Patents Examined by Michael Maskell
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Patent number: 10886098Abstract: An apparatus may include a main chamber, an entrance tunnel, having an entrance axis extending into the main chamber, and an exit tunnel, connected to the main chamber and defining an exit axis, wherein the entrance tunnel and the exit tunnel define a beam bend of less than 25 degrees therebetween. The apparatus may include an electrode assembly, disposed in the main chamber, on a lower side of the exit tunnel; and a catch assembly, disposed within the main chamber, in a line of sight from an exterior aperture of the exit tunnel.Type: GrantFiled: November 20, 2018Date of Patent: January 5, 2021Assignee: APPLIED Materials, Inc.Inventors: Alexandre Likhanskii, Frank Sinclair, Shengwu Chang, Eric D. Hermanson, Nevin H. Clay
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Patent number: 10879056Abstract: A disease diagnostic system where a sample preparation unit and/or a matrix-assisted laser desorption/ionization time-of-flight mass spectrometer (MALDI-TOF MS) data generation unit may be integrated in one system or a set of a system to improve the user-friendliness of the system. The system may include a sample preparation unit with processing modules and/or a handler to move samples in an autonomous manner to enhance reproducibility of measurement data and/or user-friendliness. A different set of processing modules may be selected for a particular disease type (e.g. such as cancer) to be diagnosed. The system may be used to identify biomaterials such as bacteria, virus, and fungi from body fluids like blood, urine, and saliva and other cells.Type: GrantFiled: December 26, 2018Date of Patent: December 29, 2020Assignee: ASTA, Co. LtdInventor: Eung Joon Jo
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Patent number: 10879445Abstract: A quantum emitter device is composed of a hole milled in a layer of hexagonal boron nitride (hBN) on a substrate made of silicon dioxide. The hole preferably has a side wall angle 1.1°±0.28° from the horizontal, has an oval shape with minor axis 516 nm±20 nm and major axis 600 nm±20 nm, and/or has a depth 4 nm±1 nm. The hBN layer preferably has a total thickness of 5-10 nm. The holes may be fabricated using a gallium focused ion beam, a helium focused ion beam, electron beam directed etching, or photolithography and reactive ion etch (RIE) with sidewall tapering.Type: GrantFiled: February 12, 2020Date of Patent: December 29, 2020Assignee: University of OregonInventors: Benjamín J. Alemán, Joshua E. Ziegler
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Patent number: 10872752Abstract: A method and system for injecting an unconcentrated sample into a receiving LC/MS/MS system that is configured to determine a concentration of GenX within the unconcentrated sample, wherein the LC/MS/MS includes ESI. The unconcentrated sample is subjected to the following ESI conditions: i) a probe gas temperature of approximately 120° C. to approximately 160° C.; ii) a sheath gas heater setting of approximately 150° C. to approximately 275° C.; and iii) a sheath gas flow of approximately 6 L/min to approximately 11 L/min. The concentration of GenX is determined within the unconcentrated sample, wherein the concentration of GenX within the unconcentrated sample has a minimum reporting level of approximately 0.010 ?g/L.Type: GrantFiled: January 21, 2020Date of Patent: December 22, 2020Assignee: SUFFOLK COUNTY WATER AUTHORITYInventor: Amanda Comando
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Patent number: 10871430Abstract: A method and system are provided for extracting a target analyte from a sample using acoustic ejection technology. The method involves applying focused acoustic energy to a fluid reservoir housing a fluid composition that contains a target analyte and comprises an upper region and a lower region, where the concentration of the target analyte in the upper region differs from that in the lower region. The focused acoustic energy is applied in a manner that is effective to result in the ejection of a fluid droplet from from the fluid composition into a droplet receiver, wherein the concentration of the analyte in the droplet corresponds to either the concentration of the analyte in the upper region or the concentration of the analyte in the lower region, and wherein the concentration of the analyte is substantially uniform throughout the droplet. The fluid composition may comprise an ionic liquid, used in the extraction of ionic target analytes.Type: GrantFiled: March 4, 2019Date of Patent: December 22, 2020Assignee: Labcyte Inc.Inventors: Joseph D. Olechno, Richard N. Ellson
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Patent number: 10867773Abstract: An apparatus may include a first grounded drift tube, arranged to accept a continuous ion beam, at least two AC drift tubes, arranged in series, downstream to the first grounded drift tube, and a second grounded drift tube, downstream to the at least two AC drift tubes. The apparatus may include an AC voltage assembly, electrically coupled to at least two AC drift tubes. The AC voltage assembly may include a first AC voltage source, coupled to deliver a first AC voltage signal at a first frequency to a first AC drift tube of at least two AC drift tubes. The AC voltage assembly may further include a second AC voltage source, coupled to deliver a second AC voltage signal at a second frequency to a second AC drift tube of the at least two AC drift tubes, wherein the second frequency comprises an integral multiple of the first frequency.Type: GrantFiled: April 7, 2020Date of Patent: December 15, 2020Assignee: Varian Semiconductor Equipment Associates, Inc.Inventor: Frank Sinclair
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Patent number: 10858732Abstract: A method for Neutral Beam irradiation derived from gas cluster ion beams and articles produced thereby including optical elements.Type: GrantFiled: February 11, 2019Date of Patent: December 8, 2020Assignee: Exogenesis CorporationInventors: Sean R. Kirkpatrick, Allen R. Kirkpatrick, Michael J. Walsh
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Patent number: 10861688Abstract: An electron beam detection element includes a control unit configured to cause a diode to transition from an inactive state to an active state in response to a change of signal level of a control signal for causing an electron gun to change from an inactive state to an active state.Type: GrantFiled: November 5, 2018Date of Patent: December 8, 2020Assignee: Canon Kabushiki KaishaInventors: Mizuki Nagasaki, Hidekazu Takahashi
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Patent number: 10861672Abstract: An apparatus for measuring ion beam current values without disturbing the state of ionization of an ion source includes a high-voltage circuit for applying a voltage between an anode and at least one cathode of an ion source based on a voltage condition and supplying its output current to the anode; a gas flow rate adjusting mechanism for adjusting the flow rate of a gas being an ion source material for generating ions and to be admitted into the ion source; a memory in which there is stored information representing a relationship between the flow rate of the gas and the value of an extraction current flowing through an extraction electrode; and an arithmetic processor for finding the extraction current corresponding to the flow rate of the gas based on the information stored in the memory and subtracting the value of the extraction current from the value of the output current supplied to the anode by the high-voltage circuit to compute the electrical current value of the ion beam.Type: GrantFiled: February 12, 2020Date of Patent: December 8, 2020Assignee: JEOL Ltd.Inventor: Munehiro Kozuka
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Patent number: 10861670Abstract: Disclosed is a charged particle optical apparatus. The charged particle optical apparatus has a liner electrode in a first vacuum zone. The liner electrode is used to generate an electrostatic objective lens field. The apparatus has a second electrode which surrounds at least a section of the primary particle beam path. The section extends in the first vacuum zone and downstream of the liner electrode. A third electrode is provided having a differential pressure aperture through which the particle beam path exits from the first vacuum zone. A particle detector is configured for detecting emitted particles, which are emitted from the object and which pass through the differential pressure aperture of the third electrode. The liner electrode, the second and third electrodes are operable at different potentials relative to each other.Type: GrantFiled: December 23, 2019Date of Patent: December 8, 2020Assignee: Carl Zeiss Microscopy GmbHInventors: Erik Essers, Michael Albiez, Stefan Meyer, Daniel Kirsten, Stewart Bean
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Patent number: 10840076Abstract: A method of mass spectrometry or ion mobility spectrometry is disclosed comprising: providing an analyte; supplying a matrix compound to said analyte such that said analyte dissolves in said matrix; forming first droplets of the dissolved analyte; and colliding said first droplets with a collision surface. The use of matrix improves the analyte ion signal.Type: GrantFiled: March 7, 2016Date of Patent: November 17, 2020Assignee: Micromass UK LimitedInventors: Emrys Jones, Tamas Karancsi, Steven Derek Pringle, Julia Balog, Daniel Simon, Lajos Godorhazy, Daniel Szalay, Zoltan Takats
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Patent number: 10832889Abstract: A charged particle beam device that can improve machining position precision in section processing using a shielding plate is provided. The invention is directed to a charged particle beam device including: an ion source (101); a sample stand (106) on which a sample (107) is mounted; a shielding plate (108) placed so that a portion of the sample (107) is exposed when seen from the ion source (101); and tilt units (123, 124) that tilt the sample (107) and the shielding plate (108) relative to the irradiation direction of an ion beam (102) from the ion source (101) to the sample (107).Type: GrantFiled: August 9, 2016Date of Patent: November 10, 2020Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Asako Kaneko, Hisayuki Takasu, Toru Iwaya
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Patent number: 10834846Abstract: A disclosed apparatus includes: a vessel accommodating an object to be treated; an ultraviolet ray lamp that emits ultraviolet rays to the object to be treated; a control unit accommodating circuit equipment that controls energization of the ultraviolet ray lamp; and two (i.e., first and second) fans disposed in series with each other in an exhaust opening, formed in a casing of the control unit, for cooling the circuit equipment within the control unit. While the apparatus is in operation, the first fan is normally kept in a driven state and an air flow exhausted by the first fan passes through the second fan while idling the second fan. The apparatus further includes an abnormality detector that detects an abnormality of the first fan, such that the second fan is activated in response to the abnormality of the first fan being detected by the abnormality detector.Type: GrantFiled: August 21, 2019Date of Patent: November 10, 2020Assignee: PHOTOSCIENCE JAPAN CORPORATIONInventors: Yuji Yamakoshi, Arata Ishii, Hiroshi Ohara
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Patent number: 10821721Abstract: Described is a method for analyzing a build layer (1; 11) in an additive manufacturing machine when forming a three-dimensional article layer by layer by successive fusion of selected areas of powder layers, which selected areas correspond to successive layers of the three-dimensional article. The method comprises the steps of radiating a portion (4; 14) of the build layer (1; 11) by an energy beam and detecting particles emitted, backscattered or reflected from the radiated portion of the build layer, and scanning the portion (4; 14) of the build layer by moving the energy beam along a main path (5; 15) and simultaneously moving the energy beam back-and-forth across the main path in a meandering pattern (6; 16).Type: GrantFiled: October 8, 2018Date of Patent: November 3, 2020Assignee: Arcam ABInventor: Christian Ekberg
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Patent number: 10825674Abstract: An apparatus for mass spectrometry includes a plate on which a semiconductor wafer including an organic matter is disposed. A hybrid provider provides a ZnO-graphene hybrid to a predetermined region on the semiconductor wafer. A mass analyzer detects the organic matter in the predetermined region using laser desorption/ionization mass spectrometry (LDI-MS).Type: GrantFiled: February 28, 2019Date of Patent: November 3, 2020Assignees: SAMSUNG ELECTRONICS CO., LTD., INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITYInventors: Kook Joo Kim, KiJu Um, Cheol Sang Yoon, KangTaek Lee
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Patent number: 10825675Abstract: The present invention is directed to a method and device to generate a chemical signature for a mixture of analytes. The present invention involves using a SPME surface to one or both absorb and adsorb the mixture of analytes. In an embodiment of the invention, the surface is then exposed to different temperature ionizing species chosen with appropriate spatial resolution to desorb a chemical signature for the mixture of analytes.Type: GrantFiled: May 7, 2020Date of Patent: November 3, 2020Assignee: IonSense Inc.Inventor: Brian D Musselman
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Patent number: 10816536Abstract: A bioparticle observation apparatus includes a dielectrophoresis electrode that outputs a first signal causing a dielectrophoresis force to act on a bioparticle, a sensor electrode that detects an impedance difference between the bioparticle and the liquid, and a control circuit that controls the first signal so that the detected impedance difference is fixed.Type: GrantFiled: June 10, 2019Date of Patent: October 27, 2020Assignees: SHARP KABUSHIKI KAISHA, KYOTO UNIVERSITYInventors: Takeshi Mitsunaka, Yuichi Ogawa
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Patent number: 10814024Abstract: An apparatus and method for irradiating a fluid containing a material to be irradiated, comprising at least one irradiation chamber having at least one inlet port and outlet port, at least one fluid cooling chamber having at least one inlet port and outlet port, one or more UV radiation sources coupled to the irradiation chamber(s); and at least one heat exchange mechanism thermally coupled to the radiation source(s) and the cooling chamber(s). At least a portion of the interior surface of the cooling chamber(s) may comprise at least a portion of the exterior surface of the irradiation chamber(s) so the cooling chamber(s) is in fluid communication with the irradiation chamber(s).Type: GrantFiled: November 11, 2019Date of Patent: October 27, 2020Assignee: AQUISENSE TECHNOLOGIES, LLCInventors: Jennifer Godwin Pagan, Steven Franklin Pugh, John Krause, Oliver Lawal, Richard Mark Simons
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Patent number: 10811219Abstract: A method for evaluating a region of an object, the method may include repeating, for each sub-region out of a first sub-region of the region till a penultimate sub-region of the region, the steps of: (a) acquiring, by a charged particle imager, a charged particle image of the sub-region; and (b) milling, by a charged particle miller, the sub-region to expose another sub-region of region; acquiring, by the charged particle imager, a charged particle image of a last sub-region of the region; and generating three-dimensional information about a content of the region based on charge particle images of the first sub-region till last sub-region of the region.Type: GrantFiled: August 7, 2018Date of Patent: October 20, 2020Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Ofer Shneyour, Ron Naftali, Ronnie Porat
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Patent number: 10804089Abstract: A switch for coupling a first ion manipulation device to a second ion manipulation device comprises a first surface and a second surface, at least one first electrode coupled to each of the first and second surface and configured to receive a first voltage and generate a first potential, and at least one second electrode coupled to each of the first and second surface and configured to receive a second voltage and generate a second potential, wherein the first potential inhibits the motion of ions along a first direction and the second potential inhibits the motion of ions along a second direction different from the first direction.Type: GrantFiled: July 11, 2018Date of Patent: October 13, 2020Assignee: Batelle Memorial InstituteInventors: Yehia M. Ibrahim, Richard D. Smith