Abstract: A sensor and a locking device therefore are disclosed. The locking device may comprise: a bracket including a first part and a second part bent and extending from the first part; a body coupled to the sensor part to be movable in the longitudinal direction of the second part of the bracket; and a cover pivotally connected to the body, wherein: the cover includes a center plate and a plurality of bridges which extend from the center plate to have a long shape in one direction and include a first bridge extending in the one direction and a second bridge extending in the one direction and spaced apart from the first bridge; the body is positioned between the plurality of bridges; and the plurality of bridges are pivotally connected to the body.

Abstract: Provided are a fluorescence imaging probe and a handheld imaging prober, relating to the technical field of medical devices. The fluorescence imaging probe includes a dichroic filter and an image detector, the dichroic filter is arranged at an included angle of 45° with a direction of a main optical axis of incident excitation light, the incident excitation light is reflected by the dichroic filter to a target detection position, the reflected incident excitation light excites a fluorescent substance at the target detection position to form fluorescence, a main optical axis of the fluorescence is arranged coaxially with the image detector, the fluorescence is incident to the image detectors through the dichroic filter, and the image detector converts the received fluorescence into an image signal.

Abstract: Optical measurement of a sample that includes a structure-of-interest (SOI) optically coupled to an unknown structure is optically measured by extracting from the resulting spectral signal the spectral variation that is correlated to key parameters associated with the SOI and removing the spectral variation from unknown structure that is irrelevant to the key parameters. An offline process is used to generate a physics-based model from a number of calibration measurements using reconstructed spectral signals after removing the spectral variation from the spectral signals that is irrelevant to the key parameters. A machine learning model may be additionally generated using at least the spectral variations correlated to key parameters associated with the SOI. In an in-line process, a sample is measured by filtering the spectral signals from a sample to remove spectral effects from the unknown structure and using the physics-based model or using the trained machine learning model.

Abstract: A multimodality system includes first and second modalities, an optical probe, a detector, and a sheath with a known fluorescence phantom, wherein the phantom would be used for calibration of the catheter providing accurate NIRAF values to the user using the sheath phantom to calibrate an optical probe's measured NIRAF signal to the known fluorescence of the phantom.

Abstract: The present disclosure provides an optical palpation device for evaluating a mechanical property of a sample material. The device comprises a body having a sensing portion and a sensing layer positioned at the sensing portion of the body and having a sensing surface positioned for direct or indirect contact with a surface area of the sample material. The sensing layer is deformable and has a predetermined deformation-dependent optical property. The device further comprises a light detector positioned to detect light transmitted through at least a portion of the sensing layer.

Abstract: An electro-optical modulating device and method that provides efficient control of the nonlinear propagation constant in an optical waveguide are featured. The electro-optical modulating device provides large wavelength tunability of the generated entangled photon pairs in real-time by using an applied external bias voltage. The electro-optical modulating device uses gate-tunable material at locations near the optical waveguide. The application of an external bias voltage creates a variable field-effect which in turn varies the optical dielectric properties of the waveguide. The result is a compact active, highly efficient wavelength-tunable integrated quantum photonic device for tunable entangled photon pair generation using an external bias voltage.

Abstract: Optical spectrometers may be used to determine the spectral components of electromagnetic waves. Spectrometers may be large, bulky devices and may require waves to enter at a nearly direct angle of incidence in order to record a measurement. What is disclosed is an ultra-compact spectrometer with nanophotonic components as light dispersion technology. Nanophotonic components may contain metasurfaces and Bragg filters. Each metasurface may contain light scattering nanostructures that may be randomized to create a large input angle, and the Bragg filter may result in the light dispersion independent of the input angle. The spectrometer may be capable of handling about 200 nm bandwidth. The ultra-compact spectrometer may be able to read image data in the visible (400-600 nm) and to read spectral data in the near-infrared (700-900 nm) wavelength range. The surface area of the spectrometer may be about 1 mm2, allowing it to fit on mobile devices.

Abstract: A laser device for use with a scientific instrument. The laser device includes a laser emitter and a control system. The laser emitter is configured to generate a laser beam for radiating a sample disposed in a vacuum chamber of the scientific instrument. The control system is configured to receive a pressure signal associated with the vacuum chamber from a pressure sensor, and to change a state of the laser beam in response to the pressure reaching a threshold level.

Abstract: A diffractive optical element (10) for a test interferometer (100) measures a shape of an optical surface (102). Diffractive shape measuring structures (16) are arranged on a used surface (14) of the element and generate a test wave (122) irradiating the surface when the element is arranged in the interferometer. At least one test field (18) several profile properties of test structures contained in the test field. The profile properties characterize a profile line of the test structures extending transversely with respect to the used surface and include a flank angle of the profile line, a profile depth and a depth of a microtrench in a bottom region of a trench-shaped profile of the test structures. The test field is arranged at one location of the used surface instead of the diffractive shape measuring structures such that the test field is surrounded by several diffractive shape measuring structures.

Abstract: A general purpose sensor architecture integrating a surface enhanced Raman spectroscopy (SERS) substrate, a diffractive laser beam delivery substrate and a diffractive infrared detection substrate is provided that can be used to implement a low-cost, compact lab-on-a-chip biosensor that can meet the needs of large-scale infectious disease testing. The sensor architecture can also be used in any other application in which molecules present in the liquid, gaseous or solid phases need to be characterized reliably, cost-effectively and with minimal intervention by highly skilled personnel.

Abstract: The present invention relates to a hazardous material measuring apparatus capable of analyzing concentration and components of various hazardous materials. The hazardous material measuring apparatus analyzes an optical spectrum obtained by a spectrometer or a hyperspectral image obtained by a hyperspectral camera, thereby analyzing concentration and components of the hazardous materials to be measured.

Abstract: A method for measuring a surface parameter of copper foil exhibiting high correlation with high frequency characteristics, the method for measuring a surface parameter of copper foil including: (a) acquiring a surface profile on at least one surface of an untreated copper foil; (b) setting a cutoff value for an L filter based on the surface profile; (c) acquiring a surface profile on at least one surface of surface-treated copper foil originating from the untreated copper foil; (d) subjecting the surface profile of the surface-treated copper foil to filter processing, the filter processing including processing using an L filter with the cutoff value; and (e) calculating at least one of surface parameters defined by ISO25178 on the surface of the surface-treated copper foil based on the surface profile after the filter processing.

Abstract: The optical interference tomographic imaging device is provided with: a wavelength sweeping laser light source; a branching unit that branches light emitted from the wavelength sweeping laser light source to object light and reference light; an irradiation unit that scans a predetermined range by irradiating different positions on the surface of the measurement target object with the object light outputted from the branching unit; a measurement unit that, after irradiation on the measurement target object, generates information about a change in the interference light intensity ratio between the reference light and the object light scattered from the measurement target object; and a control unit that, on the basis of the information about the change in the interference light intensity ratio generated by the measurement unit, acquires structure data in the depth direction of the measurement target object.

Abstract: An apparatus includes a decision module that is configured to: receive a performance metric relating to performance conditions of an optical system emitting a light beam; estimate, based on the performance metric and a predetermined learning model, an effectiveness of a proposed change to the optical system; and output a change command to the optical system if it is estimated that the proposed change to the optical system would be effective.

Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.

Abstract: The present disclosure provides a radio frequency tagging optical spectrometer, comprising: a dynamic dispersion device, the dynamic dispersion device receiving a beam comprising more than two wavelength components and being driven by driving radio frequency signals, and the dynamic dispersion device encoding the intensity of each wavelength component into the amplitude of a different beat radio frequency signal based on different driving radio frequency signals, wherein the beat frequency of the different beat radio frequency signal is equal to the frequency of the corresponding driving radio frequency signal; a single-channel photodetector for detecting the sum of beat radio frequency signals formed by adding all the beat radio frequency signals; and a processing unit for performing Fourier transform on the sum of the beat radio frequency signals to obtain a spectrum or an associated radio frequency spectrum by which the optical spectrum is obtained.

Abstract: Method for calibrating a spectral imaging device comprises forming first calibration light by illuminating a first calibration region of a calibration sample with illuminating light, forming second calibration light by illuminating a second calibration region of the calibration sample with the illuminating light, measuring a first spectrum of the first calibration light by using the spectral imaging device, measuring a second spectrum of the second calibration light by using the spectral imaging device, and determining or verifying a spectral calibration function of the spectral imaging device by comparing the measured spectra with reference spectra. The spectral calibration function specifies a relation, which associates values of a control parameter with actual spectral positions. The first calibration light has a first spectral peak at a first peak wavelength, and the second calibration light has a second spectral peak at a second peak wavelength.

Abstract: A spark spectrometry for inclusions content distribution on the surface of large size metallic materials, comprising the following steps: analyzing the surface of large-size metallic materials by spark discharge continuous excitation scanning, obtaining a mixture intensity distribution data of the solid solution and inclusions of an element on the surface of the large-size metallic materials; the relative frequency distribution diagram of spectral intensity is subjected to peak fitting of normal distribution and Gumbel distribution, obtaining an extreme value distribution data of spectral intensity of the inclusions; a size information of the inclusions in a small sample and that of the largest inclusions are correlated with the spectral intensity distribution data of inclusions, obtaining a result of content distribution of the inclusions on the surface of the large size metallic materials.

Abstract: Disclosed is a carboxylic acid-functionalized 3-dimensional SERS substrate. A carboxylic acid-functionalized 3-dimensional SERS substrate according to an embodiment of the present invention includes a substrate; a 3-dimensional nanostructure including a multistacked metal nanowire array formed by alternately and repeatedly transfer printing a single-layer metal nanowire array, laminated on a polymer mold on which a pattern of a master mold is duplicated, onto the substrate 110 to be perpendicular to each other; and a functionalized carboxylic acid into which a residue of the polymer mold present on the 3-dimensional nanostructure is functionalized and which enables a target analyte to immobilize.

Abstract: Systems, devices and methods for measuring surface roughness and surface shape of an optical element using a dual-mode interferometer are disclosed. The devices implement optical filters, with a compact form, that allows measurement of both surface characteristics without rearranging the system components. One example interferometric system includes a laser light source and a low coherence light source that alternatively provide light to a collimator, followed by a polarizer, and a polarizing beam splitter. The system further includes two optical filters, a quarter waveplate, two objectives and a reference optical component. Each light source produces a set of interferograms, where one set of interferograms is used to measure the surface shape and another set of interferograms is used to measure the surface roughness of the optical component.