Abstract: Ions fragmented from a known precursor ion of a known compound are received by an ion guide that ejects the ions into an extraction region of a TOF mass analyzer. The ion guide ejects the ions using Zeno pulsing mode and the TOF mass analyzer measures intensities of the ions over time, producing a Zeno group of mass spectra. The ion guide then switches to a normal pulsing mode, producing a normal group of mass spectra. A gain is calculated for Zeno mode in comparison to normal mode as a series of ratios of intensities of one or more ions obtained from the Zeno group to corresponding intensities of the one or more ions obtained from the normal group. The gain is used to calculate a percentage of the theoretical gain and is used along with the theoretical gain to quantitate a compound in an on-demand Zeno pulsing quantitation experiment.

Abstract: A charged particle beam device includes: an inclination mechanism driving unit configured to generate a driving force; an inclination driving force transmission unit configured to transmit the driving force; and an inclination mechanism unit having first and second load transmission units, first, second and third deformation units, and an inclinable sample holding unit. The first load transmission unit moves in a load direction by the load from the inclination driving force transmission unit and transmits the load to the first deformation unit. The second load transmission unit rotates about the second deformation unit as a fulcrum by a torque generated by deformation of the first deformation unit and transmits the load to the third deformation unit. The sample holding unit rotates about the fourth deformation unit as a fulcrum opposite to a direction of the second load transmission unit by a torque generated by deformation of the third deformation unit.

Abstract: In one embodiment, a beam detector includes a first aperture plate including a first passage hole, a second aperture plate including a second passage hole that allows a single detection target beam passing through the first passage hole to pass therethrough, and a sensor detecting a beam current of the detection target beam passing through the second passage hole. The second aperture plate includes an electrically conductive material, a plurality of third passage holes are formed around the second passage hole, and the plurality of third passage holes allow light to pass therethrough.

Abstract: An example ion mobility spectrometry system includes a drift chamber, an ion detector, a thermal sensor, and processing circuitry. The drift chamber is configured to receive an ionized sample and an ionized calibrant. The ion detector is configured to generate a drift signal in response to detecting drifted ions at a predetermined position along the drift chamber. The thermal sensor is configured to generate a temperature signal indicative of a temperature of the drift chamber. The processing circuitry is configured to determine, based on the temperature signal, a mobility relation for a target species; determine, based on the drift signal, calibrant and sample drift times; determine, based on the mobility relation and the calibrant drift time, a target drift time; and detect the target species in the ionized sample by comparing the sample drift time with the target drift time.