Patents Examined by Minh N. Tang
  • Patent number: 9793220
    Abstract: A capacitive sensor and measurement circuitry is described that may be able to reproducibly measure miniscule capacitances and variations thereof. The capacitance may vary depending upon local environmental conditions such as mechanical stress (e.g., warpage or shear stress), mechanical pressure, temperature, and/or humidity. It may be desirable to provide a capacitor integrated into a semiconductor chip that is sufficiently small and sensitive to accurately measure conditions expected to be experienced by a semiconductor chip.
    Type: Grant
    Filed: December 28, 2012
    Date of Patent: October 17, 2017
    Assignee: INTEL DEUTSCHLAND GMBH
    Inventors: Hans-Joachim Barth, Horst Baumeister, Peter Baumgartner, Philipp Riess, Jesenka Veledar Krueger
  • Patent number: 9784773
    Abstract: According to one aspect, embodiments of the invention provide a system for monitoring a load center including a plurality of current sensors, a communication bus, a plurality of sensor circuits, a power module configured to be coupled to a load center input line and to receive input AC power from the input line, a collector, and a cable configured to be coupled between the power module and the collector, wherein the power module is further configured to provide power to the plurality of sensor circuits via the communication bus, provide power to the collector via the cable, measure at least one of voltage, frequency and phase of input AC power and provide signals related to the measured voltage, frequency or phase to the collector via the cable, receive current measurement signals from the plurality of sensor circuits and provide the received current measurement signals to the collector via the cable.
    Type: Grant
    Filed: November 6, 2013
    Date of Patent: October 10, 2017
    Assignee: SCHNEIDER ELECTRIC IT CORPORATION
    Inventors: Vishwas Mohaniraj Deokar, Namwook Paik, Jeffrey Steven Young
  • Patent number: 9777564
    Abstract: A dipole antenna system emplaced in a subsurface formation is configured to produce radio frequency (RF) fields for recovery of thermally responsive constituents in a subsurface formation. Coaxially disposed inner and outer conductors connected at an earth surface to an RF power source form a transmission line carrying power from the earth surface to a dipole antenna proximate said formation. The inner conductor protrudes from the outer conductor at a junction forming one pole of the antenna. The system also includes at least one choke structure attached to the outer conductor at a distance at least ¼ wavelength above said junction, confining the RF fields such that the exposed portion of the outer conductor between the junction and the choke forms a second pole of the antenna. The dipole system is configured to confine a majority of said RF fields in a volume of said formation situated adjacent to the antenna.
    Type: Grant
    Filed: December 3, 2012
    Date of Patent: October 3, 2017
    Inventors: Richard H. Snow, Armin Hassanzadeh, Jack E. Bridges
  • Patent number: 9778306
    Abstract: Methods for accelerated soiling testing of PV modules is described herein. The methods accurately reproduce soiling characteristics across various environmental conditions and can be performed in a laboratory environment under short testing times. A method described herein comprises the steps of forming a soiling mixture, depositing the soiling mixture on a surface portion of a PV module, exposing the PV module surface portion to simulated environmental conditions and determining an extent of recovery of the PV module surface portion.
    Type: Grant
    Filed: December 23, 2015
    Date of Patent: October 3, 2017
    Assignee: Total Marketing Services
    Inventor: Patricia Prod'homme
  • Patent number: 9772392
    Abstract: In at least one embodiment an apparatus for diagnosing electronics in an insulation resistance monitoring system is provided. The apparatus includes a controller for being electrically coupled to a plurality of electronics including a plurality of switches that are electrically coupled to a positive branch and to a negative branch in a high voltage network and a low voltage network. The plurality of electronics is configured to perform insulation resistance monitoring in a vehicle. The controller is further configured to at least one of activate and deactivate any number of the plurality of switches to determine an overall voltage of the positive branch and the negative branch. The controller is further configured to detect a fault in at least one of the positive branch and the negative branch that corresponds to a failure of any one of the plurality of electronics based on the overall voltage.
    Type: Grant
    Filed: February 26, 2015
    Date of Patent: September 26, 2017
    Assignee: Lear Corporation
    Inventors: Marc Deumal Herraiz, Ricardo Riazor Gil, Eladi Homedes Pedret
  • Patent number: 9772354
    Abstract: If an output voltage increases higher than a first limit voltage, a first output transistor is controlled such that the output voltage approaches the first limit voltage, and if the output voltage decreases lower than a second limit voltage, a second output transistor is controlled such that the output voltage approaches the second limit voltage. As a result, it is possible to limit the range of the output voltage and to reduce power consumption, without an increase in an output current at the time of limiter operation, differently from a voltage limiter circuit of the related art.
    Type: Grant
    Filed: December 22, 2015
    Date of Patent: September 26, 2017
    Assignee: Alps Electric Co., Ltd.
    Inventors: Ken Kawahata, Masahiko Ota
  • Patent number: 9766277
    Abstract: A system for sensing electrical power usage in an electrical power infrastructure of a structure. The system can include a sensing device configured to be attached to a panel of the circuit breaker box overlying at least part of the one or more main electrical power supply lines. The system also can include a calibration device configured to be electrically coupled to the electrical power infrastructure of the structure. The system further can include one or more processing modules configured to receive one or more output signals from the sensing device. The sensing device can be devoid of being electrically or physically coupled to the one or more main electrical power supply lines or the electrical power infrastructure when the sensing device is attached to the panel. Other embodiments are provided.
    Type: Grant
    Filed: September 12, 2014
    Date of Patent: September 19, 2017
    Assignee: BELKIN INTERNATIONAL, INC.
    Inventors: Shwetak N. Patel, Sidhant Gupta, Matthew S. Reynolds
  • Patent number: 9759764
    Abstract: A method includes varying spacing between at least one of a source region or a drain region and a well contact region to create a group of configurations. The method further includes determining an effect of latchup on each configuration.
    Type: Grant
    Filed: December 15, 2014
    Date of Patent: September 12, 2017
    Assignee: Cypress Semiconductor Corporation
    Inventors: Chuan Lin, Dong-Hyuk Ju, Imran Khan, Jun Kang, Shibly S. Ahmed
  • Patent number: 9753068
    Abstract: Embodiments of the present disclosure provide a system for detecting and precisely measuring information content of one or more environmental conditions. The system may include a plurality of oscillator circuits that are coupled together. The coupling of the oscillator circuits generates an output signal having a pattern of amplitude and frequency. The pattern of amplitude and frequency changes as one or more values of the environmental condition(s) change.
    Type: Grant
    Filed: March 31, 2015
    Date of Patent: September 5, 2017
    Assignee: INSITU Inc.
    Inventor: Gary Lee Viviani
  • Patent number: 9753070
    Abstract: In an evaluation method for a capacitive contact sensor with at least one transmitting and at least one receiving electrode, which are able to be brought into a capacitive coupling, —at the at least one receiving or sensor electrode a measurement signal is tapped, which represents the temporal course of the coupling capacitance between the at least one transmitting electrode and the at least one receiving electrode and the temporal course of the capacitive load of the sensor electrode, respectively, —a reference signal is created from the measurement signal, and —at least one detection signal is created, when the reference signal meets at least one detection criterion. An evaluation device may be coupled with at least one transmitting electrode and at least one receiving electrode or with at least one sensor electrode of the capacitive contact sensor and is adapted to carry out the above evaluation method.
    Type: Grant
    Filed: June 28, 2012
    Date of Patent: September 5, 2017
    Assignee: MICROCHIP TECHNOLOGY INCORPORATED
    Inventors: Stefan Burger, Holger Steffens
  • Patent number: 9753087
    Abstract: A method for testing a multi-chip system with multiple ports includes determining a test path formed by connecting the multiple ports. The test path is determined in such a way that the internal logic circuit of each chip in the multi-chip system is bypassed. The method further includes injecting a test traffic to the test path, and receiving the test traffic from the test path.
    Type: Grant
    Filed: May 10, 2012
    Date of Patent: September 5, 2017
    Assignee: Telefonaktiebolaget LM Ericsson (publ)
    Inventor: Gan Wen
  • Patent number: 9726694
    Abstract: A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.
    Type: Grant
    Filed: March 30, 2015
    Date of Patent: August 8, 2017
    Assignee: Celadon Systems, Inc.
    Inventors: William A. Funk, John L. Dunklee, Bryan J. Root
  • Patent number: 9722535
    Abstract: The present disclosure provides a method and a device for arc fault detection for a photovoltaic inverter, and a photovoltaic inverter using the same. The method includes: acquiring current signals at a DC side of the photovoltaic inverter; obtaining frequency spectral characteristics of the current signal according to the current signal; judging whether the frequency spectral characteristics of the current signal have a frequency spectral characteristic of an arc; and if the frequency spectral characteristics of the current signal have a frequency spectral characteristic of an arc, shutting down the photovoltaic inverter, acquiring respectively a first input voltage when the photovoltaic inverter is shut down and a second input voltage after a predetermined time period after the shutdown, calculating a voltage drop from the first input voltage to the second input voltage, and judging whether an arc fault occurs according to the voltage drop.
    Type: Grant
    Filed: December 30, 2015
    Date of Patent: August 1, 2017
    Assignee: Delta Electronics (Shanghai) CO., LTD
    Inventors: Xuancai Zhu, Feidong Xu
  • Patent number: 9720032
    Abstract: An automated test platform for testing a first device under test includes N voltage sources for providing N different voltages. A cross matrix switching system is coupled to the N voltage sources, the cross matrix switch being configured to provide the N different voltages to M discrete test points within the first device under test, wherein M is larger than N. An N voltage measuring system is coupled to the first device under test, the N voltage measuring system being configured to measure the voltage potential present on the M discrete test points.
    Type: Grant
    Filed: March 31, 2015
    Date of Patent: August 1, 2017
    Assignee: Xcerra Corporation
    Inventors: Wai-Kong Chen, David Harris
  • Patent number: 9715800
    Abstract: Lighting control for location finding is disclosed. According to embodiments, lighting control can include determining, using a group of location detectors, a first location of a computing device of a user, and obtaining, from the computing device, a target location for the user. Lighting control can include determining a path from the first location to the target location, the path determined at least based on a lighting system including a group of light emitting diode (LED) arrays, and indicating, using a first LED array of the group of LED arrays, a first portion of the path to the target location. The first portion of the path can be indicated by determining, for the plurality of LEDs of the first LED array, at least one LED that is visible at the first location, and outputting light from the at least one LED that is visible at the first location.
    Type: Grant
    Filed: April 1, 2015
    Date of Patent: July 25, 2017
    Assignee: International Business Machines Corporation
    Inventors: Didier Boullery, Marc P. Yvon
  • Patent number: 9715034
    Abstract: A method includes obtaining, with a plurality of receivers of a logging tool, a set of induction, multi-spacing, multi-frequency measurements of a plurality of nested casings. The method also includes inverting, with a processor, the set of measurements for magnetic permeability or electrical conductivity. The method further includes calibrating, with the processor, the set of measurements using differences between measured responses of the logging tool, and simulated responses of the logging tool resulting from inverting the set of measurements for the magnetic permeability or electrical conductivity of the plurality of nested casings, to determine a calibrated set of measurements. The method also includes inverting, with the processor, the calibrated set of measurements for thickness of individual casings of the plurality of nested casings, to determine the thickness of the individual casings.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: July 25, 2017
    Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
    Inventors: Dzevat Omeragic, Saad Omar
  • Patent number: 9713993
    Abstract: This discloses apparatus including, but not limited to, an all Direct Current (DC) energy transfer circuit, a energy transfer controller, an all-DC energy transfer network, components of use in such circuits, and application apparatus that benefits from including and/or using the all-DC energy transfer device and methods of operating the above in accord with this invention. The application apparatus may include, but are not limited to, a hybrid electric vehicle, an electric vehicle, and/or a solar power device, in particular, a hybrid electric/internal combustion engine automobile.
    Type: Grant
    Filed: January 21, 2016
    Date of Patent: July 25, 2017
    Assignee: RICHARD H. SHERRAT AND SUSAN B. SHERRATT TRUST FUND
    Inventor: Brian Elfman
  • Patent number: 9704359
    Abstract: Lighting control for location finding is disclosed. According to embodiments, lighting control can include determining, using a group of location detectors, a first location of a computing device of a user, and obtaining, from the computing device, a target location for the user. Lighting control can include determining a path from the first location to the target location, the path determined at least based on a lighting system including a group of light emitting diode (LED) arrays, and indicating, using a first LED array of the group of LED arrays, a first portion of the path to the target location. The first portion of the path can be indicated by determining, for the plurality of LEDs of the first LED array, at least one LED that is visible at the first location, and outputting light from the at least one LED that is visible at the first location.
    Type: Grant
    Filed: September 28, 2015
    Date of Patent: July 11, 2017
    Assignee: International Business Machines Corporation
    Inventors: Didier Boullery, Marc P. Yvon
  • Patent number: 9689915
    Abstract: A probe card apparatus can comprise a tester interface to a test controller, probes for contacting terminals of electronic devices to be tested, and electrical connections there between. The probe card apparatus can comprise a primary sub-assembly, which can include the tester interface. The probe card apparatus can also comprise an interchangeable probe head, which can include the probes. The interchangeable probe head can be attached to and detached from the primary sub-assembly while the primary sub-assembly is secured to or in a housing of a test system. Different probe heads each having probes disposed in different patterns to test different types of electronic devices can thus be interchanged while the primary sub-assembly is secured to or in a housing of the test system.
    Type: Grant
    Filed: May 12, 2014
    Date of Patent: June 27, 2017
    Assignee: FormFactor, Inc.
    Inventors: Toshihiro Kasai, Masanori Watanabe, Yoichi Urakawa
  • Patent number: 9684015
    Abstract: A measuring apparatus includes a stage on which an object to be measured is placed, an insulating base plate, a probe fixed on the insulating base plate, a measuring unit which measures an electrical characteristic of the object to be measured through the probe, a side wall part having such a shape as to surround the probe and smaller in width than the stage, and a supply tube through which an insulating liquid is supplied, wherein when an electrical characteristic of the object to be measured is measured, the stage, the side wall part and the insulating base plate form a measurement region surrounding the object to be measured, and the insulating liquid is applied from the supply tube to the object to be measured in the measurement region.
    Type: Grant
    Filed: March 11, 2015
    Date of Patent: June 20, 2017
    Assignee: Mitsubishi Electric Corporation
    Inventors: Akira Okada, Takaya Noguchi, Kosuke Hatozaki