Patents Examined by Jonathan M Hansen
  • Patent number: 12044608
    Abstract: The invention relates to a housing for a detection unit for optically detecting smoke particles. The detection unit has a light source for emitting radiation to be scattered by smoke particles to be detected and a light detector for detecting the scattered radiation. The housing 2 has a cylindrical outer surface 7 having smoke openings 8 through which the smoke particles enter housing 2, and a radially symmetric light-guiding structure 9 with guide members. The guide members are so designed that adjacent guide members each form a guide channel through which the radiation emitted from the light source and not scattered by the smoke particles is guidable to the outside in the direction of the smoke openings 8 by multiple reflection. Higher detection sensitivity for optically detecting smoke particles can be achieved as a result.
    Type: Grant
    Filed: July 31, 2020
    Date of Patent: July 23, 2024
    Assignee: Minimax Viking Research & Development GmbH
    Inventors: Jens Eichmann, Carl Dechau, Thorsten Mitzlaff, Timo Ziegenbein, Hauke Dittmer, Dirk Siemer
  • Patent number: 12038378
    Abstract: A system and method for self-calibrating optical turbidity measurements includes a housing comprising a cavity with an inner wall having an essentially straight section and an opening for the medium. An optical standard is moveable between first and second sections within the essentially straight section, and a light source and a light sensor, arranged at the first section and configured to measure the turbidity of the medium, when the optical standard is at the second section, and configured to measure the turbidity of the optical standard and to determine, as a function of the measured turbidity, a calibration coefficient for performing a self-calibration, when the optical standard is at the first section.
    Type: Grant
    Filed: December 30, 2021
    Date of Patent: July 16, 2024
    Assignee: ABB Schweiz AG
    Inventors: Benjamin Carr, Andrew James Bowen
  • Patent number: 12038366
    Abstract: A detection device for tiny particles in a liquid is provided. The detection device includes a flow cell, a laser, a scattered light collection device, a photoelectric detector, a fiber Bragg grating and a first optical fiber coupler, wherein scattered light collected by the scattered light collection device is sent to the fiber Bragg grating through the first optical fiber coupler, and reflected light of the fiber Bragg grating after receiving the scattered light is sent to the photoelectric detector through the first optical fiber coupler. The device can eliminate most scattered light generated by the liquid, and reduce the interference of the scattered light of the liquid to scattered light signals generated by the particles, so that the scattered light signals captured by the photoelectric detector are mainly light signals generated by the particles.
    Type: Grant
    Filed: December 3, 2019
    Date of Patent: July 16, 2024
    Assignees: JIANGSU SUJING GROUP CO., LTD., SUJING GROUP AUTOMATION INSTRUMENT EQUIPMENT CORPORATION
    Inventors: Jiyong Sun, Fengfei Liang, Weidong Shen
  • Patent number: 12025438
    Abstract: A miniature, micrometer-accuracy, three-dimensional (3D) position-to-optical displacement sensor that has at least one extrinsic Fabry-Perot interferometer (EFPI) in Z direction and a series of plasmonic metasurface resonators with distinctive wavelength-selective characteristics in X and Y directions. The interferometer comprises at least one single mode optic fiber for light propagation, and a substrate mirror to create a light interference fringe as a function of distance between the mirror and the distal end of the optic fiber. Each plasmonic resonator is capable of modifying the substrate mirror and comprises an array of multiple unit nanostructure unit cells that are arranged in a two-dimensional (2D) square lattice or array in the X-Y plane. The nanostructure unit cells are preferably inscribed in the top layer of a three-layer thin film via the focused ion beam (FIB).
    Type: Grant
    Filed: August 24, 2021
    Date of Patent: July 2, 2024
    Assignee: The Curators of the University of Missouri
    Inventors: Genda Chen, Jie Gao, Chuanrui Guo
  • Patent number: 12018928
    Abstract: There is provided a film thickness measurement method which measures a film thickness of a specific film to be measured in a multilayer film in situ in a film formation system that forms the multilayer film on a substrate, the method comprising: regarding a plurality of films located under the film to be measured as one underlayer film, measuring a film thickness of the underlayer film, and deriving an optical constant of the underlayer film by spectroscopic interferometry; and after the film to be measured is formed, deriving a film thickness of the film to be measured by spectroscopic interferometry using the film thickness and the optical constant of the underlayer film.
    Type: Grant
    Filed: June 29, 2022
    Date of Patent: June 25, 2024
    Assignee: Tokyo Electron Limited
    Inventors: Kazunaga Ono, Kanto Nakamura, Toru Kitada, Atsushi Gomi
  • Patent number: 12020492
    Abstract: The present invention is to facilitate analysis of a plurality of analysis items. A cell analysis method for analyzing cells is provided in which data for analysis of cells contained in a sample are generated, and an artificial intelligence algorithm to be the input destination of the generated analysis data is selected from among a plurality of artificial intelligence algorithms, data indicating the properties of the cells are generated based on the analysis data via the artificial intelligence algorithm.
    Type: Grant
    Filed: November 25, 2020
    Date of Patent: June 25, 2024
    Assignee: SYSMEX CORPORATION
    Inventors: Momoko Imakubo, Jianyin Lu, Kentaro Shirai, Eri Katsumata, Yuji Okamoto
  • Patent number: 12011881
    Abstract: Techniques are described for calibrating an optical system in an additive fabrication device using an image of the build surface within the device. These techniques allow calibration to be performed by imaging one or more calibration features generated on (or at) the build surface, which may include illuminated regions of the build surface, regions of the build surface on which solid material has been formed, and/or regions of the build surface to which energy has otherwise been directed thereby making those regions distinguishable from their surroundings. The calibration features may be produced (at least in part) by the optical system to be calibrated. The location of the calibration features within the image may be compared with the intended location of these calibration features, and corrections to the optical system determined based on any differences between the actual and intended locations.
    Type: Grant
    Filed: July 27, 2021
    Date of Patent: June 18, 2024
    Assignee: Formlabs, Inc.
    Inventors: Carlos Ruiz-Vargas, Robb Morgan
  • Patent number: 12007328
    Abstract: Methods and systems for determining extracellular concentration data of an analyte are disclosed. A method for determining extracellular concentration data of an analyte includes receiving sensor data from one or more arrays of functionalized plasmonic nanostructures on a localized surface plasmon resonance imaging chip in contact with a fluid containing at least one living cell for a plurality of times, determining intensity data for the one or more arrays, determining fractional occupancy based on the intensity data, and determining extracellular concentration data based on the fractional occupancy data. A system for determining extracellular concentration data of an analyte includes a LSPRi chip, a sensor component, an intensity component, a fractional occupancy component, a concentration component, and a processor to implement the components.
    Type: Grant
    Filed: January 21, 2020
    Date of Patent: June 11, 2024
    Assignee: The Government of the United States of America, as represented by the Secretary of the Navy
    Inventors: Marc P. Raphael, Joseph A. Christodoulides, Jeff M. Byers, James B. Delehanty
  • Patent number: 11988497
    Abstract: An optical unit includes an input portion configured to have measurement light having a wavelength extending from an ultraviolet region to a visible region input thereto, an optical system configured to condense the measurement light in a state where a chromatic aberration is caused to occur, and an opening portion configured not to image light having a wavelength in the visible region and to image light having a wavelength in the ultraviolet region of the measurement light having a chromatic aberration having occurred therein.
    Type: Grant
    Filed: August 31, 2020
    Date of Patent: May 21, 2024
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Ikuo Arata, Satoshi Takimoto, Kenichi Ohtsuka
  • Patent number: 11988588
    Abstract: A multi-fibre optical probe for spectroscopically analysing high concentration mediums (i.e. about 40 wt % or higher solid particulates), an extruder comprising a multi-fibre optical probe, use of said multi-fibre optical probe are provided. Methods of generating a predictive model, determining the value of a parameter of a solid particulate dispersion and manufacturing a solid particulate dispersion are also provided.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: May 21, 2024
    Assignee: COLVISTEC AG
    Inventors: Andreas Berghaus, Oliver Kohler
  • Patent number: 11982527
    Abstract: Imaging systems and techniques are described. An imaging system determines, based on image data of a scene received from an image sensor, a first plurality of pixel values corresponding to a first electromagnetic (EM) frequency domain and a second plurality of pixel values corresponding to a second EM frequency domain. The imaging system reduces the first plurality of pixel values using a plurality of cross-domain contamination values (based on the second plurality of pixel values) to generate a third plurality of pixel values. The imaging system determines a reconstructed pixel value based on a combination of at least an overexposed pixel value of the first plurality of pixel values and a corresponding pixel of the third plurality of pixel values. The imaging system outputs a reconstructed image that includes the reconstructed pixel value and a subset of the third plurality of pixel values.
    Type: Grant
    Filed: September 14, 2022
    Date of Patent: May 14, 2024
    Assignee: QUALCOMM Incorporated
    Inventors: Yun-Chieh Chang, Jing Wang, Xiaoyun Jiang
  • Patent number: 11982766
    Abstract: A lidar device having an integrated optics that has a beam deflecting unit having an optical phase array that has a multiplicity of antennas that are set up to emit electromagnetic radiation at a prespecified angle of radiation. The angle of radiation covers a prespecified field of view of the lidar device. The angle of radiation has a first angle of radiation subregion, in which electromagnetic radiation is emitted having a polarization A, and has a second angle of radiation subregion, in which electromagnetic radiation is emitted having a polarization B.
    Type: Grant
    Filed: February 25, 2021
    Date of Patent: May 14, 2024
    Assignee: ROBERT BOSCH GMBH
    Inventors: Jan Niklas Caspers, Simon Schneider
  • Patent number: 11977036
    Abstract: An inspection device inspects of goods that include plural articles that sometimes overlap each other. An X-ray inspection device irradiates goods containing plural articles having a predetermined shape and inspects the goods on the basis of inspection images obtained from radiation that has passed through the goods or radiation that has reflected off the goods. The X-ray inspection device includes a storage component, a learning component, and an inspection component. The storage component stores, as teaching images, at least the inspection images of the goods that are in a state in which the plural articles overlap each other. The learning component acquires, by machine learning using the teaching images stored in the storage component, features relating to the goods that are in a state in which the plural articles overlap each other. The inspection component inspects the goods using the features that the learning component has acquired.
    Type: Grant
    Filed: October 30, 2018
    Date of Patent: May 7, 2024
    Assignee: ISHIDA CO., LTD.
    Inventors: Makoto Nakatani, Yoshinori Tarumoto, Akihiro Maenaka, Hironori Tsutsumi
  • Patent number: 11971555
    Abstract: An optical system including an enclosure including a front end and a rear end, a first pair of apertures configured to be disposed on a front plane on the front end of the enclosure and a single optical lens system disposed between the front end and the rear end of the enclosure, wherein the first pair of apertures are configured to allow sets of light rays into the enclosure through the single optical lens system to be cast on an image plane as first and second spots, the image plane being parallel to the front plane, if the first and second spots are concentrically disposed, the sets of light rays are determined to be parallelly disposed with respect to one another, otherwise the sets of light rays are determined to not be parallelly disposed with one another.
    Type: Grant
    Filed: October 30, 2023
    Date of Patent: April 30, 2024
    Assignee: MLOptic Corp.
    Inventors: Pengfei Wu, Siyuan Liang, Wei Zhou
  • Patent number: 11971307
    Abstract: According to the present disclosure, there is provided a device (2) and a method for measuring a wavelength for a laser device. The device (2) for measuring a wavelength for a laser device includes: a first optical path assembly and a second optical path assembly. The first optical path assembly and the second optical path assembly constitute a laser wavelength measurement optical path. The second optical path assembly includes: an FP etalon assembly (11) and an optical classifier (13). The homogenized laser beam passes through the FP etalon assembly (11) to generate an interference fringe. The optical classifier (13) is arranged after the FP etalon assembly (11) in the laser wavelength measurement optical path, and configured to deflect the laser beam passing through the FP etalon assembly (11).
    Type: Grant
    Filed: December 11, 2020
    Date of Patent: April 30, 2024
    Assignee: Beijing RSLaserOpto-Electronics Technology Co. Ltd
    Inventors: Guangyi Liu, Rui Jiang, Xiaoquan Han, Jiangshan Zhao, Pengfei Sha, Qingqing Yin, Hua Zhang
  • Patent number: 11971299
    Abstract: A hyperspectral image sensor includes an optical irradiator configured to irradiate light to a partial region of an object, an optical detector configured to receive detection light generated in the partial region in response to the irradiated light and generate spectrum signals, each of the spectrum signals corresponding to a respective sub-region of a plurality of sub-regions included in the partial region, and a processor configured to generate a hyperspectral image of the partial region based on the spectrum signals.
    Type: Grant
    Filed: June 21, 2022
    Date of Patent: April 30, 2024
    Assignees: SAMSUNG ELECTRONICS CO., LTD., CHUNG ANG University Industry Academic Cooperation Foundation
    Inventors: Unjeong Kim, Jeongsu Han, Hyungbin Son, Suyeon Lee
  • Patent number: 11964435
    Abstract: There is provided a method of monitoring a powder bed process in additive manufacturing, using at least one processor. The method including: obtaining a first image of a powder bed layer from scanning the powder bed layer in a first scanning direction using a first contact image sensor, the powder bed layer being formed by a powder re-coater arm in the powder bed process and the first contact image sensor being attached to the powder re-coater arm; determining a focus level property of the first image; and detecting non-uniformities in the powder bed layer based on the focus level property of the first image. There is also provided a corresponding system for monitoring a powder bed process.
    Type: Grant
    Filed: August 30, 2019
    Date of Patent: April 23, 2024
    Assignee: Nanyang Technological University
    Inventors: Matteo Seita, Tan-Phuc Le
  • Patent number: 11953595
    Abstract: A lidar apparatus is disclosed. The lidar apparatus according to an exemplary embodiment of the present disclose includes a laser generating source for generating a laser; a fixture fixedly disposed on an installation object; a rotating body disposed to rotate about a rotation axis with respect to the fixture, and provided with a laser transmitting module for transmitting a laser generated by the laser generating source to the outside and a laser receiving module for receiving a laser reflected from an external object; and a light guide unit disposed on the rotation axis to transmit a laser generated by the laser generating source from the fixture to the rotating body.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: April 9, 2024
    Assignee: HL KLEMOVE CORP.
    Inventors: HakGu Han, Hoseok Shin, ChulSeung Lee, SeongHee Jeong, YunKi Han
  • Patent number: 11939139
    Abstract: An apparatus, system and method for a consumable sheet-product level monitoring dispenser for association with a sheet-product filled consumable. The embodiments include at least a receiver for receiving the consumable upon insertion thereof; at least one sensor associated with at least one opening in the receiver; a sensing module for receiving sheet-product level data from the at least one sensor; and a communications module for communicating the sheet-product level to at least a mobile device display and over at least one network to at least one back end module.
    Type: Grant
    Filed: December 7, 2020
    Date of Patent: March 26, 2024
    Inventors: Amanda Williams, Antonio Belmontes
  • Patent number: 11933676
    Abstract: The present invention relates to a microscope for quantitative measurements of the wavefront, comprising: means for the illumination of a sample (T); an objective lens (2); an ordered two-dimensional arrangement of lenses (3), with a spacing p? greater than 500 ?m and a relative aperture of less than 10; an image sensor (4) located in a capture space (Ec) to receive the light scattered by the sample (T), and to acquire spatial and angular information on the object wavefront associated therewith; and a computational entity to perform a computational reconstruction of the object wavefront from the spatial and angular information. Other aspects of the invention relate to a method, a computer program and a product incorporating the same, adapted for the performance of the functions of the computational entity of the microscope, as well as to a module and a kit for a microscope.
    Type: Grant
    Filed: February 14, 2020
    Date of Patent: March 19, 2024
    Assignee: UNIVERSITAT DE VALÈNCIA
    Inventors: Manuel Martínez Corral, Genaro Saavedra Tortosa, Emilio Sánchez Ortiga, Peter Török