Patents Examined by Maurice C Smith
  • Patent number: 11002663
    Abstract: A gas injection device, wherein comprising: a gas channel including an air inlet provided at a upper portion therein and a gas outlet provided at a lower portion therein; and a light channel including an incident light channel and a reflected light channel provided at each side of the gas channel separately, wherein gases arrives at a surface of a sample to be tested via said gas channel and flows out from a slit between said light channel, the gas outlet of gas channel, and the surface of the sample to be tested, and gases flow in a manner of laminar flow with the Peclet number of an air flow being larger than 1. The gas injection device can effectively prevent air from returning back to the measurement system.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: May 11, 2021
    Assignee: JIANGSU LEUVEN INSTRUMMENTS CO LTD
    Inventor: Kaidong Xu
  • Patent number: 11002605
    Abstract: An ambient light color sensor adapted to determine color of ambient light and method for calibrating thereof. The ambient light color sensor comprises a sensor body having at least one diffuser and a light color sensing module disposed below the at least one diffuser. The light color sensing module comprises a plurality of channels adapted to detect light collected by the at least one diffuser at different wavelengths to produce sensor readings.
    Type: Grant
    Filed: December 5, 2019
    Date of Patent: May 11, 2021
    Assignee: Crestron Electronics, Inc.
    Inventor: Dennis Hromin
  • Patent number: 11002604
    Abstract: The purpose is to reduce the influence on the measurement due to high order diffracted light without arranging a filter for removing high order diffracted light between a diffraction grating and a PDA. The correction method includes a correction coefficient determination step of determining a correction coefficient related to a ratio of a portion of a detection signal value to the detection signal value, the portion of the detection signal value being derived from a second order diffracted light of light in the first wavelength range contained in the detection signal value of a long wavelength side photodiode for detecting light in the second wavelength range in the photodiode array, and a correction unit configured to obtain a corrected detection signal value derived from light in the second wavelength range from a different detection signal value of the long wavelength side photodiode by using the correction coefficient determined by the correction coefficient determination step.
    Type: Grant
    Filed: February 4, 2019
    Date of Patent: May 11, 2021
    Assignee: Shimadzu Corporation
    Inventor: Masato Watanabe
  • Patent number: 10989595
    Abstract: The invention discloses a hybrid and scanning/snapshot spectral imager operating in both staring-spectral scanning and video snapshot spectral imaging modes. Snapshot spectral imaging operation at a set of selectable critical spectral bands comprise the basis for a machine learning-based estimation and video-rate display of a full hyperspectral cube, without compromising spatial resolution. Operating in the staring-type scanning mode, the disclosed hybrid spectral imager acquires sets of narrow band images at a given tuning step and for a plurality of tuning steps until completing a hyperspectral cube sampling. Scanning operation may be used for optimally configuring snapshot operation, such that redundant information present in the collected spectra is discarded. The disclosed hybrid spectral imager includes embodiments susceptible for miniaturization and low power operation, allowing for their integration into mobile phone and computer platforms.
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: April 27, 2021
    Assignee: QCELL PC
    Inventor: Konstantinos Balas
  • Patent number: 10983061
    Abstract: A surface enhanced luminescence analyte nano pillar stage may include a substrate, an array of closable pillars extending from the substrate and a fluid supply connected to the array of pillars. The fluid supply is to at least partially replenish fluid amongst the pillars of the array that has evaporated to maintain a level of the fluid amongst the pillars of the array below tops of the pillars.
    Type: Grant
    Filed: October 24, 2017
    Date of Patent: April 20, 2021
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Steven Barcelo, Anita Rogacs, Raghuvir N. Sengupta
  • Patent number: 10983005
    Abstract: A spectroscopic overlay metrology system and corresponding spectroscopic overlay metrology methods are disclosed herein for improving overly measurement accuracy, optimizing overlay recipes, and/or minimizing (or eliminating) asymmetry-induced overly error from overlay measurements. An exemplary method includes generating a diffraction spectrum by an overlay target from incident radiation having more than one wavelength. The diffraction spectrum includes a plurality of positive ordered diffracted beams and a plurality of negative ordered diffracted beams that are separated by wavelength, such that the diffraction spectrum includes more than one wavelength of a positive order and a negative order.
    Type: Grant
    Filed: June 15, 2017
    Date of Patent: April 20, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Kai Wu, Hung-Chih Hsieh, Kai-Hsiung Chen, Chih-Ming Ke, Yen-Liang Chen
  • Patent number: 10983051
    Abstract: To provide a reaction system capable of analyzing a liquid sample with high accuracy. To provide a reaction system A including: a reaction vessel 1, a flow channel 2 including a deformable unit 22 having an elastic member, a pump 3, a flow channel deformation mechanism 4, a measurement unit 5 and an analysis unit 6, wherein the measurement unit 5 includes a light source unit 52 and a light receiving unit 54, the flow channel deformation mechanism 4 includes an operation unit 42 for deforming the deformable unit 22 of the flow channel 2 such that a cross-sectional area of the deformable unit 22 is reduced, and the analysis unit 6 is electrically or physically connected to the measurement unit 5 and the flow channel deformation mechanism 4, and operates the flow channel deformation mechanism 4 based on a measurement result obtained by the measurement unit 5.
    Type: Grant
    Filed: December 3, 2018
    Date of Patent: April 20, 2021
    Assignee: HITACHI, LTD.
    Inventors: Takuya Kambayashi, Toshimitsu Noguchi, Shunsuke Kono
  • Patent number: 10978280
    Abstract: Systems and methods are described for calibrating an analytical instrument analyzing a plurality of sample matrices in series. A system embodiment can include, but is not limited to, a sample analysis device configured to receive a plurality of samples from a plurality of remote sampling systems and to determine an intensity of one or more species of interest contained in each of the plurality of samples; and a controller configured to generate a primary calibration curve based on analysis of a first standard solution having a first sample matrix by the sample analysis device and generate at least one secondary calibration curve based on analysis of a second standard solution having a second sample matrix by the sample analysis device, the controller configured to associate the at least one secondary calibration curve with the primary calibration curve according to a matrix correction factor.
    Type: Grant
    Filed: December 28, 2018
    Date of Patent: April 13, 2021
    Assignee: Elemental Scientific, Inc.
    Inventors: Daniel R. Wiederin, Kyle W. Uhlmeyer, Michael P. Field, Jae Seok Lee
  • Patent number: 10969275
    Abstract: An array of sensor pixels is formed on a substrate, and a signal processing unit is connected to the array of sensor pixels. The signal processing unit includes multiple spectral channels that are defined by a respective transmission curve of each optical filter of at least one associated sensor pixel. Each of the sensor pixels includes a stack of a respective photodetector and a respective optical filter. Each spectral channel receives an output signal from one or more sensor pixels including an optical filter having the same transmission curve. At least one spectral channel has a greater number of sensor pixels than another spectral channel among the multiple spectral channels. The different number of pixels for the spectral channels can be employed to compensate for variations of sensor efficiency as a function of wavelength. Adjustment to sensor gain can be minimized through use of different number of pixels for different spectral channels.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: April 6, 2021
    Assignee: NanoLamda Korea
    Inventor: Byung Il Choi
  • Patent number: 10967666
    Abstract: The present disclosure relates to an encoding method and a decoding method using a chiral metal nanostructure. The encoding method according to an aspect of the present disclosure includes preparing a plurality of metal nanostructures having a chiral structure; obtaining the optical data of the plurality of metal nanostructures, and preparing a security medium including the plurality of metal.
    Type: Grant
    Filed: April 27, 2018
    Date of Patent: April 6, 2021
    Assignees: LG DISPLAY CO., LTD., SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
    Inventors: Ki Seok Chang, Sung Pil Ryu, Ki Tae Nam, Wook Sung Kim, Hye Eun Lee, Hyo Yong Ahn
  • Patent number: 10969332
    Abstract: Exemplary methods can be provided for the determination of a microbial pathogen. In addition, exemplary methods can be provided for the determination of a microbial pathogen and its anti-infective resistance. Further, an exemplary method can be provided for determining a bacterium and its antibiotic resistance. Systems and computer-accessible media can be provided for the determination of a microbial pathogen and its anti-infective resistance.
    Type: Grant
    Filed: July 26, 2017
    Date of Patent: April 6, 2021
    Assignees: LEIBNIZ-INSTITUT FÜR PHOTONISCHE TECHNOLOGIEN E.V., UNIVERSITÄTSKLINIKUM JENA
    Inventors: Ute Neugebauer, Jürgen Popp, Ondrej Stranik, Bettina Löffler
  • Patent number: 10962413
    Abstract: A freeform surface imaging spectrometer system including a primary mirror, a secondary mirror, a tertiary mirror, and a detector is provided. The secondary mirror is a grating having a freeform surface shape, and the grating having the freeform surface shape is obtained by intersecting a set of equally spaced parallel planes with a freeform surface. A plurality of feature rays exiting from a light source is successively reflected by the primary mirror, the secondary mirror and the tertiary mirror to form an image on an image sensor. A reflective surface of each of the primary mirror, the tertiary mirror surface and the tertiary mirror is an xy polynomial freeform surface.
    Type: Grant
    Filed: January 14, 2019
    Date of Patent: March 30, 2021
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Jun Zhu, Ben-qi Zhang, Guo-Fan Jin, Shou-Shan Fan
  • Patent number: 10962486
    Abstract: The present disclosure relates to a system for process-integrated optical analysis of flowable media, comprising a processing system for processing a flowable medium and an analytical system for analysis of the flowable medium, wherein the analytical system includes an optical measuring head, for irradiation of the medium and for receiving measuring radiation, and a reference unit. The processing system includes a measuring region, into which the medium can be introduced during the processing and which is accessible for measurement by means of the measuring head. According to the invention, a mechanism for achieving defined positions of the measuring head relative to the measuring region and/or relative to a reference unit is included, which selectively enables a measurement of the medium located in the measuring region or of the reference unit.
    Type: Grant
    Filed: October 5, 2017
    Date of Patent: March 30, 2021
    Assignee: Blue Ocean Nova AG
    Inventor: Joachim Mannhardt
  • Patent number: 10962415
    Abstract: The present invention relates to an apparatus for optical applications, a spectrometer system and method for producing an apparatus for optical applications, and in particular to an apparatus comprising an optical waveguide having a first refractive index along a light propagation axis interrupted by a plurality of scattering portions having a second refractive index. Each scattering portion has a long axis substantially perpendicular to the light propagation axis as well as a short axis substantially perpendicular to the light propagation axis and the long axis. A receiver unit or a transmitter unit is arranged on a side of the optical waveguide, the long axis being substantially perpendicular, i.e. normal to the plane of this side on which the receiver unit or transmitter unit is arranged. Accordingly, simplification and miniaturization of an optical apparatus can be realized.
    Type: Grant
    Filed: February 20, 2018
    Date of Patent: March 30, 2021
    Assignee: FiSens GmbH
    Inventor: Christian Waltermann
  • Patent number: 10962483
    Abstract: A device and method to reduce molecular background emission and to increase matrix management in solution cathode glow discharge (SCGD). A purging device for purging atmospheric gases from a solution cathode glow discharge (SCGD) apparatus, comprising a hollow body that encloses a plasma generated between a solid anode and a solution cathode, wherein the body comprises at least one opening for release of water vapor generated by the plasma. A method for reducing matrix interferences from a SCGD comprising introducing an internal standard into a sample to be analyzed, wherein the sample comprises at least one element of interest; determining a spatial emission profile of the internal standard; using linear correlation between the spatial emission profile of the internal standard and the element of interest to predict a crossover point; and using the crossover point of the element of interest to select a vertical acquisition height for SCGD analysis.
    Type: Grant
    Filed: October 3, 2018
    Date of Patent: March 30, 2021
    Assignee: InnoTech Alberta Inc.
    Inventors: Stuart Garth Schroeder, Wade Joseph Hagman
  • Patent number: 10955756
    Abstract: Methods and apparatuses for measuring a target formed on a substrate. The target includes an alignment structure and a metrology structure. In one method, a first measurement process is performed that includes illuminating the target with first radiation and detecting radiation resulting from scattering of the first radiation from the target. A second measurement process includes illuminating the target with second radiation and detecting radiation resulting from scattering of the second radiation from the target. The first measurement process detects a position of the alignment structure. The second measurement process uses the position of the alignment structure detected by the first measurement process to align a radiation spot of the second radiation onto a desired location within the metrology structure.
    Type: Grant
    Filed: May 3, 2018
    Date of Patent: March 23, 2021
    Assignee: ASML Netherlands B.V.
    Inventor: Hugo Augustinus Joseph Cramer
  • Patent number: 10948417
    Abstract: The disclosure provides a method for identifying a Raman spectrum and an electronic apparatus. The method includes steps of: measuring a Raman spectrum of a substance to be detected so as to obtain a measured spectrogram, the measured spectrogram including a series of data; extracting peak information of the measured spectrogram, the peak information including a peak intensity, a peak position and a peak area; comparing the peak information of the measured spectrogram with peak information of a prestored standard spectrogram so as to identify whether or not the peak information of the measured spectrogram matches the peak information of the standard spectrogram; and comparing, when identifying that the peak information of the measured spectrogram matches the peak information of the standard spectrogram, data of the measured spectrogram with data of the prestored standard spectrogram, so as to further identify whether or not the measured spectrogram matches the standard spectrogram.
    Type: Grant
    Filed: November 24, 2017
    Date of Patent: March 16, 2021
    Assignee: Nuctech Company Limited
    Inventors: Wei Gou, Jiaqian Zuo, Rui Fan
  • Patent number: 10935495
    Abstract: The present invention discloses a detection and analysis method for urine-modified nucleoside based on a surface-enhanced resonance Raman spectroscopy technology. In the method, a tumor marker modified nucleoside in the urine of a normal person and a cancer patient is extracted through the specificity of borophenylic acid gel; Au colloid is taken as an enhancing substrate to detect SERRS signals; and statistical analysis is conducted by using PLS-DA algorithms to establish a diagnosis and identification model for the SERRS of the urine-modified nucleoside. The model is used to discriminate that the to-be-detected urine-modified nucleoside belongs to the normal person or the cancer patient. After PLS-DA, the surface-enhanced resonance Raman spectroscopy data of the urine-modified nucleoside of the present invention has specificity of 96.9%, sensitivity of 98.2% and accuracy of 97.6%.
    Type: Grant
    Filed: September 18, 2016
    Date of Patent: March 2, 2021
    Assignee: Fujian Normal University
    Inventors: Shangyuan Feng, Zuci Zheng, Qiwen Wang, Lan Wang, Duo Lin, Cuncheng Weng, Zufang Huang, Yongzeng Li, Rong Chen
  • Patent number: 10928310
    Abstract: A method of imaging a specimen container and/or specimen. The method includes providing a specimen container containing a specimen at an imaging location, providing one or more cameras configured to capture images at the imaging location, providing one or more light sources adjacent to the imaging location, illuminating the imaging location with the one or more light sources, and capturing multiple images including: specimen images of the image location at multiple different exposures, with the specimen container and specimen being present at the image location. Quality check modules and specimen testing apparatus including a quality check module are described herein, as are other aspects.
    Type: Grant
    Filed: January 24, 2017
    Date of Patent: February 23, 2021
    Assignee: Siemens Healthcare Diagnostics Inc.
    Inventors: Patrick Wissmann, Benjamin S. Pollack
  • Patent number: 10928329
    Abstract: Disclosed herein are optical near-field systems and methods that provide a noninvasive and fast approach to detect and characterize dislocation defects in semiconductors films caused by a mismatched film-substrate, such as found in GaAs—Si. The embodiments disclosed utilize optical cavities formed by the dislocation defects. The optical cavities act to localize a beam excitation light, which elicits second harmonic generated (SHG) light from the same region. The SHG light can be probed and mapped to provide information regarding the defects. The information derived from the map includes defect location, defect density, and defect orientation.
    Type: Grant
    Filed: October 11, 2018
    Date of Patent: February 23, 2021
    Assignee: Board of Regents, The University of Texas System
    Inventors: Farbod Shafiei, Michael W. Downer