Patents Examined by Kathleen S Yuan
  • Patent number: 7986825
    Abstract: The present invention provides a model forming apparatus that can simply and efficiently form a three-dimensional model of an object using previously obtained three-dimensional model data of the object as a starting point. The apparatus comprises a photographing section 110 for photographing an object 10, an image data storage section 130 for storing three-dimensional model data of the object, a display section 140 for displaying a three-dimensional model based on the three-dimensional model data of the object 10, a recognition section 150 for recognizing an unmodeled part of the object 10 based on the three-dimensional model data stored in the image data storage section 130, and a photographing instruction information section 160 for obtaining photographing instruction information related to photographing the unmodeled part. The photographing section 110 photographs the object 10 in accordance with the photographing instruction information obtained by the photographing instruction information section 160.
    Type: Grant
    Filed: June 17, 2005
    Date of Patent: July 26, 2011
    Assignee: Topcon Corporation
    Inventors: Nobuo Kochi, Hiroyuki Aoki, Hitoshi Otani, Mitsuharu Yamada, Tadayuki Ito
  • Patent number: 7970200
    Abstract: A color image of an inspection object is taken by an imaging means capable of taking a color image to obtain color information of an RGB color space. A gray-scale image of a color component of the RGB color space or another color space is generated, and the inspection object is detected by a pattern recognition technique. Alternatively, a binary image is generated from the generated gray-scale image, and the inspection object is detected by performing pattern recognition on the binary image. Color data of a pixel occupied by the detected inspection object is compared with color data of a non-defective inspection object which is previously prepared to judge whether or not the inspection object is defective. In addition, this judgment result is reflected in another manufacturing step through a network and product quality is improved.
    Type: Grant
    Filed: June 25, 2010
    Date of Patent: June 28, 2011
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Teppei Oguni, Tatsuji Nishijima, Akiharu Miyanaga
  • Patent number: 7945120
    Abstract: According to one embodiment, an edge detection module detects edges in a frame of a moving picture signal in accordance with an edge determination reference value. A resolution conversion module converts a resolution of the frame from a first resolution to a second resolution, thereby generating a provisional high-resolution image. A corresponding pixel point detection module detects corresponding pixels in the provisional high-resolution image, which correspond to each of the detected edges. An image quality enhancement process module executes an image quality enhancement process for sharpening for each of the detected corresponding pixels in the provisional high-resolution image. A control module varies the edge determination reference value based on the detected edge number and a maximum edge number at which an information processing apparatus is able to complete the resolution-enhancing process for one frame within a target process time.
    Type: Grant
    Filed: May 12, 2009
    Date of Patent: May 17, 2011
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Akira Tanaka
  • Patent number: 7940964
    Abstract: Image data obtained by capturing an image including a human is received. The image data is analyzed and a part of the image including a human face is extracted. A prescribed part of the extracted human face is detected. Brightness of the image data is adjusted with reference to the prescribed part to obtain adjusted image data. An image is printed based on the adjusted image data.
    Type: Grant
    Filed: January 23, 2007
    Date of Patent: May 10, 2011
    Assignee: Seiko Epson Corporation
    Inventor: Toshie Kobayashi
  • Patent number: 7940965
    Abstract: According to the present invention, the face of a subject person can be rapidly detected. An image input unit inputs an image to be processed. A photographing-position input unit inputs photographing-position information attached to the processed image. An angle-range information determination unit determines an angle range, where face detection should be performed to the processed image, on the basis of the information obtained by the photographing-position information input unit. On the basis of information indicating the determined angle range, under the control of a process control unit, a face detection unit performs face detection to the processed image input by the image input unit in predetermined angle increments. A face integration unit integrates all of face data detected by a basic-angle-range face detection unit into face information and then outputs the information.
    Type: Grant
    Filed: January 6, 2009
    Date of Patent: May 10, 2011
    Assignee: Canon Kabushiki Kaisha
    Inventor: Yoshihiro Ishida
  • Patent number: 7936914
    Abstract: To determine authenticity of a solid body simply and precisely, a reference area of a paper sheet which is genuine is optically read from two different directions, and the image is registered as a reference image. A check area of a paper sheet subjected to the authenticity determination, including the reference area and having a size larger than the reference area, is read from two different directions with a scanner, and data on a partial area having the same size as the reference area are extracted from each set of check data collected by the reading. For a set consisting of the reference image and the check image optically read from the same direction, the value of the correlation with the reference image is repetitively calculated by the normalized correlation method while the partial area is shifted within the check area. The maximum correlation value and the normalized score of the maximum correlation value are compared with respective thresholds to determine the authenticity of the paper sheet.
    Type: Grant
    Filed: August 10, 2005
    Date of Patent: May 3, 2011
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Tadashi Shimizu, Tetsuya Kimura
  • Patent number: 7929732
    Abstract: The invention relates to a method of determining an identifier of determined discriminating power from biometric data. According to the method, biometric data is obtained relating to an individual. The biometric data is converted into a digital string. A word of an error-correcting code is associated with the individual. The error-correcting code word is added to the digital string. An identifier relating to the individual is determined by applying a hashing function to the error-correcting code word, the hashing function being selected to ensure the determined discriminating power to said identifier.
    Type: Grant
    Filed: January 23, 2007
    Date of Patent: April 19, 2011
    Assignee: Morpho
    Inventors: Julien Bringer, Paul Welti
  • Patent number: 7925080
    Abstract: Briefly, in accordance with one embodiment, a method of identifying marked images based at least in part on frequency domain coefficient differences is disclosed.
    Type: Grant
    Filed: January 13, 2006
    Date of Patent: April 12, 2011
    Assignee: New Jersey Institute of Technology
    Inventors: Yun-Qing Shi, ChunHua Chen
  • Patent number: 7907768
    Abstract: Methods and an apparatus process images. The method according to one embodiment accesses digital image data representing a plurality of objects with a plurality of features; generates a shape model for shapes of the plurality of objects, the step of generating a shape model including generating a baseline object by aligning the plurality of objects, and determining deformation modes to describe shape deformations between shapes of the plurality of objects and the baseline object; performs shape registration for the plurality of objects by fitting shapes of the plurality of objects using combinations of the deformation modes, to obtain registered shapes; and generates a probabilistic atlas by mapping the plurality of features from the plurality of objects to the baseline object, using the registered shapes for the plurality of objects.
    Type: Grant
    Filed: December 19, 2006
    Date of Patent: March 15, 2011
    Assignee: Fujifilm Corporation
    Inventor: Daniel Russakoff
  • Patent number: 7894642
    Abstract: A method and a device for checking fingerprints are described. The method comprises the steps of recording in succession at least two digital images of finger areas and comparing each of the recording images with a reference image that represents at least one previously recorded reference fingerprint from a reference finger areas. The device according to the invention is arranged to carry out the method.
    Type: Grant
    Filed: June 21, 2001
    Date of Patent: February 22, 2011
    Assignee: Precise Biometrics AB
    Inventor: Per Tufvesson
  • Patent number: 7889899
    Abstract: A computer-implemented method for visualization of diffusion tensor images includes providing a diffusion tensor image input and providing a volume of interest within the diffusion tensor image input. The method includes determining a plurality of direction-based classifications of the volume of interest, wherein classes are defined by a set of parameters, An optimal solution is then selected within the classifications by using a criterion defined as a ratio of inertia indicators. To represent the chosen classification, a cone graph is determined for each of the directional classes to be displayed or stored, each cone pair being the geometrical interpretation of the class parameters. The method further includes determining a spherical scatterplot of the volume of interest augmented with a cone graph for visualization of at least one of the directional classes, and displaying and/or storing the scatterplot.
    Type: Grant
    Filed: January 22, 2007
    Date of Patent: February 15, 2011
    Assignee: Siemens Medical Solutions USA, Inc.
    Inventors: Mariappan S. Nadar, Aurelien Flipo
  • Patent number: 7889926
    Abstract: An image processor obtains character images included in input image and the character codes for identifying the characters represented by the character images, classifies the character images included in the input image into a plurality of character image groups based on the obtained character codes, determines typical image patterns constituting the input image based on the character images classified in the character image groups, assigns indices for identifying the image patterns to the determined image patterns, and codes the occurrence position information of the character images included in the input image and the indices of the image patterns corresponding to the character images so as to be associated with each other.
    Type: Grant
    Filed: March 1, 2005
    Date of Patent: February 15, 2011
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Shunichi Kimura, Yutaka Koshi
  • Patent number: 7885455
    Abstract: A method of producing an enhanced Active Appearance Model (AAM) by combining images of multiple resolutions is described herein. The method generally includes processing a plurality of images each having image landmarks and each image having an original resolution level. The images are down-sampled into multiple scales of reduced resolution levels. The AAM is trained for each image at each reduced resolution level, thereby creating a multi-resolution AAM. An enhancement technique is then used to refine the image landmarks for training the AAM at the original resolution level. The landmarks for training the AAM at each level of reduced resolution is obtained by scaling the landmarks used at the original resolution level by a ratio in accordance with the multiple scales.
    Type: Grant
    Filed: January 5, 2007
    Date of Patent: February 8, 2011
    Assignee: UTC Fire & Security Americas Corporation, Inc
    Inventors: Xiaoming Liu, Frederick Wilson Wheeler, Peter Henry Tu
  • Patent number: 7881520
    Abstract: The present invention relates to a defect inspection system which can perform inspection condition setting easily in a relatively short period of time, can examine the inspection condition setting even when there is no sample, and further can provide an inspection condition and a defect signal intensity to a person, who sets the inspection condition, to assist the inspection condition setting. In the defect inspection system, a defective image, which is an inspection image, and a reference image corresponding thereto and a mismatched portion of the defective image and the reference image are digitalized as a defect signal intensity and accumulated in association with the inspection condition, and the inspection conditions are changed to repeat evaluations while repeating accumulating works until the evaluation of all the inspection conditions in a set range is completed.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: February 1, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Taketo Ueno, Yasuhiro Yoshitake
  • Patent number: 7869644
    Abstract: Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process and the soldering process and their differences are extracted. Each component on the substrate may be identified by differentiation and binarization processes and setting conditions for windows are determined corresponding to identified components. Windows are set according to determined setting conditions for inspecting the conditions of the substrate by using image data in the set windows and standard inspection data corresponding to component identification data.
    Type: Grant
    Filed: July 20, 2005
    Date of Patent: January 11, 2011
    Assignee: OMRON Corporation
    Inventors: Kiyoshi Murakami, Masato Ishiba, Jun Kuriyama, Teruhisa Yotsuya
  • Patent number: 7869635
    Abstract: A method of recognizing an injury pattern on a fingerprint is disclosed. The method comprises the steps of providing biometric information to a contact imager; imaging and characterizing the biometric information; comparing an image of the biometric information against previously stored templates; upon a comparison result of the comparison, determining an injury pattern; wherein upon an injury pattern determination, performing a comparison against a stored template based on features extracted from the biometric data and the damage data.
    Type: Grant
    Filed: January 23, 2007
    Date of Patent: January 11, 2011
    Assignee: Activcard Ireland Limited
    Inventor: Laurence Hamid
  • Patent number: 7856127
    Abstract: A ridge direction extraction device capable of extracting ridge directions accurately even in direction unstable areas is provided. In the ridge direction extraction device, a zone direction extractor calculates ridge directions and direction confidence of each zone, and a high confidence zone area determiner determines a high confidence zone area. A direction expectation calculator selects a propagation candidate zone and a reference zone, and calculates direction expectation of the ridge direction of the propagation candidate zone based on the ridge direction and distance of the reference zone. A propagation zone direction extractor recalculates the direction confidence calculated by the zone direction extractor based on the direction expectation of each propagation candidate zone, and extracts the ridge direction of a propagation candidate zone based on the direction confidence recalculated.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: December 21, 2010
    Assignee: NEC Corporation
    Inventor: Masanori Hara
  • Patent number: 7822276
    Abstract: A system and method for analyzing a specimen containing particles that can be difficult to differentiate. The system and method determines a first collective count of a selected group of particles in the specimen, treats at least a portion of the specimen to alter a subgroup of the selected group of particles, determines a second collective count of any of the selected group of particles in the treated portion of the specimen, and subtracts the second collective count from the first collective count to determine a differentiation count for the subgroup of particles altered by the treating of the specimen. The system and method is described with the example of determining concentrations of red and white blood cells in a specimen (e.g. spinal fluid), using auto-particle recognition techniques, without attempting to distinguish and count red versus white blood cells co-existing in the same specimen portion.
    Type: Grant
    Filed: February 14, 2006
    Date of Patent: October 26, 2010
    Assignee: IRIS International, Inc.
    Inventors: Richard H. Turner, Eric Chapoulaud
  • Patent number: 7817862
    Abstract: A pattern retrieving unit includes an acquiring unit that acquires a representative pattern image; a setting unit that sets a use condition of a type of shape feature of the representative pattern image; a receiving unit that receives a query pattern image used as a query; a determining unit that determines the type of shape feature of the representative pattern image to be the type of shape feature of the query pattern image, based on the use condition; a retrieving unit that retrieves a pattern image identical or similar to the query pattern image, using determined type of shape feature; and an output unit configured to output a result of retrieval by the retrieving unit.
    Type: Grant
    Filed: February 15, 2006
    Date of Patent: October 19, 2010
    Assignee: Fujitsu Limited
    Inventors: Takayuki Baba, Susumu Endo, Shuichi Shiitani, Yusuke Uehara, Daiki Masumoto, Shigemi Nagata
  • Patent number: 7813542
    Abstract: Embodiments of the invention provide a wafer aligning apparatus and a wafer aligning method. In one embodiment, the wafer aligning apparatus comprises an imaging unit adapted to take an image of a wafer being transferred from a load lock chamber to a transfer chamber and adapted to convert the image into digital signals, and a signal processing unit adapted to calculate a center alignment correction value for the wafer by comparing the digital signals to a master image stored in the signal processing unit. The wafer aligning apparatus further comprises a robot controller adapted to receive the center alignment correction value from the signal processing unit and adapted to control a transfer robot in accordance with the center alignment correction value to provide the wafer to a process chamber such that the center of the wafer is substantially aligned.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: October 12, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Heok-Jae Lee, Sang-Ho Kim, Hyu-Rim Park, Do-In Bae, Kee-Weone Seo, Chang-Woo Woo