Patents Examined by Jeff Natalini
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Patent number: 8970203Abstract: A field device comprising a signal processing unit that generates a digital measurement, control or regulation signal, and comprises an output stage that converts the digital measurement, control or regulation signal into an analog voltage or current signal, The field device also includes a monitoring device which comprises a measuring device that detects the analog voltage or current signal and converts this signal into a digital voltage or current measurement signal, a first digital low-pass filter for filtering the digital measurement, control or regulation signal, a second digital low-pass filter having the same cut-off frequency as that of the first digital low-pass filter, a comparator downstream of the low-pass filters, and an evaluation device that generates an error message when the deviation between the compared signals exceeds a pre-determined level.Type: GrantFiled: October 30, 2009Date of Patent: March 3, 2015Assignee: Siemens AktiengesellschaftInventor: Marco Enrique Idiart
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Systems, methods, and apparatus for locating possible fault locations in an electrical power network
Patent number: 8963557Abstract: Certain embodiments of the invention may include systems, methods, and apparatus for locating possible fault locations in an electrical power network. According to an example embodiment of the invention, a method is provided for locating possible fault locations in an electrical power network. The method can include receiving fault information including one or more of: an identifier associated with at least one tripping device or a fault impedance value associated with a faulted section of the electrical power network; determining a fault direction; and generating a list of possible fault locations based at least in part on the received fault information and the fault direction.Type: GrantFiled: September 6, 2011Date of Patent: February 24, 2015Assignee: General Electric CompanyInventors: Ramon Juan San Andres, Blaine Madison Mucklow, Shitanshu Srivastava -
Patent number: 8963563Abstract: A capacitive sensor for detecting the presence of a substance includes a plurality of upstanding conductive pillars arranged within a first layer of the sensor, a first electrode connected to a first group of the pillars, a second electrode connected to a second, different group of the pillars, and a dielectric material arranged adjacent the pillars, for altering the capacitance of the sensor in response to the presence of said substance.Type: GrantFiled: December 16, 2010Date of Patent: February 24, 2015Assignee: NXP B.V.Inventors: Aurelie Humbert, Matthias Merz, Youri Victorovitch Ponomarev, Roel Daamen, Marcus Johannes Henricus van Dal
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Patent number: 8952709Abstract: The present disclosure relates to a method for measuring a capacitance of a pair of electrodes including charging the pair of electrodes and transferring the charge between the pair of electrodes and a sampling capacitor, and a measuring step representative of the capacitance of the pair of electrodes according to the voltage at the terminals of the sampling capacitor according to the number of cycles executed so that the voltage at the terminals of the sampling capacitor reaches a threshold voltage. According to the present disclosure, the method comprises an initial step of charging the sampling capacitor between a first voltage and a second intermediate voltage in between the first voltage and a third voltage greater than or equal to a ground voltage, the pair of electrodes being charged between the second voltage and the third voltage. The present disclosure applies in particular to the control of a touch pad.Type: GrantFiled: December 1, 2011Date of Patent: February 10, 2015Assignee: STMicroelectronics (Rousset) SASInventors: Maxime Teissier, Laurent Beyly, Cyril Troise
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Patent number: 8947098Abstract: An ionization gauge that measures pressure has an electron source that emits electrons, and an anode that defines an ionization space. The gauge also includes a collector electrode to collect ions formed by an impact between the electrons and a gas and to measure pressure based on the collected ions. The electron source is dynamically varied in emission current between a plurality of emission levels dependent on pressure and a second parameter other than pressure. The ionization gauge may also vary various operating parameters of the gauge components according to parameters stored in a non-volatile memory and selected by a user.Type: GrantFiled: March 18, 2011Date of Patent: February 3, 2015Assignee: MKS Instruments, Inc.Inventors: Larry K. Carmichael, Jesse A. Weber, John H. Henry, Michael N. Schott, Gerardo A. Brucker, Kenneth D. Van Antwerp, Jr.
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Patent number: 8947105Abstract: In one embodiment, a system includes a touch sensor comprising a first set of electrodes and a first set of bond pads electrically coupled to the first set of electrodes. The system also includes a second set of bond pads capacitively coupled to the first set of bond pads. Each bond pad of the second set of bond pads is coincident with a bond pad of the first set of bond pads. The system also includes a circuit electrically coupled to the second set of bond pads such that signals may be communicated from the first set of bond pads to the circuit.Type: GrantFiled: December 1, 2011Date of Patent: February 3, 2015Assignee: Atmel CorporationInventor: David Brent Guard
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Patent number: 8947070Abstract: An apparatus and method for testing driver write-ability strength on an integrated circuit includes one or more drive detection units each including a number of drivers. At least some of the drivers may have a different drive strength and each may drive a voltage onto a respective driver output line. Each drive detection unit may include a number of keeper circuits, each coupled to a separate output line and configured to retain a given voltage on the output line to which it is coupled. Each detection unit may also include a number of detection circuits coupled to detect the drive voltage on each of the output lines. In one implementation, the drive voltage appearing at the output line of each driver may be indicative of that the driver was able to overdrive the voltage being retained on the output line to which it is coupled by the respective keeper circuits.Type: GrantFiled: January 17, 2012Date of Patent: February 3, 2015Assignee: Apple Inc.Inventors: Ashish R. Jain, Edgardo F. Klass
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Patent number: 8937477Abstract: The invention provides a biochemical measuring device including: a measuring unit configured to measure a base current and a peak current; a time counting unit configured to count an elapsed time from the contact of a sensor electrode to a reference solution until the start of measurement of the base current; and a control unit, wherein the control unit acquires a concentration of a specific substance using the base current value when the elapsed time is equal to or longer than a stationarizing time, and when it is shorter than the stationarizing time, acquires the concentration of the specific substance using the stationary base current value measured by the measuring unit when the elapsed time is shorter than the stationarizing time instead of the current value of the base current.Type: GrantFiled: March 19, 2012Date of Patent: January 20, 2015Assignee: Tanita CorporationInventor: Tatsuro Murayama
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Patent number: 8928334Abstract: An apparatus relating to on-chip noise measurement is disclosed. In such an apparatus, an asynchronous comparator receives a first input and a second input to provide a digital output. A threshold voltage generator receives a first periodic signal and a second periodic signal to provide the second input as an analog voltage responsive to the first and second periodic signals. A sampling circuit is coupled to receive the digital output signal and a third periodic signal. The sampling circuit is configured to sample the digital output signal using the third periodic signal to provide a sampled signal of the digital output signal. A processor is coupled to receive a delay signal and the sampled signal to determine a noise measurement signal for the first input signal.Type: GrantFiled: December 20, 2012Date of Patent: January 6, 2015Assignee: Xilinx, Inc.Inventors: Mayank Raj, Didem Z. Turker Melek
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Patent number: 8928330Abstract: A ground leakage current measurement apparatus in an ungrounded DC power system including positive and negative electric lines includes a switching unit configured to perform switching to supply measurement power to a positive side ground resistor and a negative side ground resistor by using power of the electric lines; a measurement unit connected between the switching unit and the ground and configured to measure at least one of positive and negative side ground leakage currents; and a control unit configured to control the switching unit to discriminate a positive side ground leakage current operation and a negative side ground leakage current operation of the measurement unit.Type: GrantFiled: September 16, 2011Date of Patent: January 6, 2015Assignee: Weal Electro Co., LtdInventors: Young-Chul Kim, Soon-Suk Kim
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Patent number: 8928333Abstract: A method for measuring s-parameters of an N-port device under test (DUT), using an N-port test fixture and a network analyzer. The method includes: measuring calibration errors of the N-port test fixture using a reduced set of N/2 calibration standards; measuring calibration errors due to the network analyzer by calibrating only the network analyzer using analyzer-only calibration standards; isolating test fixture s-parameters errors using results of the analyzer-only calibration standards measurement and the N-port test fixture calibration standard measurement; measuring the s-parameters errors of the DUT; and correcting the s-parameters errors of the DUT corresponding to the isolated test fixture s-parameters errors and the calibration errors of the network analyzer.Type: GrantFiled: November 30, 2011Date of Patent: January 6, 2015Assignee: Raytheon CompanyInventors: Darren E. Atkinson, Scott A. Avent
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Patent number: 8907691Abstract: A system and method are provided for testing an integrated circuit (IC) using thermally induced noise analysis. The method provides an IC die and supplies electrical power to the IC die. The IC die surface is scanned with a laser, and the laser beam irradiated locations on the IC die surface are tracked. The laser scanning heats active electrical elements underlying the scanned IC die surface. A frequency response of an IC die electrical interface is measured and correlated to irradiated locations. IC die defect regions are determined in response to identifying location-correlated frequency measurements exceeding a noise threshold. For example, a frequency measurement may be correlated to a die surface location, and if frequency measurement exceeds the noise threshold, then circuitry underlying that surface area may be identified as defective. Typically, die defect regions are associated with measurements in the frequency range between about 1 Hertz and 10 kilohertz.Type: GrantFiled: June 24, 2009Date of Patent: December 9, 2014Assignee: Applied Micro Circuits CorporationInventor: Joseph Martin Patterson
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Patent number: 8896287Abstract: A cable identification system is provided. The cable identification system includes a cable having a plurality of conductors with an electrical connector secured to at least one end. All but one of the conductors are enclosed in a shield conductor. The remaining additional conductor is positioned external to the outer surface of the shield conductor. The electrical connector is adapted to connect the plurality of conductors to a mating connector. The cable identification system further includes a signal generator adapted to connect the electrical connector to the mating connector. The signal generator is configured to generate and transmit a unique signal over the additional conductor in the cable. The cable identification system further includes a portable device configured to detect the unique signal when positioned adjacent the cable at any point along the cable.Type: GrantFiled: November 30, 2011Date of Patent: November 25, 2014Assignee: International Business Machines CorporationInventors: Tamer E. Abuelsaad, John E. Moore, Jr., Rajeshkumar N. Singi, Robert R. Wentworth
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Patent number: 8896286Abstract: A cable identification system is provided. The cable identification system includes a multiconductor cable with an electrical connector secured to at least one end. The electrical connector is adapted to connect a plurality of conductors in the cable to a mating connector. The cable identification system further includes a signal generator adapted to connect the electrical connector to the mating connector. The signal generator is configured to select an unused conductor from the plurality of conductors and generate and transmit a unique signal over the selected conductor in the cable. The cable identification system further includes a portable device configured to detect the unique signal when positioned adjacent the cable at any point along the cable.Type: GrantFiled: November 30, 2011Date of Patent: November 25, 2014Assignee: International Business Machines CorporationInventors: Tamer E. Abuelsaad, John E. Moore, Jr., Rajeshkumar N. Singi, Robert R. Wentworth
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Patent number: 8890533Abstract: An apparatus for inspecting a light emitting diode (LED) package is provided to inspect an LED to determine whether or not it is defective, and discard the LED when the LED is defective. The apparatus for inspecting an LED package includes: an inspection unit inspecting an LED through a visual inspection to determine whether or not the LED is defective; and a defective product rejection unit discarding the LED when the LED is determined to be defective on the basis of inspection results from the inspection unit among LEDs supplied from the inspection unit. Because the operation of inspecting LEDs and discarding a defective LED are automated and can be rapidly processed as a sequential process, productivity can be improved.Type: GrantFiled: December 1, 2010Date of Patent: November 18, 2014Assignee: Samsung Electronics Co., Ltd.Inventors: Ssang Gun Lim, Seung Gyu Ko, Dae Kab Kwon, Ju Hun An, Won Soo Ji
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Patent number: 8890537Abstract: An arc detection system includes a radio frequency (RF) signal probe that senses a RF signal at an input of a RF plasma chamber and that generates a signal based on at least one of the voltage, current, and power of the RF signal. A signal analyzer receives the signal, monitors the signal for frequency components that have a frequency greater than or equal to a fundamental frequency of the RF signal, and generates an output signal based on the frequency components. The output signal indicates that an arc is occurring in the RF plasma chamber.Type: GrantFiled: April 21, 2010Date of Patent: November 18, 2014Assignee: MKS Instruments, Inc.Inventors: John Valcore, Jr., Yufeng Han, Jonathan Smyka, Salvatore Polizzo, Aaron T. Radomski
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Patent number: 8890547Abstract: A capacitive sensor may include a transmit electrode and a receive electrode capacitively coupled with the transmit electrode. A capacitance sensing circuit senses a capacitance between the transmit and receive electrodes by applying a signal to the transmit electrode and rectifying a signal induced at the receive electrode. A compensation circuit reduces the effect of a mutual and parasitic capacitances of the transmit and receive electrode pair by adding a compensation signal to the rectified signal.Type: GrantFiled: January 6, 2012Date of Patent: November 18, 2014Assignee: Cypress Semiconductor CorporationInventors: Andriy Maharyta, Viktor Kremin
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Patent number: 8878544Abstract: An electric leakage sensing apparatus includes a coupling capacitor having one end connected to a DC power supply, a pulse generator that supplies a pulse to the other end of the coupling capacitor, a voltage detector that detects a voltage at the coupling capacitor charged by the pulse, an electric leakage determination part that compares the voltage detected by the voltage detector to a threshold value, and makes a determination of existence or non-existence of an electric leakage of the DC power supply based on a comparison result, and a booster circuit that applies a boosted pulse voltage to the coupling capacitor. The pulse generator converts an output voltage of the booster circuit into the pulse voltage. The voltage detector includes an offset voltage generating circuit that generates an offset voltage.Type: GrantFiled: September 12, 2012Date of Patent: November 4, 2014Assignee: Omron Automotive Electronics Co., Ltd.Inventors: Masato Kasashima, Masaki Fujii, Takeshi Sekine, Takahiro Saito
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Patent number: 8866493Abstract: A capacitance sensing system can include a noise detector coupled to a capacitance sensing network that generates a noise detect signal in response to noise; a delay circuit coupled to generate at least two different delayed sense signals in response to outputs from the capacitance sensing network; and a switch circuit that selectively outputs one of the delayed sense signals in response to the noise detect signal. Particular embodiments can include selectively discarding discrete analog samples of a capacitance signal when noise is detected in such a sample.Type: GrantFiled: August 24, 2011Date of Patent: October 21, 2014Assignee: Cypress Semiconductor CorporationInventors: Victor Kremin, Erik Anderson
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Patent number: 8866487Abstract: A directional fault sectionalizing system that utilizes one phase voltage measurement and three phase current measurements to determine the directionality of high impedance faults on a three phase electric power circuit. This eliminates the need for two of the three voltage measuring devices at each monitoring station conventionally required to determine fault directionality, which makes it economical to install at a greater number of distribution tap points. The system is particularly useful for commonly used three-way tap points along distribution lines where three phase voltage measurement is not readily available. The system is capable of identifying faults under challenging circumstances, such faults occurring on unbalanced three phase power lines and faults occurring on tapped line segments where the currents are relatively small compared to the currents flowing in the main line segments.Type: GrantFiled: September 12, 2011Date of Patent: October 21, 2014Assignee: Southern States, LLCInventors: Joseph R. Rostron, John H. Brunke, Bradley John Schafer, Richard Charles Leonhardt, David Lester Moore