Abstract: In a Bi-CM0S ESD protection structure, the holding voltage is increased by a desired amount by including a NBL of chosen length. The positioning of the NBL may be adjusted to adjust the I-V characteristics of the structure. Dual voltage capabilities may be achieved by providing two laterally spaced p-regions in a n-material and defining a n+ region and a p+ region in each of the p-regions to define I-V characteristics that are similar to those defined by a SCR device in a positive direction, but, in this case, having those characteristics in both directions. Over and above the NBL position being adjusted relative to the p-regions, the two p-regions may vary in doping level, and dimensions to achieve different I-V characteristics for the device in the positive and negative directions.