Patents Examined by Khoi Hung Duong
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Patent number: 6314386Abstract: A site access log analyzing method of analyzing and grasping how a site is utilized by users which is provided in a server on a computer network to which a plurality of computers are connected through a communication cable, the method comprising the step of transferring access logs to a server in response to the request of the server and time sequentially storing them in a memory of a computer of the site users. With this arrangement, even if a user moved to a plurality of servers, the access log information thereof is time sequentially stored in the user's computer. Thus, site managers can grasp how the user has used content files and how the user has moved in the content files when necessary by transferring the access log information to the servers and storing it in them.Type: GrantFiled: October 14, 1998Date of Patent: November 6, 2001Assignee: Venture Union Inc.Inventor: Fumiaki Uemura
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Patent number: 6304832Abstract: The invention provides a method of sampling precision measurement signals to achieve an accurate measurement position at a particular measurement time, such that the measurement accuracy is unaffected by the velocity of motion. The method involves sampling each signal during a predetermined sampling period such that a signal from one sensor is sampled first, a signal from a second sensor sampled second, etc., and then the signals are sampled in reverse order such that the first signal sampled is sampled last. These sampled signals are averaged and produce a precision measurement at a time measured at one-half of the sampling time. In addition, this method can be applied to the use of separate scale tracks where each scale track is alternately sampled, or alternatively, where one scale track is sampled in the middle of the sampling period of another scale track.Type: GrantFiled: March 16, 1999Date of Patent: October 16, 2001Assignee: Mitutoyo CorporationInventors: Nils Ingvar Andermo, David Skurnik, Mark L. Delany
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Patent number: 6298309Abstract: A method for measuring a fundamental frequency of a power system comprises sampling voltage and current waveforms associated with the power system, wherein the voltage and current waveforms are characterized by a fundamental frequency component that may vary over time. Next, determine whether, according to a prescribed frequency tracking criterion, a present value of the fundamental frequency can be measured using voltage samples. If so, measure the fundamental frequency using the voltage samples, and set a best available value (“freq”) equal to the measured value based on voltage samples. If the fundamental frequency cannot be measured using the voltage samples, determine whether, according to the prescribed frequency tracking criterion, the present value of the fundamental frequency can be measured using current samples. If so, measure the fundamental frequency using the current samples and set the best available value equal to the measured value based on current samples.Type: GrantFiled: March 5, 1999Date of Patent: October 2, 2001Assignee: ABB Power T&D Company Inc.Inventors: Joseph Benco, Ratan Das, Cliff Downs
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Patent number: 6278953Abstract: An automated “tuning” system is disclosed that utilizes the known tuning curve (on an approximation thereof) to control the tuning process. In particular, the tuning curve is transformed (if necessary) into a quadratic with a local maximum, where the maximum is associated with the optimum tuning value. In one embodiment, the tuning system of the present invention may be used to provide alignment between optical components. The system may be organized to recognize “backlash” in the tuning process and perform additional tuning adjustments to overcome this backlash. Each tuning curve may be one-dimensional and a set of such curves used to provide for an N-dimensional tuning.Type: GrantFiled: October 20, 1998Date of Patent: August 21, 2001Assignee: Lucent Technologies, Inc.Inventor: Ernest Eisenhardt Bergmann
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Patent number: 6278952Abstract: A machine, called Reliability gage, for evaluating a non-contact ammeter. Reliability gage outputs at least one of estimated merit reliability, and fault location, and fault assessment of best use of a gaged ammeter. A Reliability gage includes at least one merit measure which has an output indicative of the quality of at least one parameter of the gaged ammeter. A Reliability gage also has at least one reference merit magnitude representative of a “clean” ammeter, that is to say, first rate, or alternatively, a faulted short, faulted gap, etc., and a comparitor with processor and output so that evaluation of the gaged ammeter is done systematically to provide the required output. Reliability gage is applicable to both AC and DC Swain Meter type non-contact ammeters. Some reliability gages are adapted for use by a human operator who may make use of spreadsheets.Type: GrantFiled: December 8, 1998Date of Patent: August 21, 2001Inventor: William H Swain
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Patent number: 6263297Abstract: Low and high frequency components of ship bending loads are computed from sea trial testing data, respectively based on sea statistical properties and geometry of a model ship hull and cyclic wave impact on such model ship hull. The low and high frequency bending load components are combined through an algorithm controlled program to provide a more accurate prediction of cyclic bending loads experienced during the lifetime of a ship hull.Type: GrantFiled: March 11, 1999Date of Patent: July 17, 2001Assignee: The United States of America as represented by the Secretary of the NavyInventors: Jerome P. Sikora, Robert W. Michaelson