Abstract: A guided cold-atom inertial sensor system comprises an atom trap integrated platform, a laser system, a magnetic field system, a control system, and a computing system. The laser system and magnetic field system are adapted to form a magneto-optical trap (MOT) about a suspended waveguide of the atom trap integrated platform made of membrane integrated photonics. After loading cold atoms from a MOT, the photonic atom trap integrated platform generates one-dimensional guided atoms with an evanescent field optical dipole trap (EF-ODT) along the optical waveguide to create guided atomic accelerometers/gyroscopes. Motion of atomic wavepackets in a superposition state is created along the guided atom geometry by way of state-dependent momentum kicks. The light-pulse sequence of guided atom interferometry splits, redirects, and recombines atomic wavepackets, which allows measurement of atom interference fringes sensitive to inertial forces via a probe laser.

Abstract: A cleaning device for cleaning electrodes of an ion optical multipole device comprises at least one substantially longitudinal cleaning section, at least one handling section extending axially from the at least one cleaning section and at least one direction section extending axially from the at least one cleaning section. The at least one cleaning section has a larger cross section than the at least one handling section. The at least one direction section is capable of allowing a longitudinal movement of the cleaning device in a first axial direction and resisting a longitudinal movement of the cleaning device in a second, opposite axial direction.

Abstract: A beam arrangement portion is provided to arrange multiple primary electron beams on a substrate. The beam arrangement portion arranges the multiple primary electron beams in a square lattice along a first moving direction of a stage allowing the substrate to be placed thereon and a second moving direction perpendicular to the first moving direction in a state where, when the multiple primary electron beams are viewed as a whole, beams around four corners of the square lattice are omitted.

Abstract: There is provided a system and a method comprising obtaining a first (respectively second) image of an area of the semiconductor specimen acquired by an electron beam examination tool at a first (respectively second) illumination angle, determining a plurality of height values informative of a height profile of the specimen in the area, the determination comprising solving an optimization problem which comprises a plurality of functions, each function being representative of a difference between data informative of a grey level intensity at a first location in the first image and data informative of a grey level intensity at a second location in the second image, wherein, for each function, the second location is determined with respect to the first location, or conversely, when solving the optimization problem, wherein a distance between the first and the second locations depends on the height profile, and the first and second illumination angles.

Abstract: A mass analyser for use in a mass spectrometer, the mass analyser having: a set of sector electrodes spatially arranged to provide an electrostatic field in a 2D reference plane suitable for guiding ions along an orbit in the 2D reference plane, wherein the set of sector electrodes extend along a drift path that is locally orthogonal to the reference plane so that, in use, the set of sector electrodes provide a 3D electrostatic field region; and an injection interface configured to inject ions into the mass analyser via an injection opening such that the ions injected into the mass analyser are guided by the 3D electrostatic field region along a 3D reference trajectory according to which ions perform multiple turns within the mass analyser whilst drifting along the drift path, wherein each turn corresponds to a completed orbit in the 2D reference plane.

Abstract: Apparatus, methods and instructions for disinfecting air. The apparatus may include, and the methods may involve, a fixture. The fixture may include a germicidal light source. The fixture may include a fan. The fan may circulate air through a volume into which the germicidal light source propagates germicidal light. The light source may be configured to emit, upward from a horizontal plane, a beam that, absent reflection off an environmental object, does not cross the horizontal plane. The apparatus may include a shield that prevents light from the light source from crossing the horizontal plane. The sensor may face upward from the horizontal plane. The sensor may face downward from the horizontal plane.

Abstract: A matter-wave gyro with counter-propagating traps uses three-dimensional lattices formed of interference fringes from three pairs of interfering laser beams. Particles, such as neutral atoms, ion, or molecules are cooled to a ground state near absolute zero. The resulting ultra-cold particles are loaded into the lattices. The laser beams used to form the lattices are driven according to functions that cause the lattices to counter-propagate about a closed path (Sagnac loop) N times, where a desired tradeoff between spatial resolution and temporal resolution can be achieved by choosing an appropriate integer value of N. The lattices can be extinguished so that the particles can be imaged to identify an interference pattern. A shift in the interference pattern relative to an interference pattern that would occur with zero angular momentum can be used to measure angular momentum.

Abstract: To provide a particle beam treatment system and a method for renewing facilities of the particle beam treatment system with which the facilities can be renewed efficiently. A particle beam treatment system 1 includes a charged particle beam generation device 2 that generates a charged particle beam Bm, a first irradiation device 4(1) that irradiates the charged particle beam to a predetermined irradiation target, a first beam transportation device 3(1) that transports the charged particle beam from the charged particle beam generation device 2 to the first irradiation device 4(1), and a first vacuum valve 33(1) that is arranged in the first beam transportation device 3(1).

Abstract: Sanitizing an agricultural facility by placing a chamber having an open interior within the agricultural facility. An item is placed within an open interior of the chamber and a door is interlocked. Then light having a spectral content within a narrow range of wavelengths is provided from at least one lighting device toward the item for a predetermined amount of time to inactivate a microorganism. Simultaneously, ozone may be discharged into the open interior to sanitize the item. Before the door unlocks the ozone within the interior of the chamber is directed to a filter for forming oxygen. Sanitizing the agricultural facility by detect humans, and in response, providing a first light with one spectral content when the human is detected, and providing a second light with a different spectral content within a narrow range of wavelengths to inhibit bacteria growth when humans are not detected.

Abstract: Methods and systems are provided herein for selectively removing product ions resulting from an ECD dissociation event from the interaction region of an ECD reaction cell, while other precursor peptide ions continue to undergo ECD within the interaction region, thereby reducing or preventing the occurrence of multiple electron capture events by the product ions. In some aspects, the preferential extraction of product ions from the interaction region during the ECD reaction can occur without an auxiliary AC field being generated within the interaction region. Additionally, in some aspects, the methods and systems disclosed herein can subject the various product ions to a non-dissociative charge reduction via exposure to reagent ions of the opposite polarity so as to selectively concentrate product ions to a lower charge state.

Abstract: The invention generally relates to systems and methods for isolating a target ion in an ion trap. In certain aspects, the invention provides a system that includes a mass spectrometer having an ion trap, and a central processing unit (CPU). The CPU includes storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply a dual frequency waveform to the ion trap that ejects non-target ions from the ion trap while retaining a target ion in the ion trap.

Abstract: A charged particle multi-beam device includes a charged particle source, a collimator lens, a multi-light-source forming unit, and a reduction projection optical system. The multi-light-source forming unit has first to third porous electrodes disposed side by side in an optical axis direction. A plurality of holes for causing the multi-beams to pass is formed in each of the first to third porous electrodes. The first porous electrode and the third porous electrode have the same potential and the second porous electrode has potential different from the potential of the first porous electrode and the third porous electrode. A diameter of the holes on the second porous electrode is formed larger further away from an optical axis such that a surface on which the multi-light sources are located is formed in a shape convex to the charged particle source side.

Abstract: Provided is a mass separator (100) for performing mass separation for an ion beam (IB). The mass separator (100) includes a transfer structure (30) that is a component of a yoke (13) and move at least one of an upper yoke (13a) positioned over the beam path (L), a lower yoke (13b) positioned under the beam path (L), and a side yoke (13c, 13d) positioned at a side of the beam path (L) between a normal position (P) in the traveling of the ion beam (IB) and a retracted position (Q) that does not overlap with at least a part of the normal position (P); the yoke (13) is surrounding the beam path (L) and is made of a magnetic body.

Abstract: A personal radiation protection garment apparatus is described. The garment is equipped with multiple layers, including a central protective layer, which helps to prevent the unwanted application of radiation to an individual when worn. Multiple sections of the garment are joined by overlapping seams. The protective layer includes a first and a second partially lapping radiation-protective panels, with the first panel attached to the first layer at a first attachment zone, and the second panel attached to the second layer at a second attachment zone. The first panel is configured to overlap the second panel across the second attachment zone, providing a continuous protective covering of the second attachment zone, and the second panel overlaps the first panel across the first attachment zone as well.

Abstract: A uniaxial counter-propagating monolaser atom trap cools and traps atoms with a single a laser beam and includes: an atom slower that slows atoms to form slowed atoms; an optical diffractor including: a first diffraction grating that receives primary light and produces first reflected light; a second diffraction grating that receives primary light and produces second reflected light; and a third diffraction grating that receives the primary light and produces third reflected light; and a trapping region that forms trap light from the reflected lights and receives slowed atoms to produce trapped atoms from the slowed atoms that interact with the trap light.

Abstract: A LED structure, a lighting fixture and a method of providing white light illumination. The LED structure comprises a substrate; a light emitting area defined on the substrate as a cavity; a first type of light emitting semiconductor source with bactericidal characteristics mounted in the cavity; a second type of light emitting semiconductor source mounted in the cavity with ability to excite the wavelength conversion material to generate white light; and a wavelength conversion material layer formed on top of the light emitting semiconductor sources. The invention enables disinfection by a lighting source or a luminaire visibly apparent to human as a white light source that is neither harmful to a human nor creates discomfort.

Abstract: A method of controlling a transmission electron microscope includes: causing a first magnetic field lens to generate a first magnetic field and causing a second magnetic field lens to generate a second magnetic field; causing the magnetic field applying unit to generate a magnetic field of a direction along an optical axis on a specimen mounting surface; and changing excitations of the first excitation coil and the second excitation coil to correct a deviation of a focal length of an objective lens due to the magnetic field generated by the magnetic field applying unit.

Abstract: Techniques for operating an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the techniques comprising using a controller to perform: obtaining, based on at least one intrinsic parameter of the cantilever, a first quality factor and a first free oscillation amplitude, wherein the cantilever exhibits only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor; and controlling the cantilever to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near a resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.

Abstract: Disclosed herein are compositions for ionizing a target and methods for making the compositions. In some embodiments, the compositions can include a structured substrate having a plurality of upright surface features, for example, microscale or nanoscale pillars, in contact with an initiator. Also disclosed herein are methods for ionizing targets.

Abstract: An AFM that suppress parasitic deflection signals is described. In particular, the AFM may use a cantilever with a probe tip that is offset along a lateral direction from a longitudinal axis of torsion of the cantilever. During AFM measurements, an actuator may vary a distance between the sample and the probe tip along a direction approximately perpendicular to a plane of the sample stage in an intermittent contact mode. Then, a measurement circuit may measure a lateral signal associated with a torsional mode of the cantilever during the AFM measurements. This lateral signal may correspond to a force between the sample and the probe tip. Moreover, a feedback circuit may maintain, relative to a threshold value: the force between the sample and the probe tip; and/or a deflection of the cantilever corresponding to the force. Next, the AFM may determine information about the sample based on the lateral signal.