Abstract: Flowcells and Raman analysis systems provide improved signal collection dynamics through increased solid-angle geometries and improved numerical aperture for near-diffraction-limited performance. A combined excitation/collection beam passes through a first optical material, a sample conduit and a second optical material. A concave reflective aspheric surface focuses and re-collimates the combined beam to and from a region of the sample within the conduit. The optical materials may comprise separate windows or may integrally form sidewalls the conduit. The reflective surface may be spaced apart from the second window or may be integrally formed with the second optical material. The focused region in the sample may approximate a point or a line, and at least a portion of the interior wall of the conduit may be reflective, causing the combined beam to pass through the sample region more than once to enhance collection efficiency.

Abstract: An apparatus (10) for interferometrically measuring a surface shape (12) of a test object (14) in relation to a reference shape (41) includes (a) a diffractive optical element (30) generating a test wave (32) from measurement radiation (22), whereas a wavefront (42) of the test wave is adapted to a target shape (43) of the surface (12) of the test object (14) and the target shape is configured as a first non-spherical surface, (b) a reference element (38) with a reference surface (40) having the reference shape (41), the reference shape being configured as a further non-spherical surface, (c) a first holder (60) configured to arrange the test object (14) in the beam path of the test wave (32) in a measurement configuration, and (d) a further holder (62) configured to arrange the reference element (38) in the beam path of a reference wave (34) in the measurement configuration.

Abstract: A system and a method for synchronously detecting thickness and double-side surface profiles that belongs to the technical field of optical measurement. The system includes a light source system, a deflection reflection system, a camera acquisition system, and a processing system. The deflection reflection system includes a decomposition unit and an integration unit. In the system, an optical signal is projected to an upper surface and a lower surface of an object to be measured by the decomposition unit, and then reflected light is converged by the integration unit to form a composite signal, which is captured by a camera to generate an image. The processing system analyzes the image to accurately obtain the thickness and double-side surface profile data of the object.

Abstract: One form of a metallic particle detection system detects automatically, through analysis of image data from a first sensor, a foreign metallic particle in or on an active material layer of an electrode strip moving between a section and a subsequent section on a roll-to-roll coated electrode manufacturing line that manufactures a plate electrode. The system also determines a position of the foreign metallic particle on the electrode strip moving on the roll-to-roll coated electrode manufacturing line. The system also triggers, in response to detection of the foreign metallic particle and based on the position of the foreign metallic particle and a speed at which the electrode strip is moving, the second sensor, the second sensor generating a reflectance spectrum of the foreign metallic particle. The system also analyzes the reflectance spectrum to identify a type of metal of which the foreign metallic particle is composed.

Abstract: Methods, devices and systems for measuring surface roughness and surface shape of an object are described. An example interferometric system includes a collimator and a first and a second light sources with different spectral ranges and different coherence lengths. The system selectively allows light from one of the light sources to reach the collimator, and also includes a beamsplitter, and a Mirau type microscope having an objective lens, a plate with a central reflective spot and a beamsplitter plate to produce a reference beam and a test beam. An imaging lens receives the test and reference beams that form a plurality of interferograms. A neural network receives two of the interferograms for measuring the surface shape and another two interferograms for measuring the surface roughness of the object. The interferometric systems have a compact form, making them suitable for on-machine measurements and other applications.

Abstract: This three-dimensional measurement device comprises: a projection unit that projects reference light to an object while performing scanning with the light; a light reception unit that receives the reference light reflected on the object; a time extent setting unit that sets a scanning time extent of the reference light in accordance with a distance-measuring range for each prescribed section of the light reception unit; and a three-dimensional information calculation unit that calculates three-dimensional information about the object W by means of triangulation based on information of the light reception unit within the set scanning time extent.

Abstract: This disclosure generally relates to an optical coherence tomography (OCT) system. This disclosure particularly relates to an OCT system with a multi-pass dispersion compensation cell incorporated into its reference arm. This disclosure further relates to a hand-held compact OCT system suitable for inspection of an ear of a mammal.

Abstract: A method for quality control of sealed contact lens packages may comprise disposing a package of a sealed contact lens in a light box, causing the package to be illuminated in the light box by a light source, capturing image data of the illuminated package in the light box, analyzing, based on one or more quality control models, the image data of the illuminated package in the light box, and causing, based on the analyzing, output of a quality control metric indicative of at least an accept or reject condition of the package.

Abstract: A parts supply device includes a stage having a placement surface on which a plurality of parts is placed, an imaging system configured to image the plurality of parts from an obliquely upward direction with respect to the placement surface of the stage, and a parts detection unit configured to detect positions and orientations of the plurality of parts on the placement surface of the stage based on image information obtained by the imaging system.

Abstract: A method for detecting and identifying a remote gas, the method comprising the steps of: receiving a light wave associated with the remote gas; coupling the light wave into a single mode fibre; transmitting the light wave via the single mode fibre into a filter comprising a fibre-based tunable cavity; modulating the cavity length of the filter transmission window to cause a detected modulated signal that is proportional to the spectral feature; and processing the signal using a lock-in amplifier capable of low-pass filtering and out-of-frequency noise rejection.

Abstract: Methods and devices are disclosed to perform depth resolved imaging using parallel lateral detection employing a photodetector block in a detection path that is substantially perpendicular to the direction of light excitation, with applications in microscopy of samples. The photodetector block either comprises a single 1D array of photodetectors or a 2D array of photodetectors. Methods and devices are disclosed to perform coherence gating in configurations of light sheet tomography, to enable simultaneous depth resolved measurements of structure and of index of refraction variation.

Abstract: A spectrometer includes a base, a light input, a light splitter, an image sensor and a shader. The light input is disposed on the base for receiving an optical signal. The light splitter is disposed on the base to split the received optical signal into a plurality of spectral components. The image sensor is disposed on the base, and has a sensing surface for receiving the plurality of spectral components. The shader having a non-ring shape is disposed between the light splitter and the image sensor, and is located on a projection path of a part of the plurality of spectral components. A shadow generated by the shader on the sensing surface falls on an area of the sensing surface corresponding to the part of the plurality of spectral components. A divergence angle of each spectral component out of the part of the plurality of spectral components is reduced.

Abstract: A method and system for determining a location of artefacts and/or inclusions in a gemstone, mineral or sample thereof, the method comprising: surface mapping a gemstone, mineral or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemstone, mineral or sample thereof; sub-surface mapping the gemstone, mineral or sample thereof using an optical beam that is directed at the surface along an optical beam path, wherein the optical beam is generated by an optical source using an optical tomography process; determining a surface normal at the surface at an intersection point between the optical beam path and the determined surface geometry; determining relative positioning between the surface normal and the optical beam path; and determining the location of artefacts and/or inclusions in the gemstone, mineral or sample thereof based on the sub-surface mapping step and the determined relative positioning.

Abstract: A substrate processing apparatus includes: an imaging portion configured to acquire a surface image of a film formed on a surface of a substrate; an optical property estimation portion configured to estimate an optical property of the film based on process information acquired during formation of the film; and a film thickness estimation portion configured to estimate a film thickness of the film based on the surface image and an estimation result of the optical property.

Abstract: A metallic particle detector system includes a particle detection unit with a detector configured to detect, and provide signals as function of, light reflected from a surface of an active material layer on a charge collector backing layer moving on a roll-to-roll coated electrode manufacturing line. The particle detection unit also includes a controller configured to receive the signals from the detector and determine, in-situ and as a function of the signals from the detector, a foreign metallic particle on the active material layer. The controller is also configured to determine a position of the foreign metallic particle on the charge collector backing layer moving on the roll-to-roll coated electrode manufacturing line.

Abstract: This method for retrieving at least one optical parameter of an ophthalmic lens comprises: obtaining an image of a first and second patterns by using an image capture device located at a first position; from that image, obtaining a first set of data from at least a part of the first pattern that is seen through the lens by the image capture device and obtaining a second set of data from at least a part of the second pattern that is seen directly i.e. outside the lens by the image capture device; retrieving the at least one optical parameter by using the first and second sets of data and taking account of relative positions of the image capture device, the lens and the first and second patterns.

Abstract: A variable focus imaging lens assembly has different, calibrated settings for each of multiple different wavelength ranges. Images are captured for each wavelength range using the different settings, corrected and stacked to form an image data cube. Using multiple wavelength ranges allows a scene or object to be imaged by multispectral imagers, hyperspectral imagers and imaging spectrometers using an overall wide wavelength range.

Abstract: Disclosed is a measurement apparatus for analyzing a cell contained in a specimen, comprising: a chamber for preparing a measurement sample in which the cell is stained with first and second fluorescent dyes contained in a reagent supplied from at least one reagent container; a liquid feeding section for feeding the reagent from the reagent container to the chamber via a liquid feeding tube provided between the reagent container and the chamber; and a detection section that acquires first and second signals each corresponding to fluorescence of a first wavelength and fluorescence of a second wavelength emitted from the cell stained with the first and second fluorescent dyes in response to irradiation of the measurement sample flowing in a flow cell with light; and an analysis section that analyzes the cell on the basis of the first and second signals.

Abstract: Provided is a defect inspection apparatus including a plurality of detection optical systems for collecting illumination scattered light from the surface of a sample, a plurality of sensors for converting the illumination scattered light collected by the corresponding detection optical systems into electrical signals and outputting detection signals, and a signal processing device for processing the detection signals input from the plurality of sensors, wherein the signal processing device generates a first signal group including an integrated signal obtained by adding a plurality of detection signals in a predetermined combination based on a group of detection signals input from the plurality of sensors, generates a second signal group by performing the filtering processing on each signal that configures the first signal group, generates a third signal group including separated signals separated according to a predetermined rule from the signal corresponding to the integrated signal based on the second signa

Abstract: The present document discloses a method of determining thickness of a wet film, in particular of microfibrillated cellulose. The method comprises conveying said film (20) in a wet state on a conveyor (10) having a conveyor width, the wet film having a film width which is less than the conveyor width, providing a laser projection (1511) across a film edge, acquiring a series of images, each depicting an area of the conveyor, wherein the laser projection, a portion of the film and a portion of an exposed conveyor surface are visible, and using at least some of said images to determine at least one of a film thickness and a film thickness distribution across the film width. The document also discloses a method of forming a film, in particular a microfibrillated cellulose film, and a device for producing such film.