Abstract: An embodiment of a magnetic-field sensor includes a magnetic-field sensor arrangement and a magnetic body which has, for example, a non-convex cross-sectional area with regard to a cross-sectional plane running through the magnetic body, the magnetic body having an inhomogeneous magnetization.

Abstract: A multiple current sensor device or a multiple current shunt device includes at least two resistive sections comprising a first resistive section and a second resistive section, at least two connecting sections comprising a first connecting section and a second connecting section and a common connecting section. The first resistive section is electrically coupled in between the first connecting section and the common connecting section. The second resistive section is electrically coupled in between the second connecting section and the common connecting section. Using an embodiment may improve a trade-off between an efficient integration, a compact integration, a compact implementation and an accurate determination of at least one value indicative of at least one of multiple currents.

Abstract: In an embodiment, a chuck to support a solar cell in hot spot testing is provided. This embodiment of the chuck comprises a base portion and a support portion disposed above the base portion. The support portion is configured to support the solar cell above the base portion and to define a cavity between a bottom surface of the solar cell and the base portion that thermally separates a portion of the bottom surface of the solar cell from the base portion.

Abstract: Methods and apparatus selecting settings for circuits according to various aspects of the present invention may operate in conjunction with a measurement element connected to the circuit. The circuit may include a voltage source adapted to supply a voltage to the measurement element. The voltage may be substantially independent of the characteristics of the measurement element. The circuit may further include a measurement sensor responsive to a current in the measurement element. The measurement sensor may generate a control signal according to the current in the measurement element.

Abstract: A method and device for detecting an object in a substrate is disclosed. The device has a sensor unit having a sensor element and at least one further sensor element, a control and evaluation unit, and a display unit. The method for detecting an object in a substrate includes simultaneous reception of a receive signal and at least one further receive signal and simultaneous calculation of a depth cross-sectional image from the receive signal and at least one further depth cross-sectional image from the at least one further receive signal by the control and evaluation unit.

Abstract: A charge read-out structure for photon and particle detectors, which is capable of spatially-resolving a position of the charge. The structure comprises a resistive element defining a detection surface which is capacitively coupled to an array of electrically insulated electrodes. Each electrode in the array is capacitively coupled to an adjacent electrode in the array to form a capacitively coupled network of electrodes. Selected ones of the electrodes in the array are each coupled to an array output for connection to a respective charge measurement device. The resistive element has a resistivity sufficient to temporarily localize a charge induced on the resistive element to an area corresponding to a subset of said electrodes in the array and for a duration sufficient for signal measurement from the array of electrodes.

Abstract: A magnetic field sensor includes a comparator detector for which a measured threshold value is stored prior to power down and recalled upon power up for use by the comparator detector. A corresponding method is associated with the magnetic field sensor.

Abstract: A magnetostrictive position sensor achieves an improved signal to noise ratio by implementing several electronic control features, including: enclosing a waveguide within an approximately tubular return conductor, adjusting the energy of an interrogation pulse and then clamping the waveguide, tracking the peak voltage of a sensed signal, cutting off the signal of a pickup during the time period outside of a signal time frame, adjusting the pass band of a filter based on an interrogation rate and waveguide length, zeroing and scaling a signal without digitizing the signal, and avoiding noise from an interrogation voltage generator.

Abstract: A rotor (1b) includes a first cylindrical portion (10), and a second cylindrical portion (20) including a first partial circumferential surface (21) having a width narrower than that of the first cylindrical portion (10) in the circumferential direction, and a second partial circumferential surface (22) having a radius smaller than a radius of the first partial circumferential surface; the rotor, further, including a first to-be-detected portion having a plurality of teeth (15), and a second to-be-detected portion having at least one tooth (25), and wherein the at least one tooth of the second cylindrical portion and the tooth of the first cylindrical portion corresponding to the at least one tooth are formed in one operation by machining.

Abstract: An enclosure includes a housing adapted to cover at least the body of a power adaptor of a device charger. The housing has an opening to allow access to the charging wire port of the power adaptor. The opening is smaller than the power adaptor, so the power adaptor cannot be removed from the housing through the window. Further, the window can permit the charging wire plug to be plugged into and removed from the charging wire port while the power adaptor remains in the housing. The housing further includes charging wire trap which captures the charging wire. The charging wire trap holds the wire between the charging wire plug and the device interface. The charging wire trap is sized to not allow either the charging wire plug or the device interface to pass through it. The enclosure can also include an anchor point attached to the housing.

Abstract: A system, such as a magnetic immunity testing system, can include a first coil configured to generate a first magnetic field. The first coil can be disposed on a first side of a scanning volume and can have a first feed for supplying electric current to the first coil. A second coil can be similarly configured on an opposite side of a scanning volume, and a second magnetic field from the second coil can be combined with the first magnetic field to form a combined magnetic field. The coils can be provided with transporters that translate coils in at least one dimension. The system can also include a controller that is configured to control the transporters and the feeds to provide the combined magnetic field as a controlled and calibrated magnetic field over the scanning volume.

Abstract: Torque sensor has: magnetic member; first yoke member having (a) first nail portions arranged concentrically to face the magnetic member in radial direction and (b) first ring portion; second yoke member having (c) second nail portions arranged concentrically so that the first and second nail portions are circumferentially alternately arranged and the second nail portions face the magnetic member in radial direction and (d) second ring portion; first magnetic flux concentration ring provided between the first and second ring portions; second magnetic flux concentration ring provided between the second ring portion and the first magnetic flux concentration ring; and magnetic sensor. The first and second magnetic flux concentration rings and the first and second ring portions are arranged in layers in radial direction. A part or all of axial direction area of the first and second magnetic flux concentration rings is surrounded and shielded by the second ring portion.

Abstract: A residual magnetic flux estimation device 1 includes a DC power-source control device 11 which controls a DC power source 300 to apply a DC voltage across two terminals of a ? connection that is a secondary winding or a tertiary winding, a voltage measuring device 12 which measures a terminal voltage at the primary side of a three-phase transformer 200, a computing device 13 that determines a phase having a high voltage between the two phases other than the phase to which the voltage is applied, and a residual magnetic flux measuring device 14 that measures a phase-to-phase residual magnetic flux between the two phases other than the high-voltage phase, and estimates a measured value of the phase-to-phase residual magnetic flux as a maximum residual magnetic flux in the measurement-target three-phase transformer.

Abstract: In an impedance measurement system, a reference impedance (2) to be measured is periodically connected and disconnected by means of switch (3) in parallel to the unknown impedance (1) to be measured. The thus generated amplitude modulation of the measurement current is demodulated, and the amplitude of the demodulated signal is indicative of the reference impedance to be measured. Using a low frequency modulation of the reference impedance enables to measure the impedance of the reference impedance without disconnecting the unknown impedance.

Abstract: A testing apparatus for electronic components comprises a mounting block and a plurality of contact strips arranged on the mounting block. The contact strips are configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component. Further, a preload block located on the mounting block is operative to contact and apply a pre-stress force onto the contact strips in the biasing direction prior to contact between the electrical leads and the contact strips.

Abstract: A test wafer is disclosed with a first side configured to have integrated circuits formed thereon and a second side with a test structure formed thereon. The test wafer can include electrical test structures embedded in the second side of the wafer. An electrical test of the test wafer can be performed after handling by a tool used in a wafer manufacturing process to determine if the tool caused a defect on the second side of the wafer. The test structure can include a blanket layer disposed on the second side of the wafer. The test wafer can then be exposed to a wet etch and inspected thereafter for the presence of an ingress path caused from the etch chemistry. The presence of an ingress path is an indication that the tool used prior to the wet etch caused a defect in the wafer.

Abstract: A method for testing a semiconductor device. The method comprises moving a probe in a vertical direction towards an electrical structure on a semiconductor device to position the probe alongside the electrical structure. A tip of the probe is positioned lower than an elevation of an outermost periphery of the electrical structure. The method also includes moving the probe in a lateral direction towards the electrical structure to contact the electrical structure. The probe tip mechanically and electrically engages the electrical structure.

Abstract: A device for detecting a dielectric object includes a first electrode and a second electrode. A first unit is configured to determine a first capacitance that exists between the first electrode and a common reference point and that is influenced by the object. A second unit is configured to determine a second capacitance that exists between the second electrode and the reference point and that is influenced by the object. The device further includes a control unit for actuating the first and second units and an evaluating unit that is configured to detect the object when the determined capacitances differ by more than a predetermined amount. The control unit is configured to actuate the units in such a manner that the capacitance determinations are carried out in succession. A switching unit is provided so as to electrically connect the electrode of the respective non-actuated unit to the common reference point.

Abstract: An ambulatory infusion device for infusion of a liquid drug into a patient's body over an extended period of time and methods thereof are disclosed. The device includes a sensor assembly, which produces a sensor assembly output based on an infusion characteristic of the ambulatory infusion device and based on a supply voltage/current, and a supply unit which is coupled to a sensor of the sensor assembly and generates the supply voltage/current. A sensor testing unit detects a failure of the sensor assembly, wherein the sensor testing unit is coupled to the sensor assembly and the supply unit, and the sensor testing unit carries out a sensor testing sequence. The sensor testing sequence includes controlling the supply unit so as to produce a variation of the supply voltage/current, and determining whether the variation of the supply voltage/current produces a corresponding variation of the sensor assembly output.

Abstract: An apparatus includes a sub with recesses along an exterior wall to receive inserts, an antennae case including a coil surrounded by a sacrificial wear portion of a material through which signals between the coil and a formation of interest may pass. An eroded outer wall of the sacrificial wear portion is restorable by application of an uncured restorative material to the antennae case. A method includes securing an antennae case having a coil there within onto a sub, surrounding the coil with a metal sleeve shield, and radially receiving and securing a multi-piece sacrificial wear member intermediate the antennae case and a retainer ring having a threaded bore. The multi-piece sacrificial wear member is replaceable after use by unthreading the retainer ring to release the sacrificial wear member for radial removal from the sub.