Abstract: A photoluminescence measurement system can include an optical source.

Abstract: A condensing-type portable fluorescence detection system which detects antigens using fluorescence includes: a light source generating light to excite a fluorescent substance; a first filter selecting a proper wavelength range from the light generated from the light source; a spherical mirror including two hemispherical mirrors having different curvature radiuses and connected to each other, and condensing the light excited and emitted from the light source; a second filter selecting a proper wavelength range of the light condensed by the spherical mirror; and a photodetector detecting fluorescence from the light condensed by the spherical mirror and passing through the second filter.

Abstract: The present invention relates to light curtains and, in particular, to safety light curtains for monitoring a protective field and to optical units of such light curtains which comprise optoelectronic components interconnected by a communication bus and to a method for allocating individual addresses to each of a plurality of optoelectronic components. The optical unit comprises a controller unit, a plurality of optoelectronic components interconnected by means of a communication bus, each of said optoelectronic components having a transmission input terminal for receiving a transmission signal and a transmission output terminal for outputting a transmission signal, and a receiving terminal for receiving a control signal from said control unit. An individual address is allocated to each of said optoelectronic components depending on a position of the respective optoelectronic component with respect to the other optoelectronic components.

Abstract: A scintillating module is provided which includes a first scintillating layer including a plurality of scintillators extending in a first direction; a second scintillating layer including a plurality of scintillators extending in a second direction and stacked in a third direction with respect to the first scintillating layer, wherein the first, second and third directions are orthogonal to each other.

Abstract: A method for assessing an alpha particle emission potential of a metallic material. A metallic material is initially subjected to a secular equilibrium disruption process, such as melting and/or refining, to disrupt the secular equilibrium of the radioactive decay of one or more target parent isotopes in the material. A sample of the material is treated to diffuse target decay isotopes within the sample such that the measured alpha particle emission directly corresponds to the concentration or number of target decay isotope atoms within the entirety of the sample, enabling the concentration of target decay isotopes in the sample to be determined. The concentration of target parent isotopes in the material may then be determined from the concentration of target decay isotopes and time elapsed from the secular equilibrium disruption process, and may be used to determine a maximum alpha particle emission that the metallic material will exhibit.

Abstract: Provided is an imaging device that can correct an output value of a pixel circuit. The imaging device includes a pixel circuit, a current detection circuit, an A/D converter, one or more memory circuit portions, and an arithmetic circuit portion. The pixel circuit includes a transistor, a charge accumulation portion, and a light-receiving element. The memory circuit portion includes a first look-up table, a second look-up table, and a region where image data output from the arithmetic circuit portion is stored. The first look-up table stores data of potentials of the charge accumulation portion, which depends on the intensity of light. The second look-up table stores output data of the transistor, which depends on the potentials of the charge accumulation portion.

Abstract: A device for optical detection of a target gas in gas mixtures includes an operation and evaluation unit, a measurement cuvette with optically reflective surfaces on its interior walls and a gas inlet to the environment, a radiation source, a measuring detector and a reference detector unit provided on the measurement cuvette. The measuring detector and the reference detector unit detect the light of the radiation source and produce electrical signals corresponding to the intensity of the detected light. An optical bandpass filter element, constructed to transmit light of a measurement wavelength, is arranged upstream of the measuring detector. An optical double-bandpass filter unit, that transmits light of a first reference wavelength and light of a second reference wavelength, is arranged upstream of the reference detector unit. The operation and evaluation unit operates the radiation source and acquires the electrical signals of the measurement detector and the reference detector unit.

Abstract: A method of calibration of a dataset for spectroscopically resolved radiation scanning, comprising the steps of: generating an apparatus condition specific calibration dataset of emergent radiation intensity information generated after interaction in the scanning zone of at least one standard object spectroscopically resolved into a plurality of frequency bands; providing a transferable database comprising a dataset of transferable data items of emergent intensity information for a range of component materials, each spectroscopically resolved into a plurality of frequency bands and linked to the condition specific calibration dataset; defining a reference calibration dataset; generating a transfer function between the data item and the reference calibration dataset; applying the transfer function to the transferable data item to generate a dynamic data item adjusted to the reference calibration; populating a data register with a dynamic dataset comprising a dataset of data items each dynamically adjusted to t

Abstract: An ion detector (1) comprising a semi-conductor avalanche photodiode (4) and a scintillation layer (2), the scintillation layer having a thickness in the range 0.1 mm to 00 mm, the scintillation layer arranged to generate photons towards the photodiode resulting from ions impinging on the scintillation layer.

Abstract: A phosphor device (1) comprising a carrier member (2) having upper and lower faces; a phosphor layer (3) being arranged at the upper face of the carrier member (2), wherein the phosphor layer (3) comprises at least two tiled phosphor zones (R, G, B); an optical transmitting member (4) having a first end face (7) and a second end face (9), the optical transmitting member (4) being arranged at the top portion of the phosphor layer (3), whereby the first end face (7) of the optical transmitting member (4) covers at least a subarea (8) of each of the at least two phosphor zones (R, G, B).

Abstract: A particle detecting system includes an airborne particle detecting device that detects scattered light and/or fluorescent light produced through illuminating with light a particle included in a gas, a gas inspection flow path that introduces, into the airborne particle detecting device, a particle included in a gas that is subject to inspection, an aerosol generating portion that generates an aerosol from a liquid that is subject to inspection, and a liquids inspection flow path that introduces a particle included in the aerosol into the airborne particle detecting device.

Abstract: The invention is related to an apparatus and method for charged hadron therapy verification by detecting and/or quantifying prompt gammas produced when irradiating a target (6) with a charged hadron beam. The apparatus comprises a collimator (1) provided with a slit-shaped portion (2) configured to be arranged perpendicularly to the beam line and facing the target, a detection means (3,4) suitable for detecting said prompt gammas and a calculation and representation means. In the apparatus and method of the invention, the slit is configured to allow the passage of prompt gammas emitted from a range of depths in said target (6), said depths being measured in the direction of the charged hadron beam.

Abstract: Featured is a method for reducing frequency of taking background spectra in FTIR or FTIR-ATR spectroscopy. Such a method includes determining if there is a pre-existing reference spectrum available and if such a reference spectrum is available, acquiring a present reference scan before acquiring a sample scan. The method also includes comparing the present reference scan with the pre-existing reference spectrum to determine if there is one or more non-conformities therebetween and if there is/are one or more nonconformities, determining if the one or more non-conformities are resolvable or not. If the one or more non-conformities are resolvable; resolve each non-conformity in a determined manner and thereafter acquiring a scan of the sample, and if the non-conformities are not resolvable, then acquiring a new reference sample and thereafter acquiring a scan of the sample.

Abstract: Electronic devices may include time-of-flight (ToF) image pixels. Each ToF pixel may include a photodiode, a first capacitor coupled to the photodiode via a first transfer gate, a second capacitor coupled to the photodiode via a second transfer gate, and a third capacitor coupled to the photodiode via a third transfer gate. The first transfer gate may be turned on for a given duration to store a first charge in the first capacitor. The second transfer gate may be turned on for the given duration to store a second charge in the second capacitor. The third transfer gate may be turned on for a duration that is longer than the given duration to store a third charge in the third capacitor. Depth information may be computed based on the first, second, and third stored charges and a corresponding pixel constant.

Abstract: The invention relates to a detection device (6) for detecting photons emitted by a radiation source (2). A signal generation unit (20) generates a detection signal indicative of the energy of a detected photon while photons strike the detection device (6), and a baseline signal, which is affected by photons that previously struck the detection device (6), while photons are prevented from striking the detection device (6). A baseline shift determination unit (40) determines a baseline shift of the detection signal depending on the baseline signal. An energy determination unit (30) determines the energy of a detected photon depending on the detection signal and the determined baseline shift. Since the baseline shift of the detection signal is determined from a baseline signal that is generated while photons are prevented from striking the detection device (6), the baseline shift can be determined with higher accuracy, resulting in an improved energy determination.

Abstract: The present invention relates to a thermal vision countermeasure system to enable concealment of objects from identification by thermal imaging night vision systems, including a screen made of thermoelectric modules, disposed between the target object and an IR detector. The screen, formed of at least one thermoelectric unit, is coupled to the target object, and the thermoelectric unit includes a Thermoelectric Cooler (TEC) module coupled to a plate formed of a material selected from aluminum, copper, or aluminum with copper, the plate being substantially larger than the TEC module.

Abstract: The embodiments of the present invention provide a method for detecting an etching residue and relate to the field of display technologies, with the purpose of detecting an etching residue so as to improve product yield. The method comprises: fitting the boundary of a pattern in a position to be detected by film color difference, and positioning the pattern in a position to be detected, thereby acquiring the pattern in a position to be detected; testing an infrared spectrum of the pattern in a position to be detected, and obtaining an infrared spectrogram; determining whether the residue exists according to the infrared spectrogram. The method of the invention may be applicable for the detection of an etching residue during the process of preparing an array substrate or a cell substrate.

Abstract: A fluorescence light detection device includes an excitation light fiber having an excitation light emitting end configured to emit excitation light; a fluorescence light fiber having a fluorescence light incident end on which fluorescence light is incident; an objective lens arranged between where the excitation light emitting end and the fluorescence light incident end are located, and a sample; and a reflective member arranged between where the excitation light emitting end and the fluorescence light incident end are located, and the objective lens, and having two reflective surfaces facing in opposite directions. The two reflective surfaces of the reflective member are positioned between an optical axis of the excitation light fiber and an optical axis of the fluorescence light fiber.

Abstract: A method includes calibrating color bleed factors of optical detector channels of a sample processing apparatus through processing a color bleed calibration substance which includes a plurality of different size fragments replicated from different groups of DNA loci, wherein fragments in a same group are labeled with a same fluorescent dye, and fragments in different groups are labeled with different fluorescent dyes having different emission spectra, wherein the different size fragments are processed during different acquisition times.

Abstract: Sub-arrays such as tiles or chips having pixel elements arranged on a routing layer or carrier to form a larger array. Through-chip vias or the like to the backside of the chip are used for connecting with the pixel elements. Edge features of the tiles may provide for physical alignment, mechanical attachment and chip-to-chip communication. Edge damage tolerance with minimal loss of function may be achieved by moving unit cell circuitry and the electrically active portions of a pixel element away from the tile edge(s) while leaving the optically active portion closer to the edge(s) if minor damage will not cause a complete failure of the pixel. The pixel elements may be thermal emitter elements for IR image projectors, thermal detector elements for microbolometers, LED-based emitters, or quantum photon detectors such as those found in visible, infrared and ultraviolet FPAs (focal plane arrays), and the like. Various architectures are disclosed.