Patents Examined by Jonathan M Hansen
  • Patent number: 11988497
    Abstract: An optical unit includes an input portion configured to have measurement light having a wavelength extending from an ultraviolet region to a visible region input thereto, an optical system configured to condense the measurement light in a state where a chromatic aberration is caused to occur, and an opening portion configured not to image light having a wavelength in the visible region and to image light having a wavelength in the ultraviolet region of the measurement light having a chromatic aberration having occurred therein.
    Type: Grant
    Filed: August 31, 2020
    Date of Patent: May 21, 2024
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Ikuo Arata, Satoshi Takimoto, Kenichi Ohtsuka
  • Patent number: 11988588
    Abstract: A multi-fibre optical probe for spectroscopically analysing high concentration mediums (i.e. about 40 wt % or higher solid particulates), an extruder comprising a multi-fibre optical probe, use of said multi-fibre optical probe are provided. Methods of generating a predictive model, determining the value of a parameter of a solid particulate dispersion and manufacturing a solid particulate dispersion are also provided.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: May 21, 2024
    Assignee: COLVISTEC AG
    Inventors: Andreas Berghaus, Oliver Kohler
  • Patent number: 11982766
    Abstract: A lidar device having an integrated optics that has a beam deflecting unit having an optical phase array that has a multiplicity of antennas that are set up to emit electromagnetic radiation at a prespecified angle of radiation. The angle of radiation covers a prespecified field of view of the lidar device. The angle of radiation has a first angle of radiation subregion, in which electromagnetic radiation is emitted having a polarization A, and has a second angle of radiation subregion, in which electromagnetic radiation is emitted having a polarization B.
    Type: Grant
    Filed: February 25, 2021
    Date of Patent: May 14, 2024
    Assignee: ROBERT BOSCH GMBH
    Inventors: Jan Niklas Caspers, Simon Schneider
  • Patent number: 11982527
    Abstract: Imaging systems and techniques are described. An imaging system determines, based on image data of a scene received from an image sensor, a first plurality of pixel values corresponding to a first electromagnetic (EM) frequency domain and a second plurality of pixel values corresponding to a second EM frequency domain. The imaging system reduces the first plurality of pixel values using a plurality of cross-domain contamination values (based on the second plurality of pixel values) to generate a third plurality of pixel values. The imaging system determines a reconstructed pixel value based on a combination of at least an overexposed pixel value of the first plurality of pixel values and a corresponding pixel of the third plurality of pixel values. The imaging system outputs a reconstructed image that includes the reconstructed pixel value and a subset of the third plurality of pixel values.
    Type: Grant
    Filed: September 14, 2022
    Date of Patent: May 14, 2024
    Assignee: QUALCOMM Incorporated
    Inventors: Yun-Chieh Chang, Jing Wang, Xiaoyun Jiang
  • Patent number: 11977036
    Abstract: An inspection device inspects of goods that include plural articles that sometimes overlap each other. An X-ray inspection device irradiates goods containing plural articles having a predetermined shape and inspects the goods on the basis of inspection images obtained from radiation that has passed through the goods or radiation that has reflected off the goods. The X-ray inspection device includes a storage component, a learning component, and an inspection component. The storage component stores, as teaching images, at least the inspection images of the goods that are in a state in which the plural articles overlap each other. The learning component acquires, by machine learning using the teaching images stored in the storage component, features relating to the goods that are in a state in which the plural articles overlap each other. The inspection component inspects the goods using the features that the learning component has acquired.
    Type: Grant
    Filed: October 30, 2018
    Date of Patent: May 7, 2024
    Assignee: ISHIDA CO., LTD.
    Inventors: Makoto Nakatani, Yoshinori Tarumoto, Akihiro Maenaka, Hironori Tsutsumi
  • Patent number: 11971307
    Abstract: According to the present disclosure, there is provided a device (2) and a method for measuring a wavelength for a laser device. The device (2) for measuring a wavelength for a laser device includes: a first optical path assembly and a second optical path assembly. The first optical path assembly and the second optical path assembly constitute a laser wavelength measurement optical path. The second optical path assembly includes: an FP etalon assembly (11) and an optical classifier (13). The homogenized laser beam passes through the FP etalon assembly (11) to generate an interference fringe. The optical classifier (13) is arranged after the FP etalon assembly (11) in the laser wavelength measurement optical path, and configured to deflect the laser beam passing through the FP etalon assembly (11).
    Type: Grant
    Filed: December 11, 2020
    Date of Patent: April 30, 2024
    Assignee: Beijing RSLaserOpto-Electronics Technology Co. Ltd
    Inventors: Guangyi Liu, Rui Jiang, Xiaoquan Han, Jiangshan Zhao, Pengfei Sha, Qingqing Yin, Hua Zhang
  • Patent number: 11971555
    Abstract: An optical system including an enclosure including a front end and a rear end, a first pair of apertures configured to be disposed on a front plane on the front end of the enclosure and a single optical lens system disposed between the front end and the rear end of the enclosure, wherein the first pair of apertures are configured to allow sets of light rays into the enclosure through the single optical lens system to be cast on an image plane as first and second spots, the image plane being parallel to the front plane, if the first and second spots are concentrically disposed, the sets of light rays are determined to be parallelly disposed with respect to one another, otherwise the sets of light rays are determined to not be parallelly disposed with one another.
    Type: Grant
    Filed: October 30, 2023
    Date of Patent: April 30, 2024
    Assignee: MLOptic Corp.
    Inventors: Pengfei Wu, Siyuan Liang, Wei Zhou
  • Patent number: 11971299
    Abstract: A hyperspectral image sensor includes an optical irradiator configured to irradiate light to a partial region of an object, an optical detector configured to receive detection light generated in the partial region in response to the irradiated light and generate spectrum signals, each of the spectrum signals corresponding to a respective sub-region of a plurality of sub-regions included in the partial region, and a processor configured to generate a hyperspectral image of the partial region based on the spectrum signals.
    Type: Grant
    Filed: June 21, 2022
    Date of Patent: April 30, 2024
    Assignees: SAMSUNG ELECTRONICS CO., LTD., CHUNG ANG University Industry Academic Cooperation Foundation
    Inventors: Unjeong Kim, Jeongsu Han, Hyungbin Son, Suyeon Lee
  • Patent number: 11964435
    Abstract: There is provided a method of monitoring a powder bed process in additive manufacturing, using at least one processor. The method including: obtaining a first image of a powder bed layer from scanning the powder bed layer in a first scanning direction using a first contact image sensor, the powder bed layer being formed by a powder re-coater arm in the powder bed process and the first contact image sensor being attached to the powder re-coater arm; determining a focus level property of the first image; and detecting non-uniformities in the powder bed layer based on the focus level property of the first image. There is also provided a corresponding system for monitoring a powder bed process.
    Type: Grant
    Filed: August 30, 2019
    Date of Patent: April 23, 2024
    Assignee: Nanyang Technological University
    Inventors: Matteo Seita, Tan-Phuc Le
  • Patent number: 11953595
    Abstract: A lidar apparatus is disclosed. The lidar apparatus according to an exemplary embodiment of the present disclose includes a laser generating source for generating a laser; a fixture fixedly disposed on an installation object; a rotating body disposed to rotate about a rotation axis with respect to the fixture, and provided with a laser transmitting module for transmitting a laser generated by the laser generating source to the outside and a laser receiving module for receiving a laser reflected from an external object; and a light guide unit disposed on the rotation axis to transmit a laser generated by the laser generating source from the fixture to the rotating body.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: April 9, 2024
    Assignee: HL KLEMOVE CORP.
    Inventors: HakGu Han, Hoseok Shin, ChulSeung Lee, SeongHee Jeong, YunKi Han
  • Patent number: 11939139
    Abstract: An apparatus, system and method for a consumable sheet-product level monitoring dispenser for association with a sheet-product filled consumable. The embodiments include at least a receiver for receiving the consumable upon insertion thereof; at least one sensor associated with at least one opening in the receiver; a sensing module for receiving sheet-product level data from the at least one sensor; and a communications module for communicating the sheet-product level to at least a mobile device display and over at least one network to at least one back end module.
    Type: Grant
    Filed: December 7, 2020
    Date of Patent: March 26, 2024
    Inventors: Amanda Williams, Antonio Belmontes
  • Patent number: 11933726
    Abstract: A measurement apparatus includes a generator that causes electromagnetic waves to be incident on a sample, a receiver that receives electromagnetic waves reflected by the sample, and a controller that controls the generator and receiver. The sample includes a first layer on which the electromagnetic waves are incident and a second layer stacked on the first layer. The controller detects whether a third layer is present between the first and second layers based on the electromagnetic waves incident on the sample from the generator and the electromagnetic waves received by the receiver. The generator causes the electromagnetic waves to be incident at an angle such that the electromagnetic waves are totally reflected between the first and third layers and/or between the first and second layers.
    Type: Grant
    Filed: March 23, 2020
    Date of Patent: March 19, 2024
    Assignee: Yokogawa Electric Corporation
    Inventors: Syuhei Okada, Hiroaki Tanaka
  • Patent number: 11933676
    Abstract: The present invention relates to a microscope for quantitative measurements of the wavefront, comprising: means for the illumination of a sample (T); an objective lens (2); an ordered two-dimensional arrangement of lenses (3), with a spacing p? greater than 500 ?m and a relative aperture of less than 10; an image sensor (4) located in a capture space (Ec) to receive the light scattered by the sample (T), and to acquire spatial and angular information on the object wavefront associated therewith; and a computational entity to perform a computational reconstruction of the object wavefront from the spatial and angular information. Other aspects of the invention relate to a method, a computer program and a product incorporating the same, adapted for the performance of the functions of the computational entity of the microscope, as well as to a module and a kit for a microscope.
    Type: Grant
    Filed: February 14, 2020
    Date of Patent: March 19, 2024
    Assignee: UNIVERSITAT DE VALÈNCIA
    Inventors: Manuel Martínez Corral, Genaro Saavedra Tortosa, Emilio Sánchez Ortiga, Peter Török
  • Patent number: 11927441
    Abstract: A self-mixing interferometry sensor module, comprising a light emitter (LE), a detector unit (DU) and an optical element (OE), wherein the light emitter (LE) is operable to emit coherent electromagnetic radiation towards an external object (ET) to be placed outside the sensor module and undergo self-mixing interference, SMI, caused by reflections of the emitted electromagnetic radiation from the external object back inside the sensor module. The detector unit (DU) is operable to generate output signals indicative of an optical power output of the light emitter (LE) due to the SMI. The optical element (OE) is aligned with respect to the light emitter (LE) such that a first fraction of electromagnetic radiation is directed towards the external target (ET) or the light emitter (LE) and a second fraction of electromagnetic radiation is directed towards the detector unit (DU). An optical power ratio determined by the first and second fractions meets a pre-determined value.
    Type: Grant
    Filed: August 19, 2022
    Date of Patent: March 12, 2024
    Assignee: AMS INTERNATIONAL AG
    Inventors: Ferran Suarez, Daniel Najer
  • Patent number: 11921024
    Abstract: A method for determining airborne particulate density, the method including: locating or positioning at least one dark target within a local environment and scanning the local environment using an image capturing component of a user equipment device; constructing a geometric three-dimensional model of the local environment; determining pertinent features within the local environment based on the geometric three-dimensional model; focusing the image capturing component of the user equipment device on the dark target, the user equipment device having quantified location and orientation within the local environment; determining an instantaneous light intensity of the local environment and capturing at least one image of the dark target using the image capturing component of the user equipment device; and analyzing the at least one image in correspondence with the pertinent features, the instantaneous light intensity, and the dark target, and determining therefrom an airborne particulate density in the local envi
    Type: Grant
    Filed: June 23, 2021
    Date of Patent: March 5, 2024
    Assignee: Mobile Physics Ltd.
    Inventor: Erez Weinroth
  • Patent number: 11913773
    Abstract: The present invention relates to a method of non-destructively measuring a thickness of a reinforcement membrane, and more particularly, to a method of non-destructively measuring a thickness of a hydrogen ion exchange reinforcement membrane for a fuel cell, in which the reinforcement membrane has a symmetric three-layer structure including a reinforcement base layer and pure water layers disposed at opposing sides of the reinforcement base layer, including performing total non-destructive inspection and omitting a process of analyzing a position by means of a thickness peak of a power spectrum of the respective layers of the reinforcement membrane.
    Type: Grant
    Filed: May 20, 2019
    Date of Patent: February 27, 2024
    Assignee: LG CHEM, LTD.
    Inventors: Sung-Hyun Yun, Joo-Yong Park, Ji-Hun Kim, Jae-Choon Yang
  • Patent number: 11913830
    Abstract: A laser absorptivity measurement device uses a linearly polarized incident beam, an optical configuration comprising an internal polarizing beamsplitter that transmits the linearly polarized incident beam and a quarter-wave plate that converts linearly polarized incident beam into a circularly polarized incident beam that is reflected off a processing substrate. The quarter-wave plate and polarizing beamsplitter can then direct the reflected light back into an integrating volume, where the power of the reflected light can be measured by a photodetector. The laser absorptivity measurement device is capable of making real-time absorption efficiency measurements of a variety of laser-based processes, including laser welding and brazing, additive manufacturing, and laser marking.
    Type: Grant
    Filed: November 9, 2021
    Date of Patent: February 27, 2024
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Daniel Tung, Randal L Schmitt
  • Patent number: 11906629
    Abstract: A method for optical distance measurement, comprising a creation of at least one frame, including determining 3D information of at least one subregion of a measuring region. A time budget for creating the frame is split between a first phase for assessing at least one region of interest, and a second phase for determining 3D information from the at least one region of interest. During the first phase a plurality of measuring pulses is emitted by a transmitting unit, and reflected measuring pulses are received by a receiving unit, wherein 2D information of the measuring region is determined, wherein at least one region of interest is assessed from the 2D information. During the second phase a plurality of measuring pulses is emitted by a transmitting unit, and reflected measuring pulses are received by the receiving unit, wherein 3D information of the at least one region of interest is determined as part of the second phase.
    Type: Grant
    Filed: September 2, 2020
    Date of Patent: February 20, 2024
    Assignee: Microvision, Inc.
    Inventor: Ünsal Kabuk
  • Patent number: 11906603
    Abstract: Disclosed are a system and a method for measuring a magnetorefractive effect of an optical fiber. The system comprises a laser, a coupler A, a sensing optical fiber, a reference optical fiber, a carrier generator, a coupler B, a photoelectric detector and a data acquisition and processing module. The coupler A, the sensing optical fiber, the reference optical fiber and the coupler B form a Mach-Zehnder optical fiber interferometer. An external magnetic field influences the refractive index of the sensing optical fiber, so that the optical path difference between two paths of optical signals in the sensing optical fiber and the reference optical fiber is changed, the intensity of an interference optical signal output by the coupler B is changed, and the refractive index change of the sensing optical fiber under the action of the magnetic field is measured by detecting and processing the interference optical intensity.
    Type: Grant
    Filed: June 7, 2022
    Date of Patent: February 20, 2024
    Assignee: Shanghai University
    Inventors: Tingyun Wang, Yi Huang, Chuanlu Deng, Chengyong Hu
  • Patent number: 11892291
    Abstract: Aspects of the disclosure relate to systems, methods, and algorithms to perform wavenumber linearization and dispersion correction in optical systems without the need for hardware modifications, empirical adjustments, precise mirror alignment, and which can be conducted at low computational costs and in real-time. A one-time calibration process can generate spectra or calibration criteria, including wavenumber-linearization criteria, dispersion correction, and spectral flattening spectra, which can be used to correct an optical coherence tomogram in real time.
    Type: Grant
    Filed: February 8, 2022
    Date of Patent: February 6, 2024
    Assignee: LightLab Imaging, Inc.
    Inventors: Chih-Hao Liu, Steven M. Stromski