Abstract: A magnetic field sensor can include a substrate disposed in an x-y plane with x and y axes; one or more magnetoresistance elements, wherein magnetic directions of reference layers of each of the one or more magnetoresistance elements are parallel to the x axis; wherein the one or more magnetoresistance elements are operable to generate a magnetoresistance element signal; a first current conductor operable to generate a first AC magnetic field in an x-direction and a second current conductor operable to generate a second AC magnetic field in a y-direction; and a component determination circuit comprising at least two of: a first demodulator to demodulate the magnetoresistance element signal with a first clock signal with a first frequency, a second demodulator coupled to demodulate the magnetoresistance element signal with the first clock signal or with a second clock signal with a second frequency, or a low pass filter operable to filter the magnetoresistance element signal.

Abstract: A circuit device adapted to perform detection of angular velocity observed by a capacitance type angular velocity transducer includes a drive device, a detection device, a vibration frequency controller adapted to variably control at least one of a detection frequency and a drive frequency of the capacitance type angular velocity transducer, and a storage adapted to store a correction parameter group adapted to correct a sensor characteristic of the capacitance type angular velocity transducer due to a variation of at least one of the detection frequency and the drive frequency.

Abstract: One aspect of the disclosure provides apparatus for detecting an object. The apparatus comprises a sense coil. The apparatus comprises a processor configured to determine an amount of change in a reactance of the sense coil from a previous reactance value for the sense coil. The processor is configured to determine an amount of change in a resistance of the sense coil from a previous resistance value for the sense coil. The processor is configured to determine a presence of the object based on a relationship between the amount of change in the reactance of the sense coil and the amount of change in the resistance of the sense coil. The processor performs an inverse tangent operation on a quotient of the amount of change in the reactance of the sense coil divided by the amount of change in the resistance of the sense coil.

Abstract: A test probe for testing electric characteristics of an object to be tested. The test probe includes: a first contact portion; a second contact portion movable close to or away from the first contact portion; and an elastic deformation portion connecting the first contact portion and the second contact portion and elastically deformed by compression in a probe axial line direction, wherein at least one of the first contact portion and the second contact portion comprises a plurality of split contact portions separated by a first slit formed along a lengthwise direction. According to the present disclosure, the plurality of split contact portions are configured to independently contact the tested contact point of the object to be tested, thereby not only enhancing contact reliability but also securing contact reliability by an alternative split contact portion even though one of the split contact portions is defective or damaged.

Abstract: An averaging unit includes: a plurality of sensor connectors to which current sensors are detachably connected; an averager that generates an averaged signal for at least two detection voltage signals outputted from the current sensors connected to the sensor connectors; and an outputter that outputs the averaged signal.

Abstract: An insulation detecting method for the electric machine is provided. The leakage current leakage and the leakage resistance are detected and determined by the output potential waveform resulted from the inversion operation of the first switch and the second switch of the driver. Besides, the signal is amplified through the software or the amplification circuit coupled between the electric machine and the driver to detect the leakage resistance approximately to 5M?.

Abstract: A computing device in tiding a data port for receiving power. A detector can determine if a cable attached to the data port is capable of providing power greater than a threshold level to the computing device. A controller can generate an error signal to alert a user that the cable does not provide power over the threshold level to the computing device.

Abstract: Various approaches can be used to interrogate a surface such as a surface of a layered semiconductor structure on a semiconductor wafer. Certain approaches employ Second Harmonic Generation and in some cases may utilize pump and probe radiation. Other approaches involve determining current flow from a sample illuminated with radiation. Decay constants can be measured to provide information regarding the sample. Additionally, electric and/or magnetic field biases can be applied to the sample to provide additional information.

Abstract: A system for testing functionality of die on a wafer including a plurality of contacts includes a support structure and a plurality of probes mounted to the support structure in an array. A configuration of each of the plurality of probes varies based on a position of the probe within the array to maintain uniform engagement between the plurality of probes and a corresponding plurality of contacts across the array.

Abstract: A high volume system level testing of devices with POP structures such as POP memories includes a POP array that includes floating nests that can adjust in the XY direction in order to align individually with respective pads found on the DUTs. The floating nests also include a mechanically fixed PCB that is fixed to the nest and can either mate to a memory contactor array that can accept an unattached POP device such as a memory or can include an attached memory in order to accommodate different POP requirements. In a method, the POP array includes a number of floating nests with memory loaded are aligned and presented to their respective DUTs just prior to testing the combined DUT and POP memory assemblies.

Abstract: A test device for testing electric characteristics of an object to be tested. The test device includes: a first support member comprising a plurality of guide holes; a second support member comprising a plurality of terminal holes and arranged to be spaced apart from and in parallel with the first support member; a plurality of main contact probes; and a plurality of sub contact probes arranged to be adjacent to the main contact probes along a lengthwise direction. According to the present disclosure, contact reliability is improved by multi contact with the terminal of the test circuit board (interposer) and/or the object to be tested.

Abstract: The present disclosure describes methods and systems for determining source rock potential in a subterranean region of a hydrocarbon reservoir. One method includes receiving, an electron spin resonance (ESR) image from an in-situ ESR scanner that is attached to a wellbore at a first subterranean location, wherein the wellbore extends into the subterranean region of the hydrocarbon reservoir; determining, a spin concentration level of a source rock in the first subterranean location based on the ESR image; and determining, the source rock potential at the first subterranean location based on the determined spin concentration level.

Abstract: In an embodiment of the invention inductive coupling of an idler coil to a parent coil is used to provide a double resonance circuit without the disadvantages of capacitive coupling to the parent coil. In an embodiment of the invention, an inductive coupling coil can be used to achieve a double-tuned circuit. In an embodiment of the invention, a circuit uses inductive coupling to achieve a double resonance circuit for 1H, 19F, and 13C experiments where one of the three nuclei are observed and the other two are decoupled. In an embodiment of the invention a pivot or a shunt can be used to couple and decouple the idler coil and the parent coil.

Abstract: An image generating device is an apparatus for acquiring an image which shows a direction of an electric current flowing through a semiconductor device. The image generating device comprises a signal application unit configured to apply a stimulation signal to the semiconductor device, a magnetic detection unit configured to output a detection signal based on a magnetism generated by an application of the stimulation signal, and an image generation unit configured to generate phase image data comprising a phase component which indicates a phase difference based on the phase difference between the detection signal and a reference signal which is generated based on the stimulation signal and generate an electric current direction image which shows the direction of the electric current based on the phase image data.

Abstract: A signal correction method for correcting a measured signal has the following steps: processing a digital representation of a first signal at a first measurement input; processing a digital representation of a second signal at a second measurement input corresponding to the first signal convoluted with a transfer function; and determining the transfer function for correcting the measured signal. Further, a use of the method, a system for correcting a measured signal, and an oscilloscope are provided.

Abstract: A method in which connectivity tests of integrated circuit structures in a die are performed. The connectivity tests are performed at a first level of the die. Potential defect locations are identified in the die indicating via locations susceptible to systematic failure due to via opens or via shorts. The potential defect locations are translated to via locations for a second level of the die. The second level is below the first level. After translating the hot spot, the second level is inspected for defects. The via locations on the first level are inspected for defects. All defects for the second level are translated to the via locations for the first level. A net trace of defects is created using prior level subtraction of the translated defects for the second level and the defects for the first level.

Abstract: A method of hyperpolarisation of nuclear spins in one or more particle(s) moving relatively to a polarisation structure, wherein a polarisation of electron spins in the polarisation structure is transferred to the nuclear spins in the particle(s), wherein for one or more of the moving particle(s) within 20 nm from a surface of the polarisation structure, the correlation time of the interaction with the nearest polarisation structure electron spin due to the molecular motion is larger than the inverse of the nuclear Larmor frequency; the electron spins in the polarisation structure are polarised above thermal equilibrium; and the polarisation transfer is performed resonantly.

Abstract: A system and method are provided for a floating reference recloser voltage sensor that measures low energy analog voltage from a voltage divider connected to a high energy transmission line electrode. A floating reference cylindrical voltage screen is coaxially positioned between a high energy transmission line electrode and a cylindrical ground plate, and is positioned closer to the transmission line electrode. The floating reference recloser voltage sensor is filled with a solid dielectric material. A voltage divider network is formed when a voltmeter of a recloser controller is connected to the high-voltage electrode and the floating reference voltage screen, and connected in parallel with another divider network capacitance. The voltmeter reads a low energy voltage drop between the high energy transmission line electrode and the floating reference voltage screen. The recloser controller and the voltmeter are both disconnected from ground.

Abstract: A light-trapping geometry enhances the sensitivity of strain, temperature, and/or electromagnetic field measurements using nitrogen vacancies in bulk diamond, which have exterior dimensions on the order of millimeters. In an example light-trapping geometry, a laser beam enters the bulk diamond, which may be at room temperature, through a facet or notch. The beam propagates along a path inside the bulk diamond that includes many total internal reflections off the diamond's surfaces. The NVs inside the bulk diamonds absorb the beam as it propagates. Photodetectors measure the transmitted beam or fluorescence emitted by the NVs. The resulting transmission or emission spectrum represents the NVs' quantum mechanical states, which in turn vary with temperature, magnetic field strength, electric field strength, strain/pressure, etc.

Abstract: Apparatuses, systems, and techniques for characterizing asymmetry effects caused by cathode designs, ESC designs, cable routing, and process chamber geometries are provided. Such apparatuses, systems, and techniques may include, for example, a rotatable RF probe assembly in physical contact to a conductive plate disposed on a surface of a pedestal.