of the flat sheets where the beam of light is diffusely reflected, a sensor for sensing light diffusely reflected from the terminal edge of each of the flat sheets and generating an output signal in response to the intensity of the diffusely reflected light, and a microprocessor receiving the output signal from the sensor and generating a numerical count of the flat sheets over which the beam of light has been moved.
    Type: Grant
    Filed: August 24, 1994
    Date of Patent: October 10, 1995
    Assignee: Ford Motor Company
    Inventor: Tahir M. Mansour
  • Patent number: 5451768
    Abstract: A test system for a photosensitive array includes an on-board test circuit with a single input terminal, wherein the output of the test circuit directly affects the value of a bias charge placed on a selected photodiode. The test circuit enables a quick test for the presence of a desired bias charge when a digital-high voltage is entered on the single input terminal, and also enables a more precise test of photodiode response linearity by application of a predetermined analog voltage to the single input terminal.
    Type: Grant
    Filed: November 14, 1994
    Date of Patent: September 19, 1995
    Assignee: Xerox Corporation
    Inventors: Paul A. Hosier, Scott L. Tewinkle
  • Patent number: 5440115
    Abstract: The invention employs a reverse biased zener diode in the output circuit of a single stage or multistage electron multiplier. In a multistage device, a bypass resistor is employed between stages for increasing the bias current in downstream stages which operates at reduced potential whereby power dissipation is minimized.
    Type: Grant
    Filed: April 5, 1994
    Date of Patent: August 8, 1995
    Assignee: Galileo Electro-Optics Corporation
    Inventors: Anthony S. Bauco, Alan M. Then
  • Patent number: 5432331
    Abstract: A focus detecting system is provided for detecting the focus condition of a moving image in an optical system. The focus detecting system includes means for detecting the sharpness of a plurality of sub-images formed along a plurality of sight lines by the optical system, the detecting means including a plurality of detectors arranged in a plane tilted with respect to an optical axis of said optical system and the detectors aligned with a direction of motion of the image formed by the optical system such that the sub-images are detected at a plurality of positions in the vicinity of best focus of the optical system. A time delay is provided between the sub-images such that the sub images represent the same portion of a scene being imaged by the optical system. A position of best focus for said optical system is calculated from the sub-image data.
    Type: Grant
    Filed: June 7, 1994
    Date of Patent: July 11, 1995
    Assignee: Eastman Kodak Company
    Inventor: Alan Wertheimer
  • Patent number: 5430305
    Abstract: An apparatus and method are described for analyzing an integrated circuit (IC), The invention uses a focused light beam that is scanned over a surface of the IC to generate a light-induced voltage alteration (LIVA) signal for analysis of the IC, The LIVA signal may be used to generate an image of the IC showing the location of any defects in the IC; and it may be further used to image and control the logic states of the IC. The invention has uses for IC failure analysis, for the development of ICs, for production-line inspection of ICs, and for qualification of ICs.
    Type: Grant
    Filed: April 8, 1994
    Date of Patent: July 4, 1995
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Edward I. Cole, Jr., Jerry M. Soden
  • Patent number: 5430290
    Abstract: The present invention relates to a photosensitive element (1) for detecting flashes of light (2).According to the invention, said photosensitive element (1) includes a control device (4) knowing the instant of the emission of the flashes of light (2) and capable of switching said photosensitive element into one or the other of two different states:a positive accumulation state in which the accumulation capacitor (12) is charged by the light energy from said photosensitive element (1); anda negative accumulation state in which the accumulation capacitor (12) is discharged by the light energy from said photosensitive element (1).
    Type: Grant
    Filed: June 28, 1994
    Date of Patent: July 4, 1995
    Assignee: Societe Nationale Industrielle et Aerospatiale
    Inventors: Jean-Pierre Merle, Francis Devos
  • Patent number: 5424555
    Abstract: A scanner as a film analyzer, which inspects a frame on photo film, is consecutively supplied with the film by a notcher, which forms a notch in the film. The scanner includes an image area sensor which subjects the frame on the film to photometry. A pair of feeding rollers feed the film, so the film passes the photometric station. A winding shaft winds the film fed from the photometric station. A dancer roller displaces one portion of the film from a feeding path to form a loop. A set of loop checking sensors is disposed with the dancer roller, and checks displacement of the film in comparison with a predetermined upper limit. The notcher is disabled if the film displacement is greater than the upper limit. The displacement of the film is checked in comparison with a predetermined lower limit. The image area sensor is disabled if the film displacement is smaller than the lower limit.
    Type: Grant
    Filed: May 31, 1994
    Date of Patent: June 13, 1995
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Tsutomu Kimura, Shigeru Tanaka, Junji Sugano
  • Patent number: 5424553
    Abstract: A method for aligning a lenticular material for the printing of an image onto a printing surface of a lenticular material for the purpose of forming a 3-D image is disclosed comprising the steps of:a) directing a radiation beam to the lenticular material such that at least one of the lenticules focuses the radiation beam at the printing surface of the lenticular material;b) positioning a radiation sensitive array at a reference position that will yield a maximum sensed radiation when the position of the focused radiation beam on the printing surface of the lenticular material is in correct printing alignment; andc) adjusting the position of the lenticular material to maximize the radiation sensed by the radiation sensitive array.
    Type: Grant
    Filed: May 16, 1994
    Date of Patent: June 13, 1995
    Assignee: Eastman Kodak Company
    Inventor: Roger A. Morton
  • Patent number: 5420414
    Abstract: Night vision goggles that is internally modified such as to provide a reatic simulator without activation of any night vision enhancement and includes a depth perception loss. An assembly is positioned after the objective assembly on the same optical axis for the transfer of the focused incoming light, which light is also color filtered. A fiber optic rod achieves the transfer of the focused incoming light without any use of an image intensifier tube.
    Type: Grant
    Filed: May 5, 1994
    Date of Patent: May 30, 1995
    Assignee: The United States of America as represented by The Secretary of the Army
    Inventor: Edwin W. Wentworth