Patents Examined by Jose M. Solis
  • Patent number: 6236219
    Abstract: A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider node. The divider also includes a controlled node, a second divider element that has a selectable resistivity and that is coupled between the divider node and the controlled node, and a test circuit that is coupled between the controlled node and the second supply node. During the normal mode of operation, the first and second divider elements generate the data value having a first logic level when the second divider element has a first resistivity, and generate the data value having a second logic level when the second divider element has a second resistivity. The test circuit generates a first voltage at the controlled node during the normal mode of operation, and generates a second voltage at the controlled node during the test mode of operation.
    Type: Grant
    Filed: May 26, 1999
    Date of Patent: May 22, 2001
    Assignee: Micron Technology, Inc.
    Inventor: Donald M. Morgan
  • Patent number: 6229316
    Abstract: A spectrum analyzer in which automatic setting of parameters such as band width is done by the analyzer without manual operator input and noise measurements are determined and displayed to the operator. This is accomplished by an input signal being supplied to a frequency mixer via an input variable attenuator. The frequency of the input signal is mixed with the frequency of a local signal from a frequency sweep generator. The mixed signal is then supplied to a band pass filter and the output of the filter is amplified by an amplifier. The frequency of the amplified output is mixed with the frequency of a local signal from a local oscillator by a frequency mixer. The intermediate frequency signal is taken out by a band pass filter and the output is detected by a detector. The detected output is converted into a digital signal by an A/D converter after passing through a low pass filter and the digital signal is stored in a buffer memory. A CPU sets an attenuation amount.
    Type: Grant
    Filed: September 3, 1996
    Date of Patent: May 8, 2001
    Assignee: Advantest Corporation
    Inventors: Takayoshi Fukui, Kouichi Yamashita, Takahiro Yamaguchi, Osamu Aoyama, Takashi Kosuge, Yoshiaki Miyamae, Toshiharu Kasahara, Hiroaki Takaoku
  • Patent number: 6229318
    Abstract: An electrical resistance type humidity sensor is herein disclosed which comprises a humidity sensor in which electrodes are formed on a woodceramics substrate having linear characteristics with humidity, and a temperature sensor for temperature correction in which electrodes are formed on other woodceramics substrate having the identical characteristics as in the woodceramics humidity sensor and a film coating of a nonhygroscopic material is formed on the surface of the substrate. Thus, a resistance value measured by the woodceramics humidity sensor is corrected on the basis of a resistance value measured by the woodceramics temperature sensor to obtain an output voltage in proportion to a relative humidity. A structure insensitive to a humidity formed from all the same material i.e.
    Type: Grant
    Filed: January 15, 1998
    Date of Patent: May 8, 2001
    Assignees: Suda Toshikazu, Sanriki Kogyo Kabushiki Kaisha
    Inventor: Toshikazu Suda
  • Patent number: 6225812
    Abstract: A method and apparatus for measuring the amount of free water contained within a substance includes a waveguide having front and back sides disposed opposite each other. The waveguide defines a chamber for propagating a microwave signal therethrough. The waveguide has an end perpendicular to the front and back sides which forms a short within the chamber. The front and back sides each have an aperture for passing a substance therethrough. A microwave signal in the frequency range of 10-25 gigahertz is directed through the chamber wherein the generated microwave signal is reflected back from the short of the end. The generated and reflected signals form a ratio which is used by a microprocessor along with the measurement from an adjacent sensor that provides a dielectric constant measurement corresponding to the density of the substance in order to determine a weight of the substance compensated for free water.
    Type: Grant
    Filed: June 25, 1998
    Date of Patent: May 1, 2001
    Assignee: Rockwell Technologies, LLC
    Inventors: David L. Mays, Ira B. Goldberg, Charles S. Hollingsworth
  • Patent number: 6208148
    Abstract: An end-of-charge detection technique for a battery charger is described. The technique involves the detection of a voltage drop at the end of charging and eliminates the effect of noise spikes.
    Type: Grant
    Filed: February 3, 1994
    Date of Patent: March 27, 2001
    Assignee: SGS-Thomson Microelectronics Pte Ltd
    Inventor: Tang Kong Yuen
  • Patent number: 6204656
    Abstract: A fluid contamination analyzer employs one or more micro-miniature sensors which provide for a substantial reduction in sensor dimensions form prior art dimensions of approximately 2 in.×2 in. to approximately 1 mm×1 mm. The sensors are incorporated into probes for easy lubricant fluid accessibility or alternatively may be employed in an on-line analyzer residing in the fluid flow path. The sensors sense an impedance of the fluid which is a function of its contamination and communicates the impedance to analysis circuitry via either a hard-wired or RF data link. An array of sensors may also be utilized in conjunction with a magnetic field intensity gradient to obtain a particulate distribution across the array. Impedance information, which is indicative of the particulate distribution, is communicated to analysis circuitry individually or in a multiplexed format for fluid contamination analysis.
    Type: Grant
    Filed: May 29, 1997
    Date of Patent: March 20, 2001
    Assignee: Reid Asset Management Company
    Inventors: Margaret A. Cheiky-Zelina, Wayne A. Bush
  • Patent number: 6204678
    Abstract: An interconnect and system for testing semiconductor dice, and a test method using the interconnect are provided. The interconnect includes a substrate having patterns of contact members for electrically contacting the dice. The interconnect also includes patterns of conductors for providing electrical paths to the contact members. In addition, the interconnect includes contact receiving cavities configured to retain electrical connectors of a testing apparatus in electrical communication with the conductors. A die level test system includes the interconnect mounted to a temporary package for a singulated die. In the die level test system, the interconnect provides direct electrical access from testing circuitry to the die. A wafer level test system includes the interconnect mounted to a probe card fixture of a wafer probe handler. In the wafer level test system, the contact receiving cavities can be configured to support and align the interconnect to the probe card fixture.
    Type: Grant
    Filed: April 30, 1999
    Date of Patent: March 20, 2001
    Assignee: Micron Technology, Inc.
    Inventors: Salman Akram, James M. Wark, Warren M. Farnworth
  • Patent number: 6201400
    Abstract: The bulls-eye mid-frequency impedance probe has probe electrodes of a larger surface area that conform to the test surface to provide a very low impedance coupling between the probe and surface, unlike other open end coaxial probes. This probe provides accurate measurement of the dielectric properties of dielectric materials in the mid-frequency range of 10 MHz to 1 GHz on flat and curved solid surfaces, while conforming simple or complex curved surfaces by providing a resilient means between the probe contact surface and the probe box.
    Type: Grant
    Filed: June 23, 1998
    Date of Patent: March 13, 2001
    Assignee: The Boeing Company
    Inventor: Arthur C. Lind
  • Patent number: 6191570
    Abstract: A method for testing node isolation on a circuit board. The method utilizes an automated test system having a plurality of test channels, wherein each test channel has a digital driver with a first input and a first output, and a digital receiver with a second output and a second input. The second input of the receiver is coupled to the first output of the driver, to a number of switches, and to a test probe. The test probe is configured to couple the driver and receiver to one of a plurality of nodes on a circuit board. The number of switches are configured to selectively couple the first output and second input to ground. During a node isolation test, each node of a test node group is coupled to one of the test channels. But for a selected node of the test node group, each node of the test node group is coupled to ground via the number of switches of the test channels coupled to the nodes.
    Type: Grant
    Filed: July 26, 1999
    Date of Patent: February 20, 2001
    Assignee: Agilent Technologies, Inc.
    Inventors: Kevin G. Chandler, Barry A. Alcorn, Bryan D. Boswell, John M. Heumann, Ed O. Schlotzhauer
  • Patent number: 6191593
    Abstract: A capacitance sensor detects the absence/presence of physical matter on a sensing surface of the sensor. The capacitive sensor is a multi-cell sensor wherein each cell has one or more buried, protected, and physically inaccessible capacitor plates. The sensor is physically placed in an environment that is to be monitored for deposition of a particle, vapor, and/or drop of a foreign material on the sensing surface. All cells are initially placed in a startup condition or state. Thereafter, the cells are interrogated or readout, looking for a change in the equivalent feedback capacitance that results from an electrical field shape modification that is caused by the presence of physical matter on the sensing surface. When no such change is detected, the method is repeated for another cell. When a change is detected for a cell, a particle/vapor/drop output is provided.
    Type: Grant
    Filed: December 17, 1997
    Date of Patent: February 20, 2001
    Assignee: STMicroelectronics, Inc.
    Inventors: Marco Tartagni, Bhusan Gupta
  • Patent number: 6188225
    Abstract: In a circuit for checking the correct contacting of a switch or pushbutton in a d.c. circuit, the switch or pushbutton is connected alternatively with at least one input and at least one output of a controller or microprocessor, and a capacitor arrangement is connected in parallel with the switch or pushbutton. Another embodiment, a coil arrangement is provided in the lead of the switch or pushbutton. In a method for checking the correct contacting of a switch or pushbutton which is connected at least initially with the output, the signal level output through the output corresponds to the signal level at the input in the case of correct contacting and actuation of the switch or pushbutton. The switches or pushbuttons are connected at least with the input after a change in the signal level, whereupon the signal level is evaluated.
    Type: Grant
    Filed: April 29, 1998
    Date of Patent: February 13, 2001
    Assignee: DaimlerChrysler AG
    Inventor: Darko Tislaric
  • Patent number: 6169394
    Abstract: A micro-electric detector provides conductivity or impedance based measurements of a test sample placed in a microchannel of a micro-analysis system. The detector includes a pair of electrodes disposed on opposing sidewalls of the microchannel to create a detection zone in the microchannel between and adjacent to the electrodes. A variety of test samples can be monitored by the detector, such as particulate-containing fluids and biological materials including living cells and subcellular structures. The detector can be integrated on-chip using micromachining techniques with a variety of micro-analysis systems.
    Type: Grant
    Filed: September 18, 1998
    Date of Patent: January 2, 2001
    Assignee: University of the Utah Research Foundation
    Inventors: A. Bruno Frazier, Richard D. Rabbitt, H. Edward Ayliffe
  • Patent number: 6169406
    Abstract: Very low frequency (VLF) high voltage (HV) sinusoidal electrical test waves provide for testing AC electrical power installations and equipment having large electrical capacitances. VLF HV sinusoidal electrical waves are suitable for testing characteristics and/or qualities of insulation on long, buried electric power cables. Capacitance of a load being tested by VLF HV sinusoidal waves is discharged during a second half of each positive half-wave and during a second half of each negative half-wave by using a sequence of resistive discharge paths. Each successive discharge path in a sequence has less resistance than its predecessor for creating a sequence of progressively-reduced discharge Time Constants. Solenoid-operated switch contacts bring successive discharge paths into action. Also, solenoid-operated switch contacts reverse polarity to create positive and negative half waves of the VLF HV sinusoidal electrical test waves.
    Type: Grant
    Filed: May 2, 1998
    Date of Patent: January 2, 2001
    Inventor: Stanley G. Peschel
  • Patent number: 6160406
    Abstract: A condom testing apparatus utilizing an arcing electrical current to detect holes and excessively thin wall areas in a condom mounted on a conductive testing mandrel, where the condom is passed across a conductive fabric member to test the main body and transition portion of the condom, and is passed through the bristles of a conductive brush member to test the nipple end of the condom. In alternative embodiments, the apparatus may utilize only conductive fabric or only conductive brushes.
    Type: Grant
    Filed: January 6, 1999
    Date of Patent: December 12, 2000
    Assignee: Agri Dynamics, Inc.
    Inventors: Daniel S. Underwood, Barry W. Bass
  • Patent number: 6157184
    Abstract: An indicator for mounting on a power cord (FIG. 3) for almost instantaneously indicating the presence or absence of a single-phase AC voltage potential on a monitored power cord for a grounded AC power distribution system. The indicator comprises a housing (16, 18, 20, 26), an electronic display (10), a static suppression resistor (12), a first conductive element (14) in physical proximity to the monitored power cord, and a second conductive element (22) meant to be touched by a human being to provide a visual indication on the electronic display (10) of the presence or absence of a voltage potential on the monitored conductor or power cord. The hot conductor being part of a power cord is capacitively coupled (FIG. 1) to an electronic display (10) in parallel with a static suppression resistor (12). A current flow due to the capacitive coupling between the hot conductor and first conductive element (14) causes a voltage drop across the display (10) and the resistor (12).
    Type: Grant
    Filed: December 12, 1997
    Date of Patent: December 5, 2000
    Inventor: John C. Atherton
  • Patent number: 6154041
    Abstract: A method and apparatus for measuring sheet resistance and thickness of thin films and substrates. A four-point probe assembly engages the surface of a film on a substrate, and the thickness of the substrate is determined from the point of contact between the probes and film. A measuring apparatus then outputs a voltage waveform which applies a voltage to probes of the probe assembly. An inverter inverts the voltage and provides the inverted voltage on another probe of the probe assembly, thus inducing a current in these probes of the four point probe and through the surface of the film. Two other probes measure a voltage in the film created by the current. The voltages on the current probes provide a voltage close to zero at the other probes, thus allowing these other probes to measure voltages with greater precision. The current created by the voltage waveform and the voltage created across the inner probes are measured for each voltage level of the waveform.
    Type: Grant
    Filed: February 26, 1999
    Date of Patent: November 28, 2000
    Inventor: David Cheng
  • Patent number: 6150824
    Abstract: A contactless process for detecting electrical patterns on the outer surface of a member comprising providing a member having a charge pattern on an outer surface, repetitively measuring the charge pattern on the outer surface of the member with an electrostatic voltmeter probe maintained at a substantially constant distance from the surface, the distance between the probe and the imaging member being slightly greater than the minimum distance at which Paschen breakdown will occur to form a parallel plate capacitor with a gas between the probe and the surface, the frequency of repetition being selected to cause all time dependent signals to fall out of phase by a predetermined amount, and averaging the out of phase time dependent signals over a sufficient number of measuring repetitions to eliminate the time dependent signals. In one embodiment, the contactless process detects surface potential charge patterns in an electrostatographic imaging member.
    Type: Grant
    Filed: October 30, 1997
    Date of Patent: November 21, 2000
    Assignee: Xerox Corporation
    Inventors: Satchidanand Mishra, Edward A. Domm, Zoran D. Popovic, Denis C. Thomas, Samy A. Mesbah, Dennis J. Prosser, Steven P. Nonkes
  • Patent number: 6147500
    Abstract: An electric discharge machine for machining a workpiece by an electric discharge by supplying a machining fluid to a gap between an electrode and the workpiece and supplying pulses to the workpiece while providing the electrode with a jump motion having a periodic motion of the electrode relative to the workpiece; wherein the electric discharge machine detects a state quantity caused in a main body of the electric discharge machine by a reactive force produced by a machining operation in the gap between the electrode and the workpiece and changes machining conditions of the workpiece in accordance with a detected value of the state quantity.
    Type: Grant
    Filed: September 15, 1999
    Date of Patent: November 14, 2000
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Yoshihito Imai, Hidetaka Miyake, Takuji Magara, Akihiro Goto
  • Patent number: 6140821
    Abstract: The invention concerns a method for the recognition of insulation defects in a circuit adapted for connection to a low-ohmic current source or sink having off-load voltage U.sub.n0, Towards this end the circuit is initially subjected, in a separated state, to a diagnostic voltage from a current limited current source or sink whose off-load voltage U.sub.h0 corresponds to exceeds or, respectively, is less than the voltage U.sub.n0. A decision is made as to the presence or absence of an insulation defect based on the current and/or voltage dependence during application of the diagnostic voltage. Finally, in the event that a defect is present, an error message is issued and the low-ohmic current source or sink is not connected to the circuit for self-diagnosis. Otherwise, the low-ohmic current source is connected to the circuit, or the sink, in sequential fashion for self-diagnosis testing. In this fashion even hidden insulation defects are recognized.
    Type: Grant
    Filed: June 26, 1998
    Date of Patent: October 31, 2000
    Assignee: Temic Telefunken Microelectronics GmbH
    Inventors: Gunter Fendt, Hans Spies, Peter Hora, Guido Wetzel
  • Patent number: 6140825
    Abstract: A method for evaluating quality of a resistance weld is provided, in which a nugget generation state during a welding process is evaluated by observable numerical values based on physical phenomena, and which can afford a wide application range in welding material as well as a capability of accurate knowledge as to the nugget generation state of the weld. Based on that a specific resistance value of a metal material to be welded has a temperature dependency in a conduction state of AC or current-pulsated welding current, a rate of change of inter-chip dynamic resistance instantaneous value during a current changing period is determined, a changing state of the dynamic resistance instantaneous value is further calculated, and a heat-generating state of a weld zone, i.e., a nugget formation state is estimated. Thus, a quality evaluation of a weld is performed accurately.
    Type: Grant
    Filed: May 12, 1998
    Date of Patent: October 31, 2000
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Koji Fujii, Yasuhiro Goto, Makoto Ryudo, Kin-ichi Matsuyama