Patents Examined by L. Miranda
  • Patent number: 6082295
    Abstract: A plasma etching apparatus used in the semiconductor device fabrication process improves the uniformity of the etch process by ensuring the uniformity of a plasma gas. The apparatus includes magnetic coils surrounding an outer wall of an etching chamber for generating a magnetic field within the chamber to guide a plasma etch gas created by radio frequency (RF) energy. A power cable is connected to the magnetic coils for supplying power. A bracket, made of an insulating material, is attached at one side to the outer wall of the etching chamber and at an opposing side to the power cable.
    Type: Grant
    Filed: November 3, 1998
    Date of Patent: July 4, 2000
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Sang-yeoul Lee