Abstract: A hyperspectral image sensor includes an optical irradiator configured to irradiate light to a partial region of an object, an optical detector configured to receive detection light generated in the partial region in response to the irradiated light and generate spectrum signals, each of the spectrum signals corresponding to a respective sub-region of a plurality of sub-regions included in the partial region, and a processor configured to generate a hyperspectral image of the partial region based on the spectrum signals.

Abstract: An optical system including an enclosure including a front end and a rear end, a first pair of apertures configured to be disposed on a front plane on the front end of the enclosure and a single optical lens system disposed between the front end and the rear end of the enclosure, wherein the first pair of apertures are configured to allow sets of light rays into the enclosure through the single optical lens system to be cast on an image plane as first and second spots, the image plane being parallel to the front plane, if the first and second spots are concentrically disposed, the sets of light rays are determined to be parallelly disposed with respect to one another, otherwise the sets of light rays are determined to not be parallelly disposed with one another.

Abstract: According to the present disclosure, there is provided a device (2) and a method for measuring a wavelength for a laser device. The device (2) for measuring a wavelength for a laser device includes: a first optical path assembly and a second optical path assembly. The first optical path assembly and the second optical path assembly constitute a laser wavelength measurement optical path. The second optical path assembly includes: an FP etalon assembly (11) and an optical classifier (13). The homogenized laser beam passes through the FP etalon assembly (11) to generate an interference fringe. The optical classifier (13) is arranged after the FP etalon assembly (11) in the laser wavelength measurement optical path, and configured to deflect the laser beam passing through the FP etalon assembly (11).

Abstract: There is provided a method of monitoring a powder bed process in additive manufacturing, using at least one processor. The method including: obtaining a first image of a powder bed layer from scanning the powder bed layer in a first scanning direction using a first contact image sensor, the powder bed layer being formed by a powder re-coater arm in the powder bed process and the first contact image sensor being attached to the powder re-coater arm; determining a focus level property of the first image; and detecting non-uniformities in the powder bed layer based on the focus level property of the first image. There is also provided a corresponding system for monitoring a powder bed process.

Abstract: A lidar apparatus is disclosed. The lidar apparatus according to an exemplary embodiment of the present disclose includes a laser generating source for generating a laser; a fixture fixedly disposed on an installation object; a rotating body disposed to rotate about a rotation axis with respect to the fixture, and provided with a laser transmitting module for transmitting a laser generated by the laser generating source to the outside and a laser receiving module for receiving a laser reflected from an external object; and a light guide unit disposed on the rotation axis to transmit a laser generated by the laser generating source from the fixture to the rotating body.

Abstract: An apparatus, system and method for a consumable sheet-product level monitoring dispenser for association with a sheet-product filled consumable. The embodiments include at least a receiver for receiving the consumable upon insertion thereof; at least one sensor associated with at least one opening in the receiver; a sensing module for receiving sheet-product level data from the at least one sensor; and a communications module for communicating the sheet-product level to at least a mobile device display and over at least one network to at least one back end module.

Abstract: The present invention relates to a microscope for quantitative measurements of the wavefront, comprising: means for the illumination of a sample (T); an objective lens (2); an ordered two-dimensional arrangement of lenses (3), with a spacing p? greater than 500 ?m and a relative aperture of less than 10; an image sensor (4) located in a capture space (Ec) to receive the light scattered by the sample (T), and to acquire spatial and angular information on the object wavefront associated therewith; and a computational entity to perform a computational reconstruction of the object wavefront from the spatial and angular information. Other aspects of the invention relate to a method, a computer program and a product incorporating the same, adapted for the performance of the functions of the computational entity of the microscope, as well as to a module and a kit for a microscope.

Abstract: A measurement apparatus includes a generator that causes electromagnetic waves to be incident on a sample, a receiver that receives electromagnetic waves reflected by the sample, and a controller that controls the generator and receiver. The sample includes a first layer on which the electromagnetic waves are incident and a second layer stacked on the first layer. The controller detects whether a third layer is present between the first and second layers based on the electromagnetic waves incident on the sample from the generator and the electromagnetic waves received by the receiver. The generator causes the electromagnetic waves to be incident at an angle such that the electromagnetic waves are totally reflected between the first and third layers and/or between the first and second layers.

Abstract: A self-mixing interferometry sensor module, comprising a light emitter (LE), a detector unit (DU) and an optical element (OE), wherein the light emitter (LE) is operable to emit coherent electromagnetic radiation towards an external object (ET) to be placed outside the sensor module and undergo self-mixing interference, SMI, caused by reflections of the emitted electromagnetic radiation from the external object back inside the sensor module. The detector unit (DU) is operable to generate output signals indicative of an optical power output of the light emitter (LE) due to the SMI. The optical element (OE) is aligned with respect to the light emitter (LE) such that a first fraction of electromagnetic radiation is directed towards the external target (ET) or the light emitter (LE) and a second fraction of electromagnetic radiation is directed towards the detector unit (DU). An optical power ratio determined by the first and second fractions meets a pre-determined value.

Abstract: A method for determining airborne particulate density, the method including: locating or positioning at least one dark target within a local environment and scanning the local environment using an image capturing component of a user equipment device; constructing a geometric three-dimensional model of the local environment; determining pertinent features within the local environment based on the geometric three-dimensional model; focusing the image capturing component of the user equipment device on the dark target, the user equipment device having quantified location and orientation within the local environment; determining an instantaneous light intensity of the local environment and capturing at least one image of the dark target using the image capturing component of the user equipment device; and analyzing the at least one image in correspondence with the pertinent features, the instantaneous light intensity, and the dark target, and determining therefrom an airborne particulate density in the local envi

Abstract: A laser absorptivity measurement device uses a linearly polarized incident beam, an optical configuration comprising an internal polarizing beamsplitter that transmits the linearly polarized incident beam and a quarter-wave plate that converts linearly polarized incident beam into a circularly polarized incident beam that is reflected off a processing substrate. The quarter-wave plate and polarizing beamsplitter can then direct the reflected light back into an integrating volume, where the power of the reflected light can be measured by a photodetector. The laser absorptivity measurement device is capable of making real-time absorption efficiency measurements of a variety of laser-based processes, including laser welding and brazing, additive manufacturing, and laser marking.

Abstract: The present invention relates to a method of non-destructively measuring a thickness of a reinforcement membrane, and more particularly, to a method of non-destructively measuring a thickness of a hydrogen ion exchange reinforcement membrane for a fuel cell, in which the reinforcement membrane has a symmetric three-layer structure including a reinforcement base layer and pure water layers disposed at opposing sides of the reinforcement base layer, including performing total non-destructive inspection and omitting a process of analyzing a position by means of a thickness peak of a power spectrum of the respective layers of the reinforcement membrane.

Abstract: A method for optical distance measurement, comprising a creation of at least one frame, including determining 3D information of at least one subregion of a measuring region. A time budget for creating the frame is split between a first phase for assessing at least one region of interest, and a second phase for determining 3D information from the at least one region of interest. During the first phase a plurality of measuring pulses is emitted by a transmitting unit, and reflected measuring pulses are received by a receiving unit, wherein 2D information of the measuring region is determined, wherein at least one region of interest is assessed from the 2D information. During the second phase a plurality of measuring pulses is emitted by a transmitting unit, and reflected measuring pulses are received by the receiving unit, wherein 3D information of the at least one region of interest is determined as part of the second phase.

Abstract: Disclosed are a system and a method for measuring a magnetorefractive effect of an optical fiber. The system comprises a laser, a coupler A, a sensing optical fiber, a reference optical fiber, a carrier generator, a coupler B, a photoelectric detector and a data acquisition and processing module. The coupler A, the sensing optical fiber, the reference optical fiber and the coupler B form a Mach-Zehnder optical fiber interferometer. An external magnetic field influences the refractive index of the sensing optical fiber, so that the optical path difference between two paths of optical signals in the sensing optical fiber and the reference optical fiber is changed, the intensity of an interference optical signal output by the coupler B is changed, and the refractive index change of the sensing optical fiber under the action of the magnetic field is measured by detecting and processing the interference optical intensity.

Abstract: Aspects of the disclosure relate to systems, methods, and algorithms to perform wavenumber linearization and dispersion correction in optical systems without the need for hardware modifications, empirical adjustments, precise mirror alignment, and which can be conducted at low computational costs and in real-time. A one-time calibration process can generate spectra or calibration criteria, including wavenumber-linearization criteria, dispersion correction, and spectral flattening spectra, which can be used to correct an optical coherence tomogram in real time.

Abstract: An interferometric distance-measurement device includes a multi-wavelength light source which provides a beam having at least three different wavelengths. An interferometer unit splits the beam into measuring and reference beams. The measuring beam propagates in the direction of a measuring reflector movable along a measuring axis and undergoes a back-reflection, and the reference beam propagates in the direction of a stationary reference reflector and undergoes a back-reflection. The back-reflected measuring and reference beams interfere with each other in an interference beam. A detection unit splits the interference beam such that several phase-shifted partial interference signals result for each wavelength. A signal processing unit determines absolute position information regarding the measuring reflector from the partial interference signals of different wavelengths and an additional coarse position signal.

Abstract: A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.

Abstract: There is provided a distance measurement system in which a plurality of distance measurement sensors are installed to detect an object in a measurement area, the system including: a detection intensity distribution display device that performs quantification according to light intensities of light which reaches the object after being emitted from the distance measurement sensors, or point cloud numbers, and displays colors or lights and shades according to magnitudes of numerical values to perform visualization and a display. The detection intensity distribution display device regards a space in front of the distance measurement sensors as one cube, divides the cube into a plurality of small cubes (voxels), and quantifies a detection intensity according to the light intensity of the light that reaches each of the voxels after being emitted from the distance measurement sensors, or the point cloud number of each of the voxels.

Abstract: A distance detecting system for use in mobile machines comprises a gallium and nitrogen containing laser diode disposed within a light of a mobile machine. The gallium and nitrogen containing laser diode is configured to emit a first light with a first peak wavelength. A wavelength conversion member is configured to produce a white light. A first sensing light signal is based on the first peak wavelength. One or more optical elements are configured to direct at least partially the white light to illuminate one or more target objects or areas and to transmit respectively the first sensing light signal for sensing at least one remote point. A detector is configured to detect reflected signals of the first sensing light signal to determine coordinates of the at least one remote point.

Abstract: A method for quality assessment of a sealing section of a package, wherein the package includes at least a robustness layer and a plastic layer. The sealing section is formed by holding a first section and a second section of the package against each other while providing heat such that the plastic layer of the first and second section melt and thereby provide for that the first and second section adhere to each other. The method includes capturing image data depicting the sealing section using a camera, identifying a reference line in the image data, identifying a sealing section boundary line in the image data, determining a sealing section assessment feature set based on the reference line and the sealing section boundary line, and comparing the sealing section assessment feature set with a reference feature set.