Abstract: A method of preparation and optical analysis of a solid sample by multiple internal reflection infrared spectroscopy comprising: obtaining a least one substrate that is transparent to infrared light and comprises at least a main front face and a main rear face; producing at least one solid sample on the main front face of the substrate; installing around at least one part of the sample an element comprising a chamber having an aperture that opens onto the solid sample and defines a leaktight interaction zone (Zi) in relation to the outside of the chamber; feeding the chamber with a fluid with controlled parameters to control the environment in the leaktight interaction zone; sending an infrared light beam through the substrate; and recovering the beam after it has undergone multiple internal reflections in the substrate.

Abstract: A radiation detector includes: a radiation detecting module including a photoconductive layer containing at least one heavy metal; a voltage controller configured to detect current flowing through the photoconductive layer and control application of a voltage to the photoconductive layer based on the detected current; and a sealing part configured to seal the photoconductive layer and surround a portion of the radiation detecting module.

Abstract: A photo-detector device may include a substrate having a bottom surface. The photo-detector device may further include a photocell secured to the bottom surface of the substrate. The photo-detector device may further include a metallic block having a top portion secured to a bottom surface of the substrate to enclose the photocell, wherein an opening is formed within the metallic block that extends from the top portion of the metallic block to a bottom portion of the metallic block to form an aperture for light to travel through the metallic block to the photocell. The photo-detector device may further include a member insertable into the metallic block to vary an open area of the aperture.

Abstract: Apparatus and methods for fluorescence imaging using radiofrequency multiplexed excitation. One apparatus splits an excitation laser beam into two arms of a Mach-Zehnder interferometer. The light in the first beam is frequency shifted by an acousto-optic deflector, which is driven by a phase-engineered radiofrequency comb designed to minimize peak-to-average power ratio. This RF comb generates multiple deflected optical beams possessing a range of output angles and frequency shifts. The second beam is shifted in frequency using an acousto-optic frequency shifter. After combining at a second beam splitter, the two beams are focused to a line on the sample using a conventional laser scanning microscope lens system. The acousto-optic deflectors frequency-encode the simultaneous excitation of an entire row of pixels, which enables detection and de-multiplexing of fluorescence images using a single photomultiplier tube and digital phase-coherent signal recovery techniques.

Abstract: A radiation detector includes a plurality of pixels configured to detect radiation, and at least one of the plurality of pixels includes a radiation absorbing layer configured to convert photons incident on the radiation absorbing layer into a first electrical signal, and a photon processor including a plurality of storages configured to count and store the number of the photons based on the first electrical signal. At least one of the plurality of storages is configured to compare the first electrical signal with a first reference value to obtain a second electrical signal, and count and store the number of the photons based on a third electrical signal that is obtained based on a comparison of the second electrical signal with a second reference value.

Abstract: A sensor to detect information on a subject by using an electromagnetic wave includes a transmitting unit having a generating element and a first antenna, a polarization converting unit, and a receiving unit having a second antenna and a detecting device. The generating element generates an electromagnetic wave, and the first antenna emits the electromagnetic wave generated by the generating element as first polarization. The polarization converting unit converts the first polarization into second polarization by changing a polarization direction of the first polarization. The second antenna receives the second polarization, and the detecting device detects the electromagnetic wave received by the second antenna. The transmitting unit and the receiving unit are disposed on the same substrate.

Abstract: A method for detecting both gamma-ray events and neutron events with a common detector, where the detector includes a layer of semiconductor material bounded by electrodes, and the electrodes include an anode on one side of the semiconductor material and a cathode on the other side of the semiconductor material, includes the following steps: (a) monitoring the electrical signal at each of the anode and the cathode; and (b) comparing the magnitude of the signals at the anode and the cathode, and the transit time difference between the start of the anode signal and the time when the anode signal reaches a maximum, relatively constant value. In the comparing step, predetermined criteria are used to differentiate between gamma-ray events and neutron events.

Abstract: A tracer composite comprises a tracer disposed in a metal-based carrier which comprises: a cellular nanomatrix and a metal matrix disposed in the cellular nanomatrix, wherein the tracer is detectable at a range of from about 1 ppt to about 1,000 ppm.

Abstract: A resin identification device capable of measuring samples having various shapes is provided. The resin identification device includes a Fourier transform infrared spectrophotometer (FTIR), and sample placing plates 31 and 32 having an opening 33. The FTIR includes: an infrared light source section 10, irradiating a sample S with infrared light; an infrared light detection section 20, detecting light intensity information of the infrared light reflected from the sample S; and a control section 50, obtaining the light intensity information. By replacement of the sample S in a predetermined position so as to block off the opening 33, the infrared light source section 10 irradiates infrared light on a lower surface of the sample S, and the infrared light detection section 20 detects the light intensity information of the infrared light reflected by the lower surface of the sample S.

Abstract: Methods and devices for spectrum sensing using sliding window energy detection are provided. A sliding window energy detection test having a number of continuously-performed tests can be analyzed according to a desired cumulative false alarm rate to provide a corresponding, testing threshold. Based on the testing threshold and target signal to noise ratio, a testing window length is selected such that the sliding window energy detection is performed for a minimum expected discrete detection time. A sliding window energy detector can then obtain the selected testing window length and the corresponding, testing threshold for spectrum sensing. The sliding window energy detector includes a sampling unit, a detection probability analyzer, a testing statistic generator, a false alarm analyzer, a comparing unit, and a declaring unit.

Abstract: A method reduces drift induced by environment changes when imaging radiation from a scene in two wavelength bands. Scene radiation is focused by two wedge-shaped components through a lens onto a detector that includes three separate regions. The wedge-shaped components are positioned at a fixed distance from the lens. The radiation from the scene is imaged separately onto two of the detector regions through an f-number of less than approximately 1.5 to produce a first pixel signal. Imaged radiation on each of the two regions includes radiation in one respective wavelength band. Radiation from a radiation source is projected by at least one of the wedge-shaped components through the lens onto a third detector region to produce a second pixel signal. The first pixel signal is modified based on a predetermined function that defines a relationship between second pixel signal changes and first pixel signal changes induced by environment changes.

Abstract: According to an embodiment, a radiation detection device includes a scintillator layer, a plurality of detectors, a setting unit, an identifier, and a corrector. The scintillator layer is configured to convert radiation into scintillation light. The detectors are arranged along a first surface facing the scintillator layer to detect light. The setting unit is configured to set one of the detectors as a first detector to be corrected. The identifier is configured to identify, out of the detectors, a second detector that detects a synchronization signal synchronizing with a first signal detected by the first detector. The corrector is configured to correct an energy spectrum of light detected by the first detector on the basis of a second signal serving as the synchronization signal in signals detected by the second detector, the first signal, and characteristic X-ray energy of a scintillator raw material constituting the scintillator layer.

Abstract: A comparative discrimination spectral detection (CDSD) system for the identification of chemicals with overlapping spectral signatures, including: a radiation source for delivering radiation to a sample; a radiation collector for collecting radiation from the sample; a plurality of beam splitters for splitting the radiation collected from the sample into a plurality of radiation beams; a plurality of low-resolution optical filters for filtering the plurality of radiation beams; a plurality of radiation detectors for detecting the plurality filtered radiation beams; and a processor for: receiving a set of reference spectra related to a set of target chemicals and generating a set of base vectors for the set of target chemicals from the set of reference spectra, wherein the set of base vectors define a geometrical shape in a configuration space; receiving a set of filtered test spectra from the plurality of radiation detectors and generating a set of test vectors in the configuration space from the set of filte

Abstract: An optical sensor may have multiple detection channels to detect different characteristics of a fluid. For example, an optical sensor used in industrial cleaning and sanitizing applications may have multiple detection channels to detect when a system is both clean and properly sanitized. In one example, an optical sensor includes an optical emitter that directs light into a fluid, a first optical detector that detects light transmitted through the fluid, a second optical detector that detects light scattered by the fluid, and a third optical detector that detects fluorescent emissions emitted by the fluid. The optical emitter and optical detectors can be positioned around an optical analysis area. The optical sensor may include filters that control the characteristics of light detected by each of the optical detectors.

Abstract: One or more techniques and/or systems are described for addressing (e.g., during calibration) pixel-by-pixel variations in an image modality that utilizes photon counting techniques, such as by adjusting a number of photons detected by certain pixels (e.g., redistributing or reallocating detected photons among pixels). Such variations may cause an effective area of one or more pixels of a detector array to be larger than the effective area of other pixels, resulting in more photons being counted by some pixels than others, which can degrade resulting images. Accordingly, photons are redistributed as provided herein so that, when exposed to substantially uniform radiation, photon counts of neighboring pixels are substantially equal, statistical noise among neighboring pixels is substantially equal, and a signal-to-noise ratio among neighboring pixels is substantially equal.

Abstract: A film thickness measuring device including: a terahertz wave generator; a prism that has an entrance surface, an abutment surface capable of abutting a surface of a sample including a first film on a side where the first film is formed, and an emission surface; a terahertz wave detector that detects an S-polarization component and a P-polarization component of a reflected wave from the sample, emitted from the emission surface of the prism; and a control section configured to determine a thickness of the first film formed in the sample, based on a difference between a time waveform of the S-polarization component of the reflected wave and a time waveform of the P-polarization component of the reflected wave.

Abstract: A system for measuring a sensor having two terminals includes first and second transistors with first and second control signal inputs connected to the sensor terminals. The system further includes a current divider including a reference current input, a current divider control input and first and second current outputs connected to the first and second transistors. First and second load circuits are connected to the first and second transistors at first and second differential output nodes. First and second integrator circuits are connected to the first and second differential output nodes. A comparator is driven by first and second differential output nodes. The comparator output controls a digital filter. A value of the a current divider control signal driving the current divider control input depends at least indirectly from the digital filter output.

Abstract: In some embodiments, a system for detecting the presence of a contaminant on a surface includes an infrared light source configured to shine infrared light on the surface, an infrared light detector configured to detect infrared light reflected from the surface, and a computing device configured to receive an infrared reflectance signal from the infrared light detector and detect the presence of the contaminant from a feature in the reflectance signal.

Abstract: A radiation detection technique employs field enhancing structures and electroluminescent materials to converts incident Terahertz (THz) radiation into visible light and/or infrared light. In this technique, the field-enhancing structures, such as split ring resonators or micro-slits, enhances the electric field of incoming THz light within a local area, where the electroluminescent material is applied. The enhanced electric field then induces the electroluminescent material to emit visible and/or infrared light via electroluminescent process. A detector such as avalanche photodiode can detect and measure the emitted light. This technique allows cost-effective detection of THz radiation at room temperatures.

Abstract: The invention relates to a photon detector (10), in particular an x-ray detector, in the form of a measurement finger, which extends along a detector axis (23) and has a detector head (11) at a first end of the measurement finger, wherein the detector head (11) comprises a plurality of at least two detector modules (22), each comprising a sensor chip (12) sensitive to photon radiation (14), in particular x-radiation, said sensor chip having an exposed end face (13) and a face facing away from the end face (13), wherein the detector modules (22) are arranged around the detector axis (23) in a plane (24) extending orthogonally to the detector axis (23).