Patents Examined by Md Talikder
  • Test sequences using universal testing system
    Patent number: 10116397
    Abstract: A testing system that provides a separate set of virtualization container probes for each of at least a subset of devices that is under testing can perform Wifi Layer 2 and Wifi Layer 3 tests in a manner that minimizes or avoids wireless interference is disclosed.
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: October 30, 2018
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Dinesh Kumar, Ina Huh, Jin Ryu, Rajeev Tiwari