Abstract: An example system for analyzing a component includes a radiation source configured to transmit an input radiation beam towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; a radiation detector configured to detect the output beam pattern; and a beam adjustment device disposed between the radiation source and the component and configured to modify a radiation intensity profile of the input radiation beam, wherein the beam adjustment device has an adjustable radiation transparency.

Abstract: The present invention relates, in various embodiments, to a portable device configured to perform processing operations in respect of fluid stored in a container. For example, some embodiments include a device which is configured to be inserted into a container holding fluid, and remain at a predefined level within that container. In some embodiments that predefined level is determined by the positioning of a magnet on a sidewall of the container. Although the present invention is described primarily in connection with such examples, it will be appreciated that further embodiments find wider application.

Abstract: An apparatus comprises an array of RF ion accumulation devices, including a first RF ion accumulation device having a first ion entrance, a first ion exit, and a first set of electrodes, including a first electrode disposed at, proximal and/or adjacent to the first ion exit. An ion fragmentation device having an ion entrance and an ion exit is disposed mutually in series with the array of RF ion accumulation devices and downstream thereof. A set of power supplies, including a first power supply electrically coupled to the first set of electrodes, is configured to provide a first axial potential barrier at, proximal and/or adjacent to the first ion exit. A controller is configured to control the set of power supplies in a first configuration, wherein the first axial potential barrier prevents exit of ions within a selected mass-to-charge ratio (m/z) range, and in a second configuration, wherein the first axial potential barrier permits exit of ions within a selected m/z sub-range via the first ion exit.

Abstract: A method for generating laser pulses includes generating first laser pulses and second laser pulses using at least one laser source, and amplifying the first laser pulses and second laser pulses using an optical amplifier. Each respective second laser pulse passes through the optical amplifier offset in time in relation to a respective first laser pulse by a time offset. The method further includes separating the first laser pulses from the second laser pulses using an optical beam splitter based on at least one beam property, and passing the first laser pulses through a retardation unit. A time duration for each respective first laser pulse to pass through a retardation section of the retardation unit corresponds to the time offset. The method further includes superimposing the first laser pulses with the second laser pulses using a superposition unit to form superimposed laser pulses.

Abstract: In one aspect, an ion source for use in a mass spectrometry system is disclosed, which comprises a housing, a first and a second ion probe coupled to said housing, and a first and a second emitter configured for coupling, respectively, to said first and second ion probes. The first ion probe is configured for receiving a sample at a flow rate in nanoflow regime and the second ion probe is configured for receiving a sample at a flow rate above the nanoflow regime. Each of the ion probes includes a discharge end (herein also referred to as the discharge tip) for ionizing at least one constituent of the received sample. In some embodiment, each ion probe receives the sample from a liquid chromatography (LC) column. Further, the ion probes can be interchangeably disposed within the housing.

Abstract: A sample holder with high versatility is provided. A sample holder 100 includes a holder shaft 2, a placement unit 3 on which a sample SAM is placeable, a moving mechanism 4 that moves the holder shaft in a first direction, rotating mechanism 5 that rotates the holder shaft 2 in a first rotation direction with a center of the holder shaft 2 as a rotation axis, a protrusion unit 6 that is fixed to the holder shaft 2 so as to protrude in a second direction intersecting the first direction and whose position is changed according to the rotation and movement of the holder shaft 2, and a guide unit 7 that surrounds an outer periphery of the holder shaft 2 and whose position is not changed according to the rotation and movement of the holder shaft 2. The guide unit 7 is provided with a through hole (7a) and a through hole (7b). A width of the through hole (7a) in the first rotation direction is larger than a width of the through hole (7b) in the first rotation direction.

Abstract: A streak camera is disclosed which includes an entrance slit forming a first end of the streak camera, the entrance slit having a width and height, an image capture device forming a second send of the streak camera, and an epsilon-near-zero (ENZ) slab defined by a bandgap energy and plasma frequency disposed within the streak camera, the ENZ slab configured to receive two beams with a predetermined delay therebetween, the two beams include i) a witness beam through the entrance slit at an incident angle ?, and ii) a trigger beam at substantially a normal incident angle, wherein the trigger beam applies energy at a level below the bandgap energy of the ENZ slab to thereby modify refractive index of the ENZ slab, and thus generate a modified witness beam at a time-varying exit angle ?(t) onto the image capture device.

Abstract: In a method for operating a particle beam microscope, an image of an object region is generated by virtue of a particle beam being directed to a multiplicity of incidence locations within the object region. Particles are detected and a data record is generated. The data record represents the image by a field of pixels, with a position of the pixel in the field representing the incidence location and a pixel value of the pixel representing an intensity of the detected particles at the incidence location. In order to generate an image with an increased number of pixels, at least two images of the object region are generated in succession with a fewer number of pixels and the data records representing the at least two images are supplied to an image processing program which generates the data record representing the image with the greater number of pixels therefrom.

Abstract: An energy filter assembly (1, 100, 200, 300) for ion implantation system is provided comprising an energy filter (25), a first filter frame (40), and at least one coupling element (50). The energy filter (25) has at least one filter element (25a) absorbing the beam energy of an ion beam (10). The at least one coupling element (50) elastically connects the first filter frame (40) with the energy filter (25).

Abstract: The invention relates to an access system P for a medical treatment device, in particular an extracorporeal blood treatment apparatus 1. The invention also relates to a medical treatment device, in particular an extracorporeal blood treatment apparatus 1, comprising such an access system P. The access system according to the invention has a housing body 20 which comprises an outer housing part 21 that is hollow on the inside and that is formed a connection piece 26 for connecting a closure part 36 for the fluid-tight closure of the access system or for connecting a connector 27. The access system is characterised in that a UV irradiation unit 30 is provided for emitting ultraviolet light, which comprises a plurality of UV light-emitting diodes 32 emitting ultraviolet light or an annular UV fluorescent tube, the outer housing part 21 having a region which is permeable to ultraviolet light.

Abstract: A method is provided for deriving a surface profile of a free-form master lens for patterning one or two photo-alignment layers of a planar optical component. The method includes obtaining a desired optical function of the planar optical component; and obtaining an actual optical function of the planar optical component, the actual optical function being described as recorded using a free-form test lens with a surface profile configured to provide the desired optical function. The method includes estimating a deviation between the desired optical function and the actual optical function; and correcting the surface profile of the free-form test lens using the estimated deviation, thereby deriving a surface profile for the free-form master lens.

Abstract: A system for analyzing a sample includes a sample preparation sub-system for preparing at least one sample in a sample vessel and a magnetic bead storage sub-system. A sample intake sub-system receives the at least one sample. A mass spectrometer (MS) is communicatively coupled to the sample intake sub-system. A transfer sub-system includes a tool for moving the sample vessel from the sample preparation sub-system to the sample intake sub-system.

Abstract: Objective lenses, charged particle microscopes including the same, and associated methods are disclosed herein. An objective lens can include a lens body, a shielding electrode, and a steering electrode. The objective lens is configured such that varying a steering electrode voltage adjusts a location of a main objective plane of the objective lens to vary a focal working distance of the objective lens. A method can include positioning a sample relative to an objective lens and operating the objective lens to focus a charged particle beam to a focus location.

Abstract: A processor system capable of communicating with the multi-charged particle beam device includes reducing an influence of first crosstalk caused by a first detector detecting secondary electrons from a second scanning region by recognizing a first ghost caused by the first crosstalk from a first image using the first image. The processor system modifies a first occurrence region of the first ghost, or outputs a defect candidate position as a defect position when the detected defect candidate position is outside the first occurrence region.

Abstract: A sample holder enables easy control of a progress rate of a chemical reaction of a sample to be observed and facilitates observation of the chemical reaction. A sample holder includes a cylindrical holder outer cylinder, a sample holding section that is connected to one end of the holder outer cylinder and holds a sample, a gas reservoir tank that is connected to another end of the holder outer cylinder and stores gas, an orifice for ejecting the gas stored in the gas reservoir tank into the holder outer cylinder, and a valve for controlling a flow of the gas stored in the gas reservoir tank into the orifice. The sample holding section has an open end for discharging the gas supplied from the gas reservoir tank and having passed through the sample.

Abstract: A device may include an atomic cell with a first wall. A device may include a photonic integrated circuit positioned parallel to the atomic cell first wall, the photonic integrated circuit comprising: a set of three grating emitters mounted on the photonic integrated circuit around a circumference with a spacing of around 120 degrees, wherein each grating emitter is etched to emit free-space beams on to the first wall of the atomic cell at a selected angle, wherein the selected angle in combination with the circumference results in the set of free-space beams intersecting at a location inside the atomic cell.

Abstract: A mass spectrometer includes an ionization assembly including an ionization chamber and at least one ion lens. The removable ionization assembly has a primary axis defined by the direction of an ion beam exiting the ionization assembly, and the ionization chamber and the at least one ion lens arranged along the primary axis. The mass spectrometer further includes an electron source aligned along the primary axis of the ionization assembly and a magnet assembly including a magnet. The electron source configured to provide an electron beam parallel to the primary axis. The magnet assembly movable between a first position in which the magnet is positioned to allow removal of the ion source and a second position in which the magnet is aligned with the electron source.

Abstract: A bidirectional sterilization type console arm rest device includes a first sterilization light generator configured to generate visible light emitted to front surfaces of belongings in an arm rest, and a second sterilization light generator configured to generate visible light emitted to rear surfaces of belongings in a console inner space. Therefore, sterilization by the visible light can solve the problem of harmfulness to the human body and the problem of light directivity and transmittance and maximize a sterilization effect by light diffusion of a light guiding film and, particularly, due to a separation structure of a light source and a light guiding film, the light guiding film also comes out of a belongings storage space so that usability of the tray as well as utilization of the storage space can be increased.

Abstract: A mass spectrometer is disclosed comprising: an ion detector; ion optics for guiding ions to the ion detector; one or more voltage supply for supplying voltages to said ion optics; control circuitry for controlling the one or more voltage supply so as to switch the ion optics between operating in a first mode in which the ion optics are unable to transmit ions having a first mass to charge ratio or first polarity to the ion detector and a second mode in which the ion optics are able to transmit ions having said first mass to charge ratio or first polarity to the ion detector for a time period; and to repeatedly switch between the first and second modes a plurality of times; and a processor and circuitry configured to: (i) determine the intensity of an ion signal detected by the detector at a first time in each of the time periods that the ion optics are in the second mode; and (ii) determine the intensity of the ion signal detected by the detector at a second, later time in each of the time periods that the i

Abstract: An artificial light whitening treatment for golf balls is disclosed herein. The whitening treatment can be used for golf balls recovered from water hazards, in one aspect. The whitening treatment can be an artificial light treatment comprised of a xenon arc lamp, in one example. The treatment can be configured to whiten golf balls while avoiding using known synthetic chemical based whitening techniques or solutions.