Abstract: Systems and methods for improved power profiling of embedded applications are presented. These inventions provide the ability to unobtrusively measure the power consumption of an embedded application as the application is executing on its target hardware. The unobtrusiveness is achieved by using programmable emulation circuitry in the target system processor and available device debug terminals on the test port.
Type:
Grant
Filed:
December 19, 2002
Date of Patent:
December 12, 2006
Assignee:
Texas Instruments Incorporated
Inventors:
Robert J. Cyran, Edward A. Anderson, Gary A. Cooper, Roger Strane, Paul Kolonay