Abstract: A method and an apparatus for detecting hidden hazardous substance including the steps of: performing terahertz imaging for a detected object; judging whether there is a suspicious area containing the hidden hazardous substance in a terahertz image of the detected object obtained by the terahertz imaging; performing a multi-wavelength spectroscopy measurement to the suspicious area, determining whether the hazardous substance is contained in the suspicious area according to results of multi-wavelength spectroscopy measurement; and outputting the image of the detected object and hazardous substance detecting result. Also disclosed is an apparatus for implementing the method for detecting the hidden hazardous substance according to the present invention. Determination of the hidden hazardous substance can be performed from the perspectives of shape features and substance composition, thus the accuracy of detection is greatly increased.

Abstract: A phosphor device (1) comprising a carrier member (2) having upper and lower faces; a phosphor layer (3) being arranged at the upper face of the carrier member (2), wherein the phosphor layer (3) comprises at least two tiled phosphor zones (R, G, B); an optical transmitting member (4) having a first end face (7) and a second end face (9), the optical transmitting member (4) being arranged at the top portion of the phosphor layer (3), whereby the first end face (7) of the optical transmitting member (4) covers at least a subarea (8) of each of the at least two phosphor zones (R, G, B).

Abstract: An optical sensor system is disclosed. The optical sensor system comprises a panel and a sensing unit. The panel comprises a plurality of transparent areas. The sensing unit locates at one side of the panel and the sensing unit senses a plurality of first light signals reflected by an object and senses a plurality second light signals of an ambient light. The reflected first light signals and the second light signals pass through one of the plurality of transparent areas of the panel. The sensing unit further comprises a light sensor and a plurality of gesture sensors. The light sensor locates at the center of the sensing unit, and the light sensor senses the second light signals. The plurality of gesture sensors surrounds the light sensor, and the gesture sensors senses the reflected first light signals and then produce gesture signals corresponding to motions of the object.

Abstract: A computed radiography system includes a stimulating light source, a imaging plate (IP), a light collector having a bundle of optical fibers, a light detector, a mechanism providing relative movement in two orthogonal directions between the IP and the stimulating light source while maintaining the perpendicular relationship between the IP and the stimulating light, and a mechanism including an analog to digital converter for converting the collected and detected PLL to a diagnostic readout.

Abstract: Improved electric field (steered-electron electric-field, or SEEF) sensors and methods of manufacturing the same are provided. The SEEF sensors described herein may have increased sensitivity to low-frequency electric fields while being smaller than previously known sensors, and may allow for low-power electric field detection. The invention described herein allows for sensitive, long-term electric field monitoring for applications ranging from personnel detection to underground facility monitoring, as well as extraordinarily small vector sensing (full Poynting vector) for compact direction-finding of emitters of interest. Exemplary electric field sensors may accurately sense, measure, characterize and/or transmit electric field data over a wide frequency range. Importantly, such sensing, measuring, and/or characterizing do not require any physical or resistive contact between the sensor and a source of an electric field.

Abstract: The disclosure relates to a scintillation pixel array, a radiation sensing apparatus, a scintillation apparatus, and methods of making a scintillation pixel array wherein scintillation pixels have beveled surfaces and a reflective material around the beveled surfaces. The embodiments described herein can reduce the amount of cross-talk between adjacent scintillation pixels.

Abstract: Output voltage of a charge-to-voltage converter used in an image sensing system is compared with one or more thresholds to determine if the output voltage exceeds predetermined threshold levels. If the output voltage exceeds one or more of the threshold levels, the input terminal of the charge-to-voltage converter is connected to a reference voltage to prevent the charge-to-voltage converter from saturating. Problems that could be caused due to overload of the voltage-to-charge converter are obviated. In an embodiment, the charge-to-voltage converter is implemented by an operational amplifier (OPAMP). A pair of comparators compares the output of the OPAMP with corresponding threshold voltages. The result of the comparison is used to generate a signal for connecting the input of the OPAMP to the reference voltage, thereby preventing saturation of the OPAMP.

Abstract: A collimator (100) for collimating radiation includes collimator material (150) and at least one collimator hole (110) defined by the surrounding collimator material (150). The collimator hole (110) defines an aperture (112) and a bottom surface (132) through which radiation can leave the collimator (100). The volume of the collimator hole between the aperture (112) and the entrance opening and/or exit opening is shaped such that there is at least one cross-section of the hole between the aperture (112) and the entrance opening and/or exit opening, the cross-section being taken parallel with the aperture, such that the shape of the cross-section of the hole cannot be obtained through an affine transform of the shape of the aperture.

Abstract: An apparatus for detecting a leak in a gas cooled generator is provided. The apparatus includes a subsystem for introducing a non-corrosive second gas having an infrared absorption spectrum into the generator. The apparatus also includes an imaging component adapted to detect radiation at the infrared absorption spectrum of the non-corrosive second gas. The imaging component is provided with a filter that filters wavelengths in a range encompassing the infrared absorption spectrum of the non-corrosive second gas. The imaging component displays an image of the tracer gas leaking from the generator on the imaging component.

Abstract: A Helical Resonator Ion Accelerator in which ions are injected into a hollow dielectric pipe forming a vacuum chamber along which the ions are accelerated. The pipe is wrapped with a coil and positioned inside a metal pipe. The dielectric pipe, the coil and the metal pipe are arranged coaxially on an axis along which ions are accelerated. The metal pipe is positioned within a high intensity 0.5-3.0 Tesla solenoid. A pulse generator is coupled to the coil to generate a voltage wave pulse. The pulse travels down the axis of the accelerator on the helix formed by the coil. An ion source injects deuteron ions along the axis of the vacuum chamber. A traveling voltage wave is accelerated by tapering the characteristic velocity of the accelerator in the direction of wave propagation by tapering the coil and the outer metal pipe together in a constant ratio.

Abstract: The systems for determining and imaging wax deposition and simultaneous corrosion and wax deposit determination in pipelines relate to systems for determining wax deposition and corrosion by one or both of two techniques. In both techniques, a source of neutron radiation is directed at the pipeline. In one technique, a neutron detector surrounded by an absorption shield defining a collimation window counts neutrons reflected back to the detector by back diffusion or backscatter radiation. In the other technique, a gamma ray detector measures gamma rays emitted when the emitted neutrons are absorbed in the pipeline. A neutron moderator-reflector is placed around three sides of the pipeline to increase the likelihood of neutron capture.

Abstract: A method and device for improving the optical performance (such as time resolution) of scintillation detectors using the optical bleaching technique are disclosed. Light of a selected wavelength is emitted by a light source into a scintillator. The wavelength is selected to meet the minimum energy requirement for releasing of charge carriers captured by the charge carrier traps in the scintillation material. Trap-mediated scintillation components are thus reduced by optical bleaching and the optical performance of the scintillator crystal and the detector is enhanced.

Abstract: An optical path of infrared rays (see the broken lines in FIG. 1) is modified to a substantially U-like shape by a first reflecting mirror and a second reflecting mirror. An incidence angle of the infrared rays incident on the wavelength filter (an angle between the infrared rays incident on the surface of the wavelength filter and the line perpendicular to the surface of the wavelength filter) is nearly zero. For this reason, as compared with a conventional example, the influence of the incidence angle dependence of the wavelength filter can be reduced. As a result, the amount of the infrared rays reaching the light receiving unit through the wavelength filter is increased, thereby suppressing a decline in the detection accuracy of the gas component.

Abstract: A radiation detector system that effectively solves the electron trapping problem by optimizing shielding of individual virtual Frisch-grid detectors in an array configuration with a common cathode.

Abstract: An ion source for use in a radiation generator includes a sealed envelope containing an ionizable gas therein. The ion source also includes a RF antenna external to the sealed envelope, the RF antenna to transmit time-varying electromagnetic fields within the sealed envelope for producing ions from the ionizable gas. There is at least one extractor within the sealed envelope having a potential such that the ions are attracted toward the at least one extractor.

Abstract: According to one embodiment, an apparatus for detecting neutrons includes an array of pillars, wherein each of the pillars comprises a rounded cross sectional shape where the cross section is taken perpendicular to a longitudinal axis of the respective pillar, a cavity region between each of the pillars, and a neutron sensitive material located in each cavity region.

Abstract: A radiation detector system that solves the electron trapping problem by optimizing shielding of the individual virtual Frisch-grid detectors in an array configuration with a common cathode.

Abstract: A radiation detector includes a housing to contain a radiation detecting gas. The housing has a first thermal expansion over an operating temperature range. An elongate electrode extends within the housing and has opposing first and second ends, with the first end secured to adjacent portion of the housing. The elongate electrode has second thermal expansion over the operating temperature range defining a difference with respect to the first thermal expansion. A temperature compensator is coupled between the second end of the elongate electrode and an adjacent portion of the housing. The temperature compensator has a third thermal expansion over the operating temperature range to maintain a tension on the elongate electrode within a desired range over the operating temperature range.

Abstract: An apparatus and method for characterizing a particle beam provides receiving a particle beam in a central region of a reduced pressure enclosure; impacting the received beam against a beam strike that is thermally isolated from the enclosure; measuring a temperature change of the beam strike due to the impacting beam; measuring a pressure change in the enclosure due to receiving the beam; and processing the measured temperature change and the measured pressure change to determine beam characteristics.

Abstract: According to an embodiment of the present disclosure, an apparatus of inspecting an overlapped substrate obtained by bonding substrates together is provided. The apparatus includes a first holding unit configured to hold and rotate the overlapped substrate, and a displacement gauge configured to measure displacements of peripheral sides of a first substrate and a second substrate constituting the overlapped substrate while rotating the overlapped substrate held by the first holding unit.