Abstract: A three-dimensional measurement apparatus for calculating three-dimensional shape information of a target object, comprising: capturing means for capturing reflected pattern light of stripe pattern light formed by alternately arranging a bright portion and a dark portion as first image data, and capturing reflected pattern light of reversed stripe pattern light formed by reversing the bright portion and the dark portion of the stripe pattern light as second image data; determination means for determining a boundary position between the bright portion and the dark portion based on the first image data and the second image data; and reliability calculation means for calculating a reliability indicating accuracy of the boundary position from a correlation between a first luminance gradient of the first image data and a second luminance gradient of the second image data.

Abstract: A system and method for polarimetry are disclosed in which a polarimeter may include a light source for transmitting a light beam through a sample within a container; a wavelength selector configured to specify a target wavelength at which the polarization rotation of the light beam emerging from the sample will be evaluated; a polarization rotator configured to be selectively moved into and out of a path of the light beam from the light source; and a detector for obtaining a first measurement of the light beam polarization rotation with the polarization rotator outside the path of the light beam, and a second measurement of the light beam polarization rotation with the polarization rotator within the path of the light beam, with both measurements occurring at the wavelength resulting from the configuration of the wavelength selector.

Abstract: A measuring system for measuring absorption or scattering of a medium at a plurality of different wavelengths, whereby the measurements for the different wavelengths are performable as simultaneously and as accurately as possible. The measuring system comprises: a measuring chamber; a transmitting unit, which sends light of its respective wavelength into the measuring chamber; a control, which operates each light source with a different time modulation of transmission intensity for each wavelength; a detector for measuring a total radiation intensity. The total radiation intensity corresponds to a superpositioning of each intensity portion striking the detector for each wavelength; and a signal processing system, which determines for each of the wavelengths the associated intensity portion based on the total radiation intensity measured by detector and the modulations.

Abstract: Described herein is a sensor for sensing reflective material. The sensor includes a housing with a transparent window and a sensor mount located in the housing and angled away from a housing wall. A radiation emitter is mounted in the sensor mount and emits radiation along an axis through the transparent window which has an amount of the reflective material located thereon. A radiation detector is mounted in the sensor mount and located adjacent the radiation emitter. The radiation detector is located to receive reflected radiation from the reflective material along another axis. The first axis is angled towards the second axis.

Abstract: In a method for scanning edges of an object using a computing device, the computing device is connected to an image measuring machine including an image capturing device. A start point, an end point, a scan direction, and a scan distance interval are set. Scan points on the edges of the object are determined. For each scan point, the computing device aims the image capturing device at the scan point, controls the image capturing device to capture images of the object at different depths, and records focal points. Definition values of the images are calculated and an image with a highest definition value is determined. A focal point corresponds to the image with the highest definition value and so coordinates of the scan point are determined. Scanned edges of the object are formed based on all the scan points.

Abstract: The invention is directed to a method and an apparatus for air-borne or space-borne radiometric measurement of object points present in an object scene on the surface of an astronomical body which are assigned to rows and columns of an object matrix during a scanning progressing systematically in a first scanning direction and a second scanning direction, wherein the object matrix points are imaged on a detector in an image plane generated by optics, and the image inside the image plane is recorded by at least one radiation-sensitive detector element of the detector.

Abstract: In one embodiment, the dimensions of nanoparticles are determined by focusing light on a sample of nanoparticles suspended in a solution, collecting light scattered by the nanoparticles, measuring translational and rotational decay rates of the collected light, calculating a ratio of the rotational decay rate to translational decay rate, and estimating a first dimension of the nanoparticles based upon the decay rate ratio.

Abstract: Systems and methods for measuring a profile of a glass sample (300) are disclosed. The method includes scanning a polarization-switched light beam (112PS) through the glass sample and a reference block (320) for different depths into the glass sample to define a transmitted polarization-switched light beam. The method also includes measuring an amount of power in the polarization-switched light beam to form a polarization-switched reference signal (SR), and detecting the transmitted polarization-switched light beam to form a polarization-switched detector signal (SD). The method further includes dividing the polarization-switched detector signal by the polarization-switched reference signal to define a normalized polarization-switched detector signal (SN). Processing the normalized polarization-switched detector signal determines the profile characteristic.

Abstract: A reference system configured in accordance with a particular embodiment includes a light-emitting device having a first light emitter, a second light emitter, and a housing. The housing includes a base operably connected to the first and second light emitters. The first light emitter is configured to emit a planar light region having a vertical orientation. The second light emitter is configured to emit an indicator light beam. A slope of the indicator light beam is adjustable to change a position of the indicator light beam within a vertical adjustment field. The system further includes a controller configured to cause the first and second light emitters to rotate in concert relative to the base about a vertical axis so as to rotationally reposition the planar light region and the indicator light beam in response to a detected misalignment of the planar light region.

Abstract: A test apparatus is configured for testing a notebook including a liquid crystal display section and a body section. The positioning structure includes an optical testing module, an adjustable OTM mount, a fine-tuning module, a clamping module and a adjustable LCD mount. The optical testing module tests the liquid crystal display section, and is mounted to the adjustable OTM mount for moving the optical testing module. The optical testing module is attached to the fine-tuning module. The clamping module is for clamping the notebook. The adjustable LCD mount is mounted to the clamping module, and rotates the notebook relative to the optical testing module.

Abstract: A system for monitoring tightness of stator windings in an electric machine is provided. The system includes a light source for providing an optical power. The system also includes an optical separation sensor situated in a stator core and including an optical interface element for absorbing some of the optical power. Further, the system includes a power meter for measuring at least one intensity of the optical power after absorption by the optical interface element and a control subsystem for assessing the tightness of the stator windings.

Abstract: A measurement apparatus includes a pedestal, a supporting tray, a first movable base, a first measuring assembly, a second movable base, a second measuring assembly, a third movable base, a third measuring assembly, and a console. The supporting tray is rotationally fixed in the pedestal and can be rotated to position a workpiece at different angles to ensure that images of all portions and surfaces needing to be measured can be captured.

Abstract: A sensor device for spectrally resolved capture of optical detection radiation which emanates from a value document transported through a capture area of the sensor device, includes a detection device for spectrally resolved detection of the detection radiation and emission of detection signals which represent at least one property of the detection radiation, at least one reference radiation device which emits optical reference radiation which is coupled into a detection beam path of the detection device and which has a spectrum with a structure which is within the spectral detection range, and which has a radiation source which acts as the transmitter of a light barrier or of a light scanner by means of which barrier or scanner a motion and/or a position of the value document relative to the capture area is capturable, and a control/evaluation device which is configured for receiving detection signals from the detection device, evaluating them and emitting evaluation signals in dependence on the result of th

Abstract: A beam sampling system, includes a first beam splitter adapted to split a laser beam having a primary polarization component and a secondary polarization component, into a first intermediate sample beam, and a first beam splitter output beam, the intermediate sample beam including first percentage of the primary polarization component and a second percentage of the secondary polarization component. A 90-degree polarization rotator is positioned in the intermediate sample beam line. A second beam splitter is mounted so that the intermediate sample beam is split into an output sample beam on an output sample beam line, and a second transmitted beam, the output sample beam including substantially said first percentage of the secondary polarization component and substantially said second percentage of the primary polarization component.

Abstract: In a displacement detecting device, an objective lens condenses the outgoing light coming from a light source toward a surface-to-be-measured. The optical path of the reflected light coming from the surface-to-be-measured is separated from the optical path of the outgoing light coming from the light source by a separation optical system. The reflected light passing through the separation optical system is condensed by a collimator lens and has astigmatism generated therein by an astigmatism generator, and the reflected light in such a state is incident on a light receiving section. A position information generator generates the position information of the surface-to-be-measured using a focus error signal obtained based on the amount of light detected by the light receiving section.

Abstract: A method for determining a surface profile of subject's skin includes illuminating the subject with light from a plurality of light sources. The plurality of light sources having distinct colors is configured to illuminate the subject from distinct locations. A multi-color image of the subject is obtained. The multi-color image includes respective values corresponding to respective intensities of light of respective colors for each region of the subject. A surface profile of the subject is determined in accordance with the respective values corresponding to the respective intensities of light of the respective colors.

Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.

Abstract: A luminous unit for an optical gas detector, an optical gas detector including the luminous unit, and a method of recording an absorption spectrum in an optical gas detector include a light source for linearly polarised light radiation and a housing with an exit window. A wavelength of the light radiation radiated from the light source is tunable. The light source is arranged in the housing such that the main emission direction (OA) of the light source encloses an inclination angle (?) of between 10° and 50° with a normal (N) to the main extension plane (HE) of the exit window. The direction of polarisation (P) of the light radiation encloses a rotation angle (?) of between 22.5° and 67.5° with the plane of incidence on the exit window.

Abstract: Apparatus, methods, and systems provide emitting and negatively-refractive focusing of electromagnetic energy. In some approaches the negatively-refractive focusing includes negatively-refractive focusing from an interior field region with an axial magnification substantially less than one. In some approaches the negatively-refractive focusing includes negatively-refractive focusing with a transformation medium, where the transformation medium may include an artificially-structured material such as a metamaterial.

Abstract: Apparatus, methods, and systems provide emitting and negatively-refractive focusing of electromagnetic energy. In some approaches the negatively-refractive focusing includes negatively-refractive focusing from an interior field region with an axial magnification substantially greater than one. In some approaches the negatively-refractive focusing includes negatively-refractive focusing with a transformation medium, where the transformation medium may include an artificially-structured material such as a metamaterial.