Patents Examined by Jonathan M Hansen
  • Patent number: 11150079
    Abstract: A distance measuring element including: at least one first subpattern having a nonrepeating structure of values in a defined first value range; and at least one second subpattern, which, in comparison with the first subpattern, has a non-repeating structure of values in a second value range, the second subpattern having no values in the defined first value range, the at least two subpatterns being superimposed by summing over a defined surface area to form a surface pattern; the minimum distance between the values of the second value range being greater than the maximum value of the first value range.
    Type: Grant
    Filed: February 11, 2019
    Date of Patent: October 19, 2021
    Assignee: Robert Bosch GmbH
    Inventor: Frank-Rene Schaefer
  • Patent number: 11150077
    Abstract: Disclosed is a heterodyne laser interferometer based on an integrated secondary beam splitting component, which belongs to the technical field of laser application; the disclosure inputs two beams that are spatially separated and have different frequencies to the heterodyne laser interferometer based on the integrated secondary beam splitting component, wherein the integrated secondary beam splitting component includes two beam splitting surfaces that are spatially perpendicular to each other; and the two beam splitting surfaces are plated with a polarizing beam splitting film or a non-polarizing beam splitting film, and a measurement beam and a reference beam are the same in travel path length in the integrated secondary beam splitting component.
    Type: Grant
    Filed: August 26, 2020
    Date of Patent: October 19, 2021
    Assignee: HARBIN INSTITUTE OF TECHNOLOGY
    Inventors: Pengcheng Hu, Xiaobo Su, Haijin Fu
  • Patent number: 11143649
    Abstract: Disclosed are methods for the free solution measurement of molecular interactions by refractive index sensing other than backscattering interferometry. The disclosed methods can have very low detection limits and/or very low sample volume requirements. Also disclosed are various biosensor applications of the disclosed techniques. This abstract is intended as a scanning tool for purposes of searching in the particular art and is not intended to be limiting of the present invention.
    Type: Grant
    Filed: March 9, 2020
    Date of Patent: October 12, 2021
    Assignee: Vanderbilt University
    Inventors: Darryl J. Bornhop, Amanda Kussrow, Michael Kammer
  • Patent number: 11143498
    Abstract: Interferometer system, including optical means (2, 3, 4, 5) arranged for directing light along a first interferometer path and (separate) second interferometer path, and for combining the light for allowing interferometry, characterized in that the first interferometer path (PI) is provided with a first light transmitting structure (10) having a rotational position that is adjustable with respect to an optical axis of the first path.
    Type: Grant
    Filed: December 21, 2017
    Date of Patent: October 12, 2021
    Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
    Inventors: Huibert Visser, Hedser Van Brug
  • Patent number: 11137345
    Abstract: The present disclosure relates to a confocal imaging apparatus using a chromatic aberration lens, which is capable of quickly implementing multiple tomographic images by making it possible to quickly scan the entire object without moving the light source or the object. Since the present invention is configured to generate a three-dimensional image using multiple tomographic images by a chromatic aberration lens without moving the light source or the object up and down, there is an effect of remarkably shortening the time it takes to implement the multiple tomographic images.
    Type: Grant
    Filed: July 30, 2019
    Date of Patent: October 5, 2021
    Assignee: KOREA PHOTONICS TECHNOLOGY INSTITUTE
    Inventors: In-Hee Shin, Woo-Sub Song, Joo-Beom Eom
  • Patent number: 11131624
    Abstract: Systems and methods are disclosed herein for measuring a fundamental mode vibrational spectrum of materials and substances in the Mid-IR spectral range of 2.5 ?m to 14 ?m wavelength. In one embodiment, a Mid-infrared FT-IR spectrometer system measures, identifies, or quantifies substances in the spectral range 2.5 ?m to 14 ?m. The system includes an infrared Micro-Electro-Mechanical System (MEMS) single element emitter light source. The light source is configured in operation to be electrically pulsed and to emit electromagnetic radiation in the wavelength range from 2.5 ?m to 14 ?m and with integral energy concentrating optic to provide energy for a spectral absorption process. A scanning beam splitter is positioned in an interferometer optical path with fixed angle mirrors and a thermal detector having a sensitivity to determine a maximum optical sensitivity of the system.
    Type: Grant
    Filed: January 9, 2020
    Date of Patent: September 28, 2021
    Assignee: LIGHTSENSE TECHNOLOGY, INC.
    Inventors: Wade Martin Poteet, Terje A. Skotheim
  • Patent number: 11131547
    Abstract: A gyroscope includes a first optical resonator in optical communication with at least one optical waveguide and a second optical resonator in optical communication with the first optical resonator. One of the first optical resonator and the second optical resonator has a power loss rate L greater than zero and the other of the first optical resonator and the second optical resonator has a power gain rate G greater than zero. The at least one optical waveguide, the first optical resonator, and the second optical resonator are configured to be below lasing threshold. The gyroscope further includes at least one optical detector in optical communication with the at least one optical waveguide, and the at least one optical waveguide is configured to receive, from at least one light source, light having an input power Pin at a frequency ?p and to transmit at least a portion of the light having an output power Pout to the at least one optical detector.
    Type: Grant
    Filed: January 17, 2020
    Date of Patent: September 28, 2021
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Michel J. F. Digonnet, Matthew James Grant
  • Patent number: 11119386
    Abstract: A truncated non-linear interferometer-based atomic force microscope (AFM) includes an input port and a non-linear amplifier that renders a probe beam and a conjugate beam. The AFM includes local oscillators having a relationship with the probe beam and the conjugate beam. The displacement of the AFM's cantilever is transduced by the probe beam, and/or the conjugate beam or their respective local oscillators. The AFM's phase-sensitive detectors detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. The detected phase modulation corresponds to the change in phase. The AFM's circuitry measures phase signals that are indicative of the cantilever displacement. The resulting measurement signals exhibit a quantum noise reduction in either the intensity difference or phase sum quadrature.
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: September 14, 2021
    Assignee: UT-BATTELLE, LLC
    Inventors: Raphael C. Pooser, Benjamin J. Lawrie, Petro Maksymovych
  • Patent number: 11118894
    Abstract: In some embodiments, systems, methods, and media for multiple reference arm spectral domain optical coherence tomography are provided which, in some embodiments, includes: a sample arm coupled to a light source; a first reference arm having a first path length; a second reference arm having a longer second path length; a first optical coupler that combines light from the sample arm and the first reference arm; a second coupler that combines light from the sample arm and the second reference arm; and an optical switch comprising: a first input port coupled to the first optical coupler; a second input coupled to the second coupler via an optical waveguide that induces a delay at least equal to an acquisition time of an image sensor; and an output coupled to the image sensor.
    Type: Grant
    Filed: October 12, 2018
    Date of Patent: September 14, 2021
    Assignee: THE GENERAL HOSPITAL CORPORATION
    Inventors: Guillermo J. Tearney, Yogesh Verma, David Odeke Otuya, Romain Luu
  • Patent number: 11118895
    Abstract: A three-dimensional measurement device includes: an optical system that splits incident light into two lights, radiates one of the two lights as measurement light to a measured object and the other of the two lights as reference light to a reference surface, and recombines the two lights into combined light to emit the combined light; a light emitter that emits predetermined light entering the predetermined optical system; an imaging system that takes an image of output light emitted from the optical system; and an image processor that performs three-dimensional measurement of a predetermined measurement area of the measured object based on an interference fringe image obtained by the imaging system. The image processor obtains intensity image data at a predetermined position along an optical axis direction at each coordinate position in the measurement area by reconstruction based on an interference fringe image of the measurement area.
    Type: Grant
    Filed: May 14, 2020
    Date of Patent: September 14, 2021
    Assignee: CKD CORPORATION
    Inventors: Hiroyuki Ishigaki, Takahiro Mamiya
  • Patent number: 11119193
    Abstract: A system configured to generate images includes one or more narrowband electromagnetic sources configured to emit a first radiation and a second radiation. The system also includes a detector configured to detect first reflected radiation off of an object and second reflected radiation off of the object, where the first reflected radiation results from the first radiation and the second reflected radiation results from the second radiation. The system further includes a processor operatively coupled to the detector and configured to generate an image of the object based at least in part on a first amplitude of the first reflected radiation and a second amplitude of the second reflected radiation. The processor is also configured to determine a depth profile of the object based at least in part on the first reflected radiation and the second reflected radiation detected by the detector.
    Type: Grant
    Filed: March 28, 2019
    Date of Patent: September 14, 2021
    Assignees: Northwestern University, Southern Methodist University
    Inventors: Oliver Strider Cossairt, Fengqiang Li, Florian Willomitzer, Prasanna V. Rangarajan
  • Patent number: 11112234
    Abstract: The present subject matter at least provides an apparatus for inspecting a slab of material including a passivation layer. The apparatus includes a frequency-domain optical-coherence tomography (OCT) probe configured to irradiate the slab of material, and detect radiation reflected from the slab of material. The apparatus also includes a spectral-analysis module configured to analyze at least an interference pattern with respect to the OCT probe to thereby determine a thickness of the slab of the material. The apparatus also includes a thin-film gauge configure to determine a thickness of the passivation layer such that the determined thickness of the slab of material may be adjusted baes on the thickness of the passivation layer.
    Type: Grant
    Filed: January 13, 2020
    Date of Patent: September 7, 2021
    Assignee: APPLEJACK 199 L.P.
    Inventor: Wojciech J Walecki
  • Patent number: 11112342
    Abstract: A particle characterisation instrument, comprising a light source, a sample cell, an optical element between the light source and sample cell and a detector. The optical element is configured to modify light from the light source to create a modified beam, the modified beam: a) interfering with itself to create an effective beam in the sample cell along an illumination axis and b) diverging in the far field to produce a dark region along the illumination axis that is substantially not illuminated at a distance from the sample cell. The detector is at the distance from the sample cell, and is configured to detect light scattered from the effective beam by a sample in the sample cell, the detector positioned to detect forward or back scattered light along a scattering axis that is at an angle of 0° to 10° from the illumination axis.
    Type: Grant
    Filed: September 22, 2017
    Date of Patent: September 7, 2021
    Assignee: Malvern Panalytical Limited
    Inventors: Jason Corbett, Richard Scullion
  • Patent number: 11112233
    Abstract: Aspects of the subject technology relate to an apparatus for self-mixing particulate-matter sensing using a vertical-cavity surface-emitting laser (VCSEL) with extrinsic photodiodes. The apparatus includes a dual-emitting light source disposed on a first chip and to generate a first light beam and a second light beam. The first light beam illuminates a particulate matter (PM), and a light detector extrinsic to the first chip measures the second light beam and variations of the second light beam and generates a self-mixing signal. The variations of the second light beam are caused by a back-scattered light resulting from back-scattering of the first light beam from the PM. The light detector is coupled to the dual-emitting light source. The direction of the second light beam is opposite to the direction of the first light beam, and the second light beam is directed to a sensitive area of the light detector.
    Type: Grant
    Filed: September 12, 2019
    Date of Patent: September 7, 2021
    Assignee: Apple Inc.
    Inventors: Mehmet Mutlu, Michael K. Brown, Wesley S. Smith, Orit A. Shamir, Richard T. Chen, Mark T. Winkler, Miaolei Yan, Richard Yeh
  • Patent number: 11099007
    Abstract: System and method for monitoring of performance of a mirror array of a digital scanner with a use of light, illuminating the mirror array at grazing (off-axis) incidence, and an optical imaging system that includes a lateral shearing interferometer (operated in either static or a phase-shifting condition) during and without interrupting the process of exposure of the workpiece with the digital scanner, to either simply identify problematic pixels for further troubleshooting or measure the exact magnitude of the deformation of a mirror element of the mirror array.
    Type: Grant
    Filed: November 6, 2019
    Date of Patent: August 24, 2021
    Assignee: Nikon Corporation
    Inventor: Eric Peter Goodwin
  • Patent number: 11099070
    Abstract: The present disclosure relates to a high-fineness Fabry-Perot cavity (for use in the THz range) with a guide comprising lateral cavities arranged to guide an electromagnetic wave into the cavity. The invention also relates to a method for implementing a device including such a Fabry-Perot cavity.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: August 24, 2021
    Inventors: Gaël Mouret, Francis Hindle, Robin Bocquet
  • Patent number: 11099005
    Abstract: A fiber-optic sensors for measuring deformation, intended to operate in a harsh environment is provided. The sensor comprises a Fabry-Perot-cavity-based optical measurement head, a linking optical fiber and an expansion reserve case, the case comprising a segment of the linking optical fiber. The inside thickness of the case is comprised between one and several millimeters, the case being flat and of shape referred to as bicorne shape, the shape comprising a convex central portion and two concave symmetric ends, the optical fiber forming, inside the bicorne, one and only one arch, the segment of the optical fiber being, in addition, tangent to the internal surfaces of the reserve case, whatever the temperature conditions.
    Type: Grant
    Filed: April 10, 2019
    Date of Patent: August 24, 2021
    Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: Guy Cheymol, Laurent Remy
  • Patent number: 11092511
    Abstract: Provided is a device for measuring a lens three-dimensional profile based on laser wavenumber scanning, including: a semiconductor laser for emitting coherent light; a beam splitter for dividing the coherent light into two parts; an optical wedge; a CCD camera for capturing an interference image; a computer for processing image information; a laser controller for adjusting an operating temperature and an operating current of the semiconductor laser; and a bilateral telecentric lens. The coherent light is reflected by the optical wedge and then reaches the bilateral telecentric lens through the beam splitter, to form a first reflected light path. The coherent light is reflected by the measured lens, and then reaches the bilateral telecentric lens through the beam splitter, to form a second reflected light path. The first reflected light path and the second reflected light path form an interference image after passing through the bilateral telecentric lens.
    Type: Grant
    Filed: January 15, 2020
    Date of Patent: August 17, 2021
    Assignee: GUANGDONG UNIVERSITY OF TECHNOLOGY
    Inventors: Shengli Xie, Kan Xie, Yanzhou Zhou, Haochuan Zhang
  • Patent number: 11092425
    Abstract: Optical coherence tomography metrology systems with two highly telecentric objective lenses wherein one or both telecentric objectives can be arranged in a pseudo-bistatic configuration. One featured telecentric objective has a large scanning field of view relevant for broadband laser scanning applications where low uncertainty measurements are desired. Another featured telecentric objective has a large image space NA relevant as a standalone microscope objective or as a probing objective for optical coordinate measurement machines.
    Type: Grant
    Filed: June 20, 2019
    Date of Patent: August 17, 2021
    Assignee: University of Rochester
    Inventors: Di Xu, Romita Chaudhuri, Jannick P. Rolland-Thompson
  • Patent number: 11092426
    Abstract: Optical coherence tomography (OCT) probe and system designs are disclosed that minimize the effects of mechanical movement and strain to the probe to the OCT analysis. It also concerns optical designs that are robust against noise from the OCT laser source. Also integrated OCT system-probes are included that yield compact and robust electro-opto-mechanical systems along with polarization sensitive OCT systems.
    Type: Grant
    Filed: September 25, 2017
    Date of Patent: August 17, 2021
    Assignee: Excelitas Technologies Corp.
    Inventors: Bartley C. Johnson, Dale C. Flanders