Abstract: Outputs from data bit areas of a target sensing array, above a signal throld level, are obtained by sequential scanning of groups of the data bit area aligned in columns and rows to form a digital pattern of binary data interrogated to determined the offset of the digital pattern from the centroid of the sensor array. Interrogation is performed by simultaneous counting of data bit pulses derived from separate segments of each group on opposite sides of the centroid and comparing such summations to determine the differences therebetween reflecting directional offsets from the centroid.