Patents Examined by Joanie A. Garcia
  • Patent number: 6329262
    Abstract: A semiconductor integrated circuit includes a thermal resistor which is made of a tungsten silicon nitride containing at least about 5% by weight of silicon and formed on a semiconductor substrate directly or via an insulating film. The semiconductor integrated circuit is produced by a method including the steps of: forming a tungsten silicide nitride film on a semiconductor substrate; patterning the tungsten silicide nitride film in a predetermined pattern to form a thermal resistor; and forming a pair of electrodes to be connected to the thermal resistor.
    Type: Grant
    Filed: February 24, 1999
    Date of Patent: December 11, 2001
    Inventors: Takeshi Fukuda, Hiroshi Takenaka, Hidetoshi Furukawa, Takeshi Fukui, Daisuke Ueda