Abstract: A method and system for correcting mass flow rate measurements relating to a conveyor used to move a stream of first component material portions to and through a mixing station in which a second component material is dispensed in a predetermined mass percentage of the mass of the first component material portions. The correction of the measurements is adapted to correct for inaccuracies that arise in the measurements due to, for example, differences in the first component material portions properties, differences in the second component material properties, environmental conditions, drift of electronic instruments, and changing conditions that occur during extended use of an upstream conveyor that delivers first component material portions to the mixing station.
Type:
Grant
Filed:
May 28, 2020
Date of Patent:
April 8, 2025
Assignee:
HEAT AND CONTROL, INC.
Inventors:
Kenneth C. Petri, Paul Blake Svejkovsky
Abstract: A three-phase load is powered by an SPWM driven inverter having a single shunt-topology. During operation, drain-to-source resistances of transistors of each branch of the inverter are determined. Interpolation is performed on assumed drain-to-source resistances of the transistors for different temperatures to produce a non-linear model of drain-to-source resistance to temperature for the transistors, and the drain-to-source resistances determined during operation and the non-linear model are used to estimate temperature values of the transistors. Driving of the inverter can be adjusted so that conductivity of each branch is set so that power delivered by that branch is as high as possible without exceeding an allowed drain current threshold representing a threshold junction temperature. In addition, driving of the inverter can be ceased if the temperature of a transistor exceeds the threshold temperature.
Abstract: A thermometer includes one or more temperature sensors mounted on a housing. The one or more temperature sensors determine a temperature of at least one measurement site without contact. The non-contact thermometer displays an indicator to assist alignment of the one or more temperature sensors with the at least one measurement site, receives at least one measurement reading from the at least one measurement site, determines a temperature based on the at least one measurement reading, and displays the temperature on a display unit.
Type:
Grant
Filed:
February 23, 2022
Date of Patent:
April 1, 2025
Assignee:
Welch Allyn, Inc.
Inventors:
Matthew D. Mullin, Aaron R. Burnham, Zhon Ye Chu, David L. Kellner, John A. Lane, Carlos Andres Suarez, Per Soderberg
Abstract: A method for in situ measurement of temperature at microwave-induced microscopic hot spots, temperature measuring particles and the device used are provided. For the temperature measurement demand of the microscopic hot spot of microwave field, loading fluorescent temperature measuring particles on the surface of solid particles, and the actual temperature of particles in micro scale can be measured by using its temperature sensitive fluorescence characteristics. The present disclosure builds a microwave field in-situ fluorescence test device to disperse the test particles loaded with fluorescent temperature measuring materials in the liquid solvent and place in the quartz sample tank in the microwave cavity, which can measure the actual temperature of the particles to be measured under microwave radiation.