Patents Examined by Kara E. Geisel
  • Patent number: 12710363
    Abstract: A thermo-optic coefficient measurement system can include a housing structure configured to retain at least a first plate sample, a second plate sample, and a third plate sample in a stacked, alternating stagger arrangement such that a gap exists between the first plate sample and the third plate sample that is the thickness of the second plate sample. The system can also include a first optical device connected to the housing to output a first laser configured to be coincident with the first plate sample and the third plate sample. The first optical device can be configured to receive a first return signal. The system can also include a second optical device connected to the housing to output a second laser configured to be coincident with the second plate sample, the second optical device can be configured to receive a second return signal.
    Type: Grant
    Filed: December 14, 2023
    Date of Patent: August 18, 2026
    Assignee: Simmonds Precision Products, Inc.
    Inventor: Joshua Girard
  • Patent number: 12704461
    Abstract: A stimulated Raman scattering tomography system includes means for generating a first input light beam, means for generating a second input light beam, an objective, a condenser and a detector. The first input light beam is phase-modulated while the second input light beam is amplitude-modulated. The objective is configured to direct the first and second input light beams onto a sample. The condenser is configured to collect an output light beam from the sample. The is detector configured to detect at least a portion of the output light beam corresponding to the first input light beam. The system further includes means for forming a depth-resolved image of the sample from the detected portion of the output light beam.
    Type: Grant
    Filed: May 23, 2022
    Date of Patent: August 11, 2026
    Assignee: National University of Singapore
    Inventors: Zhiwei Huang, Li Gong, Shulang Lin
  • Patent number: 12704458
    Abstract: This disclosure describes systems and methods for critical angle reflection (CAR) imaging to quantify molecular binding kinetics on a glass surface in some embodiments. CAR is a label-free method that measures the reflectivity change near a critical angle in response to molecular binding induced refractive index changes on the sensor surface. The sensitivity and dynamic range of CAR is tunable by varying the incident angle of light, which allows for optimizing the measurement for ligands with different sizes in both biomolecular and cell-based studies.
    Type: Grant
    Filed: December 6, 2021
    Date of Patent: August 11, 2026
    Assignee: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
    Inventors: Shaopeng Wang, Runli Liang, Guangzhong Ma
  • Patent number: 12698957
    Abstract: 34 P2418PC00 Abstract Optical diffraction tomography microscope (2) comprising an illumination system (4) configured for transmitting a sample beam through a sample observation zone, a detection 5 system (8) comprising at least one image sensor (54), and a wave collection system (6) comprising a lens (16) downstream of the sample observation zone configured for directing the sample beam towards the at least one image sensor.
    Type: Grant
    Filed: December 13, 2021
    Date of Patent: August 4, 2026
    Assignee: NANOLIVE SA
    Inventors: Sebastien Equis, Yann Cotte, Pierre-Alain Cotte
  • Patent number: 12693226
    Abstract: This application provides an apparatus and a method for measuring chlorine ions in concrete, and relates to the technical field of chlorine ion measurement. The apparatus includes a first optical path system, a second optical path system, a spectrometer, and a central control unit, where the first optical path system includes a femtosecond laser device, an ablative focusing lens group, and a sample; and the second optical path system includes a heating light source, a dichroic mirror, a reflecting mirror, and a heating laser focusing lens group. According to this application, the femtosecond laser device is used as an ablative light source, improving sample ablation efficiency and resolving a problem that a chlorine ion spectral line is weak. In addition, a clustering algorithm is adopted in a sampling process in this application, resolving problems such as a large quantitative error and poor repeatability caused by non-heterogeneity of the concrete.
    Type: Grant
    Filed: January 17, 2025
    Date of Patent: July 28, 2026
    Assignee: Shenzhen University
    Inventors: Shuxian Hong, Biqin Dong, Xu Wang
  • Patent number: 12693220
    Abstract: Provided are a fault diagnosis apparatus and method based on fluorescence multivariate correction analysis of transformer oil, relating to the field of transformer fault diagnosis technology. Thus, the problem of large volume and weight of the apparatus, high costs, and inconvenience to use caused when in the related art, a fluorescence spectrometer is directly used to acquire the fluorescence spectrum of transformer oil is solved. The monochromatic excitation light of an optimal excitation wavelength generated by a fluorescence excitation source is used to excite the transformer oil in a fluorescence excitation detection apparatus to generate fluorescence. The fluorescence excitation detection apparatus generates the fluorescence according to the input monochromatic excitation light and inputs the fluorescence to a fluorescence signal acquisition and analysis apparatus.
    Type: Grant
    Filed: September 8, 2023
    Date of Patent: July 28, 2026
    Assignees: STATE GRID ANHUI ELECTRIC POWER RESEARCH INSTITUTE, STATE GRID ANHUI ELECTRIC POWER CO., LTD., HEFEI INSTITUTES OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
    Inventors: Yue Zhao, Jia Xie, Fengxiang Ma, Yumei Song, Feng Zhu, Anjing Wang, Wei Liu, Shan Zhu, Jiong Qi, Zien Liu, Taiyun Zhu, Jun Cao, Jianlin Li, Chao Luo, Qingtao Chen, Chen Hang
  • Patent number: 12693203
    Abstract: A collecting system with a magnetically coupled sample mover is provided for flow cytometry and cell sorter systems. The collecting system uses magnets in a driver carriage to control the position of other magnets in a follower carriage. The driver carriage can thereby control the position of the follower carriage without physically touching the follower carriage.
    Type: Grant
    Filed: February 4, 2022
    Date of Patent: July 28, 2026
    Assignee: Cytek Biosciences, Inc.
    Inventors: Babak Honaryar, David Vrane, Peter Truong, Kuncheng Wang, Max Schwartz
  • Patent number: 12693218
    Abstract: A system for open-path sensing of a property of a fluid in an environment comprises: a sensing light source; a pumping light source for outputting a pumping beam into the environment for inducing a change of light propagation characteristics of the fluid; wherein the system outputs a probing beam and a reference beam into the environment, such that the probing beam has a larger intersection with the pumping beam than the reference beam; wherein a first interferometer detects a phase shift and/or an intensity change of a received probing beam; and wherein a second interferometer detects a phase shift and/or an intensity change of a received reference beam.
    Type: Grant
    Filed: July 9, 2024
    Date of Patent: July 28, 2026
    Assignees: IMEC VZW, Universiteit Gent
    Inventors: YanLu Li, Roeland Baets
  • Patent number: 12693238
    Abstract: There is provided a method of determining a depth of a damage layer formed on a back surface of the substrate. The method comprises irradiating the damage layer with first light and second light; detecting the first light and the second light reflected or scattered by defects in the damage layer; determining a first penetration depth of the first light and a second penetration depth of the second light based on a first wavelength of the first light and a second wavelength of the second light; and determining the depth of the damage layer based on the first penetration depth and the second penetration depth.
    Type: Grant
    Filed: October 5, 2021
    Date of Patent: July 28, 2026
    Assignee: EHWA DIAMOND INDUSTRIAL COMPANY LIMITED
    Inventors: Seong Kwon Choi, Heedong Park
  • Patent number: 12680808
    Abstract: Provided is a system for range detection including at least one beam source arrangement configured to provide illumination of certain coherence length, an optical arrangement, and a detection arrangement including at least one detector unit.
    Type: Grant
    Filed: March 25, 2021
    Date of Patent: July 14, 2026
    Assignee: LIDWAVE LTD.
    Inventors: Yehuda Hai Vidal, Uri Weiss
  • Patent number: 12680963
    Abstract: A machine vision system includes a vision components portion and an inspection portion. The inspection portion includes a variable focal length (VFL) lens, a VFL lens controller, an inspection portion light source, an inspection portion objective lens, and an inspection portion camera. The vision components portion performs an autofocus process which indicates z-heights of a plurality of sampling points on a surface of a workpiece for determining coarse surface profile data. The inspection portion thereafter performs an inspection process, which comprises acquiring an extended depth of field (EDOF) image for each inspection point of a plurality of inspection points on the surface of the workpiece, and for which an inspection scan path is followed which includes adjustments in relation to the distance between the inspection portion and the surface of the workpiece and is determined based at least in part on the coarse surface profile data from the autofocus process.
    Type: Grant
    Filed: November 4, 2024
    Date of Patent: July 14, 2026
    Assignee: Mitutoyo Corporation
    Inventors: Paul Gerard Gladnick, Dmitri Anatolyevich Tsyboulski, Jerry R. Mccormick, Mark Lawrence Delaney
  • Patent number: 12680962
    Abstract: A car body inspection device includes a main inspection device includes an illuminator to illuminate a surface of a car body; a light receiver to receive specular reflection light from a first inspection area of the surface illuminated by the illuminator; and circuitry configured to inspect the first inspection area based on the specular reflection light received by the light receiver. The main inspection device is coupled to an auxiliary inspection device to inspect a second inspection area other than the first inspection area on the surface, and the light receiver of the main inspection device does not receive the specular reflection light in the second inspection area.
    Type: Grant
    Filed: March 12, 2024
    Date of Patent: July 14, 2026
    Assignee: RICOH COMPANY, LTD.
    Inventors: Rie Hirayama, Koji Masuda, Teruki Kamada, Takahiro Kiyama, Yuta Inoue
  • Patent number: 12674720
    Abstract: A dispersion measuring device includes a pulsed laser light source, a pulse forming unit, a correlator, and an arithmetic operation unit. The pulse forming unit forms an optical pulse train from an optical pulse output from the pulsed laser light source. The correlator detects a temporal waveform of correlated light formed from the optical pulse train. The arithmetic operation unit estimates a wavelength dispersion amount of an optical component disposed between the pulsed laser light source and the correlator, based on the temporal waveform of the correlated light. A dispersion medium gives a group delay dispersion to the optical pulse train to increase the peak intensity of the correlated light to be equal to or greater than a threshold value of the correlator. The pulse forming unit gives a group delay dispersion having a sign opposite to the group delay dispersion given to the optical pulse train to the optical pulse.
    Type: Grant
    Filed: March 14, 2022
    Date of Patent: July 7, 2026
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Koyo Watanabe, Hisanari Takahashi, Takashi Inoue
  • Patent number: 12663255
    Abstract: Disclosed herein is an interferometric range resolution apparatus comprising: an antenna and a transceiver configured to transmit and receive wireless pulses; a dish configured to direct the received wireless pulses to the antenna; and a processor electrically coupled to the antenna via the transceiver, the processor configured to provide range resolution of at least two objects along a same line-of-sight of the transmitted wireless pulses.
    Type: Grant
    Filed: June 13, 2024
    Date of Patent: June 23, 2026
    Assignee: Chapman Unviersity
    Inventors: John Howell, Andrew Jordan
  • Patent number: 12663359
    Abstract: In a configuration for analyzing data of cells measured by a cell measuring apparatus, accuracy of cell classification is improved without requiring the cell measuring apparatus to have high information processing capability. A cell analysis method, using a cell analyzer for analyzing cells in accordance with an artificial intelligence algorithm, includes: obtaining the data regarding the cells measured by the cell measuring apparatus; analyzing the data to generate information regarding a cell type of each of the cells; and transmitting the information to the cell measuring apparatus.
    Type: Grant
    Filed: March 17, 2023
    Date of Patent: June 23, 2026
    Assignee: SYSMEX CORPORATION
    Inventors: Shoichiro Asada, Konobu Kimura, Masamichi Tanaka, Kenichiro Suzuki, Kohei Nango
  • Patent number: 12663370
    Abstract: Disclosed is a metrology apparatus and method for measurement of a diffractive structure on a substrate. The metrology apparatus comprises a radiation source operable to provide first radiation for excitation of the diffractive structure such that high harmonic second radiation is generated from said diffractive structure and/or substrate; and a detection arrangement operable to detect said second radiation, at least a portion of which having been diffracted by said diffractive structure.
    Type: Grant
    Filed: October 12, 2021
    Date of Patent: June 23, 2026
    Assignee: ASML Netherlands B.V.
    Inventors: Peter Michael Kraus, Sylvianne Dorothea Christina Roscam Abbing, Filippo Campi, ZhuangYan Zhang, Petrus Wilhelmus Smorenburg, Nan Lin, Stefan Michiel Witte, Arie Jeffrey Den Boef
  • Patent number: 12663256
    Abstract: An optical coherence tomography (OCT) system comprises an interferometer configured to interfere a test beam reflected from a specimen with a reference beam to produce an interference pattern. The OCT system also comprises a spectrometer configured to measure a spectrum of the interference pattern to produce measurements of intensities of the interference pattern corresponding to different wavelengths. The OCT system further comprises a processor configured to determine noise statistics of the intensities of the interference pattern and use the noise statistics to set a threshold for detecting a number of layers of the specimen penetrated by the test beam at the location based on a pre-specified probability of false acceptance of noise as a signal. The processor is further configured to determine the profilometry measurements as an estimate of depths of the layers of the specimen causing the intensities of the interference pattern above the threshold.
    Type: Grant
    Filed: December 20, 2023
    Date of Patent: June 23, 2026
    Assignee: Mitsubishi Electric Research Laboratories, Inc.
    Inventors: Joshua Rapp, Hassan Mansour, Petros Boufounos, Toshiaki Koike Akino, Kieran Parsons
  • Patent number: 12656100
    Abstract: An adjustment method for a shape measuring device that radiates light from a light source to a master for adjustment and a reference surface respectively as measurement light and reference light and measures a shape of a surface to be measured of a measurement target using multiplexed light of the measurement light and the reference light respectively reflected by the master for adjustment and the reference surface, the adjustment method including; measuring the master for adjustment in an adjusted state in which a focus position matches an interference position and calculating and storing a matching degree parameter indicating a matching degree between the focus position and the interference position as an adjustment matching degree parameter; when the measurement target is measured, measuring the master for adjustment, calculating the matching degree parameter and comparing the matching degree parameter with the adjustment matching degree parameter, to confirm the matching degree.
    Type: Grant
    Filed: August 6, 2024
    Date of Patent: June 16, 2026
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Yoshiyuki Kawata, Katsufumi Moriyama, Hideki Morii
  • Patent number: 12650375
    Abstract: An imaging spectroscopic ellipsometry apparatus and method configured to measure thin films with high spatial resolution. The apparatus includes a rotating compensator that enables to simultaneously collect both spectrometric ellipsometric data and ellipsometric imaging with the use of the same measurement beam of light. Collecting both data sets simultaneously increases the information content for analysis and affords a substantial increase in measurement performance.
    Type: Grant
    Filed: May 24, 2023
    Date of Patent: June 9, 2026
    Assignee: Bruker Nano, Inc.
    Inventors: Emad Zawaideh, Chris Claypool
  • Patent number: 12648403
    Abstract: A sample mapping system includes a sample chuck including absolute reference marks, an imaging metrology tool to capture sets of alignment images at locations associated with sample marks on a sample on the sample chuck, and a controller. A particular set of alignment images at a particular location may include at least one alignment image associated with a particular sample mark and at least one alignment image associated with a particular portion of the absolute reference marks within a field of view of the imaging metrology tool visible through the sample. The controller may determine absolute coordinates of the sample marks based on the sets of alignment images. Determining the absolute coordinates of the particular sample mark may include determining the absolute coordinates of the particular sample mark based on a position of the particular sample mark relative to the particular portion of the absolute reference marks.
    Type: Grant
    Filed: September 9, 2021
    Date of Patent: June 2, 2026
    Assignee: KLA Corporation
    Inventors: Yoav Grauer, Amnon Manassen, Andrew V. Hill, Avner Safrani