Patents Examined by Lisa E Peters
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Patent number: 11169213Abstract: Controllers and methods to manage a battery, in which a controller estimates scale factor and a steady state current rate according to multiple battery voltage values and a steady state model during steady state operation, and estimates the current rate according to a battery voltage value, the scale factor, and a dynamic model of the battery during dynamic operation, and the controller estimates a remaining capacity of the battery according to the current rate, without requiring controller reconfiguration for different batteries.Type: GrantFiled: April 30, 2018Date of Patent: November 9, 2021Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Githin Karippumannil Prasad, Yevgen Pavlovich Barsukov, Dale Allen Blackwell
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Patent number: 11156567Abstract: There are provided a defect inspection apparatus, method, and program for, in a case of using an image of an inspection-target industrial product (test object) to conduct an inspection to check whether defects are present, allowing an image interpreter to precisely and efficiently detect defects. A possible-defect image D3 indicating a crack-like defect and a simulation result image P3 indicating the predicted growth of the crack-like defect are displayed. Sliders L1 and L2 and checkboxes CB1 are used to enable selection of possible defects and simulation results to be displayed. An image interpreter can use the checkboxes CB1 to select a type of possible defect to be displayed, and can use the sliders L1 and L2 to select possible defects to be displayed on the basis of the wall thickness of portions in which possible defects are detected and the size of possible defects.Type: GrantFiled: June 22, 2018Date of Patent: October 26, 2021Assignee: FUJIFILM CorporationInventor: Yasuhiko Kaneko
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Patent number: 11150630Abstract: Statistically significant event patterns predict the timing for performing entity maintenance. Event patterns are determined based on a target variable having an undesired value for a given entity when the event pattern occurs. Event patterns are filtered based on distributions of the event patterns across multiple entities and distributions of event patterns during desired operation of the entities and undesired operation of the entities. A predictive maintenance process is established having significant event patterns as the basis for maintenance tasks.Type: GrantFiled: October 19, 2017Date of Patent: October 19, 2021Assignee: International Business Machines CorporationInventors: Lei Fan, Sier Han, Xiao Ming Ma, A Peng Zhang
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Patent number: 11150631Abstract: Statistically significant event patterns predict the timing for performing entity maintenance. Event patterns are determined based on a target variable having an undesired value for a given entity when the event pattern occurs. Event patterns are filtered based on distributions of the event patterns across multiple entities and distributions of event patterns during desired operation of the entities and undesired operation of the entities. A predictive maintenance process is established having significant event patterns as the basis for maintenance tasks.Type: GrantFiled: May 31, 2019Date of Patent: October 19, 2021Assignee: International Business Machines CorporationInventors: Lei Fan, Sier Han, Xiao Ming Ma, A Peng Zhang
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Patent number: 11125634Abstract: Provided are a residual stress estimation method and a residual stress estimation device capable of estimating residual stress suitable for a structure in which inherent strain occupied mainly by plastic strain occurs. A constraint condition is introduced to a distribution function used in the residual stress estimation method based on an inherent strain method, the constraint condition being that a plastic-worked structure does not undergo volume change before and after working. Residual stress or elastic strain is measured from a T piece collected from the structure, and a parameter of the distribution function is optimized so as to approximate the inherent strain at each measurement point obtained from the measured value of the residual stress or elastic strain. An estimated value of the residual stress in the structure is calculated using the obtained parameter.Type: GrantFiled: February 22, 2016Date of Patent: September 21, 2021Assignee: Kobe Steel, Ltd.Inventors: Keisuke Okita, Tomokazu Nakagawa, Mariko Yamada
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Patent number: 11079368Abstract: The invention is directed towards a method and system for optically-based monitoring of chemicals of potential concern (COPCs), including mercury (Hg), methyl mercury (MeHg), and polychlorinated biphenyls (PCBs). It employs a multi-parameter statistical analysis model, such as partial least square regression (PLS regression), to identify combinations of predictors (e.g., optical, water quality, and physical properties) that have large covariance with the response values. The predictive model is validated against analytic samples from laboratories. The steps in the method are repeated until predictors, or parameters are selected that avoid over-fitting and which yield physically-based results.Type: GrantFiled: June 26, 2017Date of Patent: August 3, 2021Assignee: Integral Consulting Inc.Inventors: Grace Chang Spada, Craig A. Jones, Todd Martin
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Patent number: 11047946Abstract: Aspects of the disclosure are directed to voltage-based current sensing. In accordance with one aspect, voltage-based current sensing may include performing a coarse calibration of a voltage based current sensor to determine a coarse offset; performing a fine calibration of the voltage based current sensor to determine a fine offset; performing a frequency calibration of the voltage based current sensor to determine a frequency offset; and performing a transfer function calibration of the voltage based current sensor to determine a sensor transfer function using one or more of the coarse offset, the fine offset and the frequency offset; and measuring a load current using the sensor transfer function.Type: GrantFiled: May 8, 2018Date of Patent: June 29, 2021Assignee: Qualcomm IncorporatedInventors: Nam Dang, Rajeev Jain, Swarna Navubothu, Alan Lewis, Martin Saint-Laurent, Tung Nang Pham, Joseph Terregrossa, Paras Gupta, Somasekhar Maradani
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Patent number: 11047889Abstract: A monitoring apparatus is coupled to a sensor configured to observe a behavior of a monitoring target, and is accessible a storage device being configured to store: a database stored a phenomenon data group; stability information; and operation history information. The monitoring apparatus is configured to: calculate a stability of input phenomenon data; determine whether the stability of the input phenomenon data is a stability indicating a specific behavior; retrieve from the database, when the stability of the input phenomenon data is a stability, similar phenomenon data that is similar to the input phenomenon data; generate, by acquiring from the stability information a stability of subsequent phenomenon data continuous with the similar phenomenon data, similar case data combining the similar phenomenon data and the subsequent phenomenon data; identify, from the operation history information, operation content; and output the similar case data and the operation content.Type: GrantFiled: August 7, 2015Date of Patent: June 29, 2021Assignee: HITACHI, LTD.Inventors: Mika Takata, Norifumi Nishikawa
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Patent number: 11041877Abstract: In some examples, to perform motion detection of a moveable platform, variance values based on acceleration data from an accelerometer on the moveable platform are computed. Using the computed variance values, it is determined whether the moveable platform is in motion.Type: GrantFiled: February 24, 2017Date of Patent: June 22, 2021Assignee: BlackBerry LimitedInventors: Dake He, Alexander Levato, Yu Gao
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Patent number: 11029414Abstract: Electronic devices and methods for providing location information are provided, of which a representative method includes: generating sensor readings corresponding to sensed motion of the electronic device; determining a reference location information; computing a GPS-fused location information based on the reference location information and the sensor readings; generating a GPS-required event based on a change of the GPS-fused location information; generating a GPS-not-required event responsive to the reference location information being determined; receiving the GPS-fused location information and one of either the GPS-required event or the GPS-not-required event; responsive to the GPS-required event being received, operating the GPS receiver in a location information-acquiring mode during which the GPS receiver generates geographical location readings; and responsive to the GPS-not-required event being received, operating the GPS receiver in a power-saving mode during which the GPS receiver is deactivated.Type: GrantFiled: June 12, 2017Date of Patent: June 8, 2021Assignee: CM HK LIMITEDInventors: Yun-Chia Hsieh, Kuo-Ting Hu, Yu-Kuen Tsai, Ching-Lin Hsieh, Chien-Chih Hsu
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Patent number: 11009533Abstract: A method determines deviations between actual measured current values and setpoint current values in a number n (n?2) of parallel-connected current-regulated circuit paths for the connection of a load with an energy source. A measurement of the total actual current value flowing from the energy source to the load is effected by a precision current measuring device with a low accuracy tolerance, and the measurement of partial currents in the circuit paths is effected by standard current measuring devices with a greater accuracy tolerance, in relation to the precision current measuring device. By an adjustment of the partial currents in the circuit paths, while maintaining a constant total current, values are obtained for a n-dimensional equation system corresponding to the number of circuit paths, the resolution of which, in the knowledge of the accurate total actual current, gives the deviations in the actual values of the partial currents.Type: GrantFiled: June 29, 2016Date of Patent: May 18, 2021Assignee: Vitesco Techologies GmbHInventors: Martin Goetzenberger, Rainer Gietl
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Patent number: 11003737Abstract: A method of circuit yield analysis for evaluating rare failure events includes performing initial sampling to detect failed samples respectively located at one or more failure regions in a multi-dimensional parametric space, generating a distribution of failed samples at discrete values along each dimension, identifying the failed samples, performing a transform to project the failed samples into all dimensions in a transform space, and classifying a type of failure region for each dimension in the parametric space.Type: GrantFiled: September 5, 2017Date of Patent: May 11, 2021Assignee: Samsung Electronics Co., Ltd.Inventors: Nuo Xu, Jing Wang, Zhengping Jiang, Woosung Choi
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Patent number: 10989831Abstract: A method and system can include a sensor positioned in a borehole, characteristics of the earthen formation can be measured and logged by the sensor, and an effective permeability can be determined based on the logged characteristics. Multi-component induction (MCI) data can be measured by a logging tool, 3D resistivity components can be determined by inverting the MCI data, and the 3D resistivity components can be logged. Tri-axial permeability components can be determined based on the effective permeability and the 3D resistivity component logs. A permeability of sand in the earthen formation can be determined based on the tri-axial permeability components, the effective permeability, and a laminated shale volume. The sand permeability can be logged and modifications to operation(s) can be initiated based on the sand permeability.Type: GrantFiled: October 14, 2016Date of Patent: April 27, 2021Assignee: Halliburton Energy Services, Inc.Inventor: Junsheng Hou
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Patent number: 10989531Abstract: Described herein is a method of setting-up a range-based tracking system utilising a tracking coordinate system that uses a plurality of spaced apart stationary nodes for tracking objects within a tracking environment. The method includes the step of transmitting signals between the stationary nodes to obtain range information between at least a subset of pairs of the nodes and determining coordinates for all of the stationary nodes in a node coordinate system using these range information. The method also includes the step of obtaining spatial information related to at least one of the nodes, the spatial information being indicative of one or more features or locations within the tracking environment and determining the location of all stationary nodes in the tracking coordinate system, wherein some or all of the coordinates of the stationary nodes are used for tracking objects in the tracking system.Type: GrantFiled: August 12, 2015Date of Patent: April 27, 2021Assignee: Commonwealth Scientific and Industrial Research OrganisationInventors: Mark Hedley, Dan Popescu
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Patent number: 10955368Abstract: A data analysis system is disclosed for generating analysis data depending on microscopic data of an object generated by a charged particle microscope. The microscopic data includes an image showing a structure. A graphical representation of the structure is displayed on the display by the graphical user interface. Separation data is generated representing at least one path of a separation cut, which separates pixels of the structure from each other. The separation cut is visually marked by the graphical user interface, depending on the separation data, by differently marking different area portions of the representation, which represent different pixels of the structure which are separated from each other by the separation cut. Separate analysis data are generated for each of at least two portions of the object, depending on the microscopic data and depending on the separation data.Type: GrantFiled: August 8, 2014Date of Patent: March 23, 2021Assignee: Carl Zeiss Microscopy Ltd.Inventors: Champ Gohil, Richard Moralee
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Patent number: 10935893Abstract: Disclosed are apparatus and methods for determining process or structure parameters for semiconductor structures. A plurality of optical signals is acquired from one or more targets located in a plurality of fields on a semiconductor wafer. The fields are associated with different process parameters for fabricating the one or more targets, and the acquired optical signals contain information regarding a parameter of interest (POI) for a top structure and information regarding one or more underlayer parameters for one or more underlayers formed below such top structure. A feature extraction model is generated to extract a plurality of feature signals from such acquired optical signals so that the feature signals contain information for the POI and exclude information for the underlayer parameters. A POI value for each top structure of each field is determined based on the feature signals extracted by the feature extraction model.Type: GrantFiled: August 6, 2014Date of Patent: March 2, 2021Assignee: KLA-Tencor CorporationInventors: Stilian Ivanov Pandev, Andrei V. Shchegrov
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Patent number: 10938224Abstract: An electrical energy storage system that can store both grid-based electrical power when electricity prices are low or renewable power generated on-site. It can release the stored electricity for consumer applications when necessary based on a software program and configuration. The system may be networked. The system comprises a port for receiving a central processing unit (CPU), and facilitates the use of different CPU products for different users and uses.Type: GrantFiled: August 16, 2017Date of Patent: March 2, 2021Assignee: HELION CONCEPTS, INC.Inventors: Sudarshan Krishnamoorthy, Indradeep Ghosh
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Patent number: 10937637Abstract: In one embodiment of the invention, a method for predicting a susceptor's service life in a processing chamber is disclosed. The method begins by creating virtual sensors in a processing chamber having a susceptor. The virtual sensors monitor one or more parameters on the susceptor and the age of the susceptor is tracked throughout the susceptor's life in the processing chamber with the virtual sensors.Type: GrantFiled: August 31, 2017Date of Patent: March 2, 2021Assignee: Applied Materials, Inc.Inventor: Ilias Iliopoulos
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Patent number: 10895590Abstract: A power-measuring device serves to measure the power of a three-phase system. It comprises a measuring unit for measuring a power of a first phase of the three-phase system, a display unit for displaying measured results and an operating unit for the operation of the power-measuring device by a user. Furthermore, it comprises a communications unit by means of which it can communicate with one or more further power-measuring devices. In this context, the power-measuring device is embodied, jointly with the one or more further power-measuring devices, to measure a power of several phases of the three-phase system.Type: GrantFiled: May 30, 2016Date of Patent: January 19, 2021Assignee: ROHDE & SCHWARZ GMBH & CO. KGInventors: Andreas Schuetz, Eugen Geier, Holger Asmussen, Josef Vogel
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Patent number: 10890566Abstract: A control device for automatic analysis including a unit which stores an analysis parameter file in which setting values of multiple setting items related to analytical equipment control are specified; a unit which describes at least identification information for the sample to be analyzed and the analytical parameters file to be used for analysis, for multiple analyses to be executed in the analysis device, and generates an analysis schedule table which describes setting values relating to one or more of the multiple setting items contained in the analytical parameters file for each analysis; and a control unit which controls the operation of the analytical equipment according to the analysis schedule table. The control unit is made such that the setting values specified in the analysis schedule table are applied preferentially for setting items for which the setting value is described in both the analytical parameter file and analysis schedule table.Type: GrantFiled: August 28, 2013Date of Patent: January 12, 2021Assignee: SHIMADZU CORPORATIONInventor: Yuji Katsuyama