Abstract: Described is a non-radioactive homogenous plasma ion source that is power efficient. The non-radioactive plasma ion source comprises an ion source, an ion source housing for retaining the ion source, a gas inlet chamber having a gas conduit connectable to a gas source, at least one planar electrode for forming an electric field, a mounting head for mounting the non-radioactive plasma ion source device to an external device, and a passageway extending across a longitudinal axis of the non-radioactive plasma ion source device for allowing gas to flow therethrough. The gas inlet chamber has an improved design in that the gas inlet chamber comprises one or more openings in a body of the gas inlet chamber, the one or more openings being spaced such that the gas from the gas source is injected uniformly into the passageway.

Abstract: Radiation shielding performs a range of functions determined by the type and number of layers of materials used, thickness, weight, and structural support afforded by the radiation shielding. A radiation shield laminate stack may be constructed consisting of a plurality of layers of ultra-high molecular weight (UHMW) polyethylene, polyethylene film, and carbon fiber, which is held together with an epoxy. The carbon fiber lay may be coated with nanoparticles of Boron (B) or Boron Nitride (BN), Boron Oxide (B2O3) or Boron Carbide (B4C) or a combination thereof to increase the shielding properties of the laminate stack. The radiation shield is lighter than aluminum, structurally sound, and thus may be used in the space environment to effectively block Galactic Cosmic Rays, atomic oxygen and UV radiation.

Abstract: The present invention relates to a monochromator device. The monochromator device includes a first radiofrequency cavity positioned to receive an output beam from an electron source. A second radiofrequency cavity is positioned to receive the output beam from the first radiofrequency cavity. The first radiofrequency cavity and the second radiofrequency cavity are configured to, in combination, in combination, correct one or more energy deviations in time and space of the output beam.

Abstract: Embodiments herein describe using compressed source material to perform an atomic experiment or an atomic application within a vacuum chamber (e.g., an atom cooling and trapping apparatus). Source material is often refined and sold with dendritic or crystalline surfaces that result in a very large surface area. This surface area increases the likelihood that a large amount contaminants will form on the surface, which is especially true for reactive source materials. To mitigate the risk of contamination, in the embodiments herein the source material is compressed onto a substrate. This changes the material from having a dendritic or crystalline surface to a flat surface, which has a much smaller surface area and thus is less susceptible to contaminants which can, for example, improve the lifetime usage of the source material.

Abstract: A method and device for determining an average frequency of a series of ion detection pulses (P) in a spectrometer can be applied to a measurement interval (MI). The method may comprise determining the duration of an auxiliary interval (AI1, AI2, . . . ), wherein the auxiliary interval overlaps the measurement interval, the auxiliary interval starts at the last pulse (P0) preceding the measurement interval (MI), and the auxiliary interval ends at the last pulse (PN) within the measurement interval. The method may further comprise determining the number of pulses during the auxiliary interval and dividing the number of pulses by the duration of the auxiliary interval so as to produce the average frequency. The method may be applied to a series of ion pulses produced by a voltage-to-frequency converter connected to a Faraday cup.

Abstract: An electrospray probe for use in an electrospray ion source is disclosed, which comprises a cannula extending from a proximal end having an inlet aperture for receiving a liquid sample containing at least one analyte to a discharge emitter end having an outlet aperture through which charged liquid droplets containing ions of said analyte are discharged, and an electrically conductive coating covering at least a portion of an external surface and at least a portion of an internal surface of said emitter end.

Abstract: Disclosed are compositions and methods for the conductive fixation of organic material, including biological samples. The compositions and methods described herein can address the problems of charging and sample damage caused by electron beam-sample interactions within an electron microscope.

Abstract: Provided are an ion source and a mass spectrometer that reduce a dead volume of the connecting part of a pipe to a capillary. An ion source has a capillary and a pipe. The capillary has a large-diameter part that forms a capillary upstream-side end face on an upstream side. The large-diameter part has a large-diameter part downstream side face on a downstream side. The pipe has a pipe downstream end face on the downstream side. A capillary retaining unit has a hole through which the capillary downstream-side end face is passable and a face on which the large-diameter part downstream side face is installable. The ion source includes a pipe retaining unit that retains the pipe. The capillary retaining unit and the pipe retaining unit are disposed such that the capillary upstream-side end face contacts the pipe downstream end face to connect the capillary to the pipe.

Abstract: A system and a method for manipulating a beam of an Advanced Charge Controller module in different planes in an e-beam system are provided. Some embodiments of the system include a lens system configured to manipulate a beam in the tangential plane and the sagittal plane such that the beam spot is projected onto the wafer with high luminous energy. Some embodiments of the system include a lens system comprising at least two cylindrical lens.

Abstract: Disclosed are articles comprising substrate and graphene coating that are configured to support a sample for electron or optical microscopy. Also disclosed are methods of making the same and methods of using the same in imaging technology.

Abstract: Disclosed is an emitter device configured to operate as part of an electrospray ionization mass spectrometry device, the emitter device providing droplets of a liquid containing material to be analyzed. Also disclosed are methods of use of the emitter device 1.

Abstract: The disclosure provides a test device and a test method for isotope measurement of noble gases in lunar soil. The testing device includes a carbon dioxide laser ultra-high vacuum sample melting system, zirconium-aluminum getters, a vacuum dry pump, a first molecular pump, a second molecular pump, a neon gas capture unit, an argon gas capture unit, an argon krypton-xenon capture unit, a dilution tank, a sputtering ion pump and a noble gas mass spectrometer which are connected through pipelines, and each pipeline and each component are connected through a specific way; in addition, control valves for controlling the opening and closing of the pipelines are installed on the connection path between each pipeline and each component, and the disclosure also provides a matching test method.

Abstract: There is provided a method of identifying spurious peaks in a mass spectrum produced from a time-varying transient signal detected in a mass spectrometer. The method comprises the steps of generating, using a regularized inversion algorithm having one or more adjustable parameters, a first mass spectrum from the time-varying transient signal, according to a first set of values of said one or more adjustable parameters. Generating, using the regularized inversion algorithm, one or more perturbed mass spectra from the transient signal, according to one or more respective perturbed versions of the first set of values. Identifying one or more spurious peaks in the first mass spectrum by comparing the first mass spectrum with at least one of the perturbed mass spectra. There are also provided corresponding systems and computer readable media.

Abstract: An ion guide may comprise a set of plate electrodes, each plate electrode having a plurality of apertures formed therethrough. The set of plate electrodes are spatially arranged such that a relative positioning of each plurality of apertures of a respective plate electrode of the set of plate electrodes and respective adjacent plate electrodes of the set of plate electrodes defines a continuous ion flight path through the respective plurality of apertures of each plate electrode of the set of plate electrodes. The continuous ion flight path has a helical-based and/or spiral-based shape.

Abstract: The disclosure describes aspects of using multiple species in trapped-ion nodes for quantum networking. In an aspect, a quantum networking node is described that includes multiple memory qubits, each memory qubit being based on a 171Yb+ atomic ion, and one or more communication qubits, each communication qubit being based on a 138Ba+ atomic ion. The memory and communication qubits are part of a lattice in an atomic ion trap. In another aspect, a quantum computing system having a modular optical architecture is described that includes multiple quantum networking nodes, each quantum networking node including multiple memory qubits (e.g., based on a 171Yb+ atomic ion) and one or more communication qubits (e.g., based on a 138Ba+ atomic ion). The memory and communication qubits are part of a lattice in an atomic ion trap. The system further includes a photonic entangler coupled to each of the multiple quantum networking nodes.

Abstract: In order to improve the ionization efficiency and ion collection efficiency in an ESI ion source to achieve a higher level of analysis sensitivity while improving the throughput of the analysis, one mode of the present invention provides an ion analyzer equipped with an ion source employing an electrospray ionization method, where the ion source (2) includes: a plurality of capillaries (211-218) configured to spray a supplied liquid sample in the same direction; one or more auxiliary electrodes (23, 231-328) arranged so as to be surrounded by the plurality of capillaries; and a voltage supplier (24) configured to apply, to the plurality of capillaries, a DC high voltage for which the potential of the one or more auxiliary electrodes is used as a reference.

Abstract: The invention relates to a method for classifying a tissue sample obtained from mammary carcinoma. The method comprises determining a stiffness value for each of a plurality of points on said tissue sample, resulting in a stiffness distribution, and assigning said sample to a breast cancer subtype and nodal status based on said stiffness distribution.

Abstract: A quantum computing system, method, and computer readable medium involves initializing a state of a resonator-coupled quantum emitter having at least four levels arranged in an N-configuration, the N-configuration having a first ground state, a second ground state, a first excited state and a second excited state. A frequency of a first transition between the first ground state and the first excited state is tuned, a frequency of a second transition between the second ground state and the second excited state is tuned, and a frequency of a third transition between the second ground state and the first excited state is tuned. A plurality of photons are fed at a frequency corresponding to the frequency of the second transition, thereby entangling the plurality of photons to the resonator-coupled quantum emitter.

Abstract: Peak determination is executed with respect to the mass spectrum of a sample to generate a peak list. For each of the plurality of peaks contained in the peak list, a Kendrick mass (KM) of a designated monomer is calculated. An RKM is calculated, the RKM being a fractional part of a value obtained by dividing the KM by the integer mass of the monomer, or a remainder of dividing a nominal Kendrick mass (NKM) by the integer mass of the monomer. A plurality of peaks contained in the peak list and satisfying a grouping condition, including the permissible range of the RKM of the starting point peak, are grouped.

Abstract: The present disclosure provides a technique enabling accurate ascertaining of a charged state of a resist pattern resulting from irradiation of a charged particle beam. The present disclosure provides a charged particle beam system provided with: a charged particle device provided with a charged particle source, deflectors for causing a primary charged particle beam emitted from the charged particle source to be scanned over a sample, an energy discriminator for performing energy discrimination for secondary electrons emitted when the primary charged particle beam has reached the sample, and a detector for detecting secondary electrons which have passed the energy discriminator; and a computer system for generating a scan image on the basis of signal amounts detected by the detector, which fluctuate during scanning of primary charged particles by the deflectors, and storing the scan image into an image storage unit.