Patents Examined by Mary C O'Malley
  • Patent number: 7945406
    Abstract: M periods of the test signal and of the reference signal are received. The periods of the test signal and of the reference signal are in each case Tsig long. The test signal is sampled with N sampled values at a sampling frequency fs=1/Ts. Also, N*Ts=M*Tsig, where N>M. The sampled values are numbered progressively by n, for which 0?n ?N?1. The sampled values have a defined relative phase shift with respect to the reference signal. The phase shift T? is calculated by ? i = 0 M - 1 ? ? Idx ? ( i ) + K , K being a constant and Idx(i) corresponding to the number n which is either the first sampled value after a test signal zero crossing during the reference signal's ith period or the last sampled value before a test signal zero crossing during the reference signal's ith period. Either only rising or only falling zero crossings are taken into account.
    Type: Grant
    Filed: September 8, 2006
    Date of Patent: May 17, 2011
    Assignee: Infineon Technologies AG
    Inventors: Stephane Kirmser, Heinz Mattes, Sebastian Sattler
  • Patent number: 7925458
    Abstract: A method and apparatus are provided for detecting the occurrence of arcing of a conductor by monitoring the current on an AC power line.
    Type: Grant
    Filed: February 15, 2008
    Date of Patent: April 12, 2011
    Assignee: Leviton Manufacturing Co., Inc.
    Inventors: David Kolker, Roger M. Bradley, Ross Mernyk
  • Patent number: 7917309
    Abstract: An apparatus and method for detection of airborne contaminants and prevention of influx of the contaminants into an enclosed space, such as a vehicle cabin. A first sensor array samples exterior air prior to influx of the exterior air into the enclosed space. The first sensor array generates data uniquely corresponding to each contaminant. Data corresponding to predetermined contaminants is stored in computer memory. A user may also cause data corresponding to a contaminant selected by the user to be stored in the computer memory. Upon identification of a contaminant, an actuator is operative to control a position of a valve to prevent influx of the exterior air into the enclosed space.
    Type: Grant
    Filed: December 11, 2007
    Date of Patent: March 29, 2011
    Assignee: International Business Machines Corporation
    Inventor: Colin Brodsky
  • Patent number: 7917317
    Abstract: Configuration of an ultrasonic inspection system is facilitated using an ultrasound response predicted by a simulation tool. In one embodiment, estimated material properties of an object to be inspected are input to the simulation tool. Also input to the simulation tool is at least one estimated property of an ultrasonic transducer of the ultrasonic inspection. The simulation tool predicts the response of the object to ultrasound from the ultrasonic transducer. This response is dependent upon the estimated material properties of the object to be inspected and the at least one estimated property of the ultrasonic transducer. The ultrasonic inspection system is then configured dependent upon a feature of the predicted response. The system may be configured, for example, by setting the position of a time gate, selecting an appropriate ultrasonic transducer, selecting the position of the transducer to achieve good focus, or selecting parameters for signal processing.
    Type: Grant
    Filed: July 7, 2006
    Date of Patent: March 29, 2011
    Assignee: Sonix, Inc.
    Inventor: James C. P. McKeon
  • Patent number: 7917316
    Abstract: A test system and computer program for measuring threshold voltage variation using a device array provides accurate threshold voltage distribution values for process verification and improvement. The test system and computer program control a characterization array circuit that imposes a fixed drain-source voltage and a constant channel current at individual devices within the array. Another circuit senses the source voltage of the individual device within the array. The statistical distribution of the threshold voltage is determined directly from the source voltage distribution by offsetting each source voltage by a value determined by completely characterizing one or more devices within the array. The resulting methodology avoids the necessity of otherwise characterizing each device within the array, thus reducing measurement time dramatically.
    Type: Grant
    Filed: June 26, 2008
    Date of Patent: March 29, 2011
    Assignee: International Business Machines Corporation
    Inventors: Kanak B. Agarwal, Sani R. Nassif
  • Patent number: 7899631
    Abstract: In the method for estimating battery residual capacity of the present invention, the voltage measurement values are obtained (step S2). And once it is finished, using the initial values of the coefficients set at the step S3 as starting, the optimization is progressed with renewing each value of the coefficients on the following iterating calculations (step S4). Once the optimum value of each coefficient in the approximation is determined at the step S4, the stable open circuit voltage is calculated by the optimized reciprocal function using thereof at the step S5. And then based thereon, the battery residual capacity is calculated by the predetermined conversion method (step S6).
    Type: Grant
    Filed: March 4, 2008
    Date of Patent: March 1, 2011
    Assignee: The Furukawa Electric Co., Ltd.
    Inventor: Noriyasu Iwane
  • Patent number: 7877222
    Abstract: A design structure for an apparatus for utilizing a single set of one or more thermal sensors, e.g., thermal diodes, provided on the integrated circuit device, chip, etc., to control the operation of the integrated circuit device, associated cooling system, and high-frequency PLLs, is provided. By utilizing a single set of thermal sensors to provide multiple functions, e.g., controlling the operation of the integrated circuit device, the cooling system, and the PLLs, silicon real-estate usage is reduced through combining circuitry functionality. Moreover, the integrated circuit device yield is improved by reducing circuitry complexity and increasing PLL robustness to temperature. Furthermore, the PLL circuitry operating range is improved by compensating for temperature.
    Type: Grant
    Filed: May 29, 2008
    Date of Patent: January 25, 2011
    Assignee: International Business Machines Corporation
    Inventors: David W. Boerstler, Nathaniel R. Chadwick, Eskinder Hailu, Kirk D. Peterson, Jieming Qi
  • Patent number: 7826977
    Abstract: Systems and methods for high-speed image scanning are disclosed herein One aspect of the invention is directed to a method for high speed image scanning. The method for high speed image scanning includes adjusting an object using a positioning element; directing a portion of an image of the object toward a sensor by positioning a first mirror relative to the object, and by positioning a second mirror relative to the object and the first mirror; controlling the positioning element, the position of the first mirror and the position of the second mirror using a processor; and detecting the portion of the image of the object using the sensor positioned relative to the first mirror and the second mirror. In accord with this method, the first mirror directs the portion of the image of the object in a first direction and the second mirror directs the portion of the image of the object in a second direction.
    Type: Grant
    Filed: August 24, 2007
    Date of Patent: November 2, 2010
    Assignee: The Trustees of Columbia University in the City of New York
    Inventors: Guy Garty, Gerhard Randers-Pehrson, David J. Brenner, Oleksandra V. Lyulko
  • Patent number: 7827011
    Abstract: A method to achieve an accurate, extremely low power state classification implementation is disclosed. Embodiments include a sequence that matches the data flow from the sensor transducer, through analog filtering, to digital sampling, feature computation, and classification.
    Type: Grant
    Filed: November 21, 2007
    Date of Patent: November 2, 2010
    Assignee: Aware, Inc.
    Inventors: Richard W. DeVaul, Daniel Barkalow, Christopher Elledge
  • Patent number: 7822570
    Abstract: A method for determining an actual gas flow rate in a reaction chamber of a plasma processing system is provided. The method includes delivering gas by a gas flow delivery system controlled by a mass flow controller (MFC) to an orifice, which is located upstream from the reaction chamber. The method also includes pressurizing the gas to create a choked flow condition within the orifice. The method further includes measuring a set of upstream pressure values of the gas via a set of pressure sensors. The method yet also includes applying a calibration factor of a set of calibration factors to determine the actual flow rate. The calibration factor is a ratio of an average of the set of upstream pressure values to an average of a set of golden upstream pressure values, which is associated with an indicated flow rate for an MFC.
    Type: Grant
    Filed: November 9, 2007
    Date of Patent: October 26, 2010
    Assignee: Lam Research Corporation
    Inventors: Iqbal A. Shareef, James V. Tietz, Vernon Wong, Richard J. Meinecke
  • Patent number: 7813897
    Abstract: The present invention relates to a method for measuring a quantity of usage of a CPU, in particular to a method for measuring a quantity of usage of a CPU which is capable of getting a credible quantity of usage of a CPU without amending an algorithm in order to adapt it to the an operating system, e.g., MS-Windows System, or requiring a complicated code. The method uses various algorithms provided by the operating system on the behalf of a registry storing a quantity of usage of a CPU inside a system. Accordingly the present invention can measure a quantity of usage of a CPU easily without lowering a performance of the operating system.
    Type: Grant
    Filed: August 4, 2008
    Date of Patent: October 12, 2010
    Assignee: ANPA, Inc.
    Inventors: Sang Ho Lee, Jang Keun Oh
  • Patent number: 7805264
    Abstract: A current Ibe and a voltage Vbe before a large current discharge in a secondary battery are stored in a memory. Plural voltage-current pairs are detected and stored in the memory during the large current discharge. Next, a regression curve (or a regression line) is obtained based on the plural voltage-current pairs stored in the memory using a well-known method. A discharge current Ip which exceeds a current-sensor detectable range is input in the regression curve to obtain a voltage Vp. A maximum discharge coordinate is set using the discharge current Ip and the voltage Vp. An internal resistance Rin of the secondary battery is calculated based on an inclination of a line that connects the coordinates (Ibe, Vbe) and (Ip, Vp).
    Type: Grant
    Filed: February 21, 2008
    Date of Patent: September 28, 2010
    Assignees: Nippon Soken, Inc., Denso Corporation
    Inventors: Satoru Mizuno, Shoji Sakai, Hiroaki Ono
  • Patent number: 7805261
    Abstract: Meter electronics (20) for determining a mass fraction of flow components in a flow material flowing is provided according to an embodiment of the invention. The meter electronics (20) include an interface (201) for receiving a frequency response of the flow material and a processing system (203). The processing system (203) receives the frequency response from the interface (201) and breaks out the frequency response into at least a gas frequency component and a fluid frequency component. The processing system (203) determines an overall density from the frequency response and determines a gas density from the gas frequency component. The processing system (203) determines the void fraction of gas from the frequency response and one or more of the gas frequency component and the fluid frequency component. The processing system (203) determines the mass fraction from the void fraction of gas multiplied by a ratio of the gas density divided by the overall density.
    Type: Grant
    Filed: May 19, 2006
    Date of Patent: September 28, 2010
    Assignee: Micro Motion, Inc.
    Inventors: Mark James Bell, Craig B. McAnally
  • Patent number: 7801689
    Abstract: Systems, methods, and apparatus for propagating distilled spirit composition throughout production are disclosed. The composition of distilled spirits in each of a plurality of containers is tracked. A first distilled spirit from a first container in the plurality of containers is blended with a second distilled spirit from a second container in the plurality of containers to form a third quantity of a third distilled spirit. The third distilled spirit is placed into a third container in the plurality of containers and the composition of distilled spirits in the third container is computed based on the known composition and quantities of the first distilled spirit, the second distilled spirit, and the known composition and quantities already present in third container at a time prior to placing the first and second quantities into the third container. The composition and quantity of distilled spirits in the containers is then stored.
    Type: Grant
    Filed: July 3, 2007
    Date of Patent: September 21, 2010
    Assignee: Oracle International Corporation
    Inventors: Charu Roy, Vinay Ambekar, Anjali Kataria
  • Patent number: 7783456
    Abstract: It is possible to detect a reception signal at a high speed. A wave detection device includes: a first signal output unit for outputting a first signal s[n] which is a sum of a digital input signal subjected to A/D conversion and an output from a feedback signal output section; a second signal output unit for outputting a second signal s[n?1] which is the first signal s[n] delayed by one sampling timing; and a feedback signal output section for subjecting the second signal s[n?1] to a predetermined calculation. When n=N?1, a frequency region conversion section reads out the first signal s[N?1] and the second signal s[N?2] from registers and subjects them to a predetermined calculation, thereby obtaining the input signal subjected to DFT. Since the wave detection device has a simple configuration, it is possible to rapidly detect the reception signal which is an input signal of the wave detection device.
    Type: Grant
    Filed: March 16, 2004
    Date of Patent: August 24, 2010
    Assignee: Advantest Corporation
    Inventor: Satoshi Takahashi