Abstract: A structure and yarn sensor for fabric directly determines pick density in a fabric thereby allowing fabric length and velocity to be calculated from a count of the picks made by the sensor over known time intervals. The structure and yarn sensor is also capable of detecting full length woven defects and fabric. As a result, an inexpensive on-line pick (or course) density measurement can be performed which allows a loom or knitting machine to be adjusted by either manual or automatic means to maintain closer fiber density tolerances. Such a sensor apparatus dramatically reduces fabric production costs and significantly improves fabric consistency and quality for woven or knitted fabric.
Type:
Grant
Filed:
March 14, 1997
Date of Patent:
October 20, 1998
Assignee:
Lockheed Martin Energy Systems, Inc.
Inventors:
David K. Mee, Glenn O. Allgood, Larry R. Mooney, Michael G. Duncan, John C. Turner, Dale A. Treece