Patents Examined by John F Niebung
  • Patent number: 6544807
    Abstract: A process monitor includes a test circuit formed on a product die wherein the test circuit has a distribution of cell types that is substantially identical to that of the product die.
    Type: Grant
    Filed: November 3, 2000
    Date of Patent: April 8, 2003
    Assignee: LSI Logic Corporation
    Inventor: Randall Bach