Patents Examined by John Le
  • Patent number: 7203606
    Abstract: During an incompressible fluid movement, three consecutive times during the movement of the fluid are called first, second, and third times in time order, calculation is performed with two different types of lattices for the first and third times and for the second time. Momentum and mass density at the first time are temporally developed to the third time in accordance with a conservation law by using an upwind velocity field. A pressure at the second time is determined so that a velocity field derived from momenta at the third time satisfies an incompressibility condition, and the field at the third time is corrected by adding a change in momentum caused by a pressure term using the determined pressure. This prevents pressure vibration and avoids the complexity of advective term calculation.
    Type: Grant
    Filed: December 15, 2005
    Date of Patent: April 10, 2007
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kota Nakano, Akira Asai
  • Patent number: 7200508
    Abstract: The invention relates to a method for monitoring a control unit of an internal combustion engine, according to which a variable, which characterises the initial parameter of a lambda regulation system, is monitored for a deviation from a predefined threshold value. An error response takes place in accordance with the deviation that has been determined.
    Type: Grant
    Filed: November 17, 2003
    Date of Patent: April 3, 2007
    Assignee: Siemens Aktiengesellschaft
    Inventors: Dirk Geyer, Hong Zhang
  • Patent number: 7200492
    Abstract: The present invention provides a method and apparatus for logging an earth formation and acquiring subsurface information wherein a logging tool is conveyed in borehole to obtain parameters of interest. The parameters of interest obtained may be density, acoustic, magnetic or electrical values as known in the art. The parameters of interest may be transmitted to the surface at a plurality of resolutions using a multi-resolution image compression method. Parameters of interest are formed into a plurality of Cost Functions from which Regions of Interest are determined to resolve characteristics of the Features of interest within the Regions. Feature characteristics may be determined to obtain time or depth positions of bed boundaries and borehole Dip Angle relative to subsurface structures, as well borehole and subsurface structure orientation. Characteristics of the Features include time, depth, and geometries of the subsurface such as structural dip, thickness, and lithologies.
    Type: Grant
    Filed: July 15, 2004
    Date of Patent: April 3, 2007
    Assignee: Baker Hughes Incorporated
    Inventors: Gamal Hassan, Phil Kurkoski
  • Patent number: 7200519
    Abstract: A system for analyzing the condition of a machine having a rotating shaft and a machine body with a measuring point includes a client part communicating with a supplier part computer via a communications network. The client part includes a sensor attachable at the measuring point for generating measurement data dependent on shaft rotation, an analysis apparatus for analyzing the condition of the machine based on the measurement data, the analysis apparatus having at least one input receiving the measurement data, a data processor for processing condition data dependent on the measurement data, the data processor including an element for performing condition monitoring functions and a Logger registering their use, a communication port coupled to the data processor and connectable to the communications network to communicate with the supplier part computer. The analysis apparatus can deliver registered use information to the supplier part computer via the communication port.
    Type: Grant
    Filed: January 20, 2003
    Date of Patent: April 3, 2007
    Assignee: SPM Instrument AB
    Inventors: Stefan Lindberg, Håkan Hedlund, Jim Kummelstam, Jarl-Ove Lindberg
  • Patent number: 7200500
    Abstract: A method for determining an equivalent impedance of a transmission section of an electrical network, includes representing the transmission section as having at least two interfaces with other sections of the network. For each interface, a voltage phasor and a current phasor flowing through the interface are determined from simultaneously made measurements at the interfaces. From the phasors, the equivalent impedance is calculated. The required simultaneousness of the phasor measurements is achieved by means of Phasor Measurement Units (PMUs) that are synchronized via the Global Positioning System (GPS).
    Type: Grant
    Filed: September 29, 2003
    Date of Patent: April 3, 2007
    Assignee: ABB Research Ltd
    Inventors: Mats Larsson, Christian Rehtanz, Marek Zima
  • Patent number: 7197408
    Abstract: A modular system and method is provided for enabling remote configuring and ordering of flowmeters in a client-server environment. The system includes a meter selection module configured to enable a user to select from a plurality of flowmeter types. A process data module receives process data from a client and a fluid selection module coupled to the process module is configured to receive a process fluid selection and to calculate properties thereof. A sizing module generates parameters of at least one sized flowmeter, sized in accordance with the received process data. A material selection module provides a list of materials from which the sized flowmeter may be fabricated, and a fluid rating module rates compatibility of the various materials with the process fluid selection. A results module is configured to generate data corresponding to expected performance of the sized flowmeter.
    Type: Grant
    Filed: January 26, 2005
    Date of Patent: March 27, 2007
    Assignee: Invensys Systems, Inc.
    Inventors: David A. Ferreira, Wade M. Mattar
  • Patent number: 7197413
    Abstract: There is provided a delay amount measuring method of measuring a delay amount in an electronic device that outputs an output signal according to an input signal. The method includes a conversion step of converting the input signal and the output signal into digital data, a shift step of sequentially shifting the digital data of either of the input signal or the output signal in a time direction, an error computing step of computing a squared error of the digital data of the input signal and the digital data of the output signal with respect to each shift amount in the shift step, and a delay amount computing step of computing the shift amount when the squared error is a minimum value by means of a nonlinear least squares method and using the computed shift amount as the delay amount in the electronic device.
    Type: Grant
    Filed: October 14, 2005
    Date of Patent: March 27, 2007
    Assignee: Advantest Corporation
    Inventor: Koji Asami
  • Patent number: 7194386
    Abstract: Computer-implemented methods and apparatus are provided for collecting information gathered by an instrumentation mechanism for transport to an information collection facility. In one embodiment, the information that is collected is defined by a configuration file. An application may examine the configuration file, execute one or more queries specified by the configuration file, and write the data which is collected to one or more data structures employed by a transport mechanism in transferring information to the information collection facility. The process of collecting the information may occur periodically, such as nightly. The configuration file may be periodically updated to reflect new information that is to be collected.
    Type: Grant
    Filed: October 17, 2005
    Date of Patent: March 20, 2007
    Assignee: Microsoft Corporation
    Inventors: Ashish Parikh, David Brooks, Henry J. Lyons, Ram P. Papatla
  • Patent number: 7194367
    Abstract: A method and system for calibrating a fuel cell test station. The fuel cell test station has an interface for connection to at least one of a fuel cell, a fuel cell stack and a fuel processor to measure a plurality of physical characteristics associated therewith to obtain a plurality of station measurements. The method and system involve: (a) concurrently measuring the plurality of physical characteristics to obtain a plurality of measurements; (b) storing the plurality of measurements; and, (c) comparing the plurality of measurements with the plurality of station measurements to obtain an aggregate calibration of the fuel cell test station.
    Type: Grant
    Filed: May 16, 2003
    Date of Patent: March 20, 2007
    Assignee: Greenlight Power Technologies, Inc.
    Inventor: Marek Baker
  • Patent number: 7191073
    Abstract: Novel tracked orders (i.e., tracked orders that are not present in “healthy” machinery) are useful for locating bearing anomalies. Accordingly, a method for locating bearing anomalies in machinery is provided that includes receiving vibration measurements acquired from the machinery, analyzing the vibration measurements to identify novel tracked orders indicative of bearing anomalies, and ascertaining the location of a bearing anomaly by relating a novel tracked order thus-identified to one or more further tracked orders. Thus, the novel tracked order does not merely indicate the occurrence of a bearing anomaly, but, in combination with the one or more further tracked orders, allows the bearing anomaly to be traced to a particular position.
    Type: Grant
    Filed: November 1, 2005
    Date of Patent: March 13, 2007
    Assignee: Oxford Biosignals Limited
    Inventors: Kenneth Richard Astley, Paul Anuzis, Stephen Peter King, Dennis Maxwell King
  • Patent number: 7188052
    Abstract: A method, apparatus and computer instructions for application based tracing and for normalization of processor clocks in a symmetric multiprocessor environment. By deliberately establishing a large skew among processor clocks, it is possible to perform application based tracing by directly using the processors. In addition, the identity, time stamp, and drift information of each processor may be used to create a time library. The time library is used to adjust a measured time to execute a program or software routine. The adjusted time is a normalized time that is statistically more accurate than the measured time alone. The adjusted time is then reported as the time to execute the program or software routine.
    Type: Grant
    Filed: April 12, 2005
    Date of Patent: March 6, 2007
    Assignee: International Business Machines Corporation
    Inventors: Frank Eliot Levine, David Kevin Siegwart
  • Patent number: 7184924
    Abstract: A method, apparatus and computer program product are provided for implementing thermal integrity screening. Predefined processor module temperature data are obtained and processed. An initial thermal calibration is performed to record a predefined processor resistance with no power applied to the processor module. A limit check is performed at power up to detect and compare a thermal bond operating temperature with an identified threshold temperature for the processor module. Responsive to an identified thermal bond operating temperature greater than the identified threshold temperature, the processor module is shutdown and the processor module failed.
    Type: Grant
    Filed: November 3, 2005
    Date of Patent: February 27, 2007
    Assignee: International Business Machines Corporation
    Inventors: Peter James Shabino, Terrance Wayne Kueper
  • Patent number: 7184923
    Abstract: An operating environment of a measurement apparatus for measuring semiconductor devices under test. In particular, a measurement apparatus for a device under test and a method using the measurement apparatus in which a user can promptly and easily understand the selection of the semiconductor measurement-evaluation application used for measuring the device under test, the setting of parameters used during execution, the display of the execution and the result of the execution, and the programming-related operations.
    Type: Grant
    Filed: April 8, 2005
    Date of Patent: February 27, 2007
    Assignee: Agilent Technologies, Inc.
    Inventor: Koji Ishizuka
  • Patent number: 7184934
    Abstract: Methods and systems for obtaining the performance characteristics of a computing product are described. Obtaining a computing product's attributes, capabilities, and features includes assessing the computing product to determine the product's attributes, capabilities, and features. Once the assessment is completed, the assessment data is recorded and stored for future applications. The assessments can be performed by the operating system through an assessment tool. Assessments can be performed on various computing products including personal computers, computer components, clusters of computers, and servers.
    Type: Grant
    Filed: April 22, 2005
    Date of Patent: February 27, 2007
    Assignee: Microsoft Corporation
    Inventors: Richard Gains Russell, Mark Lee Kenworthy
  • Patent number: 7184925
    Abstract: An apparatus in one example comprises one or more control components that emulate one or more operational characteristics of one or more electronic devices through employment of one or more thermal components coupled with a frame.
    Type: Grant
    Filed: December 17, 2003
    Date of Patent: February 27, 2007
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Thom Augustin, Christopher Gregory Malone, Glenn Cochran Simon
  • Patent number: 7171324
    Abstract: A test system and method which utilizes a component data base that stores performance data for individual component of the system. The system and method can further provide for using data and information from one calibration procedure in connection with performing further calibration procedures. The system and method can further provide for utilizing data of from linear components of the system to determine performance characteristics of non-linear components.
    Type: Grant
    Filed: October 14, 2005
    Date of Patent: January 30, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Daniel L. Pleasant, Gopalakrishnan Kailasam
  • Patent number: 7171335
    Abstract: According to one embodiment, a method of analyzing semiconductor test data includes receiving a plurality of raw data entries from a testing system. Each raw data entry is associated with a test structure of a semiconductor device, and each raw data entry is uniquely identified by a name including a plurality of parseable fields. The plurality of data entries is parsed using a selected one of the plurality of parseable fields to identify a grouping of raw data entries. At least one reportable parameter indicative of the functionality of the test structures associated with the grouping of raw data entries is calculated, and the at least one reportable parameter is provided to a user.
    Type: Grant
    Filed: December 21, 2004
    Date of Patent: January 30, 2007
    Assignee: Texas Instruments Incorporated
    Inventors: Jin Liu, Pamula Jean Jones-Williams, Emily A. Donnelly, Jianglin Wang
  • Patent number: 7171320
    Abstract: Geometrical errors in a coordinate measuring machine are measured while works with various weights are mounted on the coordinate measuring machine. Compensation parameters are derived from measured results per a weight of a work and stored. A compensation parameter corresponding to a weight of a work to be measured is appropriately read out to correct measured coordinates of the work to be measured.
    Type: Grant
    Filed: January 31, 2005
    Date of Patent: January 30, 2007
    Assignee: Mitutoyo Corporation
    Inventors: Katsuyuki Ogura, Ayako Sugita, legal representative, Hirokazu Michiwaki, Kozo Sugita, deceased
  • Patent number: 7158908
    Abstract: There is provided a test apparatus having a plurality of test modules. The test apparatus stores object diagnosing programs for controlling diagnosis of the object test module to be diagnosed of a certain type per type of the test module to be diagnosed and stores, separately from it, a set of identification information of diagnostic performance board to be mounted on a test head to diagnose the object test module to be diagnosed by the respective object diagnosing programs per type of the object test modules to be diagnosed. When the diagnostic performance board is mounted on the test head, the test apparatus obtains identification information of the diagnostic performance board and executes the object diagnosing program corresponding to that type under the condition that the identification information coincides with the identification information stored correlatively with the type of the designated object test module to be diagnosed.
    Type: Grant
    Filed: May 25, 2005
    Date of Patent: January 2, 2007
    Assignee: Advantest Corporation
    Inventor: Satoshi Iwamoto
  • Patent number: 7155348
    Abstract: A force-measuring cell is disclosed which is equipped with a force transducer which includes a deformable body that is equipped with sensors. The deformable body connects a housing-mounted fixed part to a force-introducing part of the force transducer. The sensors are connected to electrical conductors of at least one flat ribbon cable which leads to a circuit module that serves to process the measuring signals and contains the connections for joining the sensors together in a measuring bridge circuit. The conductor tracks can be configured so that all of the connecting leads from nodal points of a measuring bridge to the contact terminals of the sensors have at least approximately equal resistance values.
    Type: Grant
    Filed: September 17, 2004
    Date of Patent: December 26, 2006
    Assignee: Mettler-Toledo AG
    Inventors: Urs Loher, Jean-Maurice Tellenbach, Cryrill Bucher