Patents Examined by Kyle T. Choi
  • Thermal analysis system and method of operation
    Patent number: 5604687
    Abstract: A thermal analysis system (10) for analyzing a thermal model of an object is provided which comprises a Gauss-Seidel processor (12) that includes an acceleration factor generator (14). An initial condition generator (16) and a residual energy feedback accelerator (18) are coupled to the Gauss-Seidel processor (12). A data storage (20) is coupled to the Gauss-Seidel processor (12), and a display (22) is coupled to the data storage (20).
    Type: Grant
    Filed: January 31, 1994
    Date of Patent: February 18, 1997
    Assignee: Texas Instruments Incorporated
    Inventors: Ming J. Hwang, Darvin R. Edwards