Abstract: In a sensor control circuit, an impedance signal output unit has a HPF, a P/H circuit, a LPF, etc., and detects an element impedance of a sensor element on the basis of an impedance response signal which is alternately changed in response to an alternating current signal supplied to the sensor element. The P/H circuit has an input comparator which inputs an impedance detection voltage Vz after the HPF, a rectifying element connected to the P/H circuit, and a hold capacitor which is charged by the output of the input comparator. The input comparator has a constant current circuit and a transistor. The constant current circuit limits an updating value of a hold voltage value Vph of the hold capacitor every alternating current period. The sensor control device detects the element impedance of the sensor element with high accuracy while preventing influence of noise.

Abstract: A field generation unit generates a rotating magnetic field including a first partial magnetic field in a first position and a second partial magnetic field in a second position. The first and second partial magnetic fields differ in direction by 180° and rotate in the same direction of rotation. A first detection unit detects, in the first position, a first angle that the direction of a first applied field forms with respect to a first direction. The first applied field includes the first partial magnetic field as its main component. A second detection unit detects, in the second position, a second angle that the direction of a second applied field forms with respect to a second direction. The second applied field includes the second partial magnetic field as its main component. A detected value of the angle that the direction of the rotating magnetic field in a reference position forms with respect to a reference direction is calculated based on detected values of the first and second angles.

Abstract: A waterproof housing that encloses a hand-held magnetometer for underwater use and includes a first portion open at one end and connected to a second portion with one end open and accessible through the first portion and terminating at a closed end. The magnetometer has first and second housings and is inserted into the first portion open end so that the second housing is received into the second portion and the first housing is received into the first portion. A base seal is inserted into the first portion open end to provide a fully functional magnetometer protected from water incursion at depth.

Abstract: Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic device to be tested in this state, and controlling a power consumption of a heater so that total power of a power consumption of the electronic device to be tested by the test pattern and a power consumption of the heater becomes a constant value.

Abstract: A method of testing a capacitive transducer circuit, for example a MEMS capacitive transducer, by applying a test signal via one or more capacitors provided in the transducer circuit.

Abstract: In accordance with an embodiment, a probe card structure comprises a base board, a connection interposer over the base board, a substrate over the connection interposer, and a fixture over the substrate securing the substrate and the connection interposer to the base board. The connection interposer comprises interposer electrodes that provide an electrical connection between electrodes on the base board and first electrodes on the substrate.

Abstract: A current and voltage detection printed board includes a board formed with a penetration hole; a first pattern wire formed at a periphery of the penetration hole; a second pattern wire formed at the periphery of the penetration hole; a plurality of first through holes that penetrate the board between the first and second pattern wires; a third pattern wire formed at the periphery of the penetration hole; a fourth pattern wire formed at the periphery of the penetration hole; and a plurality of second through holes that penetrate the board between the third and fourth pattern wires.

Abstract: A burn-in method includes applying a stress current for applying thermal stress to a surface-emitting semiconductor laser, measuring an operation characteristic of the surface-emitting semiconductor laser to which the stress current is applied, and making a pass/fail decision on the surface-emitting semiconductor laser on the basis of the operation characteristic measured.

Abstract: A tool for testing a magnetic disk for use in a magnetic disk drive. The tool detects surface defects or asperities by detecting a change in electrical resistance corresponding to a temperature change in a thermally sensitive layer. The apparatus includes a slider body having a thermally insulating layer formed on an air bearing surface of the slider body and a thermal sensor layer formed on the thermally insulating layer. The thermally insulating layer prevents thermal heat spikes in the thermal sensor layer (such as resulting from contact with an asperity) from dissipating quickly into the slider body itself. The thermal sensor layer is a material that exhibits a change in electrical resistance in response to a change in temperature and is preferably a PTC thermistor material which exhibits a large change in electrical resistance when a transition temperature has been reached.

Abstract: Provided are an apparatus and a method for diagnosing permanent magnet demagnetization of a permanent magnet synchronous motor. The apparatus includes a magnetic field generating unit, a stator current measuring unit, and a demagnetization diagnosing unit. The magnetic field generating unit generates magnetic fields of which directions are respectively parallel to a predetermined direction among a plurality of directions passing through a rotation axis of a rotor, on a plane vertical to the rotation axis of the rotor which is in a standstill. The stator current measuring unit measures currents which flow in a stator winding in correspondence with the respective generated magnetic fields.

Abstract: A method for testing a mask article includes steps of electrically connecting the mask article to an electrical sensor, applying a bias voltage to a plurality of testing sites of the mask article with a conductor, measuring at least one current distribution of the testing sites with the electrical sensor, and determining the quality of the mask article by taking the at least one current distribution into consideration.

Abstract: The present invention is directed to a system and method for assessing interference to a signal caused by magnetic field. The system includes a magnetic field generator configured to generate a magnetic field. The system further includes a first magnetic field sensor configured to detect a magnetic field and to generate a first signal representative of the magnetic field detected thereby. The system still further includes a second magnetic field sensor. The second magnetic field sensor is configured to detect a magnetic field and to generate a second signal representative of the magnetic field detected by the second magnetic field sensor. The system yet still further includes a processor. The processor is configured to receive and process the second signal to determine whether said magnetic field detected by said second magnetic field sensor may cause distortion to said first signal, as well as the magnitude of such distortion.

Abstract: Systems and methods are disclosed for reducing boundary-related artifacts in logs taken from resistivity logging tools. Such tools often exhibit “horns” at boundaries between formation beds having different resistivities. A boundary indicator signal serves to identify the location of these boundaries. When derived from an azimuthally-sensitive resistivity tool, the bed boundary indicator may have a magnitude and shape that serves to nearly eliminate the horns even in high-dip angle environments. Logs that are processed to eliminate these artifacts are expected to be more accurate and thus easier to interpret.

Abstract: Various environmental systems are disclosed. In accordance with one of the systems, a first and second valve are provided. The valves provide a first air flow path from an air pump to a photo-ionization detector is provided through a pre-filter. The valves also provide a second air flow path from the air pump to the photo-ionization detector so that the pre-filter is isolated from its environmental surroundings. Various other arrangements of environmental monitoring systems with one or more pre-filters are also disclosed.

Abstract: A microresistivity logging tool includes a monopole current injection electrode and at least first and second pairs of potential electrodes. The tool may further include a controller configured for making microresistivity anisotropy measurements using a single firing of the monopole current injection electrode. The controller may be configured to compute a two-dimensional tensor of the local formation resistivity from a single firing of the monopole current injection electrode. The use of a single firing tends to decrease measurement time, which in turn tends to improved azimuthal sensitivity in microresistivity anisotropy imaging while drilling applications.

Abstract: A probe card and a test apparatus including the probe card for improving test reliability. The probe card may include a first input terminal Microelectromechanical Systems (MEMS) switch that connects a first input terminal and a first input probe pin, wherein the first input terminal MEMS switch comprises a control portion that receives an operation signal and a connection portion that connects the first input terminal and the first input probe pin. The probe card may further include a first output terminal MEMS switch that connects a first output terminal and a first output probe pin, wherein the first output terminal MEMS switch comprises a control portion that receives the operation signal and a connection portion that connects the first output terminal and the first output probe pin.

Abstract: A test structure for localizing shorts in an integrated circuit and method of testing is described. A first comb structure is formed from a first busbar and a first plurality of fingers extending from the first busbar. A second comb structure formed from a second busbar and a second plurality of fingers extending from the second busbar. The second plurality of fingers is interleaved with the first plurality of fingers. A plurality of pass gates is connected between the first plurality of fingers and the first busbar. A pass gate terminal is electrically connected to the gate electrode of each of the plurality of pass gates. When the pass gates are turned OFF thereby disconnecting the first busbar from the first plurality of fingers, voltage contrast imaging can be used to identify which of the first fingers is adjacent the short.

Abstract: A chip testing apparatus and a chip testing method are provided. The chip testing apparatus includes a command generating module, a transceiving module and a control module. When the command generating module generates a first test command, the transceiving module transmits the first test command to a radio frequency identification (RFID) chip and receives a target test result from the RFID chip. The control module determines whether the target test result complies with a reference test result. When the determination result of the control module is no, the control module controls the command generating module to generate a second test command for retesting the RFID chip.

Abstract: A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device transporter. The test slot assembly also includes a conductive heating assembly. The conductive heating assembly is arranged to heat a storage device by way of thermal conduction.

Abstract: An inspection circuit for inspecting an electro-optic device that includes a data line, a scanning line, a pixel portion, a driving circuit, and a first terminal portion through which a first power supply voltage is supplied to the driving circuit. The inspection circuit includes an inspection line electrically connected to an inspection unit inspecting the pixel portion, a connection circuit electrically connecting the inspection line to the data line, and a supply circuit supplying a control signal for controlling conduction between the data line and the inspection line to the connection circuit. The supply circuit is driven using a second power supply voltage supplied through a second terminal portion.