Abstract: A waveform generator suitable for use in the testing of instrument landing systems comprising: a first generator (1) for generating digitally a first waveform comprising the superposition of a second waveform (19) of a first frequency and a third waveform (21) of a second frequency; a second generator (3) for generating digitally a fourth waveform comprising the superposition of a fifth waveform (25 or 27) comprising a phase reversed version of one (19 or 21) of said second (19) and third (21) waveforms of the frequency of said one waveform (19 or 21) and a sixth waveform (23 or 29) in phase with and of the frequency of the other one (19 or 21) of said second (19) and third (21) waveforms; and a circuit (7) for combining said first and fourth waveforms thereby to produce a waveform suitable for said use.
Abstract: The invention provides a system and method for automatically, accurately, and repeatable aligning computer numerically controlled (CNC) movable machine components with respect to their respective degrees of freedom of motion. One embodiment of the invention, particularly useful for maintenance purposes, provides a programmable CNC programmer that uses a spindle mounted probe to measure at least two different positions of a point on a movable machine component to evaluate the geometric condition of the component with respect to a degree of freedom of motion of the component and issue alignment instructions to the machine operator. One embodiment provides the invention in a CNC computer program on a programmable media having a programmed set of instructions. The preferred embodiment uses the controller control the CNC machine's operation and spindle movement, perform the machine components' maintenance evaluation, and issue instructions for aligning the components in a consistent manner.
Type:
Grant
Filed:
February 10, 1994
Date of Patent:
October 18, 1994
Assignee:
General Electric Company
Inventors:
R. David Hemmerle, James E. Randolph, Jr., John G. J. Frezza
Abstract: The present invention relates to a computer tomography system which measures the thickness and edge position of hot-rolled steel. X-rays produced by two X-ray sources are directed, through the sample being measured, to a plurality of radiation detectors. The radiation detectors measure the attenuation of the X-rays caused by the sample. The attenuation levels sensed by each detector are correlated with each detector's physical location. This information is collected as each X-ray source illuminates the radiation detectors. The collected information is triangulated or averaged, as necessary, to determine the dimensions and position of the measured sample.
Type:
Grant
Filed:
August 3, 1992
Date of Patent:
September 27, 1994
Assignees:
Bethlehem Steel Corporation, Scientific Measurement Systems, Inc.
Inventors:
Carvel D. Hoffman, Charles J. Romberger, Hunter Ellinger, Thomas W. Stephens, Richard D. Savage
Abstract: An electronic circuit parameter extraction system is provided with a pulse signal forcing generator, an interface to a device under test (DUT), a signal digitizer, a timebase to control the digitizing interval, a data processor to extract DUT essential root parameters, a circuit and/or system simulator to generate signals from the extracted parameters, and a display system to view acquired and/or simulated signals, and is able to compare simulated signals with previously acquired signals. The circuit parameter extraction system further allows extraction of realistic behavioral model parameters which may be used as a component library model within a computer aided engineering (CAE) simulator, allowing improved convergence between the results obtained with the CAE simulator and the physical circuit system response being modeled.
Abstract: A method for detecting a PN (Pseudo Noise) pattern for a remote loopback test in a communication system includes the following first through fifth steps. The first step receives a first n-bit pattern (n is an arbitrary number) which is a part of the PN pattern. The second step leftwardly shifts n bits of the first n-bit pattern by a first number of bits, so that a second n-bit pattern is generated. The third step executes an exclusive-OR operation on the n bits of the first n-bit pattern and n bits of the second n-bit pattern, so that a third n-bit pattern is generated. The fourth step rightwardly shifts n bits of the third n-bit pattern by a second number of bits, so that a fourth n-bit pattern is generated. The fifth step executes an exclusive-OR operation on the n bits of the third n-bit patterns and n bits of the fourth n-bit patterns, so that a fifth n-bit pattern is generated. The fifth n-bit pattern is a sixth n-bit pattern which is received after the first n-bit pattern.
Abstract: A MOST output signal determiner (4) with output signal strength verifying function receives a circuit connection data (D4) with MOS input information to determine the signal strength of an output signal which appears at an output terminal (drain or source) of an MOS transistor as a function of an input signal. A logic simulator verifies circuit operating characteristics in consideration for signal transmitting characteristics on the input signal of the MOST, the presence/absence of a through current in the MOST and an accurate state transition delay time through the MOST.
Abstract: A continuous wave ultrasonic tracking system using an ultrasonic transmitter acoustically radiating a continuous wave ultrasonic transmitted signal and an ultrasonic receiver detecting the transmitted signal as a received signal. The system mixes the transmitted and received signals to create an interference pattern characterized by interference fringes, counts the number of the fringes by which the pattern changes with respect to a fixed point and stores the number as a number of wavelengths of the displacement between the transmitter and receiver, interpolates a location of the fixed point between successive ones of the interference fringes as a fraction of a wavelength and stores the fraction of a wavelength and computing the displacement by combining the number of wavelengths and the fractional number of wavelengths.
Type:
Grant
Filed:
July 10, 1992
Date of Patent:
August 16, 1994
Assignee:
Northrop Grumman Corporation
Inventors:
Samuel C. Puma, John B. Sinacori, Yorke J. Brown